EN 60758:2009

SLOVENSKI STANDARD
01-april-2009
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SIST EN 60758:2005
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Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2008)
Synthetischer Quarzkristall - Festlegungen und Leitfaden für die Anwendung (IEC
60758:2008)
Cristal de quartz synthétique - Spécifications et guide d'utilisation (CEI 60758:2008)
Ta slovenski standard je istoveten z: EN 60758:2009
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 60758
NORME EUROPÉENNE
January 2009
EUROPÄISCHE NORM
ICS 31.140 Supersedes EN 60758:2005

English version
Synthetic quartz crystal -
Specifications and guidelines for use
(IEC 60758:2008)
Cristal de quartz synthétique -  Synthetischer Quarzkristall -
Spécifications et Festlegungen und Leitfaden
guide d'utilisation für die Anwendung
(CEI 60758:2008) (IEC 60758:2008)

This European Standard was approved by CENELEC on 2008-12-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: avenue Marnix 17, B - 1000 Brussels

© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60758:2009 E
Foreword
The text of document 49/808/FDIS, future edition 4 of IEC 60758, prepared by IEC TC 49, Piezoelectric
and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel
vote and was approved by CENELEC as EN 60758 on 2008-12-01.
This European Standard supersedes EN 60758:2005.
– preparation of AT-cut slice sample for etching is changed to make it easier;
– etch channel grade classification is changed considering request of the user;
– explanation of quartz axes difference between IEEE and IEC is added as Annex F.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2009-09-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2011-12-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60758:2008 was approved by CENELEC as a European
Standard without any modification.
__________
– 3 – EN 60758:2009
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60068-1 1988 Environmental testing -
+ corr. October 1988 Part 1: General and guidance

+ A1 1992 EN 60068-1 1994
IEC 60122-1 2002 Quartz crystal units of assessed quality - EN 60122-1 2002
Part 1: Generic specification
IEC 60410 1973 Sampling plans and procedures for - -
inspection by attributes
IEC/TS 61994 Series Piezoelectric and dielectric devices for - -
frequency control and selection - Glossary

IEC 60758
Edition 4.0 2008-11
INTERNATIONAL
STANDARD
Synthetic quartz crystal – Specifications and guidelines for use

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
X
ICS 31.140 ISBN 2-8318-1016-2
– 2 – 60758 © IEC:2008(E)
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Specification for as-grown synthetic quartz crystal . 11
4.1 Standard values . 11
4.1.1 Orientation of the seed. 11
4.1.2 Inclusion density . 11
4.1.3 Infrared quality indications, α , α , α . 11
3500 3585 3410
4.1.4 Frequency-versus-temperature characteristics (Figure 4 and 4.2.7). 12
4.1.5 Etch channel density ρ . 12
4.2 Requirements and measuring methods. 13
4.2.1 Orientation. 13
4.2.2 Handedness. 13
4.2.3 Synthetic quartz crystal dimensions . 13
4.2.4 Seed dimensions . 13
4.2.5 Imperfections . 13
4.2.6 Evaluation of infrared quality by alpha-measurement . 15
4.2.7 Frequency versus temperature characteristics. 17
4.2.8 Etch channel density. 18
4.3 Marking . 19
4.3.1 Shipping requirements . 19
5 Specification for lumbered synthetic quartz crystal . 20
5.1 Standard values . 20
5.1.1 Tolerance of dimensions . 20
5.1.2 Reference surface flatness . 20
5.1.3 Angular tolerance of reference surface . 20
5.1.4 Centrality of the seed. 20
5.2 Requirements and measuring methods. 20
5.2.1 As-grown quartz bars used for lumbered quartz bars . 20
5.2.2 Dimensions of lumbered synthetic quartz crystal . 20
5.2.3 Identification on reference surface . 20
5.2.4 Measurement of reference surface flatness . 20
5.2.5 Measurement of reference surface angle tolerance. 20
5.2.6 Centrality of the seed. 20
5.3 Delivery conditions. 21
5.3.1 Marking . 21
5.3.2 Packing . 21
5.3.3 Making batch . 21
6 Inspection rule for synthetic quartz crystal and lumbered synthetic quartz
crystal . 21
6.1 Inspection rule for as-grown synthetic quartz crystal . 21
6.1.1 Inspection . 21
6.1.2 Lot-by-lot test. 21
6.2 Inspection rule for lumbered synthetic quartz crystal . 22
6.2.1 Lot-by-lot test. 23
7 Guidelines for the use of synthetic quartz crystal . 23

60758 © IEC:2008(E) – 3 –
7.1 General . 23
7.1.1 Overview . 23
7.1.2 Synthetic quartz crystal. 23
7.2 Shape and size of synthetic quartz crystal. 24
7.2.1 Crystal axis and face designation. 24
7.2.2 Seed . 24
7.2.3 Shapes and dimensions . 24
7.2.4 Growth zones . 24
7.3 Standard method for evaluating the quality of synthetic quartz crystal. 25
7.4 Other methods for checking the quality of synthetic quartz crystal . 25
7.4.1 Visual inspection . 25
7.4.2 Infrared radiation absorption method . 26
7.4.3 Miscellaneous . 26
7.5 Alpha-grade. 27
7.6 Optional grading (only as ordered), in inclusions, etch channels, Al
content. 27
7.6.1 Inclusions . 27
7.6.2 Etch channels . 27
7.6.3 Al content . 27
7.6.4 Swept quartz. 28
7.7 Ordering. 28
Annex A (informative) Frequently used sampling procedures . 38
Annex B (informative) Numerical example . 40
Annex C (informative) Example of reference sample selection . 41
Annex D (informative) Explanations of point callipers . 42
Annex E (informative) Infrared absorbance alpha value compensation . 43
Annex F (informative) The differences of the orthogonal axial system for
quartz between IEC standard and IEEE standard . 47
Bibliography . 49

Figure 1 – Idealized sections of a synthetic quartz crystal grown on a Z-cut seed . 29
Figure 2 – Quartz crystal axis and face designation . 30
Figure 3 – Typical example of cutting wafers of AT-cut plate, minor
rhombohedral-cut plate, X-cut plate, Y-cut plate and Z-cut plate. 31
Figure 4 – Frequency-temperature characteristics of the test specimen for slope . 32
Figure 5 – Quartz crystal axis and face designation . 33
Figure 6 – A synthetic quartz crystal grown on a Z-cut seed of small X-dimensions . 34
Figure 7 – An example of an early 197Os relation between the extinction
coefficient pf infra-red radiation and the Q-value of synthetic quartz . 34
Figure 8 – Lumbered synthetic quartz crystal outline and dimensions along X-, Y-
and Z-axes . 35
Figure 9 – Angular deviation for reference surface . 36
Figure 10 – Centrality of the seed with respect to the dimension along the Z- or
Z'-axis.
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