ISO 17859:2015

INTERNATIONAL ISO
STANDARD 17859
First edition
2015-09-01
Fine ceramics (advanced ceramics,
advanced technical ceramics) —
Measurement method of piezoelectric
strain at high electric field
Céramiques techniques — Méthode de mesurage de la contrainte
piézoélectrique à champ électrique élevé
Reference number
©
ISO 2015
© ISO 2015, Published in Switzerland
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ii © ISO 2015 – All rights reserved

Contents Page
Foreword .iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions, and symbols . 1
3.1 Terms and definitions . 1
3.2 Symbols . 2
4 Measuring environment . 2
5 Specimens . 2
5.1 General . 2
5.2 Shape and size . 3
5.3 Electrodes . 3
5.4 Polarization . 3
6 Principle . 3
7 Measurement equipment . 3
7.1 Equipment . 3
7.2 Components of equipment . 4
7.3 Environment of specimen holder . 5
7.4 Calibration of measurement equipment . 5
8 Measurement conditions . 5
9 Measurement procedures . 5
10 Calculations and results . 6
11 Test report . 6
Annex A (informative) Example of reference sample . 8
Foreword
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The committee responsible for this document is ISO/TC 206, Fine ceramics.
iv © ISO 2015 – All rights reserved

INTERNATIONAL STANDARD ISO 17859:2015(E)
Fine ceramics (advanced ceramics, advanced technical
ceramics) — Measurement method of piezoelectric strain
at high electric field
1 Scope
This International Standard specifies the measurement method of piezoelectric strain at high electric
field for high power piezoelectric devices. This International Standard is intended to be used to
determine the piezoelectric strain coefficient of the materials by measuring strain vs. electric field:
— applied electric field: 0 to 2 MV/m;
— frequency of electric field: 0,1 to 1 Hz.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
IEC 60122-1, Quartz crystal units of assessed quality — Part 1: Generic specification
IEC 60483, Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
EN 50324-1, Piezoelectric properties of ceramic materials and components — Part 1: Terms and definitions
EN 50324-2, Piezoelectric properties of ceramic materials and components — Part 2: Method of
measurement — Low power
3 Terms and definitions, and symbols
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60122-1, IEC 60483, EN 50324-
1, EN 50324-2 and the following apply.
3.1.1
applied wave form
shape of voltage applied to specimen as a function of time
Note 1 to entry: Triangular waves are used in this International Standard.
3.1.2
signal generator
apparatus which controls the applied wave form
3.1.3
power source
high-voltage amplifier which generates an electric-field (E-field) applied to the specimen
3.1.4
E-field induced strain
strain of the specimen which is induced by applying the E-field
Note 1 to entry: The value is given by the ratio of displacement to specimen thickness.
3.1.5
displacement m
...