IEC 61445:2012

IEC 61445
Edition 1.0 2012-06
™
IEEE Std 1445
INTERNATIONAL
STANDARD
Digital Test Interchange Format (DTIF)

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IEC 61445
Edition 1.0 2012-06
IEEE Std 1445™
INTERNATIONAL
STANDARD
Digital Test Interchange Format (DTIF)

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XD
ICS 25.040; 35.060 ISBN 978-2-83220-105-3


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IEEE Std 1445-1998
Digital Test
Interchange Format (DTIF)
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all
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International Standard IEC 61445/ IEEE Std 1445-1998 has been processed through IEC
technical committee 93: Design automation, under the IEC/IEEE Dual Logo Agreement.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1445-1998 93/321/FDIS 93/328/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The IEC Technical Committee and IEEE Technical Committee have decided that the contents of
this publication will remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication
will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
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IEEE Std 1445-1998
IEEE Std 1445™-1998(R2009)
IEEE Standard for Digital Test
Interchange Format (DTIF)
Sponsor
IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems
Reaffirmed 9 December 2009
Approved 8 December 1998
IEEE-SA Standards Board
Reaffirmed 8 July 2004
Approved 16 November 1999
American National Standards Institute
Abstract: The information content and the data formats for the interchange of digital test program
data between digital automated test program generators (DATPGs) and automatic test equipment
(ATE) for board-level printed circuit assemblies are defined. This information can be broadly
grouped into data that defines the following: UUT Model, Stimulus and Response, Fault Dictionary,
and Probe.
Keywords: automatic test equipment (ATE), digital automated test program generator (DATPG),
digital test interchange format (DTIF), Fault Dictionary data
The Institute of Electrical and Electronics Engineers, Inc.
345 East 47th Street, New York, NY 10017-2394, USA
Copyright © 1999 by the Institute of Electrical and Electronics Engineers, Inc.
All rights reserved. Published 10 March 1999. Printed in the United States of America.

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