EN 62228-2:2017

SLOVENSKI STANDARD
01-april-2017
Integrirana vezja - Ocenjevanje elektromagnetne združljivosti (EMC) oddajnikov-
sprejemnikov - 2. del: Oddajniki-sprejemniki za krajevno medvezalno omrežje (IEC
62228-2:2016)
Integrated circuit - EMC Evaluation of transceivers - Part 2: LIN transceivers (IEC 62228-
2:2016)
Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 2: Emetteurs-
récepteurs LIN (IEC 62228-2:2016)
Ta slovenski standard je istoveten z: EN 62228-2:2017
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.01 Elektromagnetna združljivost Electromagnetic compatibility
na splošno in general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 62228-2
NORME EUROPÉENNE
EUROPÄISCHE NORM
February 2017
ICS 31.200
English Version
Integrated circuits - EMC evaluation of transceivers -
Part 2: LIN transceivers
(IEC 62228-2:2016)
Circuits intégrés - Évaluation de la CEM des émetteurs- Integrierte Schaltungen - Bewertung der
récepteurs - Partie 2: Émetteurs-récepteurs LIN elektromagnetischen Verträglichkeit von Sende-
(IEC 62228-2:2016) Empfangsgeräten - Teil 2: LIN-Sende-Empfangsgeräte
(IEC 62228-2:2016)
This European Standard was approved by CENELEC on 2016-12-23. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62228-2:2017 E
European foreword
The text of document 47A/994/FDIS, future edition 1 of IEC 62228-2, prepared by SC 47A "Integrated
circuits" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN 62228-2:2017.

The following dates are fixed:
(dop) 2017-09-23
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2019-12-23
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62228-2:2016 was approved by CENELEC as a European
Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu
Publication Year Title EN/HD Year

IEC 61967-1 -  Integrated circuits - Measurement of EN 61967-1 -
electromagnetic emissions,
150 kHz to 1 GHz -
Part 1: General conditions and definitions
IEC 61967-4 -  Integrated circuits - Measurement of EN 61967-4 -
electromagnetic emissions, 150 kHz to
1 GHz -
Part 4: Measurement of conducted
emissions - 1 ohm/150 ohm direct coupling
method
IEC 62132-1 -  Integrated circuits - Measurement of EN 62132-1 -
electromagnetic immunity -
Part 1: General conditions and definitions
IEC 62132-4 -  Integrated circuits - Measurement of EN 62132-4 -
electromagnetic immunity, 150 kHz to
1 GHz -
Part 4: Direct RF power injection method
IEC 62215-3 -  Integrated circuits - Measurement of EN 62215-3 -
impulse immunity - Part 3: Non-
synchronous transient injection method
ISO 7637-2 -  Road vehicles - Electrical disturbances - -
from conduction and coupling -
Part-2: Electrical transient conduction
along supply lines only
ISO 10605 -  Road vehicles - Test methods for electrical - -
disturbances from electrostatic discharge
ISO 17987-6 -  Road vehicles - Local Interconnect - -
Network (LIN) -
Part 6: Protocol conformance test
specification
IEC 62228-2 ®
Edition 1.0 2016-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Integrated circuits – EMC evaluation of transceivers –

Part 2: LIN transceivers
Circuits intégrés – Évaluation de la CEM des émetteurs-récepteurs –

Partie 2: Émetteurs-récepteurs LIN

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.200 ISBN 978-2-8322-3776-2

– 2 – IEC 62228-2:2016 © IEC 2016
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and abbreviations . 8
3.1 Terms and definitions . 8
3.2 Abbreviations . 8
4 General . 8
5 Test and operating conditions . 9
5.1 Supply and ambient conditions. 9
5.2 Test operation modes . 10
5.3 Test configuration . 10
5.3.1 General test configuration for functional test . 10
5.3.2 General test configuration for unpowered ESD test . 11
5.3.3 Coupling ports and coupling networks for functional tests . 11
5.3.4 Coupling ports and coupling networks for unpowered ESD tests . 12
5.4 Test signals . 13
5.4.1 General . 13
5.4.2 Test signals for normal operation mode . 13
5.4.3 Test signal for wake-up from sleep mode . 14
5.5 Evaluation criteria . 14
5.5.1 General . 14
5.5.2 Evaluation criteria in functional operation modes during exposure to
disturbances . 15
5.5.3 Evaluation criteria in unpowered condition after exposure to
disturbances . 16
5.5.4 Status classes . 17
6 Test and measurement . 17
6.1 Emission of RF disturbances . 17
6.1.1 Test method . 17
6.1.2 Test setup . 17
6.1.3 Test procedure and parameters . 18
6.2 Immunity to RF disturbances . 19
6.2.1 Test method . 19
6.2.2 Test setup . 19
6.2.3 Test procedure and parameters . 20
6.3 Immunity to impulses . 22
6.3.1 Test method . 22
6.3.2 Test setup . 23
6.3.3 Test procedure and parameters . 23
6.4 Electrostatic Discharge (ESD) . 26
6.4.1 Test method . 26
6.4.2 Test setup . 26
6.4.3 Test procedure and parameters . 28
7 Test report . 28
Annex A (normative) LIN test circuits . 29
A.1 General . 29

IEC 62228-2:2016 © IEC 2016 – 3 –
A.2 LIN test circuit for standard LIN transceiver ICs for functional tests . 29
A.3 LIN test circuit for IC with embedded LIN transceiver for functional tests . 31
A.4 LIN test circuit for LIN transceiver ICs for unpowered ESD test . 32
Annex B (normative) Test circuit boards. 33
B.1 Test circuit board for functional tests . 33
B.2 ESD test . 33
Annex C (informative) Examples for test limits for LIN transceiver in automotive
application . 35
C.1 General . 35
C.2 Emission of RF disturbances . 35
C.3 Immunity to RF disturbances . 36
C.4 Immunity to impulses . 37
C.5 Electrostatic Discharge (ESD) . 37
Annex D (informative) Test of indirect ESD discharge . 38
D.1 General . 38
D.2 Test setup . 38
D.3 Typical current wave form for indirect ESD test . 39
D.4 Test procedure and parameters . 39

Figure 1 – General test confi
...