IEC 60384-11:2019

IEC 60384-11 ®
Edition 4.0 2019-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 11: Sectional specification – Fixed polyethylene-terephthalate film
dielectric metal foil DC capacitors

Condensateurs fixes utilisés dans les équipements électroniques –
Partie 11: Spécification intermédiaire – Condensateurs fixes pour courant
continu à diélectrique en film de polytéréphtalate d'éthylène à armatures
en feuilles métalliques
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IEC 60384-11 ®
Edition 4.0 2019-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –

Part 11: Sectional specification – Fixed polyethylene-terephthalate film

dielectric metal foil DC capacitors

Condensateurs fixes utilisés dans les équipements électroniques –

Partie 11: Spécification intermédiaire – Condensateurs fixes pour courant

continu à diélectrique en film de polytéréphtalate d'éthylène à armatures

en feuilles métalliques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.060.30 ISBN 978-2-8322-7260-2

– 2 – IEC 60384-11:2019 © IEC 2019
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Preferred ratings and characteristics . 8
4.1 Preferred climatic categories . 8
4.2 Preferred values of ratings . 8
4.2.1 Nominal capacitance (C ) . 8
N
4.2.2 Tolerance on nominal capacitance . 8
4.2.3 Nominal capacitance with associated tolerance values . 8
4.2.4 Rated voltage (U ) . 8
R
4.2.5 Category voltage (U ) . 9
C
4.2.6 Rated temperature . 9
5 Test and measurement procedures, and performance requirements . 9
5.1 Visual examination and check of dimensions . 9
5.1.1 General . 9
5.1.2 Examination methods . 9
5.1.3 Requirements . 9
5.2 Electrical tests . 10
5.2.1 Voltage proof . 10
5.2.2 Capacitance . 10
5.2.3 Tangent of loss angle (tan δ) . 10
5.2.4 Insulation resistance . 11
5.2.5 Characteristics depending on temperature (if required in the detail
specification) . 12
5.3 Robustness of terminations . 13
5.3.1 General . 13
5.3.2 Initial inspections . 13
5.3.3 Final inspections and requirements . 13
5.4 Resistance to soldering heat . 13
5.4.1 General . 13
5.4.2 Initial inspections . 13
5.4.3 Preconditioning . 13
5.4.4 Test Conditions . 13
5.4.5 Final inspections, measurements and requirements . 13
5.5 Solderability . 13
5.5.1 General . 13
5.5.2 Preconditioning . 13
5.5.3 Test conditions . 14
5.5.4 Final inspections and measurements . 14
5.6 Rapid change of temperature . 14
5.6.1 General . 14
5.6.2 Initial inspections . 14
5.6.3 Test conditions . 14
5.6.4 Final inspections, measurements and requirements . 14
5.7 Vibration . 14

5.7.1 General . 14
5.7.2 Initial inspections . 14
5.7.3 Mounting . 14
5.7.4 Test conditions . 15
5.7.5 Final inspections and requirements . 15
5.8 Bump (repetitive shock) . 15
5.8.1 General . 15
5.8.2 Mounting . 15
5.8.3 Initial measurements . 15
5.8.4 Test conditions . 15
5.8.5 Final inspection, measurements and requirements. 15
5.9 Shock . 15
5.9.1 General . 15
5.9.2 Mounting . 15
5.9.3 Initial measurements . 16
5.9.4 Test conditions . 16
5.9.5 Final inspections, measurements and requirements . 16
5.10 Climatic sequence. 16
5.10.1 General . 16
5.10.2 Initial measurements . 16
5.10.3 Dry heat . 16
5.10.4 Damp heat, cyclic, Test Db, first cycle . 16
5.10.5 Cold. 16
5.10.6 Low air pressure (if required) . 16
5.10.7 Damp heat, cyclic, Test Db, remaining cycles . 17
5.10.8 Recovery . 17
5.10.9 Final inspections, measurements and requirements . 17
5.11 Damp heat, steady state . 17
5.11.1 General . 17
5.11.2 Initial inspections . 17
5.11.3 Test conditions . 17
5.11.4 Recovery . 18
5.11.5 Final inspections, measurements and requirements . 18
5.12 Endurance . 18
5.12.1 General . 18
5.12.2 Initial inspections . 18
5.12.3 Test conditions . 18
5.12.4 Final inspections, measurements and requirements . 18
5.13 Component solvent resistance (if applicable) . 18
5.14 Solvent resistance of the marking (if applicable) . 18
6 Marking . 18
6.1 General . 18
6.2 Information for marking . 19
6.3 Marking on capacitors . 19
6.4 Marking on packaging . 19
6.5 Additional marking . 19
7 Information to be given in the detail specification . 19
7.1 General . 19
7.2 Outline drawing and dimensions . 19

– 4 – IEC 60384-11:2019 © IEC 2019
7.3 Mounting . 20
7.4 Ratings and characteristics . 20
7.4.1 General . 20
7.4.2 Nominal capacitance range . 20
7.4.3 Particular characteristics . 20
7.4.4 Soldering . 20
7.5 Marking . 21
8 Quality assessment procedures . 21
8.1 Primary stage of manufacture . 21
8.2 Structurally similar components . 21
8.3 Certified records of released lots . 21
8.4 Qualification approval . 21
8.4.1 General . 21
8.4.2 Qualification approval on the basis of the fixed sample size procedure . 21
8.5 Quality conformance inspection . 28
8.5.1 Formation of inspection lots . 28
8.5.2 Test schedule . 28
8.5.3 Delayed delivery . 28
8.5.4 Assessment levels . 29
Annex X (informative) Cross-references to the previous edition of this document . 30
Bibliography . 32

Table 1 – Preferred combinations of capacitance series and tolerance . 8
Table 2 – Test voltages . 10
Table 3 – Insulation resistance . 11
Table 4 – Correction factor dependent on test temperature . 12
Table 5 – Characteristics at lower category temperature . 12
Table 6 – Characteristics at upper category temperature . 12
Table 7 – Acceleration and duration of the pulse . 16
Table 8 – Endurance test . 18
Table 9 – Fixed sample size test plan for qualification approval assessment level EZ . 23
Table 10 – Test schedule for qualification approval (1 of 5) . 24
Table 11 – Lot-by-lot inspection . 29
Table 12 – Periodic inspection . 29
Table X.1 – Cross-references . 30

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 11: Sectional specification – Fixed polyethylene-terephthalate
film dielectric metal foil DC capacitors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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6) All users should ensure that they have the latest edition of this publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-11 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This fourth edition cancels and replaces the third edition published in 2008. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) revision of all parts of the document based on the ISO/IEC Directives, Part 2:2018, and
harmonization with other similar kinds of documents;
b) the document structure has been organized to follow new sectional specification structure
decided in TC 40;
c) revised tables and Clause 5 so as to prevent duplications and contradictions.

– 6 – IEC 60384-11:2019 © IEC 2019
The text of this standard is based on the following documents:
FDIS Report on voting
40/2679/FDIS 40/2689/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The list of all parts of the IEC 60384 series, under the general title Fixed capacitors for use in
electronic equipment, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
The contents of the corrigendum of April 2020 have been included in this copy.

FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 11: Sectional specification – Fixed polyethylene-terephthalate
film dielectric metal foil DC capacitors

1 Scope
This part of IEC 60384 is applicable to fixed direct current capacitors, for rated voltages not
exceeding 6 300 V, using as dielectric a polyethylene-terephthalate film and electrodes of thin
metal foils. For capacitors with rated voltages exceeding 1 000 V, additional tests and
requirements may be specified in the detail specification.
The capacitors covered by this document are intended for use in electronic equipment.
Capacitors for electromagnetic interference suppression are not included, but are covered
by IEC 60384-14.
The object of this document is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1:2016 the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification are of an equal or higher performance level. Lower performance levels are not
permitted.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document.For dated references, only the edition cited
applies. For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60062, Marking codes for resistors and capacitors
IEC 60063, Preferred number series for resistors and capacitors
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60384-1:2016, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 61193-2:2007, Quality assessment systems – Part 2: Selection and use of sampling plans
for inspection of electronic components and packages
ISO 3, Preferred numbers – Series of preferred numbers.
3 Terms and definitions
For the purposes of this document, the terms and definitions of IEC 60384-1:2016, and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
– 8 – IEC 60384-11:2019 © IEC 2019
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
rated DC voltage
maximum DC voltage that may be applied continuously to a capacitor at the rated temperature
4 Preferred ratings and characteristics
4.1 Preferred climatic categories
The values given in detail specifications shall preferably be selected from the following:
The capacitors covered by this sectional specification are classified into climatic categories in
accordance with the general rules given in IEC 60068-1:2013, Annex A.
The lower and upper category temperatures and the duration of the damp heat, steady-state
test shall be chosen from the following:
– lower category temperature: −55 °C, −40 °C and −25 °C.
– upper category temperature: +85 °C, +100 °C, +105 °C and +125 °C.
– duration of the damp heat, steady-state test: 4, 10, 21 and 56 days.
The severities for the cold and dry heat tests are the lower and upper category temperatures,
respectively.
4.2 Preferred values of ratings
)
4.2.1 Nominal capacitance (C
N
Preferred values of nominal capacitance are values chosen from the E series of IEC 60063,
n
which are given in Table 1, and their decimal multiples (× 10 , where n is an integer).
4.2.2 Tolerance on nominal capacitance
The preferred tolerances on the nominal capacitance are ±20 %; ±10 %; ±5 %; ±2 %; ±1 %.
4.2.3 Nominal capacitance with associated tolerance values
For preferred combinations of capacitance series and tolerances, see Table 1.
Table 1 – Preferred combinations of capacitance series and tolerance
Preferred combinations
Series Tolerances
E  6 ±20 %
E 12 ±10 %
E 24 ±5 %
E 48 ±2 %
E 96 ±1 %
4.2.4 Rated voltage (U )
R
The preferred values of rated voltages taken from the R5 series of ISO 3 are:

40 V − 63 V − 100 V − 160 V − 250 V − 400 V − 630 V − 1 000 V − 1 600 V − 2 500 V.
The sum of the DC voltage and the peak AC voltage applied to the capacitor shall not exceed
the rated voltage. The value of the peak AC voltage shall not exceed the following
percentages of the rated voltage at the frequencies stated and shall be not greater than 280 V:
50 Hz: 20 %
100 Hz: 15 %
1 000 Hz: 3 %
10 000 Hz: 1 %
unless otherwise specified in the detail specification.
4.2.5 Category voltage (U )
C
The category voltage is:
U for upper category temperature 85 °C;
R
0,8 U for upper category temperature 100 °C;
R
0,75 U for upper category temperature 105 °C; and
R
0,5 U for upper category temperature 125 °C.
R
4.2.6 Rated temperature
The standard value of rated temperature is 85 °C.
5 Test and measurement procedures, and performance requirements
5.1 Visual examination and check of dimensions
5.1.1 General
See IEC 60384-1:2016, 4.4, with the details in 5.1.2 and 5.1.3.
5.1.2 Examination methods
Visual examination shall be carried out with suitable equipment with approximately 10×
magnification and lighting appropriate to the specimen under test and the quality level
required.
The operator should have available facilities for incident or transmitted illumination as well as
an appropriate measuring facility.
The capacitors shall be examined to verify that the materials, design, construction and
physical dimensions are appropriate.
5.1.3 Requirements
See Table 10.
The workmanship shall be in accordance with the applicable requirements given in the detail
specification.
– 10 – IEC 60384-11:2019 © IEC 2019
5.2 Electrical tests
5.2.1 Voltage proof
5.2.1.1 General
See IEC 60384-1:2016, 4.6, with the details in 5.2.1.2 to 5.2.1.4.
5.2.1.2 Test circuit
The product of R and the nominal capacitance of the capacitor under test (C ) shall be
1 x
smaller than or equal to 1 s and greater than 0,01 s.
R includes the internal resistance of the power supply.
R shall limit the discharge current to a value equal to or less than 1 A.
5.2.1.3 Test conditions
The voltages given in Table 2 shall be applied between the measuring points (from
IEC 60384-1:2016, Table 3) for a period of 1 min for qualification approval testing and
between measuring point 1a) for a period of 1 s for the lot-by-lot quality conformance testing.
Table 2 – Test voltages
Test point Test voltage
1a) 2U
R
1b) and 1c) 2U with a minimum of 200 V
R
5.2.1.4 Requirement
There shall be no breakdown or flashover during the test.
5.2.2 Capacitance
5.2.2.1 General
See IEC 60384-1:2016, 4.7, with the details in 5.2.2.2 and 5.2.2.3.
5.2.2.2 Measuring conditions
The capacitance shall be measured at, or corrected to, a frequency of 1 kHz. For nominal
capacitance values > 10 µF, 50 Hz to 120 Hz may be used, but 1 kHz shall be the reference
frequency.
The applied peak voltage at 1 kHz shall not exceed 3 % of the rated voltage, and the applied
peak voltage at 50 Hz to 120 Hz shall not exceed 20 % of the rated voltage with a maximum
of 100 V (70 V RMS).
5.2.2.3 Requirements
The capacitance shall be within the specified tolerance. See Table 10.
5.2.3 Tangent of loss angle (tan δ)
5.2.3.1 General
See IEC 60384-1:2016, 4.8, with the details in 5.2.3.2 and 5.2.3.3.

5.2.3.2 Measuring conditions for measurements at 1 kHz
Test conditions are as follows:
– Frequency: 1 kHz.
– Peak voltage: ≤ 3 % of the rated voltage.
−4
– Inaccuracy: ≤ 10 × 10 (absolute value).
5.2.3.3 Requirement for measurements at 1 kHz
−4
Tan δ shall not exceed 100 × 10 . See Table 10.
5.2.4 Insulation resistance
5.2.4.1 General
See IEC 60384-1:2016, 4.5, with the details in 5.2.4.2 to 5.2.4.4.
5.2.4.2 Preconditioning
Prior to the test, capacitors shall be carefully cleaned to remove any contamination. Care
shall be taken to maintain cleanliness in the test chambers and during post-test
measurements.
Before measurement, the capacitor shall be fully discharged. The product of the resistance of
the discharge circuit and the nominal capacitance of the capacitor under test shall be ≥ 0,01 s
or any other value prescribed in the detail specification.
5.2.4.3 Measuring conditions
The measuring voltage shall be in accordance with IEC 60384-1:2016, 4.5.2.
The measuring points shall be in accordance with IEC 60384-1:2016, Table 3.
The voltage shall be applied immediately at the correct value through the internal resistance
of the voltage source. The product of the internal resistance and the nominal capacitance of
the capacitor shall be smaller than 1 s or any other value prescribed in the detail specification.
5.2.4.4 Requirements
The insulation resistance shall meet the requirements in Table 3.
Table 3 – Insulation resistance
Requirements
Minimum RC product Minimum insulation Minimum insulation
resistance between the resistance between
(R = insulation
terminations terminations and case
Measuring points in
resistance between the
accordance with
terminations
IEC 60384-1:2016, Table 3
C = nominal
N
capacitance)
s MΩ MΩ
C > 0,33 µF C ≤ 0,33 µF
N N
1a) 10 000 30 000 -
1b) and 1c) – – 30 000
– 12 – IEC 60384-11:2019 © IEC 2019
When the test is carried out at a temperature other than 20 °C, the result shall, when
necessary, be corrected to 20 °C by multiplying the result of the measurement by the
appropriate correction factor. In case of doubt, measurement at 20 °C is decisive. The
correction factors in Table 4 can be considered as an average for polyethylene-terephthalate
film dielectric metal foil capacitors.
Table 4 – Correction factor dependent on test temperature
Temperature Correction factor
°C
15 0,79
20 1,00
25 1,26
30 1,59
35 2,00
5.2.5 Characteristics depending on temperature (if required in the detail specification)
5.2.5.1 General
See IEC 60384-1:2016, 4.24.1, with the details in 5.2.5.2 and 5.2.5.3.
5.2.5.2 Measurement conditions
The capacitance measurements shall be carried out at points b) (lower category temperature),
d) (20 °C = comparison temperature) and f) (upper category voltage).
5.2.5.3 Requirements
The requirements in lower category temperatures and upper category temperatures are given
in Table 5 and Table 6, respectively.
Table 5 – Characteristics at lower category temperature
Test temperature at point b) Temperature characteristic
of capacitance
−10 °C and −25 °C
∆C
−5 % ≤ ≤ 0 %
C
−40 °C
∆C
−7 % ≤ ≤ 0 %
C
−55 °C
∆C
−10 % ≤ ≤ 0 %
C
Table 6 – Characteristics at upper category temperature
Test temperature at point f) Temperature characteristic
of capacitance
85 °C
∆C
0 % ≤ ≤ 5 %
C
100 °C
∆C
0 % ≤ ≤ 10 %
C
105 °C
∆C
0 % ≤ ≤ 13 %
C
125 °C
∆C
0 % ≤ ≤ 20 %
C
5.3 Robustness of terminations
5.3.1 General
See IEC 60384-1:2016, 4.13, with the details in 5.3.2 and 5.3.3.
5.3.2 Initial inspections
The capacitance shall be measured in accordance with 5.2.2.2.
The tangent of loss angle shall be measured in accordance with 5.2.3.2.
5.3.3 Final inspections and requirements
No visible damage. See Table 10.
5.4 Resistance to soldering heat
5.4.1 General
See IEC 60384-1:2016, 4.14, with the details 5.4.2 to 5.4.5.
5.4.2 Initial inspections
See 5.3.2.
5.4.3 Preconditioning
No pre-drying.
5.4.4 Test Conditions
– method 1 (solder bath) or 2 (soldering iron) of IEC 60384-1:2016, 4.14, unless otherwise
specified in the detail specification
– duration: 5 s ± 0,5 s or 10 s ± 1 s, unless otherwise specified in the detail specification
If method 1 is applied, immersion and withdrawal speed shall be 25 mm/s ± 2,5 mm/s.
5.4.5 Final inspections, measurements and requirements
After recovery, the capacitors shall be visually examined and measured and shall meet the
following requirements.
Under normal lighting and approximately 10× magnification, there shall be no signs of damage
such as cracks.
The capacitance and tangent of loss angle shall be measured in accordance with 5.3.2 and
shall meet the requirements given in Table 10.
5.5 Solderability
5.5.1 General
See IEC 60384-1:2016, 4.15, with the details in 5.5.2 to 5.5.4.
5.5.2 Preconditioning
No ageing.
– 14 – IEC 60384-11:2019 © IEC 2019
5.5.3 Test conditions
See IEC 60384-1:2016, 4.15.3.
The requirements for the globule test method shall be prescribed in the detail specification.
When neither the solder bath nor the solder globule method is appropriate, the soldering iron
test shall be carried out with soldering iron size A.
5.5.4 Final inspections and measurements
The capacitor shall be visually examined under normal lighting and approximately 10×
magnification.
The areas to be soldered shall be covered with a smooth and bright solder coating with no
more than a small amount of scattered imperfections such as pinholes or un-wetted or de-
wetted areas. These imperfections shall not be concentrated in one area.
In the solder globule method, the detail specification shall define the flow time of the solder in
seconds.
5.6 Rapid change of temperature
5.6.1 General
See IEC 60384-1:2016, 4.16, with the details in 5.6.2 to 5.6.4.
5.6.2 Initial inspections
Initial measurements shall be made as prescribed by 5.3.2.
5.6.3 Test conditions
Test conditions are as follows:
– capacitors shall be tested for 5 cycles;
– duration of exposure at the temperature limit shall be 30 min, unless otherwise specified in
the detail specification for larger capacitors.
5.6.4 Final inspections, measurements and requirements
The capacitors shall be visually examined and there shall be no visual damage. See Table 10.
When specified in the detail specification, capacitors shall be measured after recovery; they
shall meet the requirements of the detail specification
5.7 Vibration
5.7.1 General
See IEC 60384-1:2016, 4.17, with the details in 5.7.2 to 5.7.5.
5.7.2 Initial inspections
Not required.
5.7.3 Mounting
The mounting method to be used shall be prescribed in the detail specification.

For capacitors with axial leads and intended to be mounted by the leads only, the distance
between the body and the mounting point shall be 6 mm ± 1 mm.
5.7.4 Test conditions
The following degree of severity of test Fc applies:
– frequency range: 10 Hz to 55 Hz, 10 Hz to 500 Hz, or 10 Hz to 2000 Hz
unless otherwise specified in the detail specification;
– amplitude or acceleration: 0,75 mm or 100 m/s , whichever is the lower acceleration;
– total duration: 6 h ( 2 h in each axis direction, X, Y and Z).
5.7.5 Final inspections and requirements
The capacitors shall be visually examined and there shall be no visual damage. See Table 10.
5.8 Bump (repetitive shock)
5.8.1 General
The detail specification shall state whether the bump or the shock test applies.
See IEC 60384-1:2016, 4.18, with the details in 5.8.2 to 5.8.5.
5.8.2 Mounting
The mounting method to be used shall be prescribed in the detail specification.
For capacitors with axial leads and intended to be mounted by the leads only, the distance
between the capacitor body and the mounting point shall be 6 mm ± 1 mm.
5.8.3 Initial measurements
Not required.
5.8.4 Test conditions
The detail specification shall state which of the following preferred severities applies:
Total number of bumps: 1 000 or 4 000
2  2
Acceleration: 400 m/s 100 m/s
or
Pulse duration: 6 ms 16 ms
5.8.5 Final inspection, measurements and requirements
The capacitors shall be visually examined and measured and shall meet the requirements
given in Table 10.
5.9 Shock
5.9.1 General
The detail specification shall state whether the bump or the shock test applies.
See IEC 60384-1:2016, 4.19, with the details in 5.9.2 to 5.9.5.
5.9.2 Mounting
The mounting method to be used shall be prescribed in the detail specification.

– 16 – IEC 60384-11:2019 © IEC 2019
For capacitors with axial leads and intended to be mounted by the leads only, the distance
between the capacitor body and the mounting point shall be 6 mm ± 1 mm.
5.9.3 Initial measurements
Not required.
5.9.4 Test conditions
The detail specification shall state which of preferred severities in Table 7 applies.
Pulse shape: half-sine.
Table 7 – Acceleration and duration of the pulse
Corresponding duration
Peak acceleration
of the pulse
m/s ms
300 18
500 11
1 000 6
5.9.5 Final inspections, measurements and requirements
The capacitors shall be visually examined and measured and shall meet the requirements
given in Table 10.
5.10 Climatic sequence
5.10.1 General
See IEC 60384-1:2016, 4.21, with the details in 5.10.2 to 5.10.9.
5.10.2 Initial measurements
Not required, see 5.4.5,
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