EN 60512-16-1:2008
(Main)Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
IEC 60512-16-1:2008 details a standard test method to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe.
Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 16-1: Mechanische Prüfungen an Kontakten und Anschlüssen - Prüfung 16a: Federung und Überdehnungsschutz
Connecteurs pour équipements électroniques - Essais et mesures - Partie 16-1: Essais mécaniques des contacts et des sorties - Essai 16a: Endommagement par sonde d'essai
La CEI 60512-16-1:2008 détaille une méthode d'essai normalisée pour évaluer l'efficacité du système élastique des contacts pour résister aux dommages provoqués par l'insertion d'une sonde d'essai spécifiée.
Konektorji za elektronsko opremo - Preskušanje in meritve - 16-1. del: Mehansko preskušanje kontaktov in priključkov - Preskus 16a: Poškodbe sonde (IEC 60512-16-1:2008)
General Information
- Status
- Published
- Publication Date
- 16-Jul-2008
- Withdrawal Date
- 30-Jun-2011
- Technical Committee
- CLC/SR 48B - Connectors
- Drafting Committee
- IEC/SC 48B - IEC_SC_48B
- Parallel Committee
- IEC/SC 48B - IEC_SC_48B
- Current Stage
- 6060 - Document made available - Publishing
- Start Date
- 17-Jul-2008
- Completion Date
- 17-Jul-2008
Relations
- Effective Date
- 03-Feb-2026
- Effective Date
- 03-Feb-2026
- Referred By
EN IEC 62282-2-100:2020 - Fuel cell technologies - Part 2-100: Fuel cell modules - Safety - Effective Date
- 03-Feb-2026
- Effective Date
- 03-Feb-2026
- Effective Date
- 03-Feb-2026
Overview
EN 60512-16-1:2008, titled "Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage", is a European standard developed by CLC based on IEC 60512-16-1:2008. This standard specifies a standardized mechanical test method aimed at evaluating the resistance of elastic contact systems in electronic connectors against damage caused by probe insertion.
The test focuses on the durability and mechanical integrity of electrical contacts within connectors used in electronic equipment. While primarily designed for cylindrical contacts, the methodology can be adapted for other contact geometries with appropriate details specified.
Key Topics
Scope and Purpose
The standard defines a mechanical test to measure the elasticity and mechanical endurance of contacts under stress from insertion of a specified test probe, simulating real-world probe contact forces.Test Specimen Preparation
The specimen typically includes the female part of a connector with terminations. Specimens may be wired if required. Measures must be taken to prevent rotation of contacts during testing unless otherwise specified.Test Equipment
Test pins and handles are specified with precise geometrical and material requirements to simulate the probe effect accurately:- Length and diameter related to contact bore minimum depth and male mating contact diameter
- Hemispherical polished hardened steel probe tips
- Specific mass and handle configurations to apply controlled torque
Test Procedure
The connector under test is subjected to insertion of the probe, followed by a 360° rotation to apply test loads across all contact positions. The process is repeated using a reduced-length pin or spacer to represent varied insertion depths.Measurements and Requirements
Visual examination before and after testing (per IEC 60512-1-1) is mandatory to detect any elastic system damage. Specifications include gauge retention force requirements and criteria to assess the contact’s mechanical integrity.Detail Specification Requirements
When applying this test in a product specification, essential test conditions to be defined include:- Preconditioning procedures
- Wiring and mounting details
- Torque and retention requirements
- Adaptations for non-cylindrical contacts
- Allowed deviations from the standard method
Applications
EN 60512-16-1:2008 is particularly valuable for manufacturers and engineers involved in:
Electronic Connector Design
Ensuring connector contacts can withstand repeated probe insertions without mechanical failure.Quality Assurance and Compliance Testing
Verifying connector durability as part of standard product quality and reliability checks.Connector Qualification for Electronic Equipment
Assessing connector performance in critical applications, such as industrial, aerospace, and telecommunications systems where contact reliability is vital.Development of Test Protocols for Custom Connectors
Adapting the test for specialized connector types with unique contact geometries per detailed specifications.
Related Standards
- IEC 60512-1-1: General examination and visual inspection methods for connectors.
- IEC 60512-16-5: Mechanical tests on contacts - Gauge retention force for resilient contacts.
- EN 60512 Series: Comprehensive test methods for connectors for electronic equipment covering electrical, mechanical, and environmental tests.
Summary
EN 60512-16-1:2008 provides a rigorous mechanical testing framework to assess the durability of elastic contacts in electronic connectors against probe-induced damage. By standardizing probe dimensions, test procedures, and acceptance criteria, this standard helps ensure the mechanical reliability of connectors in demanding applications. Manufacturers, testers, and compliance professionals benefit from its clear guidelines to maintain high-quality connector performance in electronic systems.
Keywords: EN 60512-16-1, IEC 60512-16-1, probe damage test, connector mechanical tests, electronic connectors, contact durability, elastic system test, connector quality assurance, mechanical testing standard, connector specifications
Frequently Asked Questions
EN 60512-16-1:2008 is a standard published by CLC. Its full title is "Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage". This standard covers: IEC 60512-16-1:2008 details a standard test method to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe.
IEC 60512-16-1:2008 details a standard test method to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe.
EN 60512-16-1:2008 is classified under the following ICS (International Classification for Standards) categories: 31.220.10 - Plug-and-socket devices. Connectors. The ICS classification helps identify the subject area and facilitates finding related standards.
EN 60512-16-1:2008 has the following relationships with other standards: It is inter standard links to EN 60512-16-5:2008, EN 60512-1-1:2002, EN IEC 62282-2-100:2020, EN IEC 61076-2-116:2023, EN 62282-2:2012. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
EN 60512-16-1:2008 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
SLOVENSKI STANDARD
01-november-2008
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SUHVNXãDQMHNRQWDNWRYLQSULNOMXþNRY3UHVNXVD3RãNRGEHVRQGH,(&
Connectors for electronic equipment - Tests and measurements -- Part 16-1: Mechanical
tests on contacts and terminations - Test 16a: Probe damage
Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 16-1:
Mechanische Prüfungen an Kontakten und Anschlüssen - Prüfung 16a: Federung und
Überdehnungsschutz
Connecteurs pour équipements électroniques - Essais et mesures -- Partie 16-1: Essais
mécaniques des contacts et des sorties - Essai 16a: Endommagement par sonde d'essai
Ta slovenski standard je istoveten z: EN 60512-16-1:2008
ICS:
19.060 Mehansko preskušanje Mechanical testing
31.220.10 9WLþLLQYWLþQLFHNRQHNWRUML Plug-and-socket devices.
Connectors
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN 60512-16-1
NORME EUROPÉENNE
July 2008
EUROPÄISCHE NORM
ICS 31.220.10
English version
Connectors for electronic equipment -
Tests and measurements -
Part 16-1: Mechanical tests on contacts and terminations -
Test 16a: Probe damage
(IEC 60512-16-1:2008)
Connecteurs Steckverbinder
pour équipements électroniques - für elektronische Einrichtungen -
Essais et mesures - Mess- und Prüfverfahren -
Partie 16-1: Essais mécaniques Teil 16-1: Mechanische Prüfungen
des contacts et des sorties - an Kontakten und Anschlüssen -
Essai 16a: Endommagement Prüfung 16a: Federung
par sonde d'essai und Überdehnungsschutz
(CEI 60512-16-1:2008) (IEC 60512-16-1:2008)
This European Standard was approved by CENELEC on 2008-07-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60512-16-1:2008 E
Foreword
The text of document 48B/1877/FDIS, future edition 1 of IEC 60512-16-1, prepared by SC 48B,
Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic
equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 60512-16-1 on 2008-07-01.
This standard is to be read in conjunction with EN 60512-1 and EN 60512-1-100 which explains the
structure of the EN 60512 series.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2009-04-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2011-07-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60512-16-1:2008 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 60512-16-1:2008
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1) 2)
IEC 60512-1-1 - Connectors for electronic equipment - Tests EN 60512-1-1 2002
and measurements -
Part 1-1: General examination - Test 1a:
Visual examination
3) 3)
IEC 60512-16-5 200X Connectors for electronic equipment - Tests EN 60512-16-5 200X
and measurements -
Part 16-5: Mechanical tests on contacts and
terminations - Test 16e: Gauge retention force
(resilient contacts)
1)
Undated reference.
2)
Valid edition at date of issue.
3)
To be published.
IEC 60512-16-1
Edition 1.0 2008-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Connectors for electronic equipment – Tests and measurements –
Part 16-1: Mechanical tests on contacts and terminations – Test 16a: Probe
damage
Connecteurs pour équipements électroniques – Essais et mesures –
Partie 16-1: Essais mécaniques des contacts et des sorties – Essai 16a:
Endommagement par sonde d’essai
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
F
CODE PRIX
ICS 31.220.10 ISBN 2-8318-9820-X
– 2 – 60512-16-1 © IEC:2008
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 16-1: Mechanical tests on contacts and terminations –
Test 16a: Probe damage
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical conten
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