IEC 62271-101:2012
(Main)High-voltage switchgear and controlgear - Part 101: Synthetic testing
High-voltage switchgear and controlgear - Part 101: Synthetic testing
IEC 62271-101:2012 mainly applies to a.c. circuit-breakers within the scope of IEC 62271-100. It provides the general rules for testing a.c. circuit-breakers, for making and breaking capacities over the range of test duties described in 6.102 to 6.111 of IEC 62271-100:2008, by synthetic methods. This second edition cancels and replaces the first edition published in 2007 and its Amendment 1 published in 2011. It constitutes a technical revision. This edition includes the following significant technical changes with respect to the first edition:
- addition of the new rated voltages of 1 100 kV and 1 200 kV;
- revision of Annex F regarding circuit-breakers with opening resistors;
- alignment with the second edition of IEC 62271-100:2008 and its Amendment 1 (2012).
This publication is to be read in conjunction with IEC 62271-100:2008.
Appareillage à haute tension - Partie 101: Essais synthétiques
La CEI 62271-101:2012 s'applique principalement aux disjoncteurs à courant alternatif définis dans le domaine d'application de la CEI 62271-100. Elle donne les règles générales d'essais de ces disjoncteurs, pour les pouvoirs de fermeture et de coupure dans la gamme des séquences d'essais décrites de 6.102 à 6.111 de la CEI 62271-100:2008, à l'aide de méthodes d'essais synthétiques. Cette deuxième édition annule et remplace la première édition parue en 2007 et l'Amendement 1 paru en 2011. Elle constitue une révision technique. Les principales modifications par rapport à la précédente édition sont les suivantes:
- ajout des nouvelles tensions assignées 1 100 kV et 1 200 kV;
- révision de l'Annexe F qui traite des disjoncteurs équipés de résistances d'ouverture;
- alignement avec la deuxième édition de la CEI 62271-100:2008 et Amendement 1 (2012).
Cette publication doit être lue conjointement avec la CEI 62271-100:2008.
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IEC 62271-101 ®
Edition 2.0 2012-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
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or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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IEC 62271-101 ®
Edition 2.0 2012-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XH
ICS 29.130.10 ISBN 978-2-83220-421-4
– 2 – 62271-101 © IEC:2012
CONTENTS
FOREWORD . 7
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 9
4 Synthetic testing techniques and methods for short-circuit breaking tests . 11
4.1 Basic principles and general requirements for synthetic breaking test
methods . 11
4.1.1 General . 11
4.1.2 High-current interval . 12
4.1.3 Interaction interval . 12
4.1.4 High-voltage interval . 13
4.2 Synthetic test circuits and related specific requirements for breaking tests . 14
4.2.1 Current injection methods . 14
4.2.2 Voltage injection method . 15
4.2.3 Duplicate circuit method (transformer or Skeats circuit) . 15
4.2.4 Other synthetic test methods . 16
4.3 Three-phase synthetic test methods . 16
5 Synthetic testing techniques and methods for short-circuit making tests . 19
5.1 Basic principles and general requirements for synthetic making test methods . 19
5.1.1 General . 19
5.1.2 High-voltage interval . 19
5.1.3 Pre-arcing interval . 19
5.1.4 Latching interval and fully closed position . 20
5.2 Synthetic test circuit and related specific requirements for making tests . 20
5.2.1 General . 20
5.2.2 Test circuit . 20
5.2.3 Specific requirements . 20
6 Specific requirements for synthetic tests for making and breaking performance
related to the requirements of 6.102 through 6.111 of IEC 62271-100:2008 . 21
Annex A (informative) Current distortion . 42
Annex B (informative) Current injection methods. 58
Annex C (informative) Voltage injection methods . 62
Annex D (informative) Skeats or duplicate transformer circuit . 65
Annex E (normative) Information to be given and results to be recorded for synthetic
tests . 68
Annex F (normative) Synthetic test methods for circuit-breakers with opening resistors . 69
Annex G (informative) Synthetic methods for capacitive-current switching . 76
Annex H (informative) Re-ignition methods to prolong arcing . 88
Annex I (normative) Reduction in di/dt and TRV for test duty T100a . 91
Annex J (informative) Three-phase synthetic test circuits . 100
Annex K (normative) Test procedure using a three-phase current circuit and one
voltage circuit . 107
Annex L (normative) Splitting of test duties in test series taking into account the
associated TRV for each pole-to-clear . 127
Annex M (normative) Tolerances on test quantities for type tests . 147
62271-101 © IEC:2012 – 3 –
Annex N (informative) Typical test circuits for metal-enclosed and dead tank circuit-
breakers . 150
Annex O (informative) Combination of current injection and voltage injection methods . 160
Bibliography . 163
Figure 1 – Interrupting process – Basic time intervals . 33
Figure 2 – Examples of evaluation of recovery voltage . 34
Figure 3 – Equivalent surge impedance of the voltage circuit for the current injection
method . 35
Figure 4 – Making process – Basic time intervals . 36
Figure 5 – Typical synthetic making circuit for single-phase tests. 37
Figure 6 – Typical synthetic making circuit for out-of-phase . 38
Figure 7 – Typical synthetic make circuit for three-phase tests (k = 1,5) . 39
pp
Figure 8 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic (right) for T100s with k = 1,5 . 40
pp
Figure 9 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic (right) for T100a with k = 1,5 . 41
pp
Figure A.1 – Direct circuit, simplified diagram . 49
Figure A.2 – Prospective short-circuit current . 49
Figure A.3 – Distortion current . 49
Figure A.4 – Distortion current . 50
Figure A.5 – Simplified circuit diagram . 51
Figure A.6 – Current and arc voltage characteristics for symmetrical current . 52
Figure A.7 – Current and arc voltage characteristics for asymmetrical current . 53
Figure A.8 – Reduction of amplitude and duration of final current loop of arcing . 54
Figure A.9 – Reduction of amplitude and duration of final current loop of arcing . 55
Figure A.10 – Reduction of amplitude and duration of final current loop of arcing . 56
Figure A.11 – Reduction of amplitude and duration of final current loop of arcing . 57
Figure B.1 – Typical current injection circuit with voltage circuit in parallel with the test
circuit-breaker . 59
Figure B.2 – Injection timing for current injection scheme with circuit B.1 . 60
Figure B.3 – Examples of the determination of the interval of significant change of arc
voltage from the oscillograms . 61
Figure C.1 – Typical voltage injection circuit diagram with voltage circuit in parallel
with the auxiliary circuit-breaker (simplified diagram) . 63
Figure C.2 – TRV waveshapes in a voltage injection circuit with the voltage circuit in
parallel with the auxiliary circuit-breaker . 64
Figure D.1 – Transformer or Skeats circuit . 66
Figure D.2 – Triggered transformer or Skeats circuit .
...
IEC 62271-101 ®
Edition 2.1 2017-11
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des
questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez
les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
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IEC 62271-101 ®
Edition 2.1 2017-11
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.130.10 ISBN 978-2-8322-5136-2
IEC 62271-101 ®
Edition 2.1 2017-11
CONSOLIDATED VERSION
REDLINE VERSION
VERSION REDLINE
colour
inside
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
– 2 – IEC 62271-101:2012+AMD1:2017 CSV
© IEC 2017
CONTENTS
FOREWORD . 9
INTRODUCTION to the Amendment . 11
1 Scope . 12
2 Normative references . 12
3 Terms and definitions . 12
4 Synthetic testing techniques and methods for short-circuit breaking tests . 14
4.1 Basic principles and general requirements for synthetic breaking test
methods . 14
4.1.1 General . 14
4.1.2 High-current interval . 15
4.1.3 Interaction interval . 16
4.1.4 High-voltage interval . 16
4.2 Synthetic test circuits and related specific requirements for breaking tests . 17
4.2.1 Current injection methods . 17
4.2.2 Voltage injection method . 18
4.2.3 Duplicate circuit method (transformer or Skeats circuit) . 19
4.2.4 Other synthetic test methods . 19
4.3 Three-phase synthetic test methods . 19
Synthetic testing techniques and methods for short-circuit making tests . 22
5.1 Basic principles and general requirements for synthetic making test methods . 22
5.1.1 General . 22
5.1.2 High-voltage interval . 23
5.1.3 Pre-arcing interval . 23
5.1.4 Latching interval and fully closed position . 23
5.2 Synthetic test circuit and related specific requirements for making tests . 23
5.2.1 General . 23
5.2.2 Test circuit . 23
5.2.3 Specific requirements . 23
6 Specific requirements for synthetic tests for making and breaking performance
related to the requirements of 6.102 through 6.111 of IEC 62271-100:2008
Type tests . 24
Annex A (informative) Current distortion . 57
Annex B (informative) Current injection methods. 73
Annex C (informative) Voltage injection methods . 77
Annex D (informative) Skeats or duplicate transformer circuit . 80
Annex E (normative) Information to be given and results to be recorded for synthetic
tests . 83
Annex F (normative) Synthetic test methods for circuit-breakers with opening resistors . 84
Annex G (informative) Synthetic methods for capacitive-current switching . 92
Annex H (informative) Re-ignition Step-by-step methods to prolong arcing . 111
Annex I (normative) Reduction in Correction of di/dt and TRV for test duty T100a . 115
Annex J (informative) Three-phase synthetic test circuits . 133
Annex K (normative) Test procedure using a three-phase current circuit and one
voltage circuit . 140
© IEC 2017
Annex L (normative) Splitting of test duties in test series taking into account the
associated TRV for each pole-to-clear . 181
Annex M (normative) Tolerances on test quantities for type tests . 220
Annex N (informative) Typical Examples of test circuits for metal-enclosed and dead
tank circuit-breakers . 224
Annex O (informative) Combination of current injection and voltage injection methods . 234
Bibliography . 237
Figure 1 – Interrupting process – Basic time intervals . 41
Figure 2 – Examples of evaluation of initial recovery voltage . 43
Figure 3 – Equivalent surge impedance of the voltage circuit for the current injection
method . 44
Figure 4 – Making process – Basic time intervals . 45
Figure 5 – Typical Example of synthetic making circuit for single-phase tests . 47
Figure 6 – Typical Example of synthetic making circuit for out-of-phase . 49
Figure 7 – Typical Example of synthetic make circuit for three-phase tests (k = 1,5) . 51
pp
Figure 8 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic (right) for T100s with k = 1,5 .
pp
Figure 8 – Evaluation of recovery voltage during synthetic capacitive current switching
testing . 53
Figure 9 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic tests (right) for T100a with k = 1,5 . 55
pp
Figure 10 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic tests (right) for T100a with k = 1,3 . 56
pp
Figure A.1 – Direct circuit, simplified diagram . 64
Figure A
...
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