IEC 60384-11:2008

IEC 60384-11 ®
Edition 3.0 2008-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
QC 300100
Fixed capacitors for use in electronic equipment –
Part 11: Sectional specification – Fixed polyethylene-terephthalate film dielectric
metal foil d.c. capacitors
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 11: Spécification intermédiaire – Condensateurs fixes pour courant
continu à diélectrique en film de polytéréphtalate d'éthylène à armatures en
feuilles métalliques
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IEC 60384-11 ®
Edition 3.0 2008-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
QC 300100
Fixed capacitors for use in electronic equipment –
Part 11: Sectional specification – Fixed polyethylene-terephthalate film dielectric
metal foil d.c. capacitors
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 11: Spécification intermédiaire – Condensateurs fixes pour courant
continu à diélectrique en film de polytéréphtalate d'éthylène à armatures en
feuilles métalliques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX U
ICS 31.060.30 ISBN 978-2-88912-750-4

– 2 – 60384-11  IEC:2008
CONTENTS
FOREWORD . 4

1 General . 6

1.1 Scope . 6

1.2 Object . 6

1.3 Normative references . 6

1.4 Information to be given in a detail specification . 6

1.4.1 Outline drawing and dimensions . 7
1.4.2 Mounting . 7
1.4.3 Ratings and characteristics . 7
1.4.4 Marking . 8
1.5 Terms and definitions . 8
1.6 Marking . 8
2 Preferred ratings and characteristics . 9
2.1 Preferred characteristics . 9
2.1.1 Preferred climatic categories . 9
2.2 Preferred values of ratings . 9
2.2.1 Rated capacitance (C ) . 9
R
2.2.2 Tolerance on rated capacitance . 9
2.2.3 Rated voltage (U ) . 9
R
2.2.4 Category voltage (U ) . 9
C
2.2.5 Rated temperature . 10
3 Quality assessment procedures . 10
3.1 Primary stage of manufacture . 10
3.2 Structurally similar components . 10
3.3 Certified records of released lots . 10
3.4 Qualification approval . 10
3.4.1 Qualification approval on the basis of the fixed sample size
procedure . 10
3.4.2 Tests . 11
3.5 Quality conformance inspection . 16
3.5.1 Formation of inspection lots . 16
3.5.2 Test schedule . 17

3.5.3 Delayed delivery . 17
3.5.4 Assessment levels . 17
4 Test and measurement procedures . 18
4.1 Visual examination and check of dimensions . 18
4.2 Electrical tests . 18
4.2.1 Voltage proof . 18
4.2.2 Capacitance . 18
4.2.3 Tangent of loss angle (tan δ) . 19
4.2.4 Insulation resistance . 19
4.2.5 Characteristics depending on temperature (if required in the detail
specification) . 20
4.3 Robustness of terminations . 21
4.3.1 Initial measurements . 21
4.4 Resistance to soldering heat . 21

60384-11  IEC:2008 – 3 –
4.4.1 Conditions . 21

4.4.2 Final inspection, measurements and requirements . 21

4.5 Solderability . 21

4.6 Rapid change of temperature . 21

4.6.1 Initial measurement . 21

4.6.2 Number of cycles: 5 . 22

4.7 Vibration. 22

4.8 Bump . 22

4.8.1 Initial measurements . 22

4.8.2 Severities . 22

4.8.3 Final inspection, measurements and requirements . 22
4.9 Shock . 22
4.9.1 Initial measurements . 22
4.10 Climatic sequence . 23
4.10.1 Initial measurements . 23
4.10.2 Dry heat . 23
4.10.3 Damp heat, cyclic, Test Db, first cycle . 23
4.10.4 Cold . 23
4.10.5 Low air pressure . 23
4.10.6 Damp heat, cyclic, Test Db, remaining cycles . 24
4.11 Damp heat, steady state . 24
4.11.1 Initial measurements . 24
4.12 Endurance . 24
4.13 Component solvent resistance (if applicable) . 25
4.14 Solvent resistance of the marking (if applicable) . 25

Bibliography . 26

Table 1 – Fixed sample size test plan for qualification approval – Assessment level EZ . 12
Table 2 – Test schedule for qualification approval. 13
Table 3 – Lot-by-lot inspection . 17
Table 4 – Periodic tests . 18
Table 5 – Test voltages. 18
Table 6 – Insulation resistance . 19

Table 7 – Correction factor dependent on test temperature . 20
Table 8 – Characteristics at lower category temperature . 20
Table 9 – Characteristics at upper category temperature . 21
Table 10 – Acceleration and duration of the pulse . 23
Table 11 – Endurance test . 24

– 4 – 60384-11 © IEC:2008
INTERNATIONAL ELECTROTECHNICAL COMMISSION

_______________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 11: Sectional specification –

Fixed polyethylene-terephthalate film

dielectric metal foil d.c. capacitors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 60384-11 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This third edition cancels and replaces the second edition published in 1988 and constitutes a
minor revision related to tables, figures and references.
This bilingual version (2011-11) corresponds to the monolingual English version, published in
2008-02.
The text of this standard is based on the following documents:
CDV Report on voting
40/1839/CDV 40/1864/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

60384-11  IEC:2008 – 5 –
The French version of this standard has not been voted upon.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

The list of all parts of the IEC 60384 series, under the (new) general title Fixed capacitors for

use in electronic equipment, can be found on the IEC web site.

The QC number that appears on the front cover of this publication is the specification number

in the IEC Quality Assessment System for Electronic Components (IECQ).

The committee has decided that the contents of this publication will remain unchanged until

the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 6 – 60384-11  IEC:2008
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 11: Sectional specification –

Fixed polyethylene-terephthalate film

dielectric metal foil d.c. capacitors

1 General
1.1 Scope
This part of IEC 60384 applies to fixed direct current capacitors, for rated voltages not
exceeding 6 300 V, using as dielectric a polyethylene-terephthalate film and electrodes of thin
metal foils. For capacitors with rated voltages exceeding 1 000 V, additional tests and
requirements may be specified in the detail specification.
The capacitors covered by this standard are intended for use in electronic equipment.
NOTE Capacitors for radio interference suppression are not included, but are covered by IEC 60384-14 (see
bibliography).
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1, the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification shall be of equal or higher performance level, because lower performance levels
are not permitted.
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60062, Marking codes for resistors and capacitors
1)
IEC 60063, Preferred number series for resistors and capacitors

IEC 60068-1, Environmental testing – Part 1: General and guidance
IEC 60384-1:1999, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
ISO 3: Preferred numbers – Series of preferred numbers.
1.4 Information to be given in a detail specification
Detail specifications shall be derived from the relevant blank detail specification.
—————————
1)
Second edition (1963) incorporating Amendments 1 (1967) and 2 (1977).

60384-11  IEC:2008 – 7 –
Detail specifications shall not specify requirements inferior to those of the generic, sectional

or blank detail specification. When more severe requirements are included, they shall be

listed in 1.9 of the detail specification and indicated in the test schedules, for example by an

asterisk.
NOTE The information given in 1.4.1 may, for convenience, be presented in tabular form.

The following information shall be given in each detail specification and the values quoted

shall preferably be selected from those given in the appropriate clause of this sectional

specification.
1.4.1 Outline drawing and dimensions

There shall be an illustration of the capacitor as an aid to easy recognition and for comparison
of the capacitor with others. Dimensions and their associated tolerances, which affect
interchangeability and mounting, shall be given in the detail specification. All dimensions shall
preferably be stated in millimetres, however, when the original dimensions are given in inches,
the converted metric dimensions in millimetres shall be added.
Normally the numerical values shall be given for the length of the body, the width and height
of the body and the wire spacing, or for cylindrical types, the body diameter, and the length
and diameter of the terminations. When necessary, for example when a number of items
(capacitance values/voltage ranges) are covered by a detail specification, the dimensions and
their associated tolerances shall be placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitor. When the capacitor is not
designed for use on printed boards, this shall be clearly stated in the detail specification.
1.4.2 Mounting
The detail specification shall specify the method of mounting to be applied for normal use and
for the application of the vibration and the bump or shock tests. The capacitors shall be
mounted by their normal means. The design of the capacitor may be such that special
mounting fixtures are required in its use. In this case the detail specification shall describe the
mounting fixtures and they shall be used in the application of the vibration and bump or shock
tests.
1.4.3 Ratings and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this
specification, together with the following:

1.4.3.1 Rated capacitance range
See 2.2.1.
NOTE When products approved to the detail specification have different ranges, the following statement should
be added: "The range of values available in each voltage range is given in the qualified products list".
1.4.3.2 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.3.3 Soldering
The detail specification shall prescribe the test methods, severities and requirements
applicable for the solderability and the resistance to soldering heat test.

– 8 – 60384-11  IEC:2008
1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the

package. Deviations from 1.6 of this sectional specification, shall be specifically stated.

1.5 Terms and definitions
For the purposes of this document the terms and definitions of IEC 60384-1, as well as the
following apply.
1.5.1
rated voltage (U )
R
maximum d.c. voltage which may be applied continuously to a capacitor at the rated
temperature
NOTE The sum of the d.c. voltage and the peak a.c. voltage applied to the capacitor shall not exceed the rated
voltage. The value of the peak a.c. voltage shall not exceed the following percentages of the rated voltage at the
frequencies stated and shall not be greater than 280 V,
50 Hz 20 %
100 Hz 15 %
1 000 Hz 3 %
10 000 Hz 1 %
unless otherwise specified in the detail specification.
1.6 Marking
See 2.4 of IEC 60384-1, with the following details:
1.6.1 The information given in the marking is normally selected from the following list. The
relative importance of each item is indicated by its position in the list:
a) rated capacitance (in clear or code according to IEC 60062);

b) rated voltage (d.c. voltage may be indicated by the symbol     or );
c) tolerance on rated capacitance;
d) category voltage;
e) year and month (or week) of manufacture;

f) manufacturer's name or trade mark;
g) climatic category;
h) manufacturer's type designation;
i) reference to the detail specification.
1.6.2 The capacitor shall be clearly marked with a), b) and c) above and with as many as
possible of the remaining items as is considered necessary. Any duplication of information in
the marking on the capacitor should be avoided.
1.6.3 The package containing the capacitor(s) shall be clearly marked with all the
information listed in 1.6.1.
1.6.4 Any additional marking shall be so applied that no confusion can arise.

60384-11  IEC:2008 – 9 –
2 Preferred ratings and characteristics

2.1 Preferred characteristics
The values given in detail specifications shall preferably be selected from the following:

2.1.1 Preferred climatic categories

The capacitors covered by this specification are classified into climatic categories according

to the general rules given in IEC 60068-1.

NOTE For the tests in the IEC 60068 series of publications, the editions referenced in the applicable test clauses
of the generic specification are used.
The lower and upper category temperatures and the duration of the damp heat, steady state
test shall be chosen from the following.
Lower category temperature: –55 °C, –40 °C and –25 °C.
Upper category temperature: +85 °C, +100 °C, +105 °C and +125 °C.
Duration of the damp heat, steady state test: 4, 10, 21 and 56 days.
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
2.2 Preferred values of ratings
2.2.1 Rated capacitance (C )
R
Preferred values of rated capacitance are:
1 µF, 1,5 µF, 2,2 µF, 3,3 µF, 4,7 µF and 6,8 µF and their decimal multiples.
These values conform to the E6 series of preferred values given in IEC 60063.
If other values are required they shall preferably be chosen from the E12 series.
2.2.2 Tolerance on rated capacitance
The preferred tolerances on the rated capacitance are ±5 %, ±10 % and ±20 %.

2.2.3 Rated voltage (U )
R
The preferred values of rated voltage are: 40 V, 63 V, 100 V, 160 V and 250 V and their
decimal multiples. These values conform to the basic series of preferred values R5 and R10
given in ISO 3.
2.2.4 Category voltage (U )
C
The category voltage is:
0,8 U for upper category temperature 100 °C and
R
0,75 U for upper category temperature 105 °C and
R
0,5 U for upper category temperature 125 °C.
R
– 10 – 60384-11  IEC:2008
2.2.5 Rated temperature
The standard value of rated temperature is 85 °C.

3 Quality assessment procedures

3.1 Primary stage of manufacture

The primary stage of manufacture is the winding of the capacitor element or the equivalent

operation.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, though they may be of different case sizes and values.
3.3 Certified records of released lots
The information required in 3.5.1 of IEC 60384-1 shall be made available when prescribed in
the detail specification and when requested by a purchaser. After the endurance test the
parameters for which variables information is required are the capacitance change, tan δ and
the insulation resistance.
3.4 Qualification approval
The procedures for qualification approval testing are given in 3.5 of IEC 60384-1.
The schedule to be used for Qualification Approval testing on the basis of lot-by-lot and
periodic tests is given in 3.5. The procedure using a fixed sample size schedule is given in
3.4.1 and 3.4.2 below.
3.4.1 Qualification approval on the basis of the fixed sample size procedure
3.4.1.1 Sampling
The fixed sample size procedure is described in 3.5.3 b) of IEC 60384-1. The sample shall be
representative of the range of capacitors for which approval is sought. This may or may not be
the complete range covered by the detail specification.
The sample shall consist of specimens having the lowest and highest voltages, and for these
voltages the lowest and highest capacitances. When there are more than four rated voltages
an intermediate voltage shall also be tested. Thus, for the approval of a range, testing is

required of either four or six values (capacitance/voltage combinations). When the range
consists of less than four values, the number of specimens to be tested shall be that required
for four values.
Spare specimens are permitted as follows.
a) One per value which may be used to replace the permitted defective in Group 0.
b) One per value which may be used as replacements for specimens which are defective
because of incidents not attributable to the manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so the
numbers may be reduced accordingly.
When additional groups are introduced into the Qualification Approval test schedule, the
number of specimens required for Group 0 shall be increased by the same number as that
required for the additional groups.

60384-11  IEC:2008 – 11 –
Table 1 gives the number of samples to be tested in each group or subgroup together with the

permissible number of defectives for qualification approval tests.

3.4.2 Tests
The complete series of tests specified in Table 1 and Table 2 are required for the approval of

capacitors covered by one detail specification. The tests of each group shall be carried out in

the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other

groups.
Specimens found defective during the tests of Group 0 shall not be used for the other groups.
"One non-conforming item" is counted when a capacitor has not satisfied the whole or a part of
the tests of a group.
The approval is granted when the number of non-conforming items does not exceed the
specified number of permissible non-conforming items for each group or subgroup and the total
number of permissible non-conformances.
NOTE Table 1 and Table 2 together form the fixed sample size test schedule, for which Table 1 includes the
details for the sampling and permissible defectives for the different tests or groups of tests, whereas Table 2
together with the details of test contained in Clause 4 gives a complete summary of test conditions and
performance requirements and indicates where, for example for the test method or conditions of test, a choice has
to be made in the detail specification.
The conditions of test and performance requirements for the fixed sample size test schedule shall be identical to
those prescribed in the detail specification for quality conformance inspection.

– 12 – 60384-11  IEC:2008
Table 1 – Fixed sample size test plan for qualification approval –
Assessment level EZ
Permissible number of
Group Test Subclause of Number of specimens

non-conforming items
this publica-
No.
tion
a
c
n
0 Visual examination 4.1
Dimensions 4.1
Capacitance 4.2.2 108 0
4.2.3
Tangent of loss angle (tan δ)
Voltage proof 4.2.1
Insulation resistance 4.2.4
Spare specimens
1A Robustness of terminations 4.3 12 0
Resistance to soldering heat 4.4
b
Component solvent resistance 4.13

1B Solderability 4.5 12 0
Solvent resistance of the marking 4.14
Rapid change of temperature 4.6
Vibration 4.7
b
Bump or shock 4.8 or
4.9
1 Climatic sequence 4.10 24 0
2 Damp heat, steady state 4.11 24 0

3 Endurance 4.12 36 0
4 Characteristics depending on 4.2.5 24 0
b
temperature
a
Capacitance/voltage combinations, see 3.4.1.
b
If required in the detail specification.

60384-11  IEC:2008 – 13 –
Table 2 – Test schedule for qualification approval

Number of
D specimens (n)
a
Subclause number Conditions of test a

or and number of Performance requirements
a
and test b
ND permissible non-
conformances (c)
Group 0 ND See Table 1
4.1 Visual examination   As in 4.1
Legible marking and as
specified in the detail
specification
4.1 Dimensions (detail)   See detail specification
4.2.1 Voltage proof See detail specification  No breakdown or flashover
for the method
4.2.2 Capacitance   Within specified tolerance
4.2.3 Tangent of loss Frequency: 1 kHz  As in 4.2.3.2
angle (tan δ)
4.2.4 Insulation resistance See detail specification  As in 4.2.4.2
for the method
Group 1A D See Table 1
4.3.1 Initial measurements Capacitance
Tangent of loss angle (tan δ):
For C ≤ 10 µF: at 1 kHz
R
C > 10 µF: at 50 Hz
R
to 120 Hz
4.3 Robustness of Visual examination  No visible damage
terminations
4.4 Resistance to No pre-drying
soldering heat See detail specification
for the method (1A or 1B)
No visible damage
4.4.2 Final measurements Visual examination
Legible marking
∆C/C: ≤ 2 % of value
Capacitance
measured in 4.3.1
4.13 Component solvent Solvent: …  See detail specification
resistance
Solvent temperature: …
(if applicable)
Method 2
Recovery: …
– 14 – 60384-11  IEC:2008
Table 2 (continued)
Number of
D specimens (n)
a
Subclause number Conditions of test a

or and number of Performance requirements
a
and test b
ND permissible non-
conformances (c)
Group 1B D See Table 1
4.5 Solderability Without ageing  Good tinning as evidenced by
See detail specification free flowing of the solder with

for the method wetting of the terminations or

solder shall flow within . . .s,

as applicable
4.14 Solvent resistance Solvent: .  See detail specification
of the marking Solvent temperature: .
(if applicable) Method 1
Rubbing material: cotton wool
Recovery: .
4.6.1 Initial Capacitance
measurements Tangent of loss angle (tan δ):
For C ≤ 10 µF: at 1 kHz
R
C > 10 µF: at 50 Hz
R
to 120 Hz
4.6 Rapid change of T = Lower category
A
temperature temperature
T = Upper category
B
temperature
Five cycles
Duration t = 30 min
Visual examination
No visible damage
4.7 Vibration For mounting method, see
detail specification
Procedure B4
Frequency range:
from . . .Hz to . . .Hz
Amplitude: 0,75 mm or
acceleration 98 m/s
(whichever is the less severe)
Total duration: 6 h
4.7.2 Final inspection Visual examination  No visible damage
4.8 Bump (or shock,  For mounting method
see 4.9) see detail specification
Number of bumps: …
Acceleration: …m/s
Duration of pulse: … ms
4.9 Shock (or bump,  For mounting method
see 4.8) see detail specification
Acceleration: …m/s
Duration of pulse: … ms
4.8.3 Final measurements Visual examination  No visible damage
or
Capacitance ∆C/C ≤ 5 % of value
4.9.3
measured in 4.6.1
Tangent of loss angle (tan δ) See detail specification

60384-11  IEC:2008 – 15 –
Table 2 (continued)
Number of
D specimens (n)
a
Subclause number Conditions of test a

or and number of Performance requirements
a
and test b
ND permissible non-
conformances (c)
Group 1 D See Table 1
4.10 Climatic sequence
4.10.2 Dry heat Temperature: upper category

temperature
Duration: 16 h
4.10.3 Damp heat, cyclic,
Test Db, first cycle
4.10.4 Cold Temperature: lower
category temperature
Duration: 2 h
4.10.5 Low air pressure  Air pressure: 8,5 kPa
(if required by the (85 mbar)
detail specification)
4.10.5.3 Intermediate Visual examination  No permanent breakdown,
inspection flashover or harmful
deformation of the case
4.10.6 Damp heat, cyclic, Recovery: 1 h to 2 h
Test Db, remaining
cycles
4.10.6.2 Final measure- Visual examination  No visible damage
ments Legible marking
Capacitance
∆C/C: ≤ 5 % of value
measured in 4.4.2, 4.8.3 or
4.9.3 as applicable
Tangent of loss angle (tan δ)  tan δ ≤ 0,01 or 1,2 times
values measured in 4.3.1 or
4.6.1, as applicable, whichever
is the greater
Insulation resistance  ≥50 % of values in 4.2.4.2
Group 2 D See Table 1
4.11 Damp heat, steady
state
4.11.1 Initial measure- Capacitance
ments Tangent of loss angle (tan δ)
For C ≤ 10 µF: at 1 kHz
R
C > 10 µF: at 50 Hz
R
to 120 Hz
44.11.3 Final measure- Visual examination  No visible damage
ments Legible marking
Capacitance
∆C/C ≤ 5 % of value measured
in 4.11.1
Tangent of loss angle (tan δ)  tan δ ≤ 0,01 or 1,2 times
values measured in 4.11.1,
whichever is the greater
Insulation resistance  ≥50 % of values in 4.2.4.2

– 16 – 60384-11  IEC:2008
Table 2 (continued)
Number of
D specimens (n)
a
Subclause number and Conditions of test a

or and number of Performance requirements
a
test b
ND permissible non-
conformances (c)
Group 3 D See Table 1
4.12 Endurance Duration: 1 000 h

4.12.1 Initial measurements Capacitance

Tangent of loss angle (tan δ)
For C ≤ 10 µF: at 1 kHz
R
C > 10 µF: at 50 Hz
R
to 120 Hz
Recovery: 1 to 2 h
4.12.5 Final measurements Visual examination  No visible damage
Legible marking
Capacitance  ∆C/C ≤ 5 % of value measured
in 4.12.1
Tangent of loss angle (tan δ)  tan δ ≤ 0,01 or 1,2 times
values measured in 4.12.1,
whichever is the greater
Insulation resistance  ≥50 % of values in 4.2.4.2
Group 4 ND See Table 1
4.2.5 Characteristics As in 4.2.5
Capacitance
depending on
temperature (if
applicable)
a
Subclause numbers of test and performance requirements refer to Clause 4.
b
In this table: D = destructive, ND = non-destructive.

3.5 Quality conformance inspection
3.5.1 Formation of inspection lots
a) Groups A and B inspection
These tests shall be carried out on a lot-by-lot basis.
A manufacturer may aggregate the current production into inspection lots subject to the
following safeguards:
1) The inspection lot shall consist of structurally similar capacitors (see 3.2).
2a) The sample tested shall be representative of the values and dimensions contained in
the inspection lot:
– in relation to their number;
– with a minimum of five of any one value.
2b) If there are less than five of any one value in the sample the basis for the drawing of
samples shall be agreed between the manufacturer and the National Supervising
Inspectorate.
b) Group C inspection
These tests shall be carried out on a periodic basis.

60384-11  IEC:2008 – 17 –
Samples shall be representative of the current production of the specified periods and shall

be divided into high, medium and low voltage ratings. In order to cover the range of approvals

in any period one case size shall be tested from each voltage group. In subsequent periods

other case sizes and/or voltage ratings in production shall be tested with the aim of covering

the whole range.
3.5.2 Test schedule
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given
in Clause 2, Table 4 of the blank detail specification, IEC 60384-11-1.

3.5.3 Delayed delivery
When, according to the procedures of IEC 60384-1, 3.5.3, re-inspection has to be made,
solderability and capacitance shall be checked as specified in Group A and B inspection.
3.5.4 Assessment levels
The assessment level(s) given in the blank detail specification shall preferably be selected
from the following Table 3 and Table 4.
Table 3 – Lot-by-lot inspection
c c c
D EZ F G
Inspection
a a a a a a a a a
b
IL AQL IL n c IL AQL IL AQL
subgroup
% % %
d
A0  100%
e
A1 S-3 0
e
A2 S-3 0
e
B1 S-3 0
a
IL = inspection level
AQL = acceptable quality level
n = sample size
c = permissible number of non-conforming items

b
The content of the inspection subgroup is described in Clause 2 of the relevant blank detail specification.

c
The assessment levels D, F and G are under consideration.

d
100 % testing shall be followed by re-inspection by sampling in order to monitor the outgoing quality level by
non-conforming items per million (ppm). The sampling level shall be established by the manufacturer. For the
calculation of ppm values, any parametric failure shall be counted as a non-conforming item. If one or more non-
conforming items occur in a sample, this lot shall be rejected.

e
Number to be tested: sample size as directly allotted to the code letter for IL in Table 2a of IEC 60
...