IEC 62396-1:2016
(Main)Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
IEC 62396-1:2016(E) provides guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). It defines the radiation environment, the effects of that environment on electronics and provides design considerations for the accommodation of those effects within avionics systems. This International Standard helps aerospace equipment manufacturers and designers to standardise their approach to single event effects in avionics by providing guidance, leading to a standard methodology. This edition includes the following significant technical changes with respect to the previous edition:
- incorporation of references to some new papers and issues which have appeared since 2011;
- addition of solar flares and extreme space weather reference to a proposed future Part 6;
- addition of reference to a proposed new Part 7 on incorporating atmospheric radiation effects analysis into the system design process;
- addition of a reference to a proposed future Part 8 on other particles including protons, pions and muons.
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IEC 62396-1 ®
Edition 2.0 2016-01
INTERNATIONAL
STANDARD
colour
inside
Process management for avionics – Atmospheric radiation effects –
Part 1: Accommodation of atmospheric radiation effects via single event effects
within avionics electronic equipment
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
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latest edition, a corrigenda or an amendment might have been published.
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IEC 62396-1 ®
Edition 2.0 2016-01
INTERNATIONAL
STANDARD
colour
inside
Process management for avionics – Atmospheric radiation effects –
Part 1: Accommodation of atmospheric radiation effects via single event effects
within avionics electronic equipment
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 03.100.50; 31.020; 49.060 ISBN 978-2-8322-3078-7
– 2 – IEC 62396-1:2016 IEC 2016
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 9
4 Abbreviations and acronyms . 18
5 Radiation environment of the atmosphere . 21
5.1 Radiation generation . 21
5.2 Effect of secondary particles on avionics . 21
5.3 Atmospheric neutrons . 21
5.3.1 General . 21
5.3.2 Atmospheric neutrons energy spectrum and SEE cross-sections . 22
5.3.3 Altitude variation of atmospheric neutrons . 24
5.3.4 Latitude variation of atmospheric neutrons . 25
5.3.5 Thermal neutrons within aircraft . 27
5.4 Secondary protons . 27
5.5 Other particles . 28
5.6 Solar enhancements . 29
5.7 High altitudes greater than 60 000 ft (18 290 m) . 29
6 Effects of atmospheric radiation on avionics . 30
6.1 Types of radiation effects . 30
6.2 Single event effects (SEEs) . 30
6.2.1 General . 30
6.2.2 Single event upset (SEU) . 31
6.2.3 Multiple bit upset (MBU) and multiple cell upset (MCU) . 31
6.2.4 Single effect transients (SETs) . 33
6.2.5 Single event latch-up (SEL) . 34
6.2.6 Single event functional interrupt (SEFI) . 34
6.2.7 Single event burnout (SEB) . 34
6.2.8 Single event gate rupture (SEGR) . 35
6.2.9 Single event induced hard error (SHE) . 35
6.2.10 SEE potential risks based on future technology . 35
6.3 Total ionising dose (TID) . 36
6.4 Displacement damage . 37
7 Guidance for system designs . 37
7.1 Overview. 37
7.2 System design . 40
7.3 Hardware considerations. 41
7.4 Electronic devices characterisation and control . 42
7.4.1 Rigour and discipline . 42
7.4.2 Level A systems . 42
7.4.3 Level B . 42
7.4.4 Level C . 43
7.4.5 Levels D and E . 43
8 Determination of avionics single event effects rates . 43
8.1 Main single event effects . 43
8.2 Single event effects with lower event rates. 44
8.2.1 Single event burnout (SEB) and single event gate rupture (SEGR) . 44
8.2.2 Single event transient (SET) . 44
8.2.3 Single event hard error (SHE) . 45
8.2.4 Single event latch-up (SEL) . 45
8.3 Single event effects with higher event rates – Single event upset data . 45
8.3.1 General . 45
8.3.2 SEU cross-section . 46
8.3.3 Proton and neutron beams for measuring SEU cross-sections . 46
8.3.4 SEU per bit cross-section trends in SRAMs . 50
8.3.5 SEU per bit cross-section trends and other SEE in DRAMs . 51
8.4 Calculating SEE rates in avionics . 53
8.5 Calculation of availability of full redundancy . 54
8.5.1 General . 54
8.5.2 SEU with mitigation and SET . 54
8.5.3 Firm errors and faults . 55
9 Considerations for SEE compliance . 55
9.1 Compliance . 55
9.2 Confirm the radiation environment for the avionics application . 55
9.3 Identify the system development assurance level . 55
9.4 Assess preliminary electronic equipment design for SEE . 55
9.4.1 Identify SEE-sensitive electronic components . 55
9.4.2 Quantify SEE rates . 55
9.5 Verify that the system development assurance level requirements are met
for SEE . 55
9.5.1 Combine SEE rates for the entire system . 55
9.5.2 Management of electronic components control and dependability . 56
9.6 Corrective actions . 56
Annex A (informative) Thermal neutron assessment . 57
Annex B (informative) Methods for calculating SEE rates in avionics electronics . 58
B.1 Proposed in-the-loop system test – Irradiating avionics LRU in
neutron/proton beam, with output fed into aircraft simulation computer . 58
B.2 Irradiating avionics LRU in a neutron/proton beam . 58
B.3 Utilising existing SEE data for specific electronic components on LRU . 59
B.3.1 Neutron proton data . 59
B.3.2 Heavy ion data . 60
B.4 Applying generic SEE data to all electronic components on LRU . 61
B.5 Component level laser simulation of single event effects . 62
B.6 Determination of SEU rate from service monitoring . 63
Annex C (informative) Review of test facility availability . 65
C.1 Facilities in the USA and Canada . 65
C.1.1 Neutron facilities . 65
C.1.2 Proton facilities . 66
C.1.3 Laser facilities . 68
C.2 Facilities in Europe . 69
C.2.1 Neutron facilities . 69
C.2.2 Proton facilities . 71
C.2.3 Laser facilities . 72
– 4 – IEC 62396-1:2016 IEC 2016
Annex D (informative) Tabular description of variation of atmospheric neutron flux
with altitude and latitude .
...
IEC 62396-1 ®
Edition 2.0 2016-01
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Process management for avionics – Atmospheric radiation effects –
Part 1: Accommodation of atmospheric radiation effects via single event effects
within avionics electronic equipment
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing 20 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 15 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.
IEC publications search - www.iec.ch/searchpub IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a 65 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and
CISPR.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: csc@iec.ch.
IEC 62396-1 ®
Edition 2.0 2016-01
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Process management for avionics – Atmospheric radiation effects –
Part 1: Accommodation of atmospheric radiation effects via single event effects
within avionics electronic equipment
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 03.100.50; 31.020; 49.060 ISBN 978-2-8322-3133-3
– 2 – IEC 62396-1:2016 RLV IEC 2016
CONTENTS
FOREWORD . 6
INTRODUCTION . 2
1 Scope . 10
2 Normative references . 10
3 Terms and definitions . 11
4 Abbreviations and acronyms . 17
5 Radiation environment of the atmosphere . 22
5.1 Radiation generation . 22
5.2 Effect of secondary particles on avionics . 23
5.3 Atmospheric neutrons . 23
5.3.1 General . 23
5.3.2 Energy spectrum of atmospheric neutrons Atmospheric neutrons energy
spectrum and SEE cross-sections . 23
5.3.3 Altitude variation of atmospheric neutrons . 26
5.3.4 Latitude variation of atmospheric neutrons . 27
5.3.5 Thermal neutrons within aircraft . 29
5.4 Secondary protons . 29
5.5 Other particles . 30
5.6 Solar enhancements . 30
5.7 High altitudes greater than 60 000 ft (18 290 m) . 31
6 Effects of atmospheric radiation on avionics . 32
6.1 Types of radiation effects . 32
6.2 Single event effects (SEEs) . 32
6.2.1 General . 32
6.2.2 Single event upset (SEU) . 33
6.2.3 Multiple bit upset (MBU) and multiple cell upset (MCU) . 33
6.2.4 Single effect transients (SETs) . 35
6.2.5 Single event latch-up (SEL) . 36
6.2.6 Single event functional interrupt (SEFI) . 36
6.2.7 Single event burnout (SEB) . 36
6.2.8 Single event gate rupture (SEGR) . 36
6.2.9 Single event induced hard error (SHE) . 37
6.2.10 SEE potential risks based on future technology . 37
6.3 Total ionising dose (TID) . 38
6.4 Displacement damage . 39
7 Guidance for system designs . 39
7.1 Overview. 39
7.2 System design . 42
7.3 Hardware considerations. 43
7.4 Parts Electronic devices characterisation and control . 44
7.4.1 Rigour and discipline . 44
7.4.2 Level A systems . 44
7.4.3 Level B . 44
7.4.4 Level C . 45
7.4.5 Levels D and E . 46
8 Determination of avionics single event effects rates . 46
8.1 Main single event effects . 46
8.2 Single event effects with lower event rates. 46
8.2.1 Single event burnout (SEB) and single event gate rupture (SEGR) . 46
8.2.2 Single event transient (SET) . 47
8.2.3 Single event hard error (SHE) . 47
8.2.4 Single event latch-up (SEL) . 47
8.3 Single event effects with higher event rates – Single event upset data . 48
8.3.1 General . 48
8.3.2 SEU cross-section . 48
8.3.3 Proton and neutron beams for measuring SEU cross-sections . 48
8.3.4 SEU per bit cross-section trends in SRAMs . 53
8.3.5 SEU per bit cross-section trends and other SEE in DRAMs . 54
8.4 Calculating SEE rates in avionics . 56
8.5 Calculation of availability of full redundancy . 57
8.5.1 General . 57
8.5.2 SEU with mitigation and SET . 57
8.5.3 Firm errors and faults . 58
9 Considerations for SEE compliance . 58
9.1 Compliance . 58
9.2 Confirm the radiation environment for the avionics application . 58
9.3 Identify the system development assurance level . 58
9.4 Assess preliminary electronic equipment design for SEE . 58
9.4.1 Identify SEE-sensitive electronic components . 58
9.4.2 Quantify SEE rates . 59
9.5 Verify that the system development assurance level requirements are met
for SEE . 59
9.5.1 Combine SEE rates for the entire system . 59
9.5.2 Management of parts electronic components control and dependability . 59
9.6 Corrective actions . 59
Annex A (informative) Thermal neutron assessment . 60
Annex B (informative) Methods of for calculating SEE rates in avionics electronics . 61
B.1 Proposed in-the-loop system test – Irradiating avionics LRU in
neutron/proton beam, with output fed into aircraft simulation computer . 61
B.2 Irradiating avionics LRU in a neutron/proton beam . 61
B.3 Utilising existing SEE data for specific parts electronic components on LRU . 62
B.3.1 Neutron proton data . 62
B.3.2 Heavy ion data . 63
B.4 Applying generic SEE data to all parts electronic components on LRU . 64
B.5 Component level laser simulation of single event effects . 65
B.6 Determination of SEU rate from service monitoring . 66
Annex C (informative) Review of test facility availability . 68
C.1 Facilities in the USA and Canada . 68
C.1.1 Neutron facilities . 68
C.1.2 Proton facilities . 70
C.1.3 Laser facilities . 72
C.2 Facilities in Europe . 73
C.2.1 Neutron facilities . 73
C.2.2 Proton facilities . 75
– 4 – IEC 62396-1:2016 RLV IEC 2016
C.2.3 Laser facilities . 77
Annex D (informative) Tabular descript
...
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