SIST EN 60679-4:2002

SLOVENSKI STANDARD
SIST EN 60679-4:2002
01-september-2002
Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional
specification - Capability approval (IEC 60679-4:1997)
Quartz crystal controlled oscillators of assessed quality -- Part 4: Sectional specification -
Capability approval
Quarzoszillatoren mit bewerteter Qualität -- Teil 4: Rahmenspezifikation -
Befähigungsanerkennung
Oscillateurs pilotés par quartz sous assurance de la qualité -- Partie 4: Spécification
intermédiaire - Agrément de savoir-faire
Ta slovenski standard je istoveten z: EN 60679-4:1998
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60679-4:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60679-4:2002

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SIST EN 60679-4:2002

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SIST EN 60679-4:2002

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SIST EN 60679-4:2002

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SIST EN 60679-4:2002

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SIST EN 60679-4:2002
NORME
CEI
INTERNATIONALE
IEC
60679-4
INTERNATIONAL
QC 690100
STANDARD
Première édition
First edition
1997-12
Oscillateurs pilotés par quartz sous assurance
de la qualité –
Partie 4:
Spécification intermédiaire –
Agrément de savoir-faire
Quartz crystal controlled oscillators
of assessed quality –
Part 4:
Sectional specification – Capability approval
 IEC 1997 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http: //www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
PRICE CODE U
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 General. 9
1.1 Scope . 9
1.2 Normative references. 9
2 Preferred values for ratings and guidance on detail specifications. 9
2.1 Preferred values for ratings and characteristics . 9
2.2 Information to be prescribed in detail specifications . 11
3 Capability approval. 13
3.1 Eligibility for capability approval. 13
3.2 Structural similarity . 13
3.3 Procedures for capability approval. 13
3.4 Capability manual. 15
3.5 Capability qualifying components (CQC). 15
3.6 Inspection requirements for CQCs. 19
3.7 Programme for capability approval . 19
3.8 Capability approval report. 19
3.9 Abstract of description of capability approval . 19
3.10 Modifications likely to affect the capability approval . 21
3.11 Initial capability approval . 21
3.12 Maintenance of capability approval . 49
3.13 Rework and repair work. 51
3.14 Quality conformance inspection. 51
3.15 Screening procedures . 53
4 Test and measurement procedures . 53
Tables
1 Test schedule for initial capability approval . 41
2 Periodic tests for maintenance of capability approval . 51
Figures
 1 Selection of CQCs – All methods of construction . 23
 2 Test plan for deposition for electrode material CQCs . 25
 3 Test plan for bonding CQCs . 27
 4 Test plan for component assembly CQCs . 27
 5 Test plan for alignment CQCs. 29
 6 Test plan for enclosures of CQCs. 31
 7 Test plan for mounting CQCs . 31
 8 Test plan for frequency, input, output and temperature range CQCs . 33
 9 Test plan for frequency/load coefficient, frequency/voltage coefficient,
external frequency adjustment and FM characteristics CQCs . 35
10 Test plans for climatic performance CQCs. 37
11 Test plan for frequency ageing CQCs . 39
Annexes
A Example of layout of an abstract of description of capability approval. 55
B Layout of the front page of a CQC specification for process control. 57
C Layout of the front page of a CQC specification to demonstrate a boundary or limit. 59

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
QUARTZ CRYSTAL CONTROLLED OSCILLATORS
OF ASSESSED QUALITY –
Part 4: Sectional specification – Capability approval
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60679-4 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
This International Standard has been based on EN 169100: 1993, Quartz crystal controlled
oscillators (Capability approval) of the CECC.
It forms part 4 of a series of standards for quartz crystal controlled oscillators and also
constitutes a specification in the IEC Quality Assessment System for electronic components
(IECQ) where it forms the sectional specification – Capability approval.
The text of this standard is based on the following documents:
FDIS Report on voting
49/386/FDIS 49/390/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 7 –
IEC 60679 consists of the following parts under the general title Quartz controlled oscillators of
assessed quality:
– Part 1: Generic specification (IEC 60679-1)
– Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2)
– Part 3: Standard outlines and lead connections (IEC 60679-3)
– Part 4: Sectional specification – Capability approval (IEC 60679-4)
– Part 4-1: Blank detail specification – Capability approval (IEC 60679-4-1)
– Part 5: Sectional specification – Qualification approval (IEC 60679-5)
– Part 5-1: Blank detail specification – Qualification approval (IEC 60679-5-1)
The QC number which appears on the front cover of this publication is the specification number
in the IEC Quality Assessment System for Electronic Components (IECQ).
Annexes A, B and C form an integral part of this standard.

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 9 –
QUARTZ CRYSTAL CONTROLLED OSCILLATORS
OF ASSESSED QUALITY –
Part 4: Sectional specification – Capability approval
1 General
1.1 Scope
This part of IEC 60679 applies to quartz crystal controlled oscillators as custom built products
or as standard catalogue items and whose quality is assessed on the basis of capability
approval.
It prescribes the preferred ratings and characteristics, with appropriate tests and measuring
methods contained in the generic specification, IEC 60679-1, and gives the general
performance requirements to be used in detail specifications for quartz crystal controlled
oscillators.
The concept of preferred values is directly applicable to standard catalogue items but does not
necessarily apply to custom built products.
1.2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 60679. At the time of publication, the editions indicated
were valid. All normative documents are subject to revision, and parties to agreements based
on this part of IEC 60679 are encouraged to investigate the possibility of applying the most
recent editions of the normative documents indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
IEC 61178-1:1993, Quartz crystal units – A specification in the IEC quality assessment system
for electronic components (IECQ) – Part 1: Generic specification
IEC 60679-1:1997, Quartz crystal controlled oscillators of assessed quality – Part 1: Generic
specification
IEC 60679-4-1– Quartz crystal controlled oscillators of assessed quality – Part 4-1: Blank detail
1)
specification – Capability approval
2 Preferred values for ratings and guidance on detail specifications
2.1 Preferred values for ratings and characteristics
The values given in detail specifications shall preferably be selected from those stated in 2.3 of
the generic specification IEC 60679-1.
________
1)
  To be published.

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 11 –
2.2 Information to be prescribed in detail specifications
(Applies to both custom built and standard catalogue items.)
Guidance on the preparation of detail specifications is given in the future blank detail
specification, IEC 60679-4-1.
Each detail specification shall state all the tests and measurements required for inspection. For
standard catalogue items this shall, as a minimum, include the relevant tests given in the blank
detail specification, with methods and severities.
The following information shall be given in each detail specification.
2.2.1 Outline drawing and dimensions
The detail specification shall include a dimensional drawing of the crystal controlled oscillator,
and/or reference to an appropriate international standard, to permit easy recognition and to
provide information for dimensioning and gauging procedures.
The dimensions shall include the overall dimensions of the body of the component, and the
size and spacing of the terminations. All dimensions shall be stated in millimetres.
Terminal connections shall be identified for all enclosures.
When a detail specification covers more than one enclosure, the dimensions and their
associated tolerances shall be placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the crystal controlled oscillator.
2.2.2 Marking
The detail specification shall prescribe the content of the marking on the crystal controlled
oscillator and on the primary package in accordance with 2.4 of IEC 60679-1.
2.2.3 Ordering information
The detail specification shall prescribe that the following information is required when ordering
a crystal controlled oscillator:
a) quantity;
b) detail specification number, issue number and date, and where applicable;
c) type of oscillator (e.g. SPXO, VCXO, TCXO, etc.);
d) nominal frequency in kilohertz or megahertz;
e) frequency tolerance(s) and operating temperature range;
f) full description of any additional requirements to identify the oscillator.

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 13 –
2.2.4 Additional information (not for inspection purposes)
The detail specification may include information which is not normally required to be verified by
the inspection procedure, such as circuit diagrams, curves, drawings and notes needed for
clarification.
3 Capability approval
3.1 Eligibility for capability approval
Prior to making an application for capability approval a manufacturer shall first obtain
manufacturer's inspection approval in accordance with 10.2 of IEC QC 001002.
The primary stage of manufacture shall be as defined in 3.1 of IEC 60679-1.
3.2 Structural similarity
Structural similarity is not applicable to capability approval. However, it is applicable to
released lots as defined in 3.14.1 of this specification.
3.3 Procedures for capability approval
3.3.1 General
Capability approval in quartz crystal controlled oscillator technology covers
– the complete design, material preparation and manufacturing techniques, including control
procedures and tests,
– the performance limits claimed for the processes and products, that is those specified for
the capability qualifying components (CQCs),
– the range of mechanical structures for which approval is granted.
3.3.2 Application for capability approval
In order to obtain capability approval the manufacturer shall apply the rules of procedure given
in 11.7 of IEC QC 001002.
In an application for capability approval the manufacturer shall define the boundaries of the
capability for which approval is sought, in accordance with 3.5 of this specification.
3.3.3 Granting of capability approval
Capability approval shall be granted when the manufacturer has
– prepared a capability manual describing the capability for which he wishes to be approved,
to the satisfaction of the National Supervising Inspectorate (NSI),
– agreed with the NSI the range of CQCs, as defined in 11.7.2 of IEC QC 001002, to be used
for the assessment of the capability,
– successfully demonstrated that he can design and manufacture components which satisfy
the requirements of this sectional specification, within the limits of this capability,
– prepared a capability approval test report to the satisfaction of the NSI.

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 15 –
3.4 Capability manual
The manufacturer shall prepare a manual describing his capability (see 11.7.2 of
IEC QC 001002) in relation to the technologies involved.
The manual shall be approved by the NSI, who shall ensure that it is a true and complete
record of the procedures carried out by the manufacturer during the design, production, testing,
inspection, and release of his products. The manual is a document that shall be treated as
commercial in confidence.
The manual shall include the following as a minimum:
– a general introduction and description of the technologies involved;
– aspects of customer liaison, including provisions of design rules (if appropriate), and
assistance to customers in the formulation of their requirements;
– a detailed description of the design rules to be used;
– the procedure for checking that the design rules are complied with for quartz crystal
controlled oscillators manufactured to a detail specification;
– a list of all materials used, with references to the corresponding purchasing specifications
and goods inward inspection;
– a flow chart for the total process showing quality control points and permitted rework loops,
and containing references to all process and quality control procedures;
– a declaration of processes for which approval has been sought, in accordance with 3.5.1;
– a declaration of boundaries for which approval has been sought, in accordance with 3.5.2;
– a list of capability qualifying components (CQCs) used to assess the capability, with a
general description of each, supported by a detailed table showing where the declared
boundaries of capability are demonstrated by a particular CQC;
– a detail specification for each CQC. These specifications shall be produced to the
satisfaction of the NSI (see annexes B and C).
3.5 Capability qualifying components (CQC)
There are basic methods of construction of quartz crystal controlled oscillators which include
a) leaded component techniques,
comprising assembly of wire leaded components in printed circuit board (PCB) laminates,
b) surface mounting techniques,
comprising assembly of components designed for surface mounting,
c) thick and thin film techniques,
comprising assembly of components in either thick or thin film on substrates,
d) die and wire bond techniques,
comprising assembly of components by die attach and wire bonding.
These methods of construction, or combinations thereof, may incorporate either sealed crystal
units or unencapsulated crystal units.

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 17 –
For the purpose of capability approval the method of construction shall be the first
consideration and the samples shall include the subfamilies of oscillators for which approval is
required.
The above classification covers all subfamilies of oscillators for example SPXOs, VCXOs,
TCXOs and OCXOs. For the purpose of capability approval the method shall include the
subfamilies of oscillators for which approval is required. Aggregation of subfamilies is not
allowed when validating the design and performance requirements covered under 3.11.5.
The manufacturer shall agree with the NSI the range of capability qualifying components,
selected in accordance with the general plan (see 3.11.2) specified in the capability manual.
The CQCs shall comply with the following requirements:
a) the range of CQCs used shall cover all the processes, component types and limits of the
declared capability;
b) the CQCs shall be one of the following:
– test pieces, designed for assessment of a process or range of processes, or
– quartz crystal controlled oscillators in production, or
– a combination of both of these, provided the requirements of a) are met.
When CQCs are designed and produced solely for capability approval, the manufacturer shall
satisfy the NSI that the same design rules, materials and manufacturing processes will be
applied to released products.
The CQC specifications may refer to internal control documentation which specifies production
testing and recording in order to demonstrate control and maintenance of processes and
boundaries.
3.5.1 Processes
The CQC specifications shall include the following processes to be assessed, the list of which
is not exclusive:
– deposition of electrode material on the crystal blank (see 3.11.3.1);
– bonding of the crystal resonator to the mounting (see 3.11.3.2);
NOTE – The above applies only when an unencapsulated crystal is used.
– component assembly (see 3.11.3.3);
– alignment (see 3.11.3.4);
– sealing of enclosure (see 3.11.4.1);
– durability of marking (see 3.11.4.1).
3.5.2 Boundaries
CQCs shall demonstrate a set of boundaries which shall include the following:
– frequency range(s) (see 3.11.5.1);
– frequency tolerance(s) (see 3.11.5.1);
– temperature range (see 3.11.5.1);
– output power or voltage (see 3.11.5.1);
– output waveform (see 3.11.5.1);

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 19 –
– input power (see 3.11.5.1);
– frequency/load coefficient (see 3.11.5.2);
– frequency/supply voltage coefficient (see 3.11.5.2);
– external frequency adjustment, where applicable (see 3.11.5.2);
– frequency modulation (FM) characteristics (see 3.11.5.2);
– climatic category (see 3.11.5.3);
– ageing (see 3.11.5.4);
– enclosure (see 3.11.4.1);
– mechanical test severities (see 3.11.4.2).
This list is not exclusive. Where additional boundaries are claimed, these shall be covered by
one or more CQCs.
3.6 Inspection requirements for CQCs
The inspection requirements shall be contained in the CQC detail specifications together with
environmental tests, measurements, severities and end point limits, where appropriate
(see 3.11). Where possible, the tests applied to CQCs shall be selected from clause 4 of
IEC 60679-1.
For capability approval and the subsequent maintenance of that approval, the inspection
requirements shall ensure that processes and design features meet the declared capability.
3.7 Programme for capability approval
The manufacturer shall prepare a programme for the assessment of the declared capability to
the satisfaction of the NSI. This programme shall be designed so that each declared boundary
condition is verified by the appropriate CQC.
The programme shall contain the following:
– a bar chart or other means of showing the proposed timetable for the approval exercise;
– details of all the CQCs to be used with references to their detail specifications;
– a chart showing the features to be demonstrated by each CQC.
3.8 Capability approval report
The report shall contain the following information:
– the issue number and date of the capability approval manual;
– a programme for capability approval in accordance with 3.7;
– test results obtained during the performance of the programme;
– the test methods used.
The report shall be signed by the chief inspector as a true statement of the results obtained
and submitted to the NSI for approval.
3.9 Abstract of description of capability approval
The abstract is intended for formal publication in IEC QC 001005 when capability approval is
granted by the National Authorized Institution (NAI) on the recommendation of the NSI.

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 21 –
It shall include a concise description of the manufacturer's capability and give sufficient
information on the technology, methods of construction, packaging and range of products for
which the manufacturer has been approved. The layout shall conform to annex A of this
specification, indicating the boundary conditions for which approval has been granted.
3.10 Modifications likely to affect the capability approval
Any modification likely to affect the capability approval shall satisfy the requirements of
11.7.3.4 of IEC QC 001002.
3.11 Initial capability approval
The test plans given below shall be applied to appropriately selected groups of CQCs.
The test plans are in categories as follows:
a) process CQCs;
b) process/boundary CQCs;
c) boundary CQCs.
The tests referred to in each test plan are defined in table 1. These tests have been grouped to
prove particular design areas covering materials, processes, enclosure types, crystal controlled
oscillator performance and durability.
The tests in each group shall be carried out in the given order.
The approval is granted when the selected range of CQCs has collectively satisfied the
assessment requirements of the CQC detail specifications with no defects allowed.
One defective is counted when a CQC has not satisfied the whole or part of the tests of the
group.
3.11.1 Procedure in the event of CQC failures
In the event of the failure of specimens to meet the test requirements, the manufacturer shall
maintain a record of all defectives and take one of the actions described in items a) and b)
below:
a) the manufacturer amends the scope of his declared capability with the agreement of the
NSI;
b) the manufacturer conducts an investigation into the failure to establish its cause as being
either
– failure of the test itself, for example test equipment failure or operator error, or
– design or process failure.
If the cause of failure is established as a failure of the test itself, then, subject to the
agreement of the NSI, either the specimen which apparently failed or a new one, if appropriate,
shall be returned to the test schedule after the necessary corrective action has been taken. If a
new specimen is to be used, it shall be subjected to all of the tests in the given sequence of the
test schedule(s) appropriate to the original specimen.

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 23 –
If the cause of failure is established as a design or process failure, a test programme agreed
between the manufacturer and the NSI shall be performed to demonstrate that the cause of the
failure has been eradicated and that all corrective measures, including documentation, have
been carried out. When this has been accomplished to the satisfaction of the NSI, the full test
sequences shall be repeated using new CQCs.
3.11.2 General plan for the selection of CQCs
NOTE – Some operations may be performed in a different order from that shown.
Surface
finishing
of crystal
blank
See
See
Electrode Component
3.11.3.1
3.11.3.3
deposition assembly
See
See
Crystal bonding Alignment
3.11.3.2
3.11.3.4
See
Enclosure
3.11.4.1
See
Integrity of
3.11.4.2
construction
Frequency,
See
input, output, See
Climatic
3.11.5.1
temperature 3.11.5.3
performance
range
Oscillator
design and
performance
Frequency/load coefficient
See See
Frequency/voltage coefficient
Ageing
3.11.5.2 3.11.5.4
External frequency adjustment
FM characteristics
Deliverables
Figure 1 – Selection of CQCs – All methods of construction

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SIST EN 60679-4:2002
60679-4  IEC:1997 – 25 –
3.11.3 Process CQC test plans
3.11.3.1 Deposition of electrode material on the crystal blank
The purpose of this test is to establish the quality of the electrode material by measuring the
drive level dependency, thickness and adhesion of the electrode film.
Eight specimens are required, which are representative of each electrode material and
deposition method. They shall be subjected to the test plan shown in figure 2.
Electrode materials Deposition methods
– Aluminium – Evaporation
– Gold – Sputtering
– Silver
– Chromium
–Nickel
NOTE – This list is not exclusive.
Eight specimens
Test group
1A
Drive level dependency
Four specimens Four specimens
Test group Test group
1B 1C
Thickness Adhesion
Figure 2 – Test plan for deposition of electrode material CQCs
3.11.3.2 Bonding
The purpose of this test is to demonstrate the quality of the bonded joint between the crystal
resonator and its mounting. This is achieved by measuring the electrical resistance between
the electrode and the m
...