EN 12698-2:2007

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methodsKemijska analiza nitrid silicijevega karbida - 2.del: XRD metodeAnalyse chimique des produits réfractaires contenant du carbure de silicium a liaison nitrure
- Partie 2 : Méthodes de DRXChemische Analyse von feuerfesten Erzeugnissen aus nitridgebundenem Silicumcarbid
- Teil 2: XRD-VerfahrenTa slovenski standard je istoveten z:EN 12698-2:2007SIST EN 12698-2:2007en;de71.040.40Kemijska analizaChemical analysisICS:SLOVENSKI
STANDARDSIST EN 12698-2:200701-julij-2007

EUROPEAN STANDARDNORME EUROPÉENNEEUROPÄISCHE NORMEN 12698-2March 2007ICS 71.040.40 English VersionChemical analysis of nitride bonded silicon carbide refractories -Part 2: XRD methodsAnalyse chimique des produits réfractaires contenant ducarbure de silicium à liaison nitrure
- Partie 2 : Méthodesde DRXChemische Analyse von feuerfesten Erzeugnissen ausnitridgebundenem Silicumcarbid
- Teil 2: XRD-VerfahrenThis European Standard was approved by CEN on 15 February 2007.CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this EuropeanStandard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such nationalstandards may be obtained on application to the CEN Management Centre or to any CEN member.This European Standard exists in three official versions (English, French, German). A version in any other language made by translationunder the responsibility of a CEN member into its own language and notified to the CEN Management Centre has the same status as theofficial versions.CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland,France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal,Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom.EUROPEAN COMMITTEE FOR STANDARDIZATIONCOMITÉ EUROPÉEN DE NORMALISATIONEUROPÄISCHES KOMITEE FÜR NORMUNGManagement Centre: rue de Stassart, 36
B-1050 Brussels© 2007 CENAll rights of exploitation in any form and by any means reservedworldwide for CEN national Members.Ref. No. EN 12698-2:2007: E

X-ray diffraction data for the determination of ’-SiAlON content.11 A.1 General.11 A.2 Example of calculation of z-value for ’-SiAlON.12 Bibliography.13

It includes details of sample preparation and general principles for qualitative and quantitative analysis of mineralogical phase composition. Quantitative determination of α-Si3N4, β-Si3N4, Si2ON2, AlN, and SiAlON are described. NOTE For the refinement procedures the total nitrogen content, analysed in accordance with EN 12698-1 is needed. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. EN 12475-4:1998, Classification of dense shaped refractory products — Part 4: Special products EN 12698-1, Chemical analysis of nitride bonded silicon carbide refractories — Part 1: Chemical methods ISO 836:2001, Terminology for refractories ISO 5022, Shaped refractory products — Sampling and acceptance testing ISO 8656-1, Refractory products — Sampling of raw materials and unshaped products — Part 1: Sampling scheme 3 Definitions For the purposes of this document the terms and definitions given in ISO 836:2001, EN 12475-4:1998 and the following apply.
3.1 nitride and oxynitride bonded silicon carbide refractories
refractory products predominantly consisting of silicon carbide with minor amounts of nitride phases as a matrix component NOTE
In general, metallic silicon is used as a precursor material, which undergoes a phase transformation in
an oxygen-free nitrogen atmosphere. 4 Apparatus
Bragg-Brentano diffractometers with a copper X-ray tube, graphite monochromator and scintillation counter and the following experimental setting for data collection are used:  goniometer with a measurement uncertainty of ≤ 0,5 ° at a confidence level of 95 %;  primary soller slit with a divergence
≤ 2,5 °;  divergence slit 1 °;  receiving slit ≤ 0,2
mm;
0,02 ° or continuous;  integration time 4 s. An additional scan using the same conditions as above between 60 ° and 70 ° 2 may be required if aluminium and/or iron is thought to be present. NOTE Parameters for tube settings should be: voltage 40 kV, excitation current 20 mA to 45 mA. 6.3 Qualitative analysis Use an automatic or manual search to identify different phases in accordance with the ICDD, JCPDS and ASTM databases. NOTE 1 A deconvolution program should be used for overlapping peaks.
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