Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase

IEC 61000-4-34:2005+A1:2009 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current exceeding 16 A per phase. It covers equipment installed in residential areas as well as industrial machinery, specifically voltage dips and short interruptions for equipment connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. It has the status of a Basic EMC Publication in accordance with IEC Guide 107. This consolidated version consists of the first edition (2005) and its amendment 1 (2009). Therefore, no need to order amendment in addition to this publication.

Compatibilité électromagnétique (CEM) - Partie 4-34: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension pour matériel ayant un courant d'alimentation de plus de 16 A par phase

La CEI 61000-4-34:2005+A1:2009 définit les méthodes d'essai d'immunité ainsi que la gamme des niveaux d'essais préférés pour les matériels électriques et électroniques connectés à des réseaux d'alimentation basse tension pour les creux de tension, les coupures brèves et les variations de tension. La présente norme s'applique aux matériels électriques et électroniques dont le courant nominal d'entrée dépasse 16 A par phase. Elle s'applique aux matériels installés dans des environnements résidentiels de même qu'aux matériels industriels, pour l'aspect creux de tension et coupures brèves des équipements, monophasés et triphasés, reliés à des réseaux électriques alternatif de 50 Hz ou 60 Hz. Le but de cette norme est d'établir une référence commune pour l'évaluation de l'immunité fonctionnelle des matériels électriques et électroniques soumis à des creux de tension, à des coupures brèves et à des variations de tension. La méthode d'essai décrite dans la présente partie de la CEI 61000 détaille une méthode sans faille pour estimer l'immunité d'un matériel ou d'un système à un phénomène prédéfini. Elle a le statut de publication fondamentale en CEM conformément au Guide 107 de la CEI.  Cette version consolidée comprend la première édition (2005) et son amendement 1 (2009). Il n'est donc pas nécessaire de commander l'amendement avec cette publication.

General Information

Status
Published
Publication Date
25-Nov-2009
Current Stage
PPUB - Publication issued
Start Date
26-Nov-2009
Completion Date
26-Nov-2009
Ref Project
Standard
IEC 61000-4-34:2005+AMD1:2009 CSV - Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase
English and French language
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IEC 61000-4-34 ®
Edition 1.1 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-34: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with mains
current more than 16 A per phase

Compatibilité électromagnétique (CEM) –
Partie 4-34: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension pour matériel ayant un
courant d’alimentation de plus de 16 A par phase
IEC 61000-4-34:2005+A1:2009
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IEC 61000-4-34 ®
Edition 1.1 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-34: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with mains
current more than 16 A per phase

Compatibilité électromagnétique (CEM) –
Partie 4-34: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension pour matériel ayant un
courant d’alimentation de plus de 16 A par phase

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CG
CODE PRIX
ICS 33.100.20 ISBN 2-8318-1049-2
– 2 – 61000-4-34  IEC:2005+A1:2009
CONTENTS
FOREWORD. 4
INTRODUCTION . 6

1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 General . 9
5 Test levels . 9
5.1 Voltage dips and short interruptions . 10
5.2 Voltage variations (optional) . 11
6 Test instrumentation . 13
6.1 Test generator . 13
6.2 Power source . 14
7 Test set-up . 14
8 Test procedures . 14
8.1 Laboratory reference conditions . 15
8.2 Execution of the test . 15
9 Evaluation of test results . 18
10 Test report . 18

Annex A (normative) Test generator current drive capability . 19
Annex B (informative) Electromagnetic environment classes . 21
Annex C (informative) Vectors for three-phase testing . 22
Annex D (informative) Test instrumentation . 28
Annex E (informative) Dip immunity tests for equipment with large mains current . 31

Bibliography . 33

Figure 1 – Voltage dip – 70 % voltage dip sine wave graph . 12
Figure 2 – Voltage variation . 12
Figure 3a – Phase-to-neutral testing on three-phase systems . 17
Figure 3b – Phase-to-phase testing on three-phase systems – Acceptable Method 1
phase shift . 17
Figure 3c – Phase-to-phase testing on three-phase systems – Acceptable Method 2
phase shift . 17
Figure 3d – Not acceptable – phase-to-phase testing without phase shift . 17
Figure A.1 – Circuit for determining inrush current drive capability . 20
Figure C.1 – Phase-to-neutral dip vectors . 22
Figure C.2 – Acceptable Method 1 – phase-to-phase dip vectors . 24
Figure C.3 – Acceptable Method 2 – phase-to-phase dip vectors . 26
Figure D.1 – Schematic of example test instrumentation for voltage dips and short
interruptions using tapped transformer and switches . 28

61000-4-34  IEC:2005+A1:2009 – 3 –
Figure D.2 – Applying the example test instrumentation of Figure D.1 to create
the Acceptable Method 1 vectors of Figures C.1, C.2, 4a and 4b . 29
Figure D.3 – Schematic of example test instrumentation for three-phase voltage dips,
short interruptions and voltage variations using power amplifier . 30

Table 1 – Preferred test level and durations for voltage dips . 10
Table 2 – Preferred test level and durations for short interruptions . 11
Table 3 – Timing of short-term supply voltage variations . 11
Table 4 – Generator specifications . 13
Table A.1 – Minimum peak inrush current capability . 19
Table C.1 – Vector values for phase-to-neutral dips . 23
Table C.2 – Acceptable Method 1 – vector values for phase-to-phase dips . 25
Table C.3 – Acceptable Method 2 – vector values for phase-to-phase dips . 27

– 4 – 61000-4-34  IEC:2005+A1:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-34: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity tests
for equipment with mains current more than 16 A per phase

FOREWORD
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