ISO/IEC 24789-1:2024

Date:2023-05-16
ISO/IEC ISO/IEC FDIS 24789-1:2023(E)
ISO/IEC TC JTC 1/SC 17/WG 1
Secretariat: BSI
Date: 2023-08-02
Identification cards — Card service life —
Part 1:
Application profiles and requirements
Cartes d'identification — Durée de vie des cartes —
Partie 1: Profils d'application et exigences

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ISO/IEC FDIS 24789-1:2023(E)
Copyright notice

ii © ISO/IEC 2022 – All rights reserved
ii © ISO/IEC 2023 – All rights reserved

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ISO/IEC FDIS 24789-1:2023(E)
Foreword
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www.iec.ch/members_experts/refdocs).
Field Code Changed
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www.iec.ch/understanding-standardswww.iec.ch/understanding-standards.
This document was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 17, Cards and security devices for personal identification.
This second edition cancels and replaces the first edition (ISO/IEC 24789-1:2012), which has been
technically revised.
The main changes are as follows:
— — Test parameters for most methods to be included in the test plan are determined from card
functional elements, the number of uses per day and the expected lifetime in years.
— — Test sequences in the test plan have been shortened, a maximum of three methods occur in a
sequence now.
© ISO/IEC 2022 – All rights reserved iii
© ISO/IEC 2023 – All rights reserved iii

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ISO/IEC FDIS 24789-1:2023(E)
— — Test parameter calculations are only based on the number of uses per day and the expected
lifetime in years; the complex calculations of environmental, storage and reader factors have been
removed.
A list of all parts in the ISO/IEC 24789 series can be found on the ISO and IEC websites.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html and www.iec.ch/national-
committeeswww.iso.org/members.html and www.iec.ch/national-committees.
iv © ISO/IEC 2022 – All rights reserved
iv © ISO/IEC 2023 – All rights reserved

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ISO/IEC FDIS 24789-1:2023(E)
Introduction
This document defines a methodology for determining a test plan to simulate a card's service life.
Such a test plan consists of a set of stress exposure methods, each simulating specific types of
environmental or mechanical stresses. Most of the stress
...