iTeh StandardsiTeh Standards
EURUSD
Your shopping cart is empty.
SIST

SIST EN 150003:2002

(Main)

Blank Detail Specification: Case-rated bipolar transistors for low frequency amplification

Blank Detail Specification: Case-rated bipolar transistors for low frequency amplification

D114/033: Withdrawn

Vordruck für Bauartspezifikation: Gehäusebezogene bipolaire Transistoren für NF-Verstärkung

Spécification particulière cadre: Transistors bipolaires à température de boîtier spécifiée, pour amplification en basse fréquence

Blank detail specification: Case-rated biopolar transistors for low frequency amplification

General Information

Status
Withdrawn
Publication Date
31-Aug-2002
Withdrawal Date
20-Oct-2009
ICS
31.080.30 - Transistors
Technical Committee
I11 - Imaginarni 11
Current Stage
9900 - Withdrawal (Adopted Project)
Start Date
19-Oct-2009
Due Date
11-Nov-2009
Completion Date
21-Oct-2009
Ref Project
EN 150003:1991 - Blank Detail Specification: Case-rated bipolar transistors for low frequency amplification

Buy Standard

EN 150003:2002EN 150003:2002
PreviousNext
Standard
EN 150003:2002
English language
12 pages
sale 10% off
Preview
sale 10% off
Preview
e-Library read for
1 day

Standards Content (Sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Blank detail specification: Case-rated biopolar transistors for low frequency amplificationVordruck für Bauartspezifikation: Gehäusebezogene bipolaire Transistoren für NF-VerstärkungSpécification particulière cadre: Transistors bipolaires à température de boîtier spécifiée, pour amplification en basse fréquenceBlank Detail Specification: Case-rated bipolar transistors for lo
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.

This May Also Interest You

SIST
SIST EN 62416:2010(Main)
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
EN 62416:2010

This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

  • Standard
    12 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN 62416:2010(Main)
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
EN 62416:2010

This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

  • Standard
    12 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN 62373:2007(Main)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
EN 62373:2006

This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).

  • Standard
    16 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN 120004:2002(Main)
Blank Detail Specification: Ambient rated photocouplers with phototransistor output
EN 120004:1992

Supersedes CECC 20 004 Issue 2:1987 and A1 * TC 86D disbanded at 105 BT

  • Standard
    19 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN 120003:2002(Main)
Blank Detail Specification: Phototransistors, photodarlington transistors, phototransistor arrays
EN 120003:1992

Supersedes CECC 20 003 Issue 1:1986 (and A1) * TC 86D disbanded at 105 BT

  • Standard
    13 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN ISO 3262-18:2023(Main)
Extenders - Specifications and methods of test - Part 18: Precipitated sodium aluminium silicate (ISO 3262-18:2023)
EN ISO 3262-18:2023

This part of ISO 3262 specifies requirements and corresponding methods of test for precipitated sodium aluminium
silicate.

  • Standard
    19 pages
    English language
    sale 10% off
    e-Library read for
    1 day
  • Draft
    15 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN 12309-1:2023(Main)
Gas-fired sorption appliances for heating and/or cooling with a net heat input not exceeding 70 kW - Part 1: Terms and definitions
EN 12309-1:2023

1.1   Scope of EN 12309
Appliances covered by this European Standard include one or a combination of the following:
-   gas-fired sorption chiller;
-   gas-fired sorption chiller/heater;
-   gas-fired sorption heat pump.
This European Standard applies to appliances designed to be used for space heating or cooling or refrigeration with or without heat recovery.
This European Standard applies to appliances having flue gas systems of type B and C (according to CEN/TR 1749) and to appliances designed for outdoor installations. EN 12309 does not apply to air conditioners, it only applies to appliances having:
-   integral burners under the control of fully automatic burner control systems,
-   closed system refrigerant circuits in which the refrigerant does not come into direct contact with the water or air to be cooled or heated,
-   mechanical means to assist transportation of the combustion air and/or the flue gas.
The above appliances can have one or more primary or secondary functions (i.e. heat recovery - see definitions in prEN 12309 1:2012).
In the case of packaged units (consisting of several parts), this standard applies only to those designed and supplied as a complete package.
The appliances having their condenser cooled by air and by the evaporation of external additional water are not covered by EN 12309.
Installations used for heating and/or cooling of industrial processes are not within the scope of EN 12309.
All the symbols given in this text should be used regardless of the language used.
1.2   Scope of this Part 1 of EN 12309
This part of this European Standard specifies the terms and definitions for gas-fired sorption appliances for heating and/or cooling with a net heat input not exceeding 70 kW.

  • Standard
    33 pages
    English language
    sale 10% off
    e-Library read for
    1 day
  • Draft
    33 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN ISO 3262-14:2023(Main)
Extenders - Specifications and methods of test - Part 14: Cristobalite (ISO 3262-14:2023)
EN ISO 3262-14:2023

This part of ISO 3262 specifies requirements and corresponding methods of test for cristobalite.

  • Standard
    11 pages
    English language
    sale 10% off
    e-Library read for
    1 day
  • Draft
    9 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN ISO 3262-7:2023(Main)
Extenders - Specifications and methods of test - Part 7: Dolomite (ISO 3262-7:2023)
EN ISO 3262-7:2023

This document specifies requirements and corresponding methods of test for dolomite.

  • Standard
    10 pages
    English language
    sale 10% off
    e-Library read for
    1 day
  • Draft
    8 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN ISO 10468:2023(Main)
Glass-reinforced thermosetting plastics (GRP) pipes - Determination of the ring creep properties under wet or dry conditions (ISO 10468:2023)
EN ISO 10468:2023

This document specifies methods for determining the ring creep properties for glass-reinforced thermosetting plastics (GRP) pipes. Properties include the creep factor and the long-term specific creep stiffness. Testing is performed under either wet (total immersion in water) or dry conditions.
Dry creep testing is typically performed for the assessment and control of raw material consistency. Wet creep testing is typically undertaken to determine the long-term creep performance in simulated use conditions.

  • Standard
    16 pages
    English language
    sale 10% off
    e-Library read for
    1 day
  • Draft
    13 pages
    English language
    sale 10% off
    e-Library read for
    1 day