Road vehicles — Component test methods for electrical disturbances from narrowband radiated electromagnetic energy — Part 3: Transverse electromagnetic (TEM) cell

ISO 11452-3:2016 specifies transverse electromagnetic (TEM) cell tests for determining the immunity of electronic components of passenger cars and commercial vehicles to electrical disturbances from narrowband radiated electromagnetic energy, regardless of the vehicle propulsion system (e.g. spark-ignition engine, diesel engine, electric motor). The electromagnetic disturbances considered are limited to continuous narrowband electromagnetic fields.

Véhicules routiers — Méthodes d'essai d'un équipement soumis à des perturbations électriques par rayonnement d'énergie électromagnétique en bande étroite — Partie 3: Cellule électromagnétique transverse (TEM)

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Status
Withdrawn
Publication Date
29-Aug-2016
Current Stage
9599 - Withdrawal of International Standard
Completion Date
28-May-2024
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ISO 11452-3:2016 - Road vehicles -- Component test methods for electrical disturbances from narrowband radiated electromagnetic energy
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Standards Content (Sample)

INTERNATIONAL ISO
STANDARD 11452-3
Third edition
2016-09-01
Road vehicles — Component test
methods for electrical disturbances
from narrowband radiated
electromagnetic energy —
Part 3:
Transverse electromagnetic (TEM) cell
Véhicules routiers — Méthodes d’essai d’un équipement soumis
à des perturbations électriques par rayonnement d’énergie
électromagnétique en bande étroite —
Partie 3: Cellule électromagnétique transverse (TEM)
Reference number
ISO 11452-3:2016(E)
©
ISO 2016

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ISO 11452-3:2016(E)

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© ISO 2016, Published in Switzerland
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ii © ISO 2016 – All rights reserved

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ISO 11452-3:2016(E)

Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Test conditions . 1
5 Test apparatus . 2
5.1 TEM cell . 2
5.2 Instrumentation . 3
5.3 Test set-up . 3
5.3.1 General. 3
5.3.2 Exposure of device under test and wiring harness (for major field
coupling to the harness) . 4
5.3.3 Exposure of device under test alone (for major field coupling to that device) . 6
6 Test procedure . 7
6.1 Test plan . 7
6.2 Test method . 7
6.2.1 General. 7
6.2.2 Test level setting .
...

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