IEC 60384-24:2015

IEC 60384-24 ®
Edition 2.0 2015-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 24: Sectional specification – Fixed tantalum electrolytic surface mount
capacitors with conductive polymer solid electrolyte

Condensateurs fixes utilisés dans les équipements électroniques –
Partie 24: Spécification intermédiaire – Condensateurs fixes électrolytiques au
tantale pour montage en surface à électrolyte solide en polymère conducteur

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IEC 60384-24 ®
Edition 2.0 2015-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –

Part 24: Sectional specification – Fixed tantalum electrolytic surface mount

capacitors with conductive polymer solid electrolyte

Condensateurs fixes utilisés dans les équipements électroniques –

Partie 24: Spécification intermédiaire – Condensateurs fixes électrolytiques au

tantale pour montage en surface à électrolyte solide en polymère conducteur

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.060.40; 31.060.50 ISBN 978-2-8322-2791-6

– 2 – IEC 60384-24:2015  IEC 2015
CONTENTS
FOREWORD . 5
1 General . 7
1.1 Scope . 7
1.2 Object . 7
1.3 Normative references . 7
1.4 Information to be given in a detail specification . 7
1.4.1 General . 7
1.4.2 Outline drawing and dimensions . 8
1.4.3 Mounting . 8
1.4.4 Ratings and characteristics . 8
1.4.5 Marking . 9
1.5 Terms and definitions . 9
1.6 Marking . 9
1.6.1 General . 9
1.6.2 Information for marking . 9
1.6.3 Marking on capacitors . 9
1.6.4 Marking on packaging . 9
2 Preferred ratings and characteristics . 9
2.1 Preferred characteristics . 9
2.2 Preferred values of ratings . 10
2.2.1 Nominal capacitance (C ) . 10
N
2.2.2 Tolerance on nominal capacitance . 10
2.2.3 Rated voltage (U ) . 10
R
2.2.4 Category voltage (U ) . 10
C
2.2.5 Surge voltage (U or U ) . 10
RS CS
2.2.6 Rated temperature . 10
3 Quality assessment procedures . 11
3.1 Primary stage of manufacture . 11
3.2 Structurally similar components . 11
3.3 Certified test records of released lots . 11
3.4 Qualification approval procedures . 11
3.4.1 General . 11
3.4.2 Qualification approval on the basis of the fixed sample size procedure . 11
3.4.3 Tests . 12
3.5 Quality conformance inspections . 19
3.5.1 Formation of inspection lots . 19
3.5.2 Test schedule . 20
3.5.3 Delayed delivery . 20
3.5.4 Assessment levels . 20
4 Test and measurement procedures . 21
4.1 Preliminary drying . 21
4.2 Measuring conditions . 21
4.3 Mounting . 21
4.4 Visual examination and check of dimensions . 21
4.4.1 General . 21
4.4.2 Visual examination and check of dimensions . 22

4.4.3 Requirements . 22
4.5 Electrical tests . 22
4.5.1 Leakage current . 22
4.5.2 Capacitance . 22
4.5.3 Tangent of loss angle (tan δ) . 23
4.5.4 Equivalent series resistance (if required) . 23
4.6 Resistance to soldering heat . 23
4.6.1 General . 23
4.6.2 Initial inspections . 23
4.6.3 Test conditions . 23
4.6.4 Recovery . 23
4.6.5 Final inspections and requirements . 24
4.7 Solderability . 24
4.7.1 General . 24
4.7.2 Final inspections and requirements . 24
4.8 Shear test . 24
4.9 Substrate bending test (if required) . 24
4.9.1 General . 24
4.9.2 Initial inspections . 24
4.9.3 Test conditions . 24
4.9.4 Final inspections and requirements . 24
4.10 Rapid change of temperature . 24
4.10.1 General . 24
4.10.2 Initial inspections . 24
4.10.3 Test conditions . 24
4.10.4 Recovery . 25
4.10.5 Final inspections and requirements . 25
4.11 Climatic sequence. 25
4.11.1 General . 25
4.11.2 Initial inspections . 25
4.11.3 Dry heat . 25
4.11.4 Damp heat, cyclic, test Db, first cycle . 25
4.11.5 Cold. 25
4.11.6 Damp heat, cyclic, test Db, remaining cycles . 25
4.11.7 Recovery . 25
4.11.8 Final inspections and requirements . 25
4.12 Damp heat, steady state . 25
4.12.1 General . 25
4.12.2 Initial inspections . 25
4.12.3 Test conditions . 26
4.12.4 Recovery . 26
4.12.5 Final inspections and requirements . 26
4.13 Characteristics at high and low temperature . 26
4.13.1 General . 26
4.13.2 Initial inspections and requirements . 26
4.14 Surge voltage . 26
4.14.1 General . 26
4.14.2 Initial inspections . 26
4.14.3 Test conditions . 26

– 4 – IEC 60384-24:2015  IEC 2015
4.14.4 Recovery . 27
4.14.5 Final inspections and requirements . 27
4.15 Endurance . 27
4.15.1 General . 27
4.15.2 Initial inspections . 27
4.15.3 Test conditions . 27
4.15.4 Recovery . 27
4.15.5 Final inspections and requirements . 27
4.16 Component solvent resistance (if required) . 27
4.17 Solvent resistance of marking (if required) . 27
4.18 High surge current (if required) . 27
4.19 Storage at high temperature . 27
4.19.1 General . 27
4.19.2 Initial inspections . 28
4.19.3 Test conditions . 28
4.19.4 Recovery . 28
4.19.5 Final inspections and requirements . 28
Bibliography . 29

Table 1 – Category and surge voltages . 11
Table 2 – Category and surge voltages . 11
Table 3 – Sampling plan for qualification approval, assessment level EZ . 13
Table 4 – Test schedule for qualification approval (1 of 6) . 14
Table 5 – Lot-by-lot inspection . 20
Table 6 – Periodic inspection . 21

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 24: Sectional specification – Fixed tantalum electrolytic surface
mount capacitors with conductive polymer solid electrolyte

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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6) All users should ensure that they have the latest edition of this publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-24 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This second edition cancels and replaces the first edition published in 2006 and constitutes a
technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) Revision of the structure in accordance with ISO/IEC Directives, Part 2:2011 (sixth edition)
to the extent practicable, and harmonization between other similar kinds of documents.
b) In addition, Clause 4 and all the tables have been reviewed in order to prevent
duplications and contradictions.

– 6 – IEC 60384-24:2015  IEC 2015
The text of this standard is based on the following documents:
FDIS Report on voting
40/2382/FDIS 40/2395/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The list of all parts of the IEC 60384 series, under the general title Fixed capacitors for use in
electronic equipment, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
The contents of the Corrigendum 1 of December 2016 have been included in this copy.

FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 24: Sectional specification – Fixed tantalum electrolytic surface
mount capacitors with conductive polymer solid electrolyte

1 General
1.1 Scope
This part of IEC 60384 applies to fixed tantalum electrolytic surface mount capacitors with
conductive polymer solid electrolyte primarily intended for d.c. applications for use in
electronic equipment.
Fixed tantalum electrolytic surface mount capacitors with solid (MnO ) electrolyte are not
included but are covered by IEC 60384-3.
These capacitors are primarily intended for use in electronic equipment to be mounted directly
on substrates for hybrid circuits or to printed boards.
Capacitors for special-purpose applications may need additional requirements.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1 the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification shall be of equal or higher performance level, because lower performance levels
are not permitted.
1.3 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60063, Preferred number series for resistors and capacitors
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60384-1:2008, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 61193-2:2007, Quality assessment systems − Part 2: Selection and use of sampling
plans for inspection of electronic components and packages
ISO 3, Preferred numbers – Series of preferred numbers
1.4 Information to be given in a detail specification
1.4.1 General
Detail specifications shall be derived from the blank detail specification.

– 8 – IEC 60384-24:2015  IEC 2015
Detail specifications shall not specify requirements inferior to those of the generic, sectional
or blank detail specification. When more severe requirements are included, they shall be
listed in 1.9 of the detail specification and indicated in the test schedules, for example, by an
asterisk.
The information given in 1.4.2 may, for convenience, be presented in tabular form.
The following information shall be given in each detail specification and the values quoted
shall preferably be selected from those given in the appropriate clause of this sectional
specification.
1.4.2 Outline drawing and dimensions
There shall be an illustration of the capacitors as an aid to easy recognition and for
comparison of the capacitors with others.
Dimensions and their associated tolerances, which affect interchangeability and mounting,
shall be given in the detail specification. All dimensions shall preferably be stated in
millimetres; however, when the original dimensions are given in inches, the converted metric
dimensions in millimetres shall be added.
The numerical values of the body shall be given as follows:
– for general: the width, length and height.
The numerical values of the terminals shall be given as follows:
– for terminals: the width, length and spacing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitor.
1.4.3 Mounting
The method of mounting for tests and measurements are given in 4.3. The detail specification

shall specify the methods of mounting for normal use.
1.4.4 Ratings and characteristics
1.4.4.1 General
The ratings and characteristics shall be given in accordance with the relevant clauses of this
specification, together with the following.
1.4.4.2 Nominal capacitance range
See 2.2.1.
When products approved to the detail specification have different nominal capacitance ranges,
the following statement should be added:
“The nominal capacitance range available in each voltage range is given in the register of
approvals, available for example on the IECQ on-line certificate system
website www.iecq.org”.
1.4.4.3 Particular characteristics
Additional characteristics may be listed when they are considered necessary to specify

adequately the component for design and application purposes.

1.4.4.4 Soldering
The detail specification shall specify the test methods, severities and requirements applicable
for the solderability and the resistance to soldering heat tests.
1.4.5 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
packaging. When there are deviations from 1.6, these shall be given in the detail specification.
1.5 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60384-1:2008 apply.
1.6 Marking
1.6.1 General
See IEC 60384-1:2008, 2.4, with the following details.
1.6.2 Information for marking
The information given in the marking is normally selected from the following list; the relative
importance of each item is indicated by its position in the list:
a) polarity of the terminations (unless identified by the construction);
b) rated voltage (d.c. voltage may be indicated by the symbol      or    );
c) nominal capacitance;
d) category temperature;
e) tolerance on nominal capacitance;
f) year and month (or, year and week) of manufacture;
g) manufacturer’s name and/or trademark;
h) manufacturer’s type designation;
i) reference to the detail specification.
1.6.3 Marking on capacitors
Polarity of the terminations shall be marked. Other elements are marked as necessary.
Any marking shall be legible and not easily smeared or removed by rubbing with the finger.
1.6.4 Marking on packaging
The packaging containing the capacitors should be clearly marked with all the information
listed in 1.6.2 as necessary.
2 Preferred ratings and characteristics
2.1 Preferred characteristics
Preferred climatic categories only shall be given in the preferred characteristics.
The capacitors covered by this specification are classified into climatic categories according
to the general rules given in IEC 60068-1:2013, Annex A.
The lower and upper category temperature shall be taken from the following:

– 10 – IEC 60384-24:2015  IEC 2015
lower category temperature: –55 °C;
upper category temperature: +105 °C and +125 °C.
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
The upper category temperature shall be 105°C or 125 °C for a rated temperature of 85 °C.
The upper category temperature shall be 125 °C for a rated temperature of 105 °C.
2.2 Preferred values of ratings
2.2.1 Nominal capacitance (C )
N
Preferred values of nominal capacitance are shown unit of microfarad (µF).
Preferred values of nominal capacitance shall be taken from the E 12 series of IEC 60063 are:
1,0 – 1,2 – 1,5 – 1,8 – 2,2 – 2,7 – 3,3 – 3,9 – 4,7 – 5,6 – 6,8 – 8,2;
n
and their decimal multiples (× 10 , n: integer).
2.2.2 Tolerance on nominal capacitance
Preferred value of tolerance on nominal capacitance is:
–20 % to +20 %.
2.2.3 Rated voltage (U )
R
Preferred values of rated direct voltages taken from R 10 and R 20 series of ISO 3 are:
– from R 10: 1,0 – 1,25 – 1,6 – 2,0 – 2,5 – 4,0 – 5,0 – 6,3 – 8,0;
– from R 20: 3,5;
n
and their decimal multiples (× 10 , n: integer).
2.2.4 Category voltage (U )
C
The category voltage for capacitors is given in Table 1 and Table 2.
2.2.5 Surge voltage (U or U )
RS CS
The surge voltage shall be 1,15 times the rated or category voltage rounded off (significant
digit of 2) to the nearest volt (see Table 1 and Table 2).
NOTE U is the surge voltage to rated voltage;
RS
U is the surge voltage to category voltage.
cs
2.2.6 Rated temperature
The value of the rated temperature is +85 °C and +105 °C (see Table 1 and Table 2).

Table 1 – Category and surge voltages
Dimensions in volt
Upper category temperature 125 °C / rated temperature 85 °C
U 2,0 2,5 4,0 5,0 6,3 8,0 10 12,5 16 20 25 35
R
U = 0,80 U
1,6 2,0 3,2 4,0 5,0 6,4 8,0 10 13 16 20 28
C R
U 2,3 2,9 4,6 5,8 7,2 9,2 12 14 18 23 29 40
RS
U 1,8 2,3 3,7 4,6 5,8 7,4 9,2 12 15 18 23 32
CS
Table 2 – Category and surge voltages
Dimensions in volt
Upper category temperature 125 °C / rated temperature 105 °C

or Upper category temperature 105 °C / rated temperature 85 °C
U 2,0 2,5 4,0 5,0 6,3 8,0 10 12,5 16 20 25 35
R
U = 0,90 U 1,8 2,3 3,6 4,5 5,7 7,2 9,0 11 14 18 23 32
C R
U 2,3 2,9 4,6 5,8 7,2 9,2 12 14 18 23 29 40
RS
U 2,0 2,6 4,1 5,2 6,5 8,2 10 13 16 20 26 36
CS
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the forming of the oxide layer.
3.2 Structurally similar components
Capacitors, considered as being structurally similar, are capacitors produced with similar
processes and materials, though they may be of different case sizes and values.
3.3 Certified test records of released lots
The information required in IEC 60384-1:2008, Q.9 shall be made available when prescribed
in the detail specification and when requested by a purchaser. After the endurance test, the
required parameters are the capacitance change, tangent of loss angle, equivalent series
resistance, and leakage current.
3.4 Qualification approval procedures
3.4.1 General
The procedures for qualification approval testing are given in IEC 60384-1:2008, Q.5.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in 3.5. The procedure using a fixed sample size schedule is given in
3.4.2 and 3.4.3.
3.4.2 Qualification approval on the basis of the fixed sample size procedure
The fixed sample size procedure is described in IEC 60384-1:2008, Q.5.3, list item b). The
sample shall be representative of the range of capacitors for which approval is sought. The
sample may be the whole or the part of the range given in the detail specification.

– 12 – IEC 60384-24:2015  IEC 2015
The sample shall consist of four specimens having the maximum and minimum voltages and
for these voltages the maximum and minimum case size. When there are more than four case
sizes, an intermediate case size shall also be tested. In each of these case size/voltage
combinations (values), the maximum capacitance shall be chosen. Thus, for the approval of a
range, testing is required of either four or six values. When the range consists of less than
four values, the number of specimens to be tested shall be that required for four values.
Two (for 6 values) or three (for 4 values) per value may be used as replacements for
specimens, which are non-conforming because of incidents not attributable to the
manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so, the
numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the
number of specimens required for Group 0 shall be increased by the same number as that
required for the additional groups.
Table 3 gives the number of samples to be tested in each group or subgroup together with the
permissible number of non-conforming items for qualification approval tests.
3.4.3 Tests
The complete series of tests specified in Table 3 and Table 4 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other
groups.
Specimens found to be non-conforming in the tests of Group 0 shall not be used for the other
groups.
Approval is granted when the number of non-conforming items is zero.
Table 3 and Table 4 together form the fixed sample size test schedule for the qualification
approval on the basis of the fixed sample size procedure.
Table 3 gives the number of the samples or permissible non-conforming items for each tests
or test groups.
Table 4 gives a summary of the test conditions and performance requirements, and choices of
the test conditions and performance requirements in the detail specification.
The test conditions and performance requirements for the qualification approval on the basis
of the fixed sample size procedure should be identical to those for quality conformance
inspections given in the detail specification.

Table 3 – Sampling plan for qualification approval, assessment level EZ
Group no. Test Subclause Number of Permissible
specimens number of non-
conforming
items
d
n c
c f
0  High surge current 4.18 0
120+12
Visual examination 4.4
Dimensions 4.4
Leakage current 4.5.1
Capacitance 4.5.2
Tangent of loss angle 4.5.3
c
Equivalent series resistance 4.5.4
Spare specimens
1A Resistance to soldering heat 4.6 12 0
c
Component solvent resistance 4.16
1B Solderability 4.7 12 0
c
Solvent resistance of marking 4.17
e
2 Substrate bending test 4.9 12 0
b
a
3 Mounting 4.3 84 0
Visual examination 4.4.2
Leakage current 4.5.1
Capacitance 4.5.2
Tangent of loss angle 4.5.3
c
Equivalent series resistance 4.5.4
3.1 Shear test 4.8  12 0
Rapid change of temperature 4.10
Climatic sequence 4.11
3.2 Damp heat, steady state 4.12  12 0
3.3 Characteristics at high and low 4.13  12 0
temperature
Surge voltage 4.14
3.4 Endurance 4.15  36 0
3.5 Storage at high temperature 4.19  12 0
a
The values of these inspections serve as initial inspections for the tests of Group 3.
b
The capacitors found non-conforming after mounting shall not be taken into account when calculating the
non-conforming items for the following tests. They shall be replaced by spare capacitors.
c
If required.
d
For case size/voltage combinations, see 3.4.2.
e
Not applicable to capacitors, which shall be mounted on alumina substrates only, according to their detail
specification.
f
Spare specimens.
– 14 – IEC 60384-24:2015  IEC 2015
Table 4 – Test schedule for qualification approval (1 of 6)
a
Subclause number and D Conditions of test and Number of Performance

a a
test , inspection items or measurements specimens requirements
b
ND (n) and
permissible
number of
non-
conforming
items (c)
GROUP 0 ND See Table 3
e
4.18 High surge current See IEC 60384-1:2008, 4.39 See detail specification
4.4.2 Visual examination See 4.4.2 Legible marking and as
specified in the detail
specification
4.4 Dimension (detail) See 4.4.2 See detail specification
4.5.1 Leakage current See 4.5.1.2
≤0,1 C U or 10 µA,
N R
whichever is the greater
d
(at 20 °C ± 2 °C)
4.5.2 Capacitance See 4.5.2.2 Within specified tolerance
4.5.3 Tangent of loss See 4.5.3.2 See detail specification
angle (tan δ)
4.5.4 Equivalent series See 4.5.4.2 See detail specification
e
resistance
GROUP 1A D See Table 3
4.6 Resistance to See 4.6.3
soldering heat
4.6.2 Initial inspections
Capacitance See 4.5.2.2
4.6.4 Recovery See 4.6.4
4.6.5 Final inspections
Visual examination See 4.6.5 There shall be no signs of
remarkable damage
Dissolution of the end face
plating (leaching) shall not
exceed 25 % of the length
of the edge concerned
Capacitance See 4.5.2.2 See detail specification
Tangent of loss See 4.5.3.2 See detail specification
angle
Leakage current See 4.5.1.2 See detail specification
4.16 Component solvent See IEC 60384-1:2008, 4.31 See IEC 60384-1:2008,
e
resistance 4.31
Table 4 (2 of 6)
a
Subclause number and D Conditions of test and Number of Performance

a a
test , inspection items or measurements specimens requirements
b
ND (n) and
permissible
number of
non-
conforming
items (c)
GROUP 1B D See Table 3
4.7 Solderability See IEC 60384-1:2008, 4.15
4.7.2 Final inspections
Visual examination See 4.4.2 There shall be no signs of
damage.
Areas to be soldered shall
be covered with a new
solder coating with no
more than a small amount
of scattered imperfections
such as pinholes or un-
wetted or de-wetted areas.
These imperfections shall
not be concentrated in one
area.
An area in which plating
does not exist such as the
tip of the terminal shall not
be evaluated.
4.17 Solvent resistance See IEC 60384-1:2008, 4.32 See IEC 60384-1:2008,
c,e
of the marking 4.32
GROUP 2 D See Table 3
4.9 Substrate bending See 4.9.3
e
test
4.9.2 Initial inspections
Capacitance See 4.5.2.2
4.9.4 Final inspections
Visual examination See 4.4.2 No visible damage
Capacitance (with See detail specification
printed board in
bent position)
GROUP 3 D See Table 3
4.3 Mounting See 4.3.3
4.3.2 Initial inspections
Capacitance See 4.5.2.2
4.3.4 Final inspections
Visual examination See 4.4.2 No visible damage
Leakage current See 4.5.1.2 See detail specification
Capacitance See 4.5.2.2
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