EN 131200:2002

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Sectional Specification: Fixed capacitors with metallized electrodes and polypropylene dielectricRahmenspezifikation: Festkondensatoren mit metallisierten Polypropylenfolien als DielektrikumSpécification intermédiaire: Condensateurs fixes à électrodes métallisées et à diélectrique en polypropylèneSectional Specification: Fixed capacitors with metallized electrodes and polypropylene dielectric31.060.30Papirni kondenzatorji in folijski kondenzatorjiPaper and plastics capacitorsICS:Ta slovenski standard je istoveten z:EN 131200:2002SIST EN 131200:2003en01-oktober-2003SIST EN 131200:2003SLOVENSKI
STANDARD
EUROPEAN STANDARDEN 131200NORME EUROPÉENNEEUROPÄISCHE NORMMay 2002CENELECEuropean Committee for Electrotechnical StandardizationComité Européen de Normalisation ElectrotechniqueEuropäisches Komitee für Elektrotechnische NormungCentral Secretariat: rue de Stassart 35, B - 1050 Brussels© 2002 CENELEC -All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.Ref. No. EN 131200:2002 EICS 31.060.30Supersedes CECC 31 200:1981English versionSectional Specification:Fixed capacitors with metallized electrodesand polypropylene dielectricSpécification intermédiaire:Condensateurs fixes à électrodesmétallisées et à diélectrique enpolypropylèneRahmenspezifikation:Festkondensatoren mit metallisiertenPolypropylenfolien als DielektrikumThis European Standard was approved by CENELEC on 1997-03-11. CENELEC members are bound tocomply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving thisEuropean Standard the status of a national standard without any alteration.Up-to-date lists and bibliographical references concerning such national standards may be obtained onapplication to the Central Secretariat or to any CENELEC member.This European Standard exists in three official versions (English, French, German). A version in anyother language made by translation under the responsibility of a CENELEC member into its ownlanguage and notified to the Central Secretariat has the same status as the official versions.CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands,Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.SIST EN 131200:2003

- 3 -EN 131200:2002ContentsPage1General.41.1Scope.41.2Normative references.41.3Information to be given in a detail specification.41.4Definitions.51.5Marking.62Preferred ratings and characteristics.72.1Preferred climatic categories.72.2Preferred values of ratings.73Quality assessment procedure.83.1Primary stage of manufacture.83.2Structurally similar components.83.3Certified test records.93.4Qualification approval.93.5Quality conformity inspection.104Test and measurement procedures.104.1Visual inspection and check of dimensions.104.2Electrical tests.114.3Tests of groups 1a and C1a.154.4Tests of groups 1b and C1b.164.5Climatic sequence.184.6Test Ca: Damp heat, steady state.204.7Endurance (under d.c. voltage).214.8Charge and discharge.22Annex A (normative)
Test plans for qualification approval and quality conformity inspection24Annex B (normative)
Test schedule for qualification approval.30SIST EN 131200:2003

- 5 -EN 131200:20021.3.2 Outline drawing and dimensionsThere shall be an illustration of the capacitor as an aid to easy recognition and for comparison of thecapacitor with others. Dimensions and their associated tolerances, which affect interchangeability andmounting, shall be given in the detail specification. All dimensions are preferably to be stated inmillimetres.Normally the numerical values shall be given for the length, the width and height of the body and thewire spacing, or for cylindrical types, the body diameter, and the length and diameter of theterminations. When necessary, for example when a number of items (capacitance values/voltageranges) is covered by a detail specification, the dimensions and their associated tolerances shall beplaced in a table below the drawing.When the configuration is other than described above, the detail specification shall state suchdimensional information as will adequately describe the capacitor. When the capacitor is not designedfor use on printed boards, this shall be clearly stated in the detail specification.1.3.3 MountingThe detail specification shall specify the method of mounting to be applied for the application of thevibration and the bump or shock tests. The design of the capacitor may be such that special mountingfixtures are required in its use. In this case the detail specification shall describe the mounting fixturesand they shall be used in the application of the vibration and bump or shock tests.If recommendations for mounting for “normal” use are made, they shall be included in the detailspecification under “9 Additional information (not for inspection purposes)”. If they are included awarning can be given that the full vibration, bump and shock performance may not be available ifmounting methods other than those specified in 1.1 of the detail specification are used.1.3.4 Ratings and characteristicsThe ratings and characteristics shall be in accordance with the relevant clauses of this specification,together with the following:a) rated capacitance range;see 2.2.1NOTE 1
When products approved to the detail specification may have different ranges, the following statement should be added:“The range of values available in each voltage range is given in the Register of approvals CECC 00200”.b) particular characteristics.NOTE 2
Additional characteristics may be listed, when they are considered necessary to specify adequately the component fordesign and application purposes.1.3.5 MarkingThe detail specification shall specify the content of the marking on the capacitor and on the package.Deviations from 1.5 of this sectional specification shall be specifically stated.1.4 DefinitionsFor the purposes of this standard the definitions given in EN 130000 apply, together with thefollowing:1.4.1performance grade 1 capacitorscapacitors intended for long-life applications with stringent requirements for the electrical parametersSIST EN 131200:2003

values. Distinction in performance of the three combinations are shown in final requirementsafter tests.1.4.5rated voltagethe maximum d.c. voltage which may be applied continuously to a capacitor at the rated temperatureNOTEThe sum of the d.c. voltage, peak a.c. voltage and peak pulse voltage applied to the capacitors shall not exceed the d.c.rated voltage. The value of the peak a.c. voltage allowed at different frequencies is under consideration.1.5 Marking1.5.1The information given in the marking is normally selected from the following list; the relativeimportance of each item is indicated by its position in the list:a) rated capacitance (may be indicated by the code given in EN 60062);b) rated voltage: (d.c. voltage may be indicated by the symbol ____ or _______);c) tolerance on rated capacitance (may be indicated by the code given in EN 60062);d) year and month (or week) of manufacture (may be indicated by one of the codes given inEN 60062);e) manufacturer’s name or trade mark;f) climatic category;g) manufacturer’s type designation;SIST EN 131200:2003

- 7 -EN 131200:2002h) national number of the DS, date of issue and any further information required by the nationalsystem, together with any amendment numbers, if issued.1.5.2The capacitor shall be clearly marked with a), b) and c) of 1.5.1 and with as many as possibleof the remaining items as is considered necessary. Any duplication of information in the marking onthe capacitor should be avoided.1.5.3The package containing the capacitor(s) shall be clearly marked with all the information listedin 1.5.4.1.5.4Any additional marking shall be so applied that no confusion can arise.2 Preferred ratings and characteristics2.1 Preferred climatic categoriesThe capacitors covered by this specification are classified into climatic categories according to thegeneral rules given in EN 60068-1.The lower and upper category temperature and the duration of the damp heat, steady state test shallbe within the following ranges:- Lower category temperature:- 55 C to - 10 C- Upper category temperature:+ 70 C to + 100 C- Duration of the damp heat, steady state test:04 days to 56 days.Values selected within these ranges shall be chosen from those listed in EN 60068-2. The severitiesfor the cold and dry heat tests are the lower and upper category temperatures respectively.2.2 Preferred values of ratings2.2.1 Rated capacitance (CR)Preferred values of rated capacitance are values chosen from the E series of preferred values givenin IEC 60063.2.2.2 Tolerance on rated capacitanceThe preferred tolerances on the rated capacitance are: 20 %;
10 %;
5 %;
2 %;
1 %.SIST EN 131200:2003
20 %E 12
10 %E 24 5 %E 48 2 %E 96 1 %2.2.4 D.C. rated voltage (UR)The preferred values of d.c. rated voltage are:40; 63; 100; 160; 250; 400; 630; 1000; 1600; 2500 V. These values conform to the basic series ofpreferred values R5 given in ISO 3.2.2.5 Category voltage (UC)The category voltage is:UR for upper category temperatures up to 85 C,0,7 UR for upper category temperature of 100 C.2.2.6 Rated temperatureFor upper category temperatures
85 C the rated temperature is 85 C and for an upper categorytemperature < 85 C the rated temperature is equal to the upper category temperature.3 Quality assessment procedure3.1 Primary stage of manufactureThe primary stage of manufacture is the winding of the capacitor element or the equivalent operation.3.2 Structurally similar componentsCapacitors considered as being structurally similar are capacitors produced with similar process andmaterials, though they may be of different case sizes and values.SIST EN 131200:2003

- 9 -EN 131200:20023.3 Certified test recordsThe information required in 3.6 of EN 130000:1993 shall be made available when prescribed in thedetail specification and when requested by a purchaser. After the endurance test the parameters forwhich variables information is required are the capacitance change, tan
and the insulationresistance.3.4 Qualification approval3.4.1 SamplingThe sample shall be representative of the range of capacitors for which approval is sought. This mayor may not be the complete range covered by the detail specification.The sample shall consist of specimens having the lowest and highest voltages, and for these voltagesthe lowest and highest capacitances. When there are more than four rated voltages an intermediatevoltage shall also be tested. Thus for the approval of a range, testing is required of either four or sixvalues (capacitance/voltage combinations). When the range consists of less than four values thenumber of specimens to be tested shall be that required for four values.The test plan and the samples required for qualification approval are given in A.1. The headings ofcolumns No. 4 to 10 have the following significance:3This is the number of specimens to be tested per value for each group or subgroup4This is the total number of specimens required when four or less values are to betested7This is the total number of specimens required when six values are to be tested5 and 8These are the numbers of permissible non conforming items in any group orsubgroup with reference to columns 5 and 8 respectively.6 and 9These are total number of permissible non conforming items for all groups (otherthan group 0) and subgroups combined with reference to columns 4 and 7respectively.Spares are permitted as follows: one per value which may be used to replace the permitted defective in group 0; one per value which may be used as replacement for specimens lost due to incidents notattributable to the manufacturer.3.4.2 TestsThe complete series of tests specified for the test plan for the selected assessment level given inannex A are required for the approval of capacitors covered by one detail specification. The tests ofeach group shall be carried out in the order given.The whole sample, with the exception of those specimens to be submitted to the tests of group 5,shall be subjected to the tests of group 0 and then divided for the other groups.SIST EN 131200:2003

- 11 -EN 131200:20024.2 Electrical tests4.2.1 Voltage proofSee 4.6 of EN 130000:1993 with the following additional details.In the test circuits delete the capacitor C1. The product of R1 and the rated capacitance Cx shall besmaller than or equal to 1 s and greater than 0,01 s.R1 includes the internal resistance of the power supply.R2 shall limit the discharge current to a value equal to or less than 1/A.The voltages given in Table 3 shall be applied for a period of 1 min between the measuring points ofTable 3 in 4.5.3 of EN 130000:1993.Table 3 — Test voltagesTest pointTest voltage1a)Grade 1:1,6 URGrade 2:1,4 UR1b), 1c) and 1d)2UR with a minimum of 200 VNOTEThe occurrence of self-healing breakdowns during the application of the test voltages is allowed.4.2.2 CapacitanceSee 4.7 of EN 130000:1993 with the following details.The capacitance shall be measured at, or corrected to, a frequency of 1000 Hz. For rated capacitancevalues
1 F, 50 Hz to 120 Hz may be used, but 1 kHz shall be the referee frequency.The applied peak voltage at 1000 Hz shall not exceed 3 % of the rated voltage, and the applied peakvoltage at 50 Hz to 120 Hz shall not exceed 20 % of the rated voltage with a maximum of 100 V (70V r.m.s).The capacitance shall be within the specified tolerance limits.4.2.3 Tangent of loss angle (tan )See 4.8 of EN 130000:1993 with the following details.a) Measuring conditions for measurements at 1 kHz (lot-by-lot test and where the detailspecification does not prescribe measuring conditions for periodic tests)Tan
shall be measured as follows and the value shall be noted (for reference purposes):— Frequency:100 Hz— Peak voltage: 3 % of the rated voltageSIST EN 131200:2003

shall not exceed the values shown in Table 4.Table 4 — Maximum values of tan Tangent of loss angleMeasurementfrequencykHzRated capacitanceFPerformance grade1Performance grade21 kHzCR
1 F 10
10-4 20
10-4NOTE
For C > 1 F, values of tan
should be specified in the detail specification.b) Measuring conditions for measurements at 10 kHz (for tests where specified in the detailspecification)For capacitors with CR
1 F, tan
shall be measu
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