MT 62391-1 - TC 40/MT 62391-1

IEC 62391-1:2022 applies to fixed electric double-layer capacitors (hereafter referred to as capacitors) mainly used in DC circuits of electric and electronic equipment.
This part of IEC 62391 establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
This edition includes the following significant technical changes with respect to the previous edition:
The document has been completely restructured to comply with the ISO/IEC Directives, Part 2; a new technical categorization of test methods has been introduced and the test methods have been reorganized according to these new categories; tables, figures and references have been revised accordingly.
Calculation formula of charging/discharging efficiency in Annex D were divided into two cases: "Calculation assuming full charge and discharge" and "Calculation assuming incomplete charging and discharging due to internal resistance".

IEC 62391-1:2015 applies to fixed electric double-layer capacitors (hereafter referred to as capacitor(s)) mainly used in d.c. circuits of electric and electronic equipment. This part of IEC 62391 establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition:
a) enhancement of the scope to include electric (high power) application;
b) implementation of Annex Q, replacing Clause 3 in the first edition;
c) in addition, minor revisions related to tables, figures and references.
The contents of the corrigenda of December 2016 and of June 2019 have been included in this copy.

IEC 62391-1:2006 applies to fixed electric double layer capacitors (hereafter called "capacitor(s)") mainly used in DC circuits of electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.