IEC 61850-10:2005
(Main)Communication networks and systems in substations - Part 10: Conformance testing
Communication networks and systems in substations - Part 10: Conformance testing
Specifies standard techniques for testing of conformance of implementations, as well as specific measurement techniques to be applied when declaring performance parameters. The use of these techniques will enhance the ability of the system integrator to integrate IEDs easily, operate IEDs correctly, and support the applications as intended.
This publication is of core relevance for Smart Grid.
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INTERNATIONAL IEC
STANDARD 61850-10
First edition
2005-05
Communication networks and systems
in substations –
Part 10:
Conformance testing
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INTERNATIONAL IEC
STANDARD 61850-10
First edition
2005-05
Communication networks and systems
in substations –
Part 10:
Conformance testing
IEC 2005 Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
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International Electrotechnical Commission
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For price, see current catalogue
– 2 – 61850-10 IEC:2005(E)
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope.7
2 Normative references .7
3 Terms and definitions .8
4 Abbreviated terms .10
5 Introduction to conformance testing.11
5.1 General .11
5.2 Conformance test procedures.12
5.3 Quality assurance and testing .12
5.3.1 General .12
5.3.2 Quality plan .13
5.4 Testing .14
5.4.1 General .14
5.4.2 Use of SCL files .16
5.4.3 Device testing.16
5.5 Documentation of conformance test report .16
6 Device related conformance testing.17
6.1 General guidelines .17
6.1.1 Test methodology .17
6.1.2 Test system architectures.17
6.2 Conformance test procedures.18
6.2.1 General .18
6.2.2 Test procedure requirements .18
6.2.3 Test structure .19
6.2.4 Test cases to test a server .20
6.2.5 Acceptance criteria.37
7 Performance tests .38
7.1 General .38
7.2 Communications latency.38
7.2.1 Application domain .38
7.2.2 Methodology.39
7.3 Time synchronisation and accuracy.40
7.3.1 Application domain .40
7.3.2 Methodology.40
7.3.3 Testing criteria .41
7.3.4 Performance.41
8 Additional tests.41
Annex A (informative) Examples of test procedure template.42
Bibliography.43
61850-10 IEC:2005(E) – 3 –
Figure 1 – Conceptual conformance assessment process .15
Figure 2 – Conceptual test system architecture.18
Figure 3 – Test procedure format.19
Figure 4 – Performance testing (black box principle).39
Figure 5 – Time synchronisation and accuracy test setup .40
Table 1 – Positive test cases .22
Table 2 – Negative test cases .22
Table 3 – Positive test cases .22
Table 4 – Negative test cases .23
Table 5 – Positive test cases .23
Table 6 – Negative test cases .24
Table 7 – Positive test cases .24
Table 8 – Negative test cases .25
Table 9 – Positive test cases .25
Table 10 – Negative test cases .25
Table 11 – Positive test cases .26
Table 12 – Negative test cases .28
Table 13 – Positive test cases .28
Table 14 – Negative test cases .29
Table 15 – Positive test cases .29
Table 16 – Positive test cases .30
Table 17 – Negative test cases .30
Table 18 – Negative test cases .31
Table 19 – Positive test cases .31
Table 20 – Positive test cases .31
Table 21 – Negative test cases .32
Table 22 – Negative test cases .32
Table 23 – Positive test cases .32
Table 24 – Test cases for SBOes.33
Table 25 – Test cases for DOns.34
Table 26 – Test cases for SBOns.34
Table 27 – Test cases for DOes.35
Table 28 – Negative test cases .35
Table 29 – Positive test cases .36
Table 30 – Negative test cases .36
Table 31 – Positive test cases .36
Table 32 – Negative test cases .37
Table 33 – Combination test case .37
– 4 – 61850-10 IEC:2005(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
COMMUNICATION NETWORKS AND SYSTEMS
IN SUBSTATIONS –
Part 10: Conformance testing
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
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5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61850-10 has been prepared by IEC technical committee 57:
Power systems management and associated information exchange.
The text of this standard is based on the following documents:
FDIS Report on voting
57/742/FDIS 57/749/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
61850-10 IEC:2005(E) – 5 –
IEC 61850 consists of the following parts, under the general title Communication networks
and systems in substations:
Part 1: Introduction and overview
Part 2: Glossary
Part 3: General requirements
Part 4: System and project management
Part 5: Communication requirements for functions and device models
Part 6: Configuration description language for communication in electrical substations
related to IEDs
Part 7-1: Basic communication structure for substation and feeder equipment – Principles
and models
Part 7-2: Basic communication structure for substation and feeder equipment – Abstract
communication service interface (ACSI)
Part 7-3: Basic communication structure for substation and feeder equipment – Common
data classes
Part 7-4: Basic communication structure for substation and feeder equipment – Compatible
logical node classes and data classes
Part 8-1: Specific Communication Service Mapping (SCSM) – Mappings to MMS (ISO 9506-
1 and ISO 9506-2) and to ISO/IEC 8802-3
Part 9-1: Specific Communication Service Mapping (SCSM) – Sampled values over serial
unidirectional multidrop point to point link
Part 9-2: Specific Communication Service Mapping (SCSM) – Sampled values over
ISO/IEC 8802-3
Part 10: Conformance testing
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
A bilingual edition of this standard may be issued at a later date.
– 6 – 61850-10 IEC:2005(E)
INTRODUCTION
This part of IEC 61850 is part of a set of specifications which details a layered substation
communication architecture.
This part of IEC 61850 defines:
• the methods and abstract test cases for conformance testing of devices used in
substation automation systems, and
• the metrics to be measured within devices according to the requirements defined in
IEC 61850-5.
The intended readers are test system developers.
NOTE 1 Tests regarding EMC requirements and environmental conditions are subject to IEC 61850-3 and not
included in this part of IEC 61850.
NOTE 2 It is recommended that IEC 61850-5 and IEC 61850-7-1 be read first in conjunction with IEC 61850-7-2,
IEC 61850-7-3, and IEC 61850-7-4.
NOTE 3 Abbreviations used in IEC 61850-10 are listed in Clause 4 or may be found in other parts of IEC 61850
that are relevant for conformance testing.
61850-10 IEC:2005(E) – 7 –
COMMUNICATION NETWORKS AND SYSTEMS
IN SUBSTATIONS –
Part 10: Conformance testing
1 Scope
This part of IEC 61850 specifies standard techniques for testing of conformance of
implementations, as well as specific measurement techniques to be applied when declaring
performance parameters. The use of these techniques will enhance the ability of the system
integrator to integrate IEDs easily, operate IEDs correctly, and support the applications as
intended.
NOTE 1 The role of the test facilities for conformance testing and certifying the results are beyond the scope of
this part of IEC 61850.
NOTE 2 The test approach and test system design to test a client device is likely to be different across the broad
range of clients. There are many possibilities to test clients. The client tests are beyond the scope of this part of
IEC 61850. It is intended to define client test requirements during the maintenance of this part.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 61850-2, Communication networks and systems in substations – Part 2: Glossary
IEC 61850-4, Communication networks and systems in substations – Part 4: System and
project management
IEC 61850-5, Communication networks and systems in substations – Part 5: Communication
requirements for functions and device models
IEC 61850-6, Communication networks and systems in substations – Part 6: Configuration
description language for communication in electrical substations related to IEDs
IEC 61850-7-1, Communication networks and systems in substations – Part 7-1: Basic
communication structure for substation and feeder equipment – Principles and models
IEC 61850-7-2 , Communication networks and systems in substations – Part 7-2: Basic
communication structure for substation and feeder equipment – Abstract communication
service interface (ACSI)
IEC 61850-7-3 , Communication networks and systems in substations – Part 7-3: Basic
communication structure for substation and feeder equipment – Common data classes
IEC 61850-7-4 , Communication networks and systems in substations – Part 7-4: Basic
communication structure for substation and feeder equipment – Compatible logical node
classes and data classes
IEC 61850-8-1, Communication networks and systems in substations – Part 8-1: Specific
communication service mapping (SCSM) – Mappings to MMS (ISO 9506-1 and ISO 9506-2)
and to ISO/IEC 8802-3
– 8 – 61850-10 IEC:2005(E)
IEC 61850-9-1, Communication networks and systems in substations – Part 9-1: Specific
Communication Service Mapping (SCSM) – Sampled values over serial unidirectional
multidrop point to point link
IEC 61850-9-2, Communication networks and systems in substations – Part 9-2: Specific
Communication Service Mapping (SCSM) – Sampled values over ISO/IEC 8802-3
ISO/IEC 9646-1, Information technology – Open Systems Interconnection – Conformance
testing methodology and framework – Part 1: General concepts
ISO/IEC 9646-2, Information technology – Open Systems Interconnection – Conformance
testing methodology and framework – Part 2: Abstract test suite specification
ISO/IEC 9646-4, Information technology – Open Systems Interconnection – Conformance
testing methodology and framework – Part 4: Test realization
ISO/IEC 9646-5, Information technology – Open Systems Interconnection – Conformance
testing methodology and framework – Part 5: Requirements on test laboratories and clients
for the conformance assessment process
ISO/IEC 9646-6, Information technology – Open Systems Interconnection – Conformance
testing methodology and framework – Part 6: Protocol profile test specification
3 Terms and definitions
For the purpose of this document, the terms and definitions provided in IEC 61850-2 as well
as the following definitions apply.
3.1
Factory Acceptance Test
FAT
customer agreed functional tests of the specifically manufactured substation automation
system or its parts using the parameter set for the planned application as specified in a
specific customer specification. The FAT will be carried out in the factory of the manufacturer
or other agreed-upon location by the use of process simulating test equipment.
3.2
hold point
point, defined in the appropriate document beyond which an activity shall not proceed without
the approval of the initiator of the conformance test. The test facility shall provide a written
notice to the initiator at an agreed time prior to the hold point. The initiator or his
representative is obligated to verify the hold point and approve the proceeding of the activity.
3.3
interoperability
ability of two or more IEDs from the same vendor (or different vendors) to exchange
information and use that information for correct co-operation.
A set of values having defined correspondence with the quantities or values of another set.
3.4
Model Implementation Conformance Statement
MICS
details the standard data object model elements supported by the system or device
61850-10 IEC:2005(E) – 9 –
3.5
negative test
test to verify the correct response of a system or a device when subjected to:
– IEC 61850 series conformant information and services which are not implemented in the
system or device under test;
– non IEC 61850 series conformant information and services sent to the system or device
under test
3.6
Protocol Implementation Conformance Statement
PICS
summary of the communication capabilities of the system or device to be tested
3.7
Protocol Implementation eXtra Information for Testing
PIXIT
the Protocol Implementation eXtra Information for Testing document contains system or
device specific information regarding the communication capabilities of the system or device
to be tested and which are outside the scope of the IEC 61850 series. The PIXIT is not
subject to standardisation.
3.8
routine test
performed by the manufacturer in order to ensure device operation and safety
3.9
Site Acceptance Test
SAT
verification of each data and control point and the correct functionality within the SAS and
between the SAS and its operating environment at the whole installed plant by use of the final
parameter set as specified in a specific customer specification. The SAT is the precondition
for the SAS being put into operation.
3.10
system related test
verification of correct behaviour of the IEDs and of the overall SAS under specific application
conditions. The system related test is part of the final stage of the development of IEDs as
belonging to a SAS-product family.
3.11
test equipment
all tools and instruments which simulate and verify the input/outputs of the operating
environment of the SAS such as switchgear, transformers, network control centres or
connected telecommunication units on the one side, and the serial links between the IEDs of
the SAS on the other
3.12
test facility
organisation able to provide appropriate test equipment and trained staff for conformance
testing. The management of conformance tests and the resulting information should follow a
quality system.
3.13
type test
verification of correct behaviour of the IEDs of the SAS by use of the system tested software
under the test conditions corresponding with the technical data
– 10 – 61850-10 IEC:2005(E)
The type test marks the final stage of the hardware development and is the precondition for
the start of the production. This test is carried out with IEDs, which have been manufactured
through the normal production cycle.
3.14
witness point
point, defined in the appropriate document at which an inspection will take place on an
activity. The activity may proceed without the approval of the initiator of the conformance test.
The test facility provides a written notice to the initiator at an agreed time prior to the witness
point. The initiator or his representative has the right, but is NOT obligated, to verify the
witness point.
4 Abbreviated terms
ACSI Abstract Communication Service Interface
ASDU Application Service Data Unit
BRCB Buffered Report Control Block
CDC Common Data Class
CT Current Transducer
DTD Document Type Definition
DUT Device Under Test
FAT Factory Acceptance Test
GI General Interrogation
GoCB GOOSE Control Block
GOOSE Generic Object Oriented Substation Events
GSE Generic Substation Event
GSSE Generic Substation Status Event
GsCB GSSE Control Block
HMI Human Machine Interface
ICD IED Capability Description
IED Intelligent Electronic Device
IP Internet Protocol
LCB Log Control Block
LD Logical Device
LN Logical Node
MC MultiCast
MCAA Multicast Application Association
MICS Model Implementation Conformance Statement
MMS Manufacturing Message Specification (ISO 9506 series)
MSVCB Multicast Sampled Value Control Block
PICS Protocol Implementation Conformance Statement
PIXIT Protocol Implementation eXtra Information for Testing
RTU Remote Terminal Unit
SAS Substation Automation System
61850-10 IEC:2005(E) – 11 –
SAT Site Acceptance Test
SAV Sampled Analogue Value (IEC 61850-9 series)
SCADA Supervisory Control And Data Acquisition
SCD Substation Configuration Description.
SCL Substation Configuration Language
SCSM Specific Communication Service Mapping
SGCB Setting Group Control Block
SoE Sequence-of-Events
SSD System Specification Description
SUT System Under Test
SV Sampled Values
SVC Sampled Value Control
TCP Transport Control Protocol
TPAA Two Party Application Association
URCB Unbuffered Report Control Block
USVCB Unicast Sampled Value Control Block
UTC Coordinated Universal Time
VT Voltage Transducer
XML eXtensible Markup Language
5 Introduction to conformance testing
5.1 General
There are many steps involved from the development and production of a device to the proper
running of a complete system designed according the specific needs of a customer. Suitable
test steps are incorporated in this process.
The quality system of the producer/supplier forms the basis of reliable testing in development
and production activities.
Many internal tests during the development of a device (or a system kit) result in a type test
(unit level test) performed at least by the provider and – if required by applicable standards –
by an independent test authority. In the context of this document, the term type test is
restricted to the functional behaviour of the device.
Continuing routine tests in the production chain are necessary to ensure a constant quality of
delivered devices in accordance with the quality procedures of the producer.
A conformance test is the type test for communication and – since communication establishes
a system – the system related test of the incorporated IEDs. As a global communications
standard, the IEC 61850 series includes standardised conformance tests to ensure that all
suppliers comply with applicable requirements.
– 12 – 61850-10 IEC:2005(E)
Type tests and conformance tests do not completely guarantee that all functional and
performance requirements are met. However, when properly performed, such tests
significantly reduce the risk of costly problems occurring during system integration in the
factory and on-site.
Conformance testing does not replace project specific system related tests such as the FAT
and SAT. The FAT and SAT are based on specific customer requirements for a dedicated
substation automation system and are done by the system integrator and normally witnessed
by the customer. These tests increase the confidence level that all potential problems in the
system have been identified and solved. These tests establish that the delivered substation
automation system is performing as specified.
5.2 Conformance test procedures
In general, conformance testing of the communication behaviour of an IED should address the
functional requirements and performance requirements of typical applications supported by
these devices in a SAS. IEC 61850-4 defines a general classification of quality tests, which
are used within this part.
Conformance testing demonstrates the capability of the DUT to operate with other IEDs in a
specified way according to the IEC 61850 series.
Conformance testing requires consideration of the following issues:
– The problem of all testing is the completeness of the tests. The number of all possible
situations can be very large. It may be possible to cover all normal operating cases, but
this may not be true for all failure cases.
– It is impossible to test all system configurations using IEDs from different world-wide
suppliers. Therefore, a standardised test architecture with device simulators should be
used. The use of such a test architecture implies agreement about its configuration and
the test procedures applied in order to achieve compatible and reproducible results.
– A communication standard does not standardise the functions of the communicating
equipment. Therefore, the failure modes of the functions are outside the scope of this part
of the IEC 61850 series. But both, the existence of distributed functions and the impact of
function response in devices on the data flow, create some interdependence.
– Depending on the definition range of the standard, some properties of the device may be
proven by information and documents provided with the DUT for the conformance testing
instead of the conformance test itself.
The conformance test establishes that the communication of the DUT works according the
IEC 61850 series. The IEC 61850 series is focussed on interoperability using data, function
and device models including all services above or at the application level (ACSI). In addition,
performance classes are addressed.
Since the IEC 61850 series defines no new communication stacks, the conformance to all
seven ISO/OSI layers may be proven by documentation that communication stack software
compliant with the corresponding specifications is implemented and may have been pre-
tested and optionally certified. In the standard conformance test, only the application
according to ACSI can be tested.
5.3 Quality assurance and testing
5.3.1 General
In order to assure the quality during conformance testing, a quality assurance system has to
be in place. This shall be clearly demonstrated by the test facility. This applies to the quality
systems of all sub-suppliers.
61850-10 IEC:2005(E) – 13 –
In general, quality surveillance is used to monitor and verify the status of components during
all phases of the conformance tests. For this purpose, inspections are carried out, based on
hold and witness points that are indicated by the initiator or its representative in the test and
the inspection plan that is supplied by the test facility. These inspections are process-related
and will provide information and confidence on the quality of the tests. Quality surveillance
will reduce the risks of failure during the FAT and SAT.
5.3.2 Quality plan
5.3.2.1 Conformance test quality plan
The test facility will supply, for evaluation, a quality plan for the conformance test.
The conformance test quality plan shall meet the requirements of ISO 9001. The plan shall
describe all measures for the scope of work and/or deliveries in the areas of budget,
organisation, time, information and quality. There is only one plan for the test facility and its
sub-suppliers.
The conformance test quality plan shall also contain the following:
– A complete and detailed description of the work methods. This will help ensure that all
verifiable activities will fulfil all applicable requirements and conditions as stated in the
scope of work during the time allowed.
– A detailed description of all tasks to be performed, including references to the schedule,
an overview of the involved staff, materials and work methods as well as relevant methods
and procedures.
– A detailed description of the organisation, including the assignments, tasks and
responsibilities of mentioned staff during the different stages of the test programs. The
description shall include all tests, inspections, research and audits during the various
stages of the tests and the dates on which they will take place. These descriptions will be
part of the test and inspection plan.
– A method for handling deviations, changes and modifications during all stages of the test.
– A sign off procedure and a description of the documentation to be supplied.
5.3.2.2 Test and inspection plan
The conformance test quality plan shall contain a test and inspection plan. In this plan, the
test facility specifies, for all phases of the tests:
– what will be inspected, tested and registered;
– the purpose of the inspections and tests;
– the procedures and standards to which inspections, tests and registrations will be
performed;
– the expected results of the inspections and tests;
– by whom the inspections, tests and registrations will be performed.
The test facility is responsible for the correct and timely performance of all activities
mentioned in the test and inspection plan.
The test facility shall provide a proposal for so-called hold, witness and review points in the
test and inspection plan.
– 14 – 61850-10 IEC:2005(E)
There are several methods to perform a hold or witness point. The initiator of the
conformance test or a representative can be present during the execution of a test or
inspection. It is also possible to review the associated quality documents, e.g. checklists,
verification and validation documents. This review can take place at the test facility’s site
during the execution of a test or inspection can be made at the initiator’s site in which case
the test facility shall provide all relevant documentation to the initiator.
All hold and witness points will be announced by the test facility at least a predefined time
before they take place. A period of at least one week is recommended, depending on the time
needed for making travel arrangements and the availability of the needed resources.
5.3.2.3 Audits requested by initiator
The initiator of a conformance test has the right to conduct audits on the quality system of the
test facility and its sub-suppliers. The test facility shall co-operate and provide access to all
locations applicable for the conformance test. The initiator’s right to check the quality of the
conformance test does not dismiss the test facility from its responsibilities.
Inspections and tests by the initiator of a conformance test shall be possible at mutually
agreeable times at the locations, offices and factories of the test facility and all applicable
third parties and sub-suppliers.
5.4 Testing
5.4.1 General
Conformance testing shall be customised for each device under test based on the capabilities
identified in the PICS, PIXIT and MICS provided by the vendor. When submitting devices for
testing, the following shall be provided:
– device ready for testing;
– Protocol Implementation Conformance Statement (PICS). A standard PICS, also known as
PICS proforma shall be supplied (see IEC 61850-7-2, Annex A);
– Protocol Implementation eXtra Information for Testing (PIXIT) statement;
– Model Implementation Conformance Statement (MICS);
– instruction manuals detailing the installation and operation of the device.
The requirements for conformance testing fall into two categories:
1) Static conformance requirements (define the requirements the implementation shall fulfil);
2) Dynamic conformance requirements (define the requirements that arise from the protocol
used for a certain implementation).
The static and dynamic conformance requirements shall be defined in a Protocol
Implementation Conformance Statement or PICS. The PICS serves three purposes:
1) selection of the appropriate set of tests;
2) ensure that the tests appropriate to a claim of conformance are performed;
3) provide the basis for the review of the static conformance.
A standard PICS shall be supplied.
Concrete PICS shall be as defined for the SCSMs.
61850-10 IEC:2005(E) – 15 –
A Model Implementation Conformance Statement or MICS shall be provided detailing the data
object model elements supported by the system or device. The MICS is implemented in the
file SCD (Substation configuration description) according to IEC 61850-6.
In addition to the PICS, a Protocol Implementation eXtra Information for Testing or PIXIT
document shall be provided.
The process of assessing the conformance is shown in Figure 1.
Start
Static
conformance
requirements
PICS
Static
conformance
Dynamic
review
MICS
conformance
requirements
Conformance
Selection
PIXIT test suite
and para-
meterisation
Dynamic tests
________________________
Basic interconnection testing
Capability testing
Behaviour testing
Analysis of results
Final conformance review
Synthesis and conclusion
Test report production
Control flow
End
Data flow
IEC 598/05
Figure 1 – Conceptual conformance assessment process
– 16 – 61850-10 IEC:2005(E)
5.4.2 Use of SCL files
The DUT shall be delivered with an ICD file.
The test entity shall generate from the ICD file, the corresponding SCD file based on the
configuration of the test system. If the test entity requires that the initiator of a conformance
test also provides the SCD file, then the test entity shall provide the SSD file and the SCD file
of the test system.
5.4.3 Device testing
A single device shall be conformance tested against a single test device.
NOTE The device test may require a base load generator. The definition of base load is beyond the scope of this
part of the IEC 61850 series. The use of priorities according to IEC 61850-8-1 and IEC 61850-9-2 mitigates the use
of base load simulation for time critical information exchange like for GSE and sampled value exchange.
The device-specific conformance tests contain the positive and negative testing of the
following, as appropriate:
– inspection of the documentation and version control of the device (IEC 61850-4);
– test of device configuration file against standardised syntax (schema) (IEC 61850-6);
– test of device configuration file against the device related object model (IEC 61850-7-4,
IEC 61850-7-3);
– test of communication stack implementation against applicable SCSM (IEC 61850-8-1,
IEC 61850-9-1, and IEC 61850-9-2);
– test of implemented ACSI services against ACSI definition (IEC 61850-7-2);
– test of device specific extensions according to rules given by the IEC 61850 series in
general.
5.5 Documentation of conformance test report
A conformance test report shall include the following information:
– A reference list of all documents that describe or specify any qualifying tests that have
been performed. These documents may include the vendor's standard operating and
testing procedures, and local, national and international standards. International standards
shall be cited by document number, date, clause and subclauses. References to other
documents shall include a complete source address and document identification. A
complete and contextually accurate summary or extract of the document may be included
for convenience.
– A list of any specialised test equipment or computer programs used for performing the
conformance tests.
– Name and address of the vendor.
– Name and address of the initiator of the conformance test (if different from vendor name).
– Name of the tested device.
– All of the variants (hardware, firmware, etc.) of the tested device.
– Name and address of the test facility.
– Date of issue of the test report.
– Name and signature of the tester.
– Unique reference number.
– A list of test items performed to verify conformance.
– Comments and problems found.
61850-10 IEC:2005(E) – 17 –
– For each test item, the following subjects shall be documented:
• description of the test item with the objective of the test, the procedure how to perform
the test and the expected result;
• reference to the IEC 61850 series Part, Clause and Subclause;
• unique identifier per test item;
• test result: Passed, Failed, Inconclusive, Not applicable or = not tested;
• comparison of the test result to the expected result.
Changes or alterations to the device made at any point in the test, particularly those made to
correct a test deficiency, shall be completely described. The consequences and requirements
of re-testing of a server device – if required – shall be specified in corresponding test plans
and test reports.
Conformance test documentation shall be supplied to the
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