IEC 62149-3:2014

IEC 62149-3 ®
Edition 2.0 2014-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fibre optic active components and devices – Performance standards –
Part 3: Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s
fibre optic transmission systems

Composants et dispositifs actifs à fibres optiques – Normes de performances –
Partie 3: Emetteurs à diodes laser à modulateur intégré pour des systèmes de
transmission à fibres optiques de 2,5 Gbit/s à 40 Gbit/s

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IEC 62149-3 ®
Edition 2.0 2014-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fibre optic active components and devices – Performance standards –

Part 3: Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s

fibre optic transmission systems

Composants et dispositifs actifs à fibres optiques – Normes de performances –

Partie 3: Emetteurs à diodes laser à modulateur intégré pour des systèmes de

transmission à fibres optiques de 2,5 Gbit/s à 40 Gbit/s

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX N
ICS 33.180.20 ISBN 978-2-8322-1585-2

– 2 – IEC 62149-3:2014 © IEC 2014
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms, definitions and symbols . 7
3.1 Terms and definitions. 7
3.2 Symbols . 7
4 Product parameters . 7
4.1 Absolute limiting ratings . 7
4.2 Operating environment . 8
4.3 Functional specification . 8
4.4 Diagrams . 10
5 Testing . 10
5.1 General . 10
5.2 Characterization testing . 10
5.3 Performance testing . 11
6 Environmental specifications . 13
6.1 General safety . 13
6.2 Laser safety . 13
Bibliography . 14

Figure 1 – Schematic diagram . 10

Table 1 – Absolute limiting ratings . 8
Table 2 – Operating environment . 8
Table 3 – Operating conditions for functional specification . 8
Table 4 – Functional specification . 9
Table 5 – Characterization tests . 11
Table 6 – Performance test plan . 12
Table 7 – Recommended performance test failure criteria . 13

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES –
PERFORMANCE STANDARDS –
Part 3: Modulator-integrated laser diode transmitters
for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62149-3 has been prepared by subcommittee 86C: Fibre optic
systems and active devices, of IEC technical committee 86: Fibre optics
This second edition cancels and replaces the first edition published in 2004 and constitutes a
technical revision.
The significant technical change with respect to the previous edition is as follows:
The performance standards covered by this standard are now extended to a 40 Gb/s-class
system from their original 2,5 Gb/s.

– 4 – IEC 62149-3:2014 © IEC 2014
The text of this standard is based on the following documents:
CDV Report on voting
86C/1157/CDV 86C/1230/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 62149 series, published under the general title Fibre optic active
components and devices – Performance standards, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
INTRODUCTION
Fibre optic transmitters are used to convert electrical signals into optical signals. This part of
IEC 62149 covers the performance standard for optical modulators monolithically integrated
with laser diodes for 2,5 Gbit/s to 40 Gbit/s multi-channel optical telecommunication systems.

– 6 – IEC 62149-3:2014 © IEC 2014
FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES –
PERFORMANCE STANDARDS –
Part 3: Modulator-integrated laser diode transmitters
for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems

1 Scope
This part of IEC 62149 covers the performance specification for optical modulators
monolithically integrated with laser diodes for 2,5 Gbit/s to 40 Gbit/s multi-channel fibre optic
transmission systems. This performance standard contains a definition of the product
performance requirements together with a series of sets of tests and measurements with clearly
defined conditions, severities and pass/fail criteria. The tests are intended to be run as an initial
design verification to prove any product’s ability to satisfy the performance standard’s
requirements. This standard is only applicable for on-off keying format.
A product that has been shown to meet all the requirements of a performance standard can be
declared as complying with the performance standard, but should then be controlled by a quality
assurance program.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
IEC 60068-2-1, Environmental testing – Part 2: Tests – Tests A: Cold
IEC 60068-2-2, Basic environmental testing procedures – Part 2: Tests – Tests B: Dry heat
IEC 60068-2-6, Environmental testing – Part 2: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-14, Basic environmental testing procedures – Part 2: Tests – Test N: Change of
temperature
IEC 60068-2-27, Basic environmental testing procedures – Part 2: Tests – Test Ea and guidance:
Shock
IEC 60068-2-78, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat, steady state
IEC 60749-7, Semiconductor devices – Mechanical and climatic test methods – Part 7: Internal
moisture content measurement and the analysis of other residual gases
IEC 60749-26, Semiconductor devices – Mechanical and climatic test methods – Part 26:
Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)
IEC 60825-1, Safety of laser products – Part 1: Equipment classification and requirements
IEC 60950-1, Information technology equipment – Safety – Part 1: General requirements

IEC 62007-1, Semiconductor optoelectronic devices for fibre optic system applications – Part 1:
Specification template for essential ratings and characteristics
ITU-T Recommendation G.694.1: Spectral grids for WDM applications: DWDM frequency grid
MIL-STD-883, U.S. Department of Defense – Test method standard – Microcircuits
3 Terms, definitions and symbols
3.1 Terms and definitions
For the purposes of this document, terminology concerning physical concepts, types of devices,
general terms and definitions related to ratings and characteristics contained in IEC 62007-1
apply.
3.2 Symbols
X modulation speed in Gbit/s
PD photodiode
T laser sub-mount temperature
LD
T shortening of symbol T
s sub
V forward modulation voltage
fm
V reverse modulation voltage
rm
V reverse modulation centre voltage
rmc
V peak-to-peak modulation voltage
rmpp
T submount temperature
sub
4 Product parameters
4.1 Absolute limiting ratings
Absolute limiting (maximum and/or minimum) ratings given in Table 1 imply that no catastrophic
damage will occur if the product is subject to these ratings for short periods, provided each
limiting parameter is in isolation and all other parameters have values within the normal
performance parameters. It should not be assumed that limiting values of more than one
parameter can be applied at any one time.

– 8 – IEC 62149-3:2014 © IEC 2014
Table 1 – Absolute limiting ratings
Parameter Symbol Minimum Maximum Unit
Operating case temperature T 0 °C
+70
case
(at the bottom of the case)
Storage temperature T –40 °C
+85
stg
Soldering temperature T 260/10 °C/s
sid
(minimum distance to case specified)
Laser diode
Reverse voltage V 2 V
R(LD)
Continuous forward current I 200 mA
F(LD)
Continuous radiant power φ 10 mW
e
Photodiode
Reverse voltage V 10 V
R(PD)
Forward current I 1 mA
F(PD)
Modulator
Reverse modulation voltage V 5 V
Rm
Forward modulation voltage V 1 V
Fm
Thermal electric cooler
Cooler current under cooling and heating I 1,5 A
P
Cooler voltage under cooling and heating V 2,5 V
P
4.2 Operating environment
The operating environment is indicated in Table 2.
Table 2 – Operating environment
Value
Parameter Symbol Unit
Minimum Maximum
Operating case temperature T 0 70 °C
case
4.3 Functional specification
Functional specification shall be within the limit specified in Table 4 at the operating conditions
specified in Table 3.
Table 3 – Operating conditions for functional specification
Value
Parameter Symbol Unit
Minimum Maximum
Laser operating current I 50 200 mA
op
Laser operating temperature T 15 35 °C
op
Reverse modulation centre voltage V 0,5 1,5 V
rmc
Peak to peak modulation voltage V 2 3 V
rmpp
NOTE Operating conditions are adjusted to match ITU-T Recommendation G.694.1 wavelength within the above
specified limit.
Table 4 – Functional specification
Characteristics and conditions at T = T , I = I Value
LD op F(LD) op
Reverse modulation voltage (V ) = 0 V, unless Symbol Unit
rm
Minimum Maximum
otherwise stated
Laser and modulator diode
X
Modulation speed 2,5 43,02 Gbit/s
V
Forward voltage at specified φ or I 2,2 V
F(LD)
e op
Threshold current I 50 mA
(TH)
Radiant power at specified I 0,5 mW
φ
op
e
Kink free radiant power φ 0,6 mW
e
ER 8,2 dB
Extinction ratio at specified φ or I
e op
a
(under modulated conditions)
Peak emission wavelength at specified φ or I λ nm
e op P b b
a, b
(under modulated conditions)
Side-mode suppression ratio at specified φ or I SMSR 30 dB
e op
a
(under modulated conditions)
a
Rise time t 600/X ps
Switching times at specified φ or I
r
e op
(under modulated conditions)
a
Fall time t 600/X ps
f
S 6,0 dB
RF return loss at specified φ or I
e op
V = 1/2 V , f = X GHz, 50 Ω termination
rm rmpp
Transmission penalty due to dispersion at specified φ or Pe 2 dB
e
a
I , under modulated conditions and specified fibre length
op
Monitor photodiode
I 10 nA
Dark current at φ = 0 and specified V
DARK
e R(PD)
Monitor current at specified φ or I and V I 50 2 000 µA
e op R(PD) M
Tracking error between operating temperature range with
TE 0,5 dB
reference at 25 °C at specified φ or I and V specified
e op R(PD)
Thermal sensor
Resistance at specified sensor current R 9,5 10,5
kΩ
s
a
Thermister constant, B B 3 300 3 950 K
Thermal electric cooler
I
Cooler current at ∆T = T – T and  1,5 A
p
case(max) LD
∆T = T –T at specified φ or I
LD case(min) op
Cooler voltage at ∆T = T – T and V 2,5 V
case(max) LD p
∆T = T – T at specified φ or I
LD case(min) op
a 23
Definition and condition according to ITU-T G.957, PRBS 2 – 1 , V = V ± 1/2 V .
rm rmc
rmpp
b
According to ITU-T Recommendation G.694.1.
c
B = ln(R/R )/1/T-1/T ) where R is the resistance at ambient temperature T (° K) and R is the resistance at ambient
0 0 0
temperature T (° K).
– 10 – IEC 62149-3:2014 © IEC 2014
4.4 Diagrams
Figure 1 provides a representative example of a schematic diagram.
PD anode Case ground
DC bias
Thermistor Monitor
PD
Laser
EA modulator
Cooler
PD cathode
Case ground RF input
IEC  1398/14
Figure 1 – Schematic diagram
5 Testing
5.1 General
Initial characterization and qualification shall be undertaken when a build standard has been
completed and frozen. Qualification maintenance is carried using periodic testing programs.
Test conditions for all tests unless otherwise stated are 25 °C ± 2 °C
5.2 Characterization testing
Characterization shall be carried out on at least 20 transmitters, taken from at least three
different manufacturing lots. The test conditions are detailed in Table 5.

Table 5 – Characterization tests
Characteristics and conditions at T = T , I = I Value
LD F(LD)
op op
Reverse modulation voltage(V ) = 0V, Symbol Unit
rm
Minimum Maximum
unless otherwise stated
Laser and modulator diode
X
Modulation speed 2,5 43,02 Gbit/s
Forward voltage at specified φ or I V 2,2 V
e op F(LD)
Threshold current I 50 mA
(TH)
Radiant power at specified I 0,5 mW
φ
op
e
Kink free radiant power φ 0,6 mW
e
Extinction ratio at specified I or I
op op
ER 8,2 dB
a
(under modulated conditions)
Peak emission wavelength at specified φ or I
e op b b
nm
λ
a, b P
(under modulated conditions)
Side-mode suppression ratio at specified φ or I
e op
SMSR 30 dB
a
(under modulated conditions)
a
Switching times at specified φ or I Rise time t 600/X ps
e op r
(under modulated conditions)
a
Fall time t 600/X ps
f
RF return loss at specified φ or I
e op
S 6,0 dB
V = 1/2V , f = X GHz, 50 Ω termination
rm rmpp
Transmission penalty due to dispersion at specified φ or
e
Pe 2 dB
a
I , under modulated condition and specified fibre length
op
Monitor photodiode
Dark current at φ = 0 and specified V I 10 nA
e R(PD) DARK
I
Monitor current at specified φ or I and V 50 2 000 µA
e op R(PD) M
Tracking error between operating temperature range with
TE 0,5 dB
reference at 25 °C at specified φ or I and V
e op R(PD)
specified
Thermal sensor
Resistance at specified sensor current R 9,5 10,5 kΩ
s
c
Thermister B constant B 3 300 3 950 K
Thermal electric cooler
Cooler current at ∆T = T – T and
case(max) LD
I 1,5 A
p
–T at specified φ or I
∆T = T
LD case(min) op
Cooler voltage at ∆T = T – T and
case(max) LD
V 2,5 V
p
∆T = T –T at specified φ or I
LD case(min) op
Manufacturing lot shall be specified by each vendor.
a 23
Definition and conditions according to ITU-T G.957, PRBS 2 – 1 , V = V ± ½ V .
rm rmc Rmpp
b
According to ITU-T Recommendation G.694.1.
c
B = ln(R/R )/1/T-1/T ) where R is the resistance at ambient temperature T (°K) and R is the resistance at ambient
0 0 0
temperature T (°K).
5.3 Performance testing
Performance testing is undertaken when characterization testing is complete. See Table 6 for
the performance test plan and Table 7 for recommended performance test failure criteria.

– 12 – IEC 62149-3:2014 © IEC 2014
Table 6 – Performance test plan
Test Reference Conditions Sample size
Endurance tests of module:
High temperature storage IEC 60068-2-2 Temperature: T = T max.
stg
b
Duration: > 2 000 h
Temperature: T = T min.
Low temperature storage IEC 60068-2-1 11
stg
b
Duration: > 2 000 h
Temperature cycling IEC 60068-2-14 Temperature: 11
T = T min.
A stg
T = T max.
B stg
Number of cycles = 100
Damp heat IEC 60068-2-78 T = 40 °C, RH = 95 %, 56 days 11
Cyclic moisture resistance MIL-STD-883H 11
Method 1004
Endurance test of laser IEC 60068-2-14 Temperature: at least two test
diode on submount temperatures:
φ specified, constant power
e
c
T 1 = T max. By agreement
sub sub
c
2 = < (T 1 – 20 °C) By agreement
T
sub sub
b
Duration: >5 000 h
Endurance test of IEC 60068-2-14 Temperature: at least two test
photodiode in temperatures:
representative package V or I specified
R R
a c
T 1 = 125 °C min. By agreement
sub
c
T 2 = < (T 1 – 30 °C) By agreement
sub s
Duration: >1 000 h
Power cycle tests of the Number of cycles: 20 K 11
thermoelectric cooler
T = T
CASE
op max
T = T to
sub CASE
(T – ∆T )
CASE max
High temperature storage MIL-STD-883H
T = T of the sensor 25
stg max
of the thermal sensor Method 1008
Fibre pull 1 kg, 5 s, 3 times 11
Mechanical shock IEC 60068-2-27 500 G, 1,0 ms 11
5 times/axis
Vibration IEC 60068-2-6 20 G, 20 Hz – 2 000 Hz, 11
4 min/cycle, 4 cycles/axis
Thermal shock IEC 60068-2-14 11
∆T = 100 °C
ESD IEC 60749-26 Human body model 11
–6
Internal moisture IEC 60749-7 11
≤5 000 × 10
a
Or as limited by technology.
b
Provided data about the distribution of wear-out lifetime is accumulated with significant accuracy. Provisional
approval for product shipment shall be granted at 2 000 h. It is also recommended to continue the test until
accurate extrapolation of lifetime is possible with an upper limit of 10 000 h. Duration up to 5 000 h may be
needed for accurate lifetime prediction.
c
The number shall be determined by discussion between the manufacturers and users concerned.

Table 7 – Recommended performance test failure criteria
Device Parameter Failure criterion Measurement condition
a
Laser diode Threshold current or 50 % increase or 25 °C or life test
operating current 10 mA increase if I temperature
(TH)
<20 mA
a
Slope efficiency 10 % change 25 °C or life test
temperature
a
Forward voltage 10 % change 25 °C or life test
temperature
Kinks in L/I curve T , 25 °C, T
Kink-free within 1,2 × P
op min op max
nom
a
(linearity change ≤ 10 %)
b
Wavelength See application 25 °C
a
Photodiode Dark current USL or 10-nA increase 25 °C
a
Laser module Laser threshold or 50 % increase or 25 °C or life test
operating current 10 mA increase if I temperature
(TH)
<20 mA
a
Fibre output power 10 % change Life test temperature
I set to initial value
M
Kinks in L/I curve T , 25 °C, T
Kink-free within 1,2 × P
op min op max
nom
a
(linearity change ≤10 %)
Wavelength See DS and application See detail specification
Tracking ratio T – T
op min op max
(I / P ) at rated power level
M fibre
a
Photodiode dark current USL or 10 nA increase 25 °C
a
Thermistor resistance 5 % change 25 °C or life test
temperature T
sub
a
Peltier cooler current ±10 % change To maintain constant ∆T
during test
a
Peltier cooler voltage
±10 % change
a
Change of pre- and post- test values.
b
Or to be determined by agreement between the manufacturers and users concerned.

6 Environmental specifications
6.1 General safety
All products meeting this standard shall conform
...