EN 62008:2005

SLOVENSKI STANDARD
01-september-2006
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Performance characteristics and calibration methods for digital data acquisition systems
and relevant software
Leistungseigenschaften und Kalibrierverfahren für digitale Datenerfassungssysteme und
entsprechende Software
Caractéristiques de performance et méthodes d'étalonnage pour les systèmes
d'acquisition de données numériques et logiciels appropriés
Ta slovenski standard je istoveten z: EN 62008:2005
ICS:
35.080
35.160
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 62008
NORME EUROPÉENNE
EUROPÄISCHE NORM October 2005

ICS 33.200
English version
Performance characteristics and calibration methods
for digital data acquisition systems
and relevant software
(IEC 62008:2005)
Caractéristiques de performance  Leistungseigenschaften
et méthodes d'étalonnage und Kalibrierverfahren
pour les systèmes d'acquisition für digitale Datenerfassungssysteme
de données numériques und entsprechende Software
et logiciels appropriés (IEC 62008:2005)
(CEI 62008:2005)
This European Standard was approved by CENELEC on 2005-10-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2005 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 62008:2005 E
Foreword
The text of document 85/267/FDIS, future edition 1 of IEC 62008, prepared by IEC TC 85, Measuring
equipment for electrical and electromagnetic quantities, was submitted to the IEC-CENELEC parallel
vote and was approved by CENELEC as EN 62008 on 2005-10-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2006-07-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2008-10-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62008:2005 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 62008:2005
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60748-4 1997 Semiconductor devices - Integrated - -
circuits
Part 4: Interface integrated circuits

1)
IEC 60748-4-3 - Part 4-3: Interface integrated circuits - - -
Dynamic criteria for Analogue-Digital
Converters (ADC)
2) 3)
ISO/IEC 17025 - General requirements for the competence EN ISO/IEC 2005
of testing and calibration laboratories 17025

2)
BIPM/IEC/IFCC/ISO/
- Guide to the expression of uncertainty in - -
IUPAC/IUPAP/OIML
measurement (GUM)
1)
To be published.
2)
Undated reference.
3)
Valid edition at date of issue.

NORME CEI
INTERNATIONALE
IEC
INTERNATIONAL
Première édition
STANDARD
First edition
2005-07
Caractéristiques de performance et
méthodes d'étalonnage pour les systèmes
d'acquisition de données numériques
et logiciels appropriés
Performance characteristics and calibration
methods for digital data acquisition systems
and relevant software
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62008  IEC:2005 – 3 –
CONTENTS
FOREWORD.7
INTRODUCTION.11

1 Scope.13
2 Normative references .13
3 Terms, definitions, abbreviations and symbols.15
3.1 Terms and definitions .15
3.2 Abbreviations and symbols.17
4 General requirements .17
4.1 Test procedures and measurement uncertainty estimation .17
4.2 General requirements for ADMs .19
4.3 Descriptions of parameters.19
4.4 Testing methods of measurable parameters .27
5 Hardware functionality for calibration.51
5.1 Onboard calibration information.51
5.2 General measurement adjustment hardware.51
5.3 Self-adjustment hardware.53
6 Software calibration methods.53
6.1 Calibration application programming interface (API) .53
6.2 Self-calibration methods .53
6.3 External calibration methods .55
7 Calibration procedures .55

Annex A (informative) Examples of calculation of modular DAQ system uncertainty.57
Annex B (normative) Pseudo-code to perform static test by method B (see 4.4.1.2)
and a numerical example .63
Annex C (informative) ADM characteristics .83

Bibliography.93

Figure 1 – Test signals applied to the ADM.31
Figure 2 – Test procedure.35
Figure 3 – Representation in different grey tones of the cumulative histograms
computed in each step in the case of a 5-bit ADM and a test with 4 steps.35
Figure 4 – Test arrangement for noise measurements on ADMs .43
Figure C.1 – Bipolar ADM with true zero .85
Figure C.2 – Bipolar ADM with no true zero .87
Figure C.3 – Offset (specified at step 000).89
Figure C.4 – Gain component of uncertainty (after correction of offset) (specified at
step 011) .91

62008  IEC:2005 – 5 –
Table 1 – Precision of estimates of code transition level for different record lengths .29
Table 2 – Example of parameters specification of ADM for measurement uncertainty
estimation of DAQ device.49
Table B.1 – Derivation of the amplitude (A) and offset (C ) of the small triangular waves,
j
the number of samples per record (M) and the number of records (R). .73
Table B.2 – Results of the histogram test and corresponding transition voltages for a
5-bit ADM tested by method B in 4 steps .75
Table B.3 – Deriving INL and DNL from the measured transition voltages.79

62008  IEC:2005 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS
FOR DIGITAL DATA ACQUISITION SYSTEMS
AND RELEVANT SOFTWARE
FOREWORD
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International Standard IEC 62008 has been prepared by IEC technical committee 85:
Measuring
...