IEC 60269-4:1986/AMD2:2002/COR1:2003
(Amendment)Corrigendum 1 to Amendment 2 - Low-voltage fuses. Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
Corrigendum 1 to Amendment 2 - Low-voltage fuses. Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
Corrigendum 1 to Amendment 2 - Fusibles basse tension. Quatrième partie: Prescriptions supplémentaires concernant les éléments de remplacement utilisés pour la protection des dispositifs à semiconducteurs
General Information
- Status
- Published
- Publication Date
- 19-Mar-2003
- Technical Committee
- SC 32B - Low-voltage fuses
- Current Stage
- DELPUB - Deleted Publication
- Start Date
- 01-Dec-2006
- Completion Date
- 13-Feb-2026
Relations
- Effective Date
- 05-Sep-2023
- Effective Date
- 05-Sep-2023
Get Certified
Connect with accredited certification bodies for this standard
Intertek Testing Services NA Inc.
Intertek certification services in North America.
UL Solutions
Global safety science company with testing, inspection and certification.
ANCE
Mexican certification and testing association.
Sponsored listings
Frequently Asked Questions
IEC 60269-4:1986/AMD2:2002/COR1:2003 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Corrigendum 1 to Amendment 2 - Low-voltage fuses. Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices". This standard covers: Corrigendum 1 to Amendment 2 - Low-voltage fuses. Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
Corrigendum 1 to Amendment 2 - Low-voltage fuses. Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
IEC 60269-4:1986/AMD2:2002/COR1:2003 is classified under the following ICS (International Classification for Standards) categories: 29.120.50 - Fuses and other overcurrent protection devices. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 60269-4:1986/AMD2:2002/COR1:2003 has the following relationships with other standards: It is inter standard links to IEC 60269-4:1986/AMD2:2002, IEC 60269-4:2006. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
IEC 60269-4:1986/AMD2:2002/COR1:2003 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
CEI 60269-4 IEC 60269-4
(Troisième édition – 1986) (Third edition – 1986)
Amendement 2 (2002) Amendment 2 (2002)
Fusibles basse tension – Low-voltage fuses –
Partie 4: Prescriptions supplémentaires Part 4: Supplementary requirements
concernant les éléments de remplacement for fuse-links for the protection
utilisés pour la protection des dispositifs of semiconductors devices
à semi-conducteurs
CORRIGENDUM 1
Page 16 Page 17
Tableau XIIA – Valeurs pour les essais Table XIIA – Values for breaking-
de vérification du pouvoir de coupure capacity tests on a.c. fuses
des fusibles pour courant alternatif
Explication des symboles Explanation of symbols
Au lieu de: Instead of:
I ……… Des temps inférieurs peuvent I ……… Shorter times may be chosen
2a 2a
être choisis pour des applications for special applications.
spéciales.
lire: read:
I ……… Des temps inférieurs à 30 s I ……… Shorter times than 30 s may
2a 2a
peuvent être choisis pour des applications be chosen for special applications. See
spéciales. Voir note de 7.4. note of 7.4.
Page 18 Page 19
Tableau XIIB – Valeurs pour les essais Table XIIB – Values for breaking-
de vérification du pouvoir de coupure capacity tests on d.c. fuses
des fusibles pour courant continu
c c
Constante de temps Time constant
Au lieu de: Instead of:
Lorsque le courant présumé d’essai est Where prospective test curren
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.
Loading comments...