IEC TS 62565-4-4:2025

IEC TS 62565-4-4 ®
Edition 1.0 2025-04
TECHNICAL
SPECIFICATION
Nanomanufacturing – Product specification –
Part 4-4: Nanophotonic products – Blank detail specification: Quantum dot
enabled light conversion films

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IEC TS 62565-4-4 ®
Edition 1.0 2025-04
TECHNICAL
SPECIFICATION
Nanomanufacturing – Product specification –

Part 4-4: Nanophotonic products – Blank detail specification: Quantum dot

enabled light conversion films

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120  ISBN 978-2-8327-0226-0

– 2 – IEC TS 62565-4-4:2025 © IEC 2025
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 9
3.1 General terms . 9
3.2 General product description and procurement information . 10
3.3 Physical key control characteristics . 11
3.4 Mechanical key control characteristics . 11
3.5 Optical key control characteristics . 12
3.6 Reliability control characteristics . 13
3.7 Measurement methods . 13
4 General introduction regarding measurement methods . 13
5 Specification format . 14
5.1 General product description and procurement information . 14
5.2 General material information of QDs and Q-LCF . 15
5.3 Physical key control characteristics . 16
5.4 Mechanical key control characteristics . 16
5.5 Optical key control characteristics . 16
5.6 Reliability key control characteristics . 17
6 Overview of test methods . 17
Annex A (normative) Supporting information for standardized KCC measurement
procedures . 21
A.1 General . 21
A.2 Thickness: Mechanical scanning . 21
A.2.1 General. 21
A.2.2 Measurement standard . 21
A.3 Surface resistivity: DC method . 21
A.3.1 General. 21
A.3.2 Measurement standard . 21
A.4 Coefficient of linear thermal expansion: Thermomechanical analysis . 22
A.4.1 General. 22
A.4.2 Measurement standard . 22
A.5 Haze: Hazemeter or spectrophotometer . 22
A.5.1 General. 22
A.5.2 Measurement standard . 22
A.6 Total luminous transmittance: Hazemeter or spectrophotometer . 22
A.6.1 General. 22
A.6.2 Measurement standard . 22
A.7 Tensile strength: Tensile testing machine . 22
A.7.1 General. 22
A.7.2 Measurement standard . 22
A.8 Elongation at break: Tensile testing machine . 23
A.8.1 General. 23
A.8.2 Measurement standard . 23
A.9 180° peel strength: Peel test . 23

A.9.1 General. 23
A.9.2 Measurement standard . 23
A.10 Pencil hardness: Pencil test . 23
A.10.1 General. 23
A.10.2 Measurement standard . 23
A.11 Thermoshrinking percentage: Oven heating method . 23
A.11.1 General. 23
A.11.2 Measurement standard . 23
A.12 Peak wavelength: BLU with spectroradiometer. 23
A.12.1 General. 23
A.12.2 Measurement standard . 24
A.12.3 Adaptations and modifications required . 24
A.13 FWHM: BLU with spectroradiometer . 24
A.13.1 General. 24
A.13.2 Measurement standard . 24
A.13.3 Adaptations and modifications required . 24
A.14 Chromaticity coordinate: BLU with spectroradiometer . 24
A.14.1 General. 24
A.14.2 Measurement standard . 24
A.14.3 Adaptations and modifications required . 24
A.15 Chromaticity coordinate non-uniformity: BLU with spectroradiometer . 25
A.15.1 General. 25
A.15.2 Measurement standard . 25
A.15.3 Adaptations and modifications required . 25
A.16 Luminance: BLU with spectroradiometer . 26
A.16.1 General. 26
A.16.2 Measurement standard . 26
A.16.3 Adaptations and modifications required . 26
A.17 Luminance uniformity: BLU with spectroradiometer . 26
A.17.1 General. 26
A.17.2 Measurement standard . 26
A.17.3 Adaptations and modifications required . 26
Annex B (informative) Guidance for KCC measurement procedures if no standard is
available . 27
B.1 General . 27
B.2 Light conversion efficiency: BLU with spectroradiometer . 27
B.2.1 General. 27
B.2.2 Measurement standard . 27
B.3 Photon absorptance: BLU with spectroradiometer . 29
B.3.1 General. 29
B.3.2 Measurement standard . 29
Bibliography . 30

Figure A.1 –Schematic structure of Q-LCF . 21
Figure A.2 –Measuring arrangement for Q-LCF . 25
Figure B.1 – Standard measurement system . 28

Table 1 – General product description and procurement information . 14

– 4 – IEC TS 62565-4-4:2025 © IEC 2025
Table 2 – General material information for QDs . 15
Table 3 – General material information for Q-LCF . 15
Table 4 – Format for physical key control characteristics for Q-LCF . 16
Table 5 – Format for mechanical key control characteristics for Q-LCF . 16
Table 6 – Format for optical key control characteristics for Q-LCF . 17
Table 7 – Format for reliability key control characteristics for Q-LCF . 17
Table 8 – Overview of measurement methods . 19

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
NANOMANUFACTURING – PRODUCT SPECIFICATION –

Part 4-4: Nanophotonic products – Blank detail specification:
Quantum dot enabled light conversion films

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
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preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
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Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
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expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
may be required to implement this document. However, implementers are cautioned that this may not represent
the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
shall not be held responsible for identifying any or all such patent rights.
IEC TS 62565-4-4 has been prepared by IEC technical committee 113: Nanotechnology for
electrotechnical products and systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
113/822/DTS 113/888/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.

– 6 – IEC TS 62565-4-4:2025 © IEC 2025
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 62565 series, published under the general title Nanomanufacturing –
Product specification, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
INTRODUCTION
This document specifies how to report the various key control characteristics of quantum dot
(QD) enabled light conversion film (Q-LCF) for industrial use in nano-enabled optoelectrical
display, and how to incorporate these into a bilateral detail specification between vendor and
user.
QDs are a kind of typical luminescent nanomaterial, which exhibit unique optical properties
including narrow emission spectrum, tunable emission wavelength, high peak energy and high
quantum efficiency. Q-LCF are optical films with QDs embedded in the polymer matrix. The
major function of Q-LCF is converting short wavelength light (such as blue light) to longer
wavelength light (green light, red light, etc.); this critical optical characteristic originates from
QDs. A type of novel display technique by assembling Q-LCF into traditional LCD devices, QD-
LCDs for short, has developed rapidly in recent years. The QD-LCD technique can improve
greatly display colour gamut and chromaticity coordinates. These excellent properties are due
to QDs in Q-LCF, which make high quality tricolour (red, green, blue) for realizing full-colour
display to achieve much better image quality.
Comparing with the display performance of traditional LCD techniques, the outstanding
advantage of QD-LCDs is unique display colour, which exhibits high colour gamut and colour
contrast, this characteristic is decided by the optical and physicochemical performance of QDs
and optical physical, mechanical and stability performance of Q-LCF. To enable large-scale
mass production of QD-LCDs, a reliable, affordable means of preparing Q-LCF is necessary,
so it is significant to build up a BDS by specifying crucial parameters.
This document provides crucial characteristics influencing the key performance of Q-LCF, and
also provides information about measurement methods and existing standards concerning the
correct determination of key control characteristics.

– 8 – IEC TS 62565-4-4:2025 © IEC 2025
NANOMANUFACTURING – PRODUCT SPECIFICATION –

Part 4-4: Nanophotonic products – Blank detail specification:
Quantum dot enabled light conversion films

1 Scope
This part of IEC 62565, which is a Technical Specification, establishes a standardized method
to determine a blank detail specification (BDS) for
• quantum dot enabled light conversion film (Q-LCF).
This document is intended to be used for nano-enabled photoelectric display, based on liquid
crystal display (LCD).
The relevant key control characteristics (KCC) of Q-LCF are listed, including physical,
mechanical and optical properties, and stability. For each KCC, measurement methods and
existing standards are reported.
Numeric values for the KCCs are left blank as they will be specified between customer and
supplier in the detail specification (DS). In the DS KCCs can be added or removed if agreed
between customer and supplier.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 62595-2-1:2016, Display lighting unit – Part 2-1: Electro-optical measuring methods of LED
backlight unit
IEC 62631-3-2:2023, Dielectric and resistive properties of solid insulating materials – Part 3-2:
Determination of resistive properties (DC methods) – Surface resistance and surface resistivity
ISO 527-1:2019, Plastics – Determination of tensile properties – Part 1: General principles
ISO 527-3:2018, Plastics – Determination of tensile properties – Part 3: Test conditions for films
and sheets
ISO 4593:1993, Plastics – Film and sheeting – Determination of thickness by mechanical
scanning
ISO 8510-2:2006, Adhesives – Peel test for a flexible-bonded-to-rigid test specimen assembly –
Part 2: 180° peel
ISO 11359-2:2021, Plastics – Thermomechanical analysis (TMA) – Part 2: Determination of
coefficient of linear thermal expansion and glass transition temperature
ISO 11501:1995, Plastics – Film and sheeting – Determination of dimensional change on
heating
ISO 13468-1:2019, Plastics – Determination of the total luminous transmittance of transparent
materials – Part 1: Single-beam instrument
ISO 13468-2:2021, Plastics – Determination of the total luminous transmittance of transparent
materials – Part 2: Double-beam instrument
ISO 14782:2021, Plastics – Determination of haze for transparent materials
ISO 15184:2020, Paints and varnishes – Determination of film hardness by pencil test
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1 General terms
3.1.1
quantum dot
QD
crystalline nanoparticle that exhibits size-dependent properties due to quantum confinement
effects on the electronic states
[SOURCE: ISO/TS 27687:2008, 4.7]
3.1.2
quantum dot enabled light conversion film
Q-LCF
optical film based on quantum dots that converts high energy light at a particular wavelength
into low energy light at another wavelength
Note 1 to entry: QDs in Q-LCF can be one of two types according to the applicable requirements, that is the Q-LCF
can be monochromatic or multi-colour film.
3.1.3
key control characteristic
KCC
product characteristic which can affect safety or compliance with regulations, fit, function,
performance, quality, reliability or subsequent processing of the final product
Note 1 to entry: The measurement of a key control characteristic is described in a standardized measurement
procedure with known accuracy and precision.
Note 2 to entry: It is possible to define more than one measurement method for a key control characteristic if the
correlation of the results is well-defined and known.
[SOURCE: IEC TS 62565-1:2023, 3.1]

– 10 – IEC TS 62565-4-4:2025 © IEC 2025
3.1.4
blank detail specification
BDS
structured generic specification providing a comprehensive set of key control characteristics
which are needed to describe a specific product without assigning specific values or attributes
Note 1 to entry: Examples of nano-enabled products are: nanocomposites and nano-subassemblies.
Note 2 to entry: Blank detail specifications are intended to be used by industrial users to prepare their detail
specifications used in bilateral procurement contracts. A blank detail specification facilitates the comparison and
benchmarking of different materials. Furthermore, a standardized format makes procurement more efficient and more
error robust.
[SOURCE: IEC TS 62565-1:2023, 3.2]
3.2 General product description and procurement information
3.2.1
peak absorption wavelength
wavelength of radiation at the highest intensity of the ultraviolet-visible absorption spectral
distribution
Note 1 to entry: Peak wavelength is expressed in nanometres (nm).
[SOURCE: IEC 62504:2014, 3.31, modified – The term "peak wavelength" has been replaced
with "peak absorption wavelength". In the definition, "ultraviolet-visible absorption" has been
added.]
3.2.2
peak fluorescence wavelength
wavelength of radiation at the highest intensity of the fluorescence emission spectral distribution
Note 1 to entry: Peak wavelength is expressed in nanometres (nm).
[SOURCE: IEC 62504:2014, 3.31, modified – The term "peak wavelength" has been replaced
with "peak fluorescence wavelength". In the definition, "fluorescence emission" has been
added.]
3.2.3
barrier property
property of preventing diffusion of molecules (e.g. O , H O) into the QD layer of Q-LCF
2 2
[SOURCE: IEC TR 61931:1998, 2.3.77, modified – The entry has been adapted to define a
property and made specific to the QD layer of Q-LCF.]
3.2.4
haze
percentage of transmitted light, passing through a specimen, which deviates from the incident
light by no more than 0,044 rad (2,5°) by forward scattering
[SOURCE: ISO 14782:1999, 3.1]
3.2.5
total luminous transmittance
ratio of the transmitted luminous flux to the incident luminous flux when a parallel beam of light
passes through a specimen
[SOURCE: ISO 13468-1:2019, 3.2]

3.2.6
refractive index
at a point in a medium and in a given direction, the ratio of the velocity of light in vacuum to the
magnitude of the phase velocity of a sinusoidal plane wave propagating in that given direction
[SOURCE: IEC TR 61931:1998, 2.1.27]
3.3 Physical key control characteristics
3.3.1
surface resistivity
σ/square
surface resistance reduced to a square
[SOURCE: IEC 62631-3-2:2023, 3.9]
3.3.2
coefficient of linear thermal expansion
reversible increase in length of a material per unit length per degree change in temperature
[SOURCE: ISO 11359-2:1999, 3.2, modified – Note 1 to entry has been deleted.]
3.4 Mechanical key control characteristics
3.4.1
tensile strength
maximum tensile stress recorded in extending the test piece to breaking point
[SOURCE: IEC 60811-501:2012, 3.3]
3.4.2
elongation at break
increase of the length between the reference marks of the test piece, expressed as the
percentage of the length between the reference marks of the unstretched test piece at breaking
point
[SOURCE: IEC 60811-501:2012, 3.4]
3.4.3
180° peel strength
force required to peel a first substrate from a second substrate at an angle of 180°
[SOURCE: ISO 29862:2018, 3.1, modified – The term "peel adhesion" has been replaced with
"180° peel strength". In the definition, "a strip of adhesive tape from a specified substrate at a
specified angle and speed" has been replaced with "a first substrate from a second substrate
at an angle of 180°".]
3.4.4
pencil hardness
resistance of the surface of Q-LCF to marking or the formation of some other defect, as a result
of the action of a pencil, with a lead of specified dimensions, shape and hardness, which is
pushed across the surface
[SOURCE: ISO 15184:2020, 3.1, modified – In the definition, "a paint film" has been replaced
with "Q-LCF".]
– 12 – IEC TS 62565-4-4:2025 © IEC 2025
3.4.5
thermoshrinking percentage
l
linear dimensional change of Q-LCF at elevated temperature
l = [(D − D )/D ] × 100,
f o o
where
D is the final length (or thickness) of Q-LCF after test,
f
D is the original length (or thickness) of Q-LCF.
o
Note 1 to entry: A negative value denotes shrinkage.
3.5 Optical key control characteristics
3.5.1
light conversion efficiency
LCE
ratio of the number of fluorescence photons emitted by Q-LCF to the number of photons
absorbed of the backlight source based on the backlight test platform
3.5.2
photon absorptance
PA
ratio of the number of photons absorbed by Q-LCF to the number of photons emitted from
backlight
3.5.3
peak wavelength
wavelength of radiation at the highest intensity of the spectral distribution
[SOURCE: IEC 62504:2014, 3.31]
3.5.4
full width at half maximum
FWHM
in a distribution curve comprising a single peak, the distance between the abscissa of two points
on the curve whose ordinates are half of the maximum ordinate of the peak
[SOURCE: IEC 62372:2021, 3.1.11]
3.5.5
chromaticity coordinate
ratio of each of a set of three tristimulus values to their sum
[SOURCE: IEC 60050-845:1987, 845-03-33]
3.5.6
chromaticity non-uniformity
maximum chromaticity coordinate difference between the centre and the other points on the
Q-LCF, indicated using the maximum value of ∆u′v′
Note 1 to entry: Adapted from IEC 62595-2-1:2016, 5.2.6.

3.5.7
luminance
photometric measure of the luminous intensity per unit area of light travelling in a given direction
[SOURCE: IEC 62087-1:2015, 3.1.4, modified – Note 1 to entry has been deleted.]
3.5.8
luminance uniformity
ratio of maximum and minimum luminance measured on the horizontally divided points of the
Q-LCF
[SOURCE: IEC PAS 62815-2:2013, 3.13, modified – In the definition, "lamp," has been replaced
with "Q-LCF" and "in which the percentage of minimum/maximum luminance among both ends
and the centre shall be reported" has been deleted.]
3.6 Reliability control characteristics
3.6.1
invalid edge
edge of Q-LCF with a significant decline in optical performance, failing to function
3.6.2
chromaticity coordinate shift
shift of chromaticity coordinate after reliability test measured on the specific point of the Q-LCF
3.6.3
light conversion efficiency reduction
reduction of light conversion efficiency of the Q-LCF after reliability test
3.7 Measurement methods
3.7.1
thermomechanical analysis
TMA
technique in which a deformation of a test specimen under non-oscillatory load is measured as
a function of temperature whilst the test specimen is subjected to a controlled temperature
programme
[SOURCE: IEC 61006:2004, 2.6]
3.7.2
backlight unit
BLU
illumina
...