SIST EN 60444-1:2002/A1:2002
(Amendment)Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
EN following parallel vote - D114/118: CLC/TC 49 disbanded
Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-Netzwerk -- Teil 1: Verfahren zur Messung der Resonanzfrequenz und des Resonanzwiderstandes von Schwingquarzen nach dem Null-Phasenverfahren in einem Pi-Netzwerk
Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi -- Partie 1: Méthode fondamentale pour la mesure de la fréquence de résonance et de la résistance de résonance des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network - Amendment A1 (IEC 60444-1:1986/A1:1999)
General Information
- Status
- Published
- Publication Date
- 31-Aug-2002
- Current Stage
- 6060 - National Implementation/Publication (Adopted Project)
- Start Date
- 01-Sep-2002
- Due Date
- 01-Sep-2002
- Completion Date
- 01-Sep-2002
Relations
- Effective Date
- 21-Sep-2010
Overview
EN 60444-1:1997/A1:1999 (CLC/IEC) defines the basic zero‑phase technique for measuring the resonance frequency and resonance resistance of quartz crystal units using a pi‑network. Amendment A1 introduces a normative Annex B that updates several formulae and the calibration procedure to improve measurement accuracy. The standard is intended for laboratories and manufacturers performing parameter measurement, quality control and component characterization of quartz crystal units.
Key Topics
- Zero‑phase measurement in a pi‑network: method to determine resonance frequency and resonance resistance by observing the zero phase condition when the crystal is inserted in a terminated pi‑network.
- Calibration with a reference resistor: Annex B updates calibration to use a reference resistor R = 25 Ω instead of a short; this change affects the derivation of transfer factors and measurement formulas.
- Voltage transfer factor and network modelling: detailed derivation of the voltage transfer factor V_B/V_A for the terminated pi‑network, showing dependence on network resistances and the crystal impedance.
- Resonance resistance formula and error analysis: a formula for resonance resistance R_r is provided (derived for arbitrary reference resistor R_n) and an error analysis (partial derivatives) quantifies influence of voltage measurement deviations and resistor tolerances.
- Crystal current and drive level: expressions for crystal current at resonance and for drive level (power) in the pi‑network are given, enabling practical control of test conditions.
- Phase slope and Q correction: Annex B derives the phase slope near resonance and replaces the incorrect Q formula from appendix A with a corrected relation for the loaded quality factor Q_eff.
Applications
- Production test and incoming inspection of quartz crystal units to verify resonance frequency and series resistance.
- R&D and component characterization for oscillator and filter designers needing accurate motional parameters and drive-level estimates.
- Calibration and method validation in metrology laboratories measuring frequency control devices.
- Education and documentation for instrument manufacturers implementing zero‑phase pi‑network test fixtures.
Related Standards
- IEC/CLC adoption of IEC 60444-1 (basic method) and its Amendment A1 (1999) - the current text is aligned with EN 60444-1:1997/A1:1999.
- Referenced guidance: IEC 61080 (Guide to the measurement of equivalent electrical parameters of quartz crystal units) for narrow‑band approximations and measurement best practice.
This amendment and Annex B focus on practical improvements - calibration to 25 Ω, updated transfer factors, explicit error propagation, and a corrected Q formula - all intended to increase reproducibility and accuracy of quartz crystal parameter measurements using the zero‑phase pi‑network technique.
Frequently Asked Questions
SIST EN 60444-1:2002/A1:2002 is a amendment published by the Slovenian Institute for Standardization (SIST). Its full title is "Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network". This standard covers: EN following parallel vote - D114/118: CLC/TC 49 disbanded
EN following parallel vote - D114/118: CLC/TC 49 disbanded
SIST EN 60444-1:2002/A1:2002 is classified under the following ICS (International Classification for Standards) categories: 31.140 - Piezoelectric devices. The ICS classification helps identify the subject area and facilitates finding related standards.
SIST EN 60444-1:2002/A1:2002 has the following relationships with other standards: It is inter standard links to SIST EN 60444-1:2002. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
SIST EN 60444-1:2002/A1:2002 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
SLOVENSKI STANDARD
01-september-2002
Measurement of quartz crystal unit parameters by zero phase technique in a pi-
network - Part 1: Basic method for the measurement of resonance frequency and
resonance resistance of quartz crystal units by zero phase technique in a pi-
network - Amendment A1 (IEC 60444-1:1986/A1:1999)
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -
- Part 1: Basic method for the measurement of resonance frequency and resonance
resistance of quartz crystal units by zero phase technique in a pi-network
Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-
Netzwerk -- Teil 1: Verfahren zur Messung der Resonanzfrequenz und des
Resonanzwiderstandes von Schwingquarzen nach dem Null-Phasenverfahren in einem
Pi-Netzwerk
Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle
dans le circuit en pi -- Partie 1: Méthode fondamentale pour la mesure de la fréquence
de résonance et de la résistance de résonance des quartz piézoélectriques par la
technique de phase nulle dans le circuit en pi
Ta slovenski standard je istoveten z: EN 60444-1:1997/A1:1999
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
NORME CEI
INTERNATIONALE IEC
60444-1
INTERNATIONAL
STANDARD
AMENDEMENT 1
AMENDMENT 1
1999-08
Amendement 1
Mesure des paramètres des quartz
piézoélectriques par la technique de phase nulle
dans le circuit en pi –
Partie 1:
Méthode fondamentale pour la mesure de la
fréquence de résonance et de la résistance de
résonance des quartz piézoélectriques par la
technique de phase nulle dans le circuit en pi
Amendment 1
Measurement of quartz crystal unit parameters
by zero phase technique in a pi-network –
Part 1:
Basic method for the measurement of resonance
frequency and resonance resistance of quartz
crystal units by zero phase technique in
a pi-network
IEC 1999 Droits de reproduction réservés Copyright - all rights reserved
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
H
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue
60444-1 Amend. 1 © IEC:1999 – 3 –
FOREWORD
This amendment has been prepared by IEC technical committee 49: Piezoelectric and
dielectric devices for frequency control and selection.
The text of this amendment is based on the following documents:
FDIS Report on voting
49/442/FDIS 49/445/RVD
Full information on the voting for the approval of this amendment can be found in the report on
voting indicated above.
___________
Page 3
CONTENTS
Add the title of annex B as follows:
Annex B – Updating of some formulae of appendix A
Page 43
Add, after appendix A, the new annex B as follows:
Annex B
(normative)
Updating of some formulae of appendix A
B.1 Purposes
In this annex some formulae of the appendix A are updated, taking into account the modified
calibration procedure of the π-network with a reference resistor R = 25 Ω instead of a short.
n
The formula relating R to the measured voltages is derived for arbitrary values of the
r
reference resistor R . The error of R is taken into account in the error analysis for R .
n n r
The formula for current and drive level of the crystal in the π-network is given. The phase slope
of the crystal inserted in the π-network is derived and the formula for Q is corrected.
eff
60444-1 Amend. 1 © IEC:1999 – 5 –
B.2 The -network terminated by Z = 50 (with power splitter according to
π Ω
figure 5a)
Power splitter
(see figure 5a)
Z
c
R R
Z 4
Z
Z
R R R
3 5 6 Z
R V
B
Z
V
V
AA V V
V AAV
B0
IEC 1019/99
Figure B.1 – Terminated π-network
B.3 Voltage transfer factor of the terminated π-network
In the following an elementary derivation of the voltage transfer factor is presented to provide a
more comprehensive formula.
−1
1 1
′
= = +
Let R R Z
6 6
R Z
6
′
V R
B 6
= = =
Then k 0,3649 (B.1)
π
′ ′
V R + R
B 6 7
−1
1 1
′ ′
Define = + = + = = 12,5 Ω
R R R R R
5 5 6 7 T2
′
R
R + R
6 7
where R is the termination resistance at the output of the π-network as seen by the crystal.
T2
′ ′
R
V
B 5
=
Then (B.2)
′′′ ′
V R + Z
A
5 c
−1
′ ′ 1 1
Define R = R R + Z = +
3 3 5 c
′
R
+
R Z
5 c
′
′′′
V R
A 3
Then = (B.3)
″ ′
V R + R
A 3 4
60444-1 Amend. 1 © IEC:1999 – 7 –
−1
1 1
′ ′
Define R = R R + R = +
2 2 3 4
′
R
2 R + R
3 4
Then, for a power splitter according to figure 5a and disregarding the cables:
″ ′
V R
A 2
= (B.4)
′ ′
...




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