EN 61646:2008

SLOVENSKI STANDARD
01-december-2008
1DGRPHãþD
SIST EN 61646:2001
Tankoplastni prizemni fotonapetostni (PV) moduli - Ocena zasnove in odobritev
tipa (IEC 61646:2008)
Thin-film terrestrial photovoltaic (PV) modules - Design qualification and type approval
Terrestrische Dünnschicht-Photovoltaik (PV)-Module - Bauarteignung und
Bauartzulassung
Modules photovoltaïques (PV) en couches minces pour application terrestre -
Qualification de la conception et homologation
Ta slovenski standard je istoveten z: EN 61646:2008
ICS:
27.160 6RQþQDHQHUJLMD Solar energy engineering
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 61646
NORME EUROPÉENNE
August 2008
EUROPÄISCHE NORM
ICS 27.160 Supersedes EN 61646:1997

English version
Thin-film terrestrial photovoltaic (PV) modules -
Design qualification and type approval
(IEC 61646:2008)
Modules photovoltaïques (PV)  Terrestrische Dünnschicht-Photovoltaik
en couches minces (PV)-Module -
pour application terrestre - Bauarteignung und Bauartzulassung
Qualification de la conception (IEC 61646:2008)
et homologation
(CEI 61646:2008)
This European Standard was approved by CENELEC on 2008-06-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61646:2008 E
Foreword
The text of document 82/512/FDIS, future edition 2 of IEC 61646, prepared by IEC TC 82, Solar
photovoltaic energy systems, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 61646 on 2008-06-01.
This European Standard supersedes EN 61646:1997.
The major change is in the pass/fail criteria. It no longer relies on meeting a plus/minus criterion before
and after each test, but rather on meeting the rated power after all of the tests have been completed and
the modules have been light-soaked. This was done to eliminate the technology-specific preconditioning
necessary to accurately measure the changes caused by the test. (Some modules lose power in light
while others lose power during dark heat.) Since all modules must work after exposure to light, this
seemed like a good approach and will streamline the test procedure, hopefully reducing the testing cost.
– updated normative references;
– added a definition of “minimum value of maximum output power”;
– modified the wording in major visual defects to allow some bending and misalignment without failure;
– added requirements to the report from EN ISO/IEC 17025;
– removed the “Twist Test” as was done from EN 61215, since no one has ever failed this test;
– made the pass/fail criteria for insulation resistance and wet leakage current dependent on the module
area;
– added the temperature coefficient of power (δ) to the required measurements;
– modified temperature coefficient section to allow for measurements under natural sunlight or a solar
simulator;
– deleted reference plate method from NOCT;
– added apparatus sections to those test procedures that did not have apparatus sections in
EN 61646:1997;
– rewrote the hot-spot test;
– eliminated edge dip method from wet leakage current test;
– changed mechanical load test to 3 cycles to be consistent with other standards;
– added bypass diode thermal test.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2009-03-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2011-06-01
Annex ZA has been added by CENELEC.
__________
- 3 - EN 61646:2008
Endorsement notice
The text of the International Standard IEC 61646:2008 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60904-5 NOTE  Harmonized as EN 60904-5:1995 (not modified).
IEC 60904-8 NOTE  Harmonized as EN 60904-8:1998 (not modified).
__________
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

1) 2)
IEC 60068-1 - Environmental testing - EN 60068-1 1994
Part 1: General and guidance
1) 2)
IEC 60068-2-21 - Environmental testing - EN 60068-2-21 2006
Part 2-21: Tests - Test U: Robustness of
terminations and integral mounting devices

2)
IEC 60068-2-78 2001 Environmental testing - EN 60068-2-78 2001
Part 2-78: Tests - Test Cab: Damp heat,
steady state
1)
IEC 60410 - Sampling plans and procedures for inspection - -
by attributes
1) 2)
IEC 60721-2-1 - Classification of environmental conditions - HD 478.2.1 S1 1989
Part 2-1: Environmental conditions appearing
in nature - Temperature and humidity

1) 2)
IEC 60891 - Procedures for temperature and irradiance EN 60891 1994
corrections to measured I-V characteristics of
crystalline silicon photovoltaic devices

2)
IEC 60904-1 2006 Photovoltaic devices - EN 60904-1 2006
Part 1: Measurement of photovoltaic current-
voltage characteristics
1) 2)
IEC 60904-2 - Photovoltaic devices - EN 60904-2 2007
Part 2: Requirements for reference solar
devices
1) 2)
IEC 60904-3 - Photovoltaic devices - EN 60904-3 2008
Part 3: Measurement principles for terrestrial
photovoltaic (PV) solar devices with reference
spectral irradiance data
1) 2)
IEC 60904-7 - Photovoltaic devices - EN 60904-7 1998
Part 7: Computation of spectral mismatch
error introduced in the testing of a photovoltaic
device
1) 2)
IEC 60904-9 - Photovoltaic devices - EN 60904-9 2007
Part 9: Solar simulator performance
requirements
1) 2)
IEC 60904-10 - Photovoltaic devices - EN 60904-10 1998
Part 10: Methods of linearity measurement

1) 2)
IEC 61215 - Crystalline silicon terrestrial photovoltaic (PV) EN 61215 2005
modules - Design qualification and type
approval
1)
Undated reference.
2)
Valid edition at date of issue.

- 5 - EN 61646:2008
Publication Year Title EN/HD Year

1) 2)
ISO/IEC 17025 - General requirements for the competence of EN ISO/IEC 17025 2005
testing and calibration laboratories

IEC 61646
Edition 2.0 2008-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Thin-film terrestrial photovoltaic (PV) modules – Design qualification and type
approval
Modules photovoltaïques (PV) en couches minces pour application terrestre –
Qualification de la conception et homologation

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
X
CODE PRIX
ICS 27.160 ISBN 2-8318-9746-7
– 2 – 61646 © IEC:2008
CONTENTS
FOREWORD.5
1 Scope and object.7
2 Normative references .7
3 Sampling .8
4 Marking .8
5 Testing .9
6 Pass criteria .9
7 Major visual defects.10
8 Report .10
9 Modifications .11
10 Test procedures .14
10.1 Visual inspection .14
10.1.1 Purpose.14
10.1.2 Procedure.14
10.1.3 Requirements .14
10.2 Maximum power determination .14
10.2.1 Purpose.14
10.2.2 Apparatus.14
10.2.3 Procedure.14
10.3 Insulation test.15
10.3.1 Purpose.15
10.3.2 Apparatus.15
10.3.3 Test conditions .15
10.3.4 Procedure.15
10.3.5 Test requirements.16
10.4 Measurement of temperature coefficients .16
10.4.1 Purpose.16
10.4.2 Apparatus.16
10.4.3 Procedure.16
10.5 Measurement of nominal operating cell temperature (NOCT).18
10.5.1 Purpose.18
10.5.2 Introduction .18
10.5.3 Principle .18
10.5.4 Apparatus.18
10.5.5 Test module mounting .19
10.5.6 Procedure.19
10.6 Performance at STC and NOCT .21
10.6.1 Purpose.21
10.6.2 Apparatus.22
10.6.3 Procedure.22
10.7 Performance at low irradiance .22
10.7.1 Purpose.22
10.7.2 Apparatus.22
10.7.3 Procedure.22
10.8 Outdoor exposure test .23

61646 © IEC:2008 – 3 –
10.8.1 Purpose.23
10.8.2 Apparatus.23
10.8.3 Procedure.23
10.8.4 Final measurements .23
10.8.5 Requirements .23
10.9 Hot-spot endurance test .23
10.9.1 Purpose.23
10.9.2 Hot-spot effect.23
10.9.3 Classification of cell interconnection .24
10.9.4 Apparatus.25
10.9.5 Procedure.25
10.9.6 Final measurements .26
10.9.7 Requirements .26
10.10 UV preconditioning test.27
10.10.1 Purpose .27
10.10.2 Apparatus .27
10.10.3 Procedure .27
10.10.4 Final measurements.27
10.10.5 Requirements .27
10.11 Thermal cycling test.27
10.11.1 Purpose .27
10.11.2 Apparatus .28
10.11.3 Procedure .28
10.11.4 Final measurements.28
10.11.5 Requirements .29
10.12 Humidity-freeze test.29
10.12.1 Purpose .29
10.12.2 Apparatus .29
10.12.3 Procedure .30
10.12.4 Final measurements.30
10.12.5 Requirements .30
10.13 Damp heat test .30
10.13.1 Purpose .30
10.13.2 Procedure .30
10.13.3 Final measurements.30
10.13.4 Requirements .30
10.14 Robustness of terminations test.31
10.14.1 Purpose .31
10.14.2 Types of terminations.31
10.14.3 Procedure .31
10.14.4 Final measurements.32
10.14.5 Requirements .32
10.15 Wet leakage current test.32
10.15.1 Purpose .32
10.15.2 Apparatus .32
10.15.3 Procedure .32
10.15.4 Requirements .32
10.16 Mechanical load test.33
10.16.1 Purpose .33

– 4 – 61646 © IEC:2008
10.16.2 Apparatus .33
10.16.3 Procedure .33
10.16.4 Final measurements.33
10.16.5 Requirements .33
10.17 Hail test .33
10.17.1 Purpose .33
10.17.2 Apparatus .33
10.17.3 Procedure .35
10.17.4 Final measurements.36
10.17.5 Requirements .36
10.18 Bypass diode thermal test.36
10.18.1 Purpose .36
10.18.2 Apparatus .37
10.18.3 Procedure 1 .37
10.18.4 Procedure 2 .38
10.18.5 Final Measurements.38
10.18.6 Requirements .39
10.19 Light-soaking .39
10.19.1 Purpose .39
10.19.2 Apparatus .39
10.19.3 Procedure .39
10.19.4 Final measurements.39
10.19.5 Requirements .39
Bibliography.40

Figure 1 – Qualification test sequence .12
Figure 2 – NOCT correction factor .21
Figure 3 – Hot-spot effect in a thin-film module with serially connected cells. Worst
case shading condition is shading of 4 cells at the same time.24
Figure 4 – Thermal cycling test .28
Figure 5 – Humidity-freeze cycle.29
Figure 6 – Hail test equipment .35
Figure 7 – Impact locations.36
Figure 8 – Bypass Diode Thermal Test .38

Table 1 – Summary of test levels .13
Table 2 – Ice ball masses and test velocities .34
Table 3 – Impact locations .36

61646 © IEC:2008 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
THIN-FILM TERRESTRIAL PHOTOVOLTAIC (PV) MODULES –
DESIGN QUALIFICATION AND TYPE APPROVAL

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61646 has been prepared by IEC technical committee 82: Solar
photovoltaic energy systems.
This second edition cancels and replaces the first edition published in 1996. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
The major change is in the pass/fail criteria. It no longer relies on meeting a plus/minus
criterion before and after each test, but rather on meeting the rated power after all of the tests
have been completed and the modules have been light-soaked. This was done to eliminate
the technology-specific preconditioning necessary to accurately measure the changes caused
by the test. (Some modules lose power in light while others lose power during dark heat.)
Since all modules must work after exposure to light, this seemed liked a good approach and
will streamline the test procedure, hopefully reducing the testing cost.
• Updated Normative references.
• Added a definition of “minimum value of maximum output power”.

– 6 – 61646 © IEC:2008
• Modified the wording in Major visual defects to allow some bending and misalignment
without failure.
• Added requirements to the report from ISO/IEC 17025.
• Removed the “Twist Test” as was done from IEC 61215, since no one has ever failed this
test.
• Made the pass/fail criteria for insulation resistance and wet leakage current dependent on
the module area.
• Added the temperature coefficient of power (δ) to the required measurements.
• Modified temperature coefficient section to allow for measurements under natural sunlight
or a solar simulator.
• Deleted reference plate method from NOCT.
• Added apparatus sections to those test procedures that did not have apparatus sections in
edition 1.
• Rewrote the hot-spot test.
• Eliminated edge dip method from wet leakage current test.
• Changed mechanical load test to 3 cycles to be consistent with other standards.
• Added bypass diode thermal test.
The text of this standard is based on the following documents:
FDIS Report on voting
82/512/FDIS 82/528/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
61646 © IEC:2008 – 7 –
THIN-FILM TERRESTRIAL PHOTOVOLTAIC (PV) MODULES –
DESIGN QUALIFICATION AND TYPE APPROVAL

1 Scope and object
This International Standard lays down requirements for the design qualification and type
approval of terrestrial, thin-film photovoltaic modules suitable for long-term operation in
general open-air climates as defined in IEC 60721-2-1. This standard is intended to apply to
all terrestrial flat plate module materials not covered by IEC 61215.
The test sequence is derived from IEC 61215 for the design qualification and type approval of
terrestrial crystalline silicon PV modules. However, it no longer relies on meeting a plus/minus
criterion before and after each test, but rather on meeting a specified percentage of the rated
minimum power after all of the tests have been completed and the modules have been light-
soaked. This eliminates the technology-specific preconditioning necessary to accurately
measure the changes caused by the test.
This standard does not apply to modules used with concentrators.
The object of this test sequence is to determine the electrical and thermal characteristics of
the module and to show, as far as possible within reasonable constraints of cost and time,
that the module is capable of withstanding prolonged exposure in climates described in the
scope. The actual life expectancy of modules so qualified will depend on their design, their
environment and the conditions under which they are operated.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60068-1: Environmental testing – Part 1: General and guidance
IEC 60068-2-21: Environmental testing – Part 2-21: Tests – Test U: Robustness of
terminations and integral mounting devices
IEC 60068-2-78:2001, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat,
steady state
IEC 60410, Sampling plans and procedures for inspection by attributes
IEC 60721-2-1, Classification of environmental conditions – Part 2-1: Environmental
conditions appearing in nature – Temperature and humidity
IEC 60891, Procedures for temperature and irradiance corrections to measured I-V
characteristics of crystalline silicon photovoltaic (PV) devices
IEC 60904-1:2006, Photovoltaic devices – Part 1: Measurements of photovoltaic current-
voltage characteristics
IEC 60904-2, Photovoltaic devices – Part 2: Requirements for reference solar devices

– 8 – 61646 © IEC:2008
IEC 60904-3, Photovoltaic devices – Part 3: Measurement principles for terrestrial
photovoltaic (PV) solar devices with reference spectral irradiance data
IEC 60904-7, Photovoltaic devices – Part 7: Computation of spectral mismatch error
introduced in the testing of a photovoltaic device
IEC 60904-9, Photovoltaic devices – Part 9: Solar simulator performance requirements
IEC 60904-10, Photovoltaic devices – Part 10: Methods of linearity measurements
IEC 61215, Crystalline silicon terrestrial photovoltaic (PV) modules – Design qualification
and type approval
ISO/IEC 17025, General requirements for the competence of testing and calibration
laboratories.
3 Sampling
Eight modules for qualification testing (plus spares as desired) shall be taken at random from
a production batch or batches, in accordance with the procedure given in IEC 60410. The
modules shall have been manufactured from specified materials and components in
accordance with the relevant drawings and process sheets and shall have been subjected to
the manufacturer's normal inspection, quality control and production acceptance procedures.
The modules shall be complete in every detail and shall be accompanied by the
manufacturer's handling, mounting and connection instructions, including the maximum
permissible system voltage.
If the bypass diodes are not accessible in the standard modules, a special sample can be
prepared for the bypass diode thermal test (see 10.18). The bypass diode should be mounted
physically as it would be in a standard module, with a thermal sensor placed on the diode as
required in 10.18.2. This sample does not have to go through the other tests in the sequence.
When the modules to be tested are prototypes of a new design and not from production, this
fact shall be noted in the test report (see Clause 8).
4 Marking
Each module shall carry the following clear and indelible markings:
• name, monogram or symbol of manufacturer;
• type or model number;
• serial number;
• polarity of terminals or leads (colour coding is permissible);
• maximum system voltage for which the module is suitable;
• nominal and minimum values of maximum output power at STC, as specified by the
manufacturer for the product type.
The minimum value of maximum output power refers to the lowest stabilized power that the
manufacturer specifies for the product type (for example after any light induced degradation
or recovery).
NOTE If the modules to be tested are prototypes of a new design and not from production, the results of this test
sequence may be used to establish the module minimum power rating.

61646 © IEC:2008 – 9 –
The date and place of manufacture shall be marked on the module or be traceable from the
serial number.
5 Testing
The modules shall be divided into groups and subjected to the qualification test sequences in
Figure 1, carried out in the order laid down. Each box refers to the corresponding subclause
in this standard. Test procedures and severities, including initial and final measurements
where necessary, are detailed in Clause 10. However, with regard to the tests of 10.2, 10.4,
10.6 and 10.7, it should be noted that the procedures laid down in IEC 60891 for temperature
and irradiance corrections to measured I-V characteristics apply only to linear modules. Use
IEC 60904-10 to assess linearity. If the module is non-linear, these tests shall be carried out
within ±5 % of the specified irradiance and within ±2 °C of the specified temperature.
NOTE 1 Where the final measurements for one test serve as the initial measurements for the next test in the
sequence, they need not be repeated. In these cases, the initial measurements are omitted from the test.
For diagnostic purposes, intermediate measurements of maximum power (10.2) may be undertaken before and
after individual tests.
NOTE 2 The control module should be stored in accordance with the manufacturer’s recommendation.
Any single test, executed independently of a test sequence, shall be preceeded by the initial
tests of 10.1, 10.2 and 10.3.
In carrying out the tests, the tester shall strictly observe the manufacturer's handling,
mounting and connection instructions. Tests given in 10.4, 10.5, 10.6 and 10.7 may be
omitted if future IEC 61853 has been or is scheduled to be run on this module type.
Thin film technologies can have different stabilization characteristics. It is impossible to define
a single stabilisation procedure applicable to all thin film technologies. This procedure tests
the modules “as received“ and attempts to reach a stabilised condition before final test.
Test conditions are summarized in Table 1.
NOTE 3 The test levels in Table 1 are the minimum levels required for qualification. If the laboratory and the
module manufacturer agree, the tests may be performed with increased severities.
6 Pass criteria
A module design shall be judged to have passed the qualification tests, and therefore, to be
IEC type approved, if each test sample meets all the following criteria:
a) after the final light soaking, the maximum output power at STC is not less than 90 % of the
minimum value specified by the manufacturer in Clause 4;
NOTE The pass/fail criteria must consider the laboratory uncertainty of the measurement. As an example, if
the laboratory extended uncertainty, 2 sigma of the STC measurement, is ±5 %, then a maximum power
measurement greater than 85,5 % of the minimum specified value would be the pass criteria.
b) no sample has exhibited any open-circuit during the tests;
c) there is no visual evidence of a major defect, as defined in Clause 7;
d) the insulation test requirements are met after the tests;
e) the wet leakage current test requirements are met at the beginning and the end of each
sequence and after the damp heat test;
f) specific requirements of the individual tests are met.
If two or more modules do not meet these test criteria, the design shall be deemed not to
have met the qualification requirements. Should one module fail any test, another two
modules meeting the requirements of Clause 3 shall be subjected to the whole of the relevant

– 10 – 61646 © IEC:2008
test sequence from the beginning. If one or both of these modules also fail, the design shall
be deemed not to have met the qualification requirements. If, however, both modules pass the
test sequence, the design shall be judged to have met the qualification requirements.
7 Major visual defects
For the purposes of design qualification and type approval, the following are considered to be
major visual defects:
a) broken, cracked, or torn external surfaces, including superstrates, substrates, frames and
junction boxes;
b) bent or misaligned external surfaces, including superstrates, substrates, frames and
junction boxes to the extent that the installation and/or operation of the module would be
impaired;
c) voids in, or visible corrosion of any of the thin film layers of the active circuitry of the
module, extending over more than 10 % of any cell;
d) bubbles or delaminations forming a continuous path between any part of the electrical
circuit and the edge of the module;
e) loss of mechanical integrity, to the extent that the installation and/or operation of the
module would be impaired;
f) Module markings (label) is no longer attached or the information is unreadable.
8 Report
Following type approval, a certified report of the qualification tests, with measured
performance characteristics and details of any failures and re-tests, shall be prepared by the
test agency in accordance with ISO/IEC 17025. Each certificate or test report shall include at
least the following information.
a) A title.
b) Name and address of the test laboratory and location where the tests were carried out.
c) Unique identification of the certification or report and of each page.
d) Name and address of client, where appropriate.
e) Description and identification of the item tested.
f) Characterization and condition of the test item.
g) Date of receipt of test item and date(s) of test, where appropriate.
h) Identification of test method used.
i) Reference to sampling procedure, where relevant.
j) Any deviations from, additions to or exclusions from the test method, and any other
information relevant to a specific tests, such as environmental conditions.
k) Measurements, examinations and derived results supported by tables, graphs, sketches
and photographs as appropriate including temperature coefficients of short circuit current,
open circuit voltage and peak power, NOCT, power at NOCT, STC and low irradiance, the
maximum shaded cell temperature observed during the hot-spot test, spectrum of the lamp
used for the UV prescreening test, minimum power observed after light soaking and any
failures observed. If the maximum power loss observed after each of the tests has been
measured it should also be reported.
l) A statement of the estimated uncertainty of the test results (where relevant).
m) A signature and title, or equivalent identification of the person(s) accepting responsibility
for the content of the certificate or report, and the date of issue.
n) Where relevant, a statement to the effect that the results relate only to the items tested.

61646 © IEC:2008 – 11 –
o) A statement that the certificate or report shall not be reproduced except in full, without the
written approval of the laboratory.
A copy of this report shall be kept by the laboratory and manufacturer for reference purposes.
9 Modifications
Any change in the design, materials, components or processing of the module may require a
repetition of some or all of the qualification tests to maintain type approval.

– 12 – 61646 © IEC:2008
8 Modules
10.1
Visual inspection
10.2
Max power determination
10.3
Insulation test
10.15
Wet leakage current test
1 Module 1 Module 2 Modules 2 Modules
2 Modules
10.11
10.8 10.10
10.13
Thermal cycling test
Outdoor exposure test UV precondition test
Damp heat test
2 2
200 cycles
60 kWh/m 15 kWh/m 1 000 h
–40 °C to 85 °C
85 °C
85 % RH
10.4
10.11
Measurement of
Thermal cycling test
temperature coefficients
50 cycles
(see Note 1)
–40 °C to 85 °C
10.5
NOCT
10.12
(see Note 2)
Humidity freeze test
10 cycles
–40 °C to 85 °C
10.6
C
85 % RH 1 Module 1 Module
Performance at
o
STC and NOCT (see Note 1)
n
t
1 Module
r
10.7
1 Module 10.16
10.17
o
Performance at
Mechanical
Hail test
l
low irradiance (see Note 1)
load test
10.14
Robustness of
10.18
terminations test
Bypass diode
thermal test
(see Note 3)
10.9
Hot-spot
endurance
...