IEC TS 62607-11-1:2025

IEC TS 62607-11-1 ®
Edition 1.0 2025-08
TECHNICAL
SPECIFICATION
Nanomanufacturing - Key control characteristics -
Part 11-1: Electromagnetic compatibility - Shielding effectiveness of
nanomaterials: near-field probe method
ICS 07.120; 07.030 ISBN 978-2-8327-0631-2

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CONTENTS
FOREWORD. 2
INTRODUCTION . 4
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 General introduction . 6
4.1 Measurement principle . 6
4.2 Sample preparation method . 7
4.3 Test equipment . 8
5 Apparatus . 9
6 Procedure . 9
6.1 General . 9
6.2 Preparation of near-field probe (NFP) . 9
6.3 Operating the NFP with samples . 9
6.4 Analysing SE characteristics . 9
6.4.1 Measuring and analysing SE (shielding effectiveness) . 9
6.4.2 Report of SE . 9
7 Test report . 11
7.1 General . 11
7.2 Measurement conditions . 11
7.3 Measurement data presentation . 11
Annex A (informative) Case study 1: Measured examples of SE by test equipment in
Figure 2 using near-field scanner (NFS) . 12
Annex B (informative) Case study 2: To convert measured S-parameter to power . 14
Bibliography . 15

Figure 1 – Near-field zone: approximately within λ/2π. 7
Figure 2 – Experimental setup for near-field testing . 8
Figure 3 – E-field SE measured at point (0,0) . 10
Figure 4 – E-field SE according to measurement location . 10
Figure 5 – H-field SE measured at point (0,0) . 10
Figure 6 – H-field SE according to measurement location . 11
Figure A.1 – NFS full view . 12
Figure A.2 – Measurement specification . 12
Figure A.3 – Measurement system of NFS . 13
Figure A.4 – Equipment of fixing samples . 13

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Nanomanufacturing -
Key control characteristics -
Part 11-1: Electromagnetic compatibility -
Shielding effectiveness of nanomaterials: near-field probe method

FOREWORD
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IEC TS 62607-11-1 has been prepared by IEC technical committee 113: Nanotechnology for
electrotechnical products and systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
113/872/DTS 113/909/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 62607 series, published under the general title Nanomanufacturing -
Key control characteristics, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
INTRODUCTION
Due to the characteristic electrical conductivity of nanomaterials such as carbon nanotubes
(CNTs) or graphene, development of new electromagnetic shielding materials using them has
drawn much interest in electronic and electric industries. However, the existing standard
method is not suitable for being applied to nanomaterials because of the requirement of sample
size and limited frequency range from 30 MHz to 1,5 GHz. Furthermore, it is essential to
elucidate shielding effectiveness (SE) as a function of distance between the probe and a sample
by emergence of new technologies such as wearable electronics and development of high-
integrity devices with multilayered structure.
This document specifies SE measurement of nanomaterials under the near-field condition.

1 Scope
This part of IEC 62607 provides a standardized method for measuring shielding effectiveness
on nanomaterials including carbon nanotubes (CNTs) in the near-field region. This document
provides
– recommendations for sample preparation,
– outlines of the experimental procedures to measure shielding effectiveness of CNTs in thin
films,
– methods of interpretation of results and discussion of data analysis, and
– case studies.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC TS 61967-3, Integrated circuits - Measurement of electromagnetic emissions - Part 3:
Measurement of radiated emissions - Surface scan method
IEC 61967-6, Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to
1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
– IEC Electropedia: available at https://www.electropedia.org/
– ISO Online browsing platform: available at https://www.iso.org/obp
3.1
electromagnetic interf
...