IEC 62024-1:2008

IEC 62024-1
Edition 2.0 2008-02
INTERNATIONAL
STANDARD
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor

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IEC 62024-1
Edition 2.0 2008-02
INTERNATIONAL
STANDARD
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 29.100.10 ISBN 2-8318-9631-2

– 2 – 62024-1 © IEC:2008(E)
CONTENTS
FOREWORD.4

1 Scope.6

2 Normative references .6

3 Inductance, Q-factor and impedance .6

3.1 Inductance .6

3.1.1 Measuring circuit .7

3.1.2 Mounting of the inductor to the test fixture .7
3.1.3 Measurement method and calculation.9
3.1.4 Notes on measurement.9
3.2 Quality factor.10
3.2.1 Measurement method .10
3.2.2 Measurement circuit .11
3.2.3 Mounting of the inductor .11
3.2.4 Methods of measurement and calculation .11
3.2.5 Notes on measurement.11
3.3 Impedance .11
3.3.1 Measurement method .11
3.3.2 Measurement circuit .11
3.3.3 Measurement method and calculation.11
3.3.4 Notes on measurement.12
4 Resonance frequency.12
4.1 Self-resonance frequency.12
4.2 Minimum output method .12
4.2.1 Measurement circuit .12
4.2.2 Mounting the inductor for test .13
4.2.3 Measuring method .13
4.2.4 Note on measurement .14
4.3 Reflection method .14
4.3.1 Measurement circuit .14
4.3.2 Mounting the inductor for test .14
4.3.3 Measurement method .15
4.3.4 Notes on measurement.15

4.4 Measurement by analyser.16
4.4.1 Measurement by impedance analyser.16
4.4.2 Measurement by network analyser.16
5 DC resistance.16
5.1 Measuring circuit (Bridge method) .16
5.2 Measuring method and calculation formula.17
5.3 Precaution for measurement.17
5.4 Measuring temperature.18

Annex A (normative) Mounting method for a surface mounting coil .19

Figure 1 – Example of circuit for vector voltage/current method .7
Figure 2 – Fixture A .8

62024-1 © IEC:2008(E) – 3 –
Figure 3 – Fixture B .8

Figure 4 – Short device shape .10

Figure 5 – Example of test circuit for the minimum output method.12

Figure 6 – Self-resonance frequency test board (minimum output method) .13

Figure 7 – Example of test circuit for the reflection method .14

Figure 8 – Self-resonance frequency test board (reflection method).15

Figure 9 – Suitable test fixture for measuring self-resonance frequency.16

Figure 10 – Example of measuring circuit of d.c. resistance.17

Table 1 – Dimensions of l and d.8
Table 2 – Short device dimensions and inductances .10

– 4 – 62024-1 © IEC:2008(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
HIGH FREQUENCY INDUCTIVE COMPONENTS –

ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –

Part 1: Nanohenry range chip inductor

FOREWORD
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International Standard IEC 62024-1 has been prepared by IEC technical committee 51:
Magnetic components and ferrite materials.
This second edition cancels and replaces the first edition published in 2002. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) sizes 0402 added in Table 1 and Table 2;
b) contents of 4.4 reviewed for easier understanding;
c) correct errors in 3.1.4.2.
62024-1 © IEC:2008(E) – 5 –
The text of this standard is based on the following documents:

FDIS Report on voting
51/908/FDIS 51/915/RVD
Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts of IEC 62024 series, published under the general title High frequency

inductive components – Electrical characteristics and measuring methods, can be found on
the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
The contents of the corrigendum of July 2008 have been included in this copy.

– 6 – 62024-1 © IEC:2008(E)
HIGH FREQUENCY INDUCTIVE COMPONENTS –

ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –

Part 1: Nanohenry range chip inductor

1 Scope
This part of IEC 62024 specifies electrical characteristics and measuring methods for the
nanohenry range chip inductor that is normally used in high frequency (over 100 kHz) range.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendm
...