Nanomanufacturing - Key control characteristics - Part 6-1: Graphene-based material - Volume resistivity: four probe method

IEC TS 62607-6-1:2020 establishes a standardized method to determine the electrical key control characteristic
– volume resistivity
for powder consisting of graphene-based material like flakes of graphene, few layer graphene and/or reduced graphene oxide after preparation of a sample in pellet form by
– four probe method
using powder resistivity measurement system.
The volume resistivity is a measure of the quality of powder-type graphene products in terms of electrical property and reflects the density-dependency shown in a pellet of powder-type graphene.
The volume conductivity can directly be derived from the volume resistivity.
Typical application areas are industries that use powder-type graphene products for graphene manufacture, potential developers, and users who produce graphene-based products. As the volume resistivity measured according to this document requires the preparation of a sample in the form of a pellet, this document describes in detail
– an apparatus to prepare consistently a test sample, the pellet,
– the preparation of the pellet starting from powder-type graphene,
– the measurement procedure to measure the volume resistivity (or volume conductivity) of the pellet, and
– the data analysis, the interpretation and reporting of the results.

General Information

Status
Published
Publication Date
07-Jul-2020
Current Stage
PPUB - Publication issued
Start Date
30-Jul-2020
Completion Date
08-Jul-2020
Ref Project

Buy Standard

Technical specification
IEC TS 62607-6-1:2020 - Nanomanufacturing - Key control characteristics - Part 6-1: Graphene-based material - Volume resistivity: four probe method
English language
32 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (Sample)


IEC TS 62607-6-1 ®
Edition 1.0 2020-07
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –
Part 6-1: Graphene-based material – Volume resistivity: four probe method

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.

need further assistance, please contact the Customer Service

Centre: sales@iec.ch.
IEC TS 62607-6-1 ®
Edition 1.0 2020-07
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –

Part 6-1: Graphene-based material – Volume resistivity: four probe method

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120 ISBN 978-2-8322-8561-9

– 2 – IEC TS 62607-6-1:2020 © IEC 2020
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
3.1 General terms . 8
3.2 Key control characteristics . 8
3.3 Terms related to measurements . 8
4 Sample preparation . 10
5 Measurement of volume resistivity of graphene pellet . 10
5.1 Description of the measurement apparatus . 10
5.2 Determination of sample amount . 12
5.3 The measurement procedures . 12
6 Data analysis and interpretation of results . 12
6.1 General . 12
6.2 Analysis of volume resistivity as a function of the applied pressures . 13
6.3 Calculation of volume conductivity of a pellet . 13
6.4 Analysis of volume resistivity (or volume conductivity) as a function of the
volume density of graphene pellet . 13
7 Report . 14
Annex A (informative) Case studies . 15
A.1 Graphene (reduced graphene oxide (rGO) and graphene nanopowder
(GNP)) . 15
A.2 Morphology change of rGO flakes before and after pressurization. 15
A.3 Raman spectroscopy measurement of graphene powder before and after
pressurization up to 52 MPa. 16
A.4 Results on powder resistivity measurements . 17
A.4.1 Powder resistivity measurement of rGO-A (company 1) with various
amounts . 17
A.4.2 Powder resistivity measurement of 1,0 g of rGO-B (company 2). 19
A.4.3 Powder resistivity measurement of GNP . 22
A.4.4 Powder resistivity measurement of graphene oxides with different

amounts of oxygen . 26
Bibliography . 32

Figure 1 – Measurement system . 11
Figure A.1 – FE-SEM images of rGO flakes of (A) Company 1 (rGO-A), (B) Company 2
(rGO-B) and (C) graphene nanopowder (GNP) before (left) and after (right)
pressurization . 15
Figure A.2 – Raman spectra of (A) rGO-A, (B) rGO-B and (C) GNP before (black line)
and after (red line) pressurization . 16
Figure A.3 – Comparison data for I /I of rGO-A (short-dash line), rGO-B (solid line)
D G
and GNP (long-dash line) before and after pressurization . 16
Figure A.4 – Correlation plots of (A) thickness, (B) volume resistivity (ρ ), and (C)
v
volume conductivity (σ ) as a function of the applied pressure: (1) 0,1 g and (2) 0,2 g
v
of rGO-A . 18

Figure A.5 – Correlation plots of (A) volume resistivity (ρ ) and (B) volume conductivity
v
(σ ) as a function of the volume density (d ) of a graphene pellet: 0,1 g (filled symbol)
v v
and 0,2 g (unfilled symbol) of rGO-A . 19
Figure A.6 – Correlation plots of (A) thickness (t), (B) volume resistivity (ρ ), and
v
(C) volume conductivity (σ ) of rGO-B (1,0 g) as a function of the applied pressure . 19
v
Figure A.7 – Correlation plots of (A) volume resistivity (ρ ) and (B) volume conductivity
v
(σ ) of rGO-B (1,0 g) as a function of the volume density (d ) of the graphene pellet . 20
v v
Figure A.8 – Correlation plots of (A) volume resistivity (ρ ) and (B) volume conductivity
v
(σ ) as a function of the volume density (d )of graphene pellets: 0,1 g (filled symbol),
v v
0,2 g (unfilled symbol) of rGO-A and 1,0 g (lined symbol) of rGO-B . 20
Figure A.9 – Correlation plots of (A) thickness (t), (B) volume resistivity (ρ ), and (C)
v
volume conductivity (σ ) as a function of the applied pressure: (1) 0,1 g and (2) 0,2 g
v
of GNP . 22
Figure A.10 – Correlation plots of (A) volume resistivity (ρ ) and (B) volume
v
conductivity (σ ) as a function of the volume density (d ) of a graphene pellet: 0,1 g
v v
(filled symbol) and 0,2 g (unfilled symbol) of GNP . 23
Figure A.11 – Comparison plots of (A) volume resistivity (ρ ) and (B) volume
v
conductivity (σ ) as a function of the volume density (d ) of graphene pellets: rGO-A
v v
(filled symbol) and GNP (unfilled symbol). 23
Figure A.12 – XPS survey spectra of as-received (A) rGO-A, (B) rGO-B and (C) GNP . 24
Figure A.13 – Correlation plots of thickness (t) as a function of the applied pressure:
0,3 g samples of four types of graphene oxide (G-a, G-b, G-c, and G-d) . 26
Figure A.14 – Correlation plots of volume resistivity (ρ ) as a function of the applied
v
pressure: 0,3 g samples of four types of graphene oxide (G-a, G-b, G-c, and G-d) . 27
Figure A.15 – Correlation plots of volume conductivity (σ ) as a function of the applied
v
pressure: 0,3 g samples of four types of graphene oxide (G-a, G-b, G-c, and G-d) . 28
Figure A.16 – Correlation plots of volume resistivity (ρ ) as a function of the volume
v
density (d ) of graphene oxide pellet (G-a, G-b, G-c, and G-d) . 29
v
Figure A.17 – Correlation plots of volume conductivity (σ ) as a function of the volume
v
density (d ) of graphene oxide pellet (G-a, G-b, G-c, and G-d) . 30
v
Figure A.18 – Comparison plots of (A) volume resistivity (σ ) and (B) volume
v
conductivity (σ ) as a function of the volume density (d ) of graphene oxide pellet
v v
(G‑a, G-b, G-c, and G-d) . 30

Table 1 – Minimum thickness of the pellet vs amount of the used sample at the
maximum applied pressure . 12
Table A.1 – An example of the measurement parameters for rGO-A (0,2 g) . 17
Table A.2 – Volume resistivity and volume conductivity of rGO pellets . 21
Table A.3 – Volume resistivity and volume conductivity of GNP pellets . 23
Table A.4 – Summary of XPS data of three graphene samples in a powder form . 24
Table A.5 – Volume resistivity (ρ ) and volume conductivity (σ ) of graphene pellets . 25
v v
Table A.6 – Volume resistivity (σ ) and volume conductivity (σ ) of four graphene oxide
v v
pellets . 31

– 4 – IEC TS 62607-6-1:2020 © IEC 2020
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
NANOMANUFACTURING –
KEY CONTROL CHARACTERISTICS –
Part 6-1: Graphene-based material –
Volume resistivity: four probe method

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC Publication(s)"). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their n
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.