IEC 62496-2:2017
(Main)Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
IEC 62496-2:2017 specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results.
Cartes à circuits optiques - Méthodes fondamentales d'essais et de mesures - Partie 2: Recommandations générales pour la définition des conditions de mesure des caractéristiques optiques des cartes à circuits optiques
IEC 62496-2:2017 spécifie une méthode pour définir les conditions de mesure des caractéristiques optiques des cartes à circuits optiques. La méthode inclut l'utilisation de tableaux présentant des références à des codes pour identifier différents aspects critiques de l'environnement de mesure. Les valeurs extraites des tableaux sont utilisées pour construire un code d'identification des mesures qui contient suffisamment d'informations sur les conditions de mesure, afin d'assurer la cohérence des résultats mesurés de manière indépendante avec une marge acceptable. Des conditions de mesure recommandées sont spécifiées pour réduire le plus possible les variations des résultats mesurés de manière indépendante.
Mots clés: densités de largeur de bande, caractéristiques optiques des cartes à circuits optiques
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IEC 62496-2 ®
Edition 1.0 2017-05
INTERNATIONAL
STANDARD
colour
inside
Optical circuit boards – Basic test and measurement procedures –
Part 2: General guidance for definition of measurement conditions for optical
characteristics of optical circuit boards
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
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International Standards for all electrical, electronic and related technologies.
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IEC 62496-2 ®
Edition 1.0 2017-05
INTERNATIONAL
STANDARD
colour
inside
Optical circuit boards – Basic test and measurement procedures –
Part 2: General guidance for definition of measurement conditions for optical
characteristics of optical circuit boards
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.180.01 ISBN 978-2-8322-4404-3
– 2 – IEC 62496-2:2017 IEC 2017
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Measurement definition system for optical circuit boards . 9
4.1 General . 9
4.2 Measurement definition system requirements. 9
4.2.1 Accuracy . 9
4.2.2 Accountability . 9
4.2.3 Efficiency . 10
4.2.4 Convenience . 10
4.2.5 Independent . 10
4.2.6 Scalable . 10
4.2.7 Customised requirements . 10
4.2.8 Prioritised structure . 10
4.3 Measurement definition criteria . 10
4.3.1 General . 10
4.3.2 Source characteristics . 11
4.3.3 Launch conditions . 11
4.3.4 Input coupling conditions . 14
4.3.5 Output coupling conditions . 15
4.3.6 Capturing conditions . 16
4.4 Launch and capturing position . 16
4.5 Launch and capture direction . 17
5 Measurement identification code . 19
5.1 General . 19
5.2 Measurement identification code construction . 19
5.2.1 General . 19
5.2.2 AAA – Source characteristics. 19
5.2.3 BBB(b1) – Launch conditions . 19
5.2.4 CCC – Input coupling conditions . 20
5.2.5 DDD – Output coupling conditions . 20
5.2.6 EEE – Capturing conditions . 20
5.3 Extended measurement identification code with customisation parameters . 20
5.3.1 General . 20
5.3.2 Customisation parameters with placeholders . 20
5.4 Reference measurements . 21
5.5 Coordinate table AAA – Source characteristics . 21
5.5.1 Mandatory parameters . 21
5.5.2 Customisation parameters . 21
5.6 Coordinate table BBB – Launch conditions. 24
5.6.1 Mandatory parameter. 24
5.6.2 Customisation parameters . 24
5.7 Coordinate table CCC – Input coupling conditions. 27
5.7.1 Mandatory parameters . 27
5.7.2 Customisation parameters . 27
5.8 Coordinate table DDD – Output coupling conditions . 29
5.8.1 Mandatory parameters . 29
5.8.2 Customisation parameters . 29
5.9 Coordinate table EEE – Capturing conditions . 31
5.9.1 Mandatory parameters . 31
5.9.2 Customisation parameters . 31
5.10 Examples of deployment . 34
5.10.1 General . 34
5.10.2 MIC-042-113(400)-001-001-112 (integrating sphere device details
including supplier and model number). 34
5.10.3 MIC-072-123(205)-053(1.56, X,X)-001-042 (integrating sphere device
details including supplier and model number) . 34
5.10.4 Fast polarisation axis: MIC-091-072(150)-042(1.53, 25, -30)-051-004;
slow polarisation axis: MIC-091-072(75)-042(1.53, 25, -120)-051-004 . 35
Annex A (informative) State of the art in optical interconnect technologies . 36
A.1 Diversity of optical interconnect technologies . 36
A.2 Fibre-optic circuit laminates . 36
A.3 Polymer waveguides . 36
A.4 Planar glass waveguides . 36
A.5 Free space optics . 37
A.6 Target applications . 37
Bibliography . 38
Figure 1 – Optical circuit board varieties . 6
Figure 2 – Recommended test setup for single-mode fibre launch conditions . 13
Figure 3 – Recommended test setup for multimode fibre launch conditions . 13
Figure 4 – Cross-sectional views of channel under test at input . 15
Figure 5 – Cross-sectional views of the channel under test at output . 16
Figure 6 – Measurement setup with collinear launch and capture direction . 17
Figure 7 – Measurement setup with orthogonal launch and capture direction . 18
Figure 8 – Measurement setup with oblique launch and capture direction . 18
Figure 9 – Measurement identification code construction . 19
Figure 10 – Reference measurements with the same MIC . 21
Table 1 – Recommended modal launch profiles . 12
Table 2 – AAA coordinate reference for source characteristics . 22
Table 3 – BBB coordinate reference for launch conditions . 25
Table 4 – CCC coordinate reference for input coupling conditions . 28
Table 5 – DDD coordinate reference for output coupling conditions . 30
Table 6 – EEE coordinate reference for capturing conditions . 32
– 4 – IEC 62496-2:2017 IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
OPTICAL CIRCUIT BOARDS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 2: General guidance for definition of measurement conditions for
optical characteristics of optical circuit boards
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC
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in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with
...
IEC 62496-2 ®
Edition 1.0 2017-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Optical circuit boards – Basic test and measurement procedures –
Part 2: General guidance for definition of measurement conditions for optical
characteristics of optical circuit boards
Cartes à circuits optiques – Méthodes fondamentales d'essais et de mesures –
Partie 2: Recommandations générales pour la définition des conditions de
mesure des caractéristiques optiques des cartes à circuits optiques
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
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IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing 21 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 16 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.
IEC publications search - webstore.iec.ch/advsearchform IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a 67 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and
CISPR.
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IEC 62496-2 ®
Edition 1.0 2017-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Optical circuit boards – Basic test and measurement procedures –
Part 2: General guidance for definition of measurement conditions for optical
characteristics of optical circuit boards
Cartes à circuits optiques – Méthodes fondamentales d'essais et de mesures –
Partie 2: Recommandations générales pour la définition des conditions de
mesure des caractéristiques optiques des cartes à circuits optiques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.180.01 ISBN 978-2-8322-5232-1
– 2 – IEC 62496-2:2017 IEC 2017
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Measurement definition system for optical circuit boards . 9
4.1 General . 9
4.2 Measurement definition system requirements . 9
4.2.1 Accuracy . 9
4.2.2 Accountability . 9
4.2.3 Efficiency . 10
4.2.4 Convenience. 10
4.2.5 Independent . 10
4.2.6 Scalable . 10
4.2.7 Customised requirements . 10
4.2.8 Prioritised structure . 10
4.3 Measurement definition criteria . 10
4.3.1 General . 10
4.3.2 Source characteristics . 11
4.3.3 Launch conditions . 11
4.3.4 Input coupling conditions . 14
4.3.5 Output coupling conditions. 15
4.3.6 Capturing conditions . 16
4.4 Launch and capturing position . 16
4.5 Launch and capture direction . 17
5 Measurement identification code . 19
5.1 General . 19
5.2 Measurement identification code construction . 19
5.2.1 General . 19
5.2.2 AAA – Source characteristics . 19
5.2.3 BBB(b1) – Launch conditions . 19
5.2.4 CCC – Input coupling conditions . 20
5.2.5 DDD – Output coupling conditions . 20
5.2.6 EEE – Capturing conditions . 20
5.3 Extended measurement identification code with customisation parameters . 20
5.3.1 General . 20
5.3.2 Customisation parameters with placeholders . 20
5.4 Reference measurements . 21
5.5 Coordinate table AAA – Source characteristics . 21
5.5.1 Mandatory parameters . 21
5.5.2 Customisation parameters . 21
5.6 Coordinate table BBB – Launch conditions . 24
5.6.1 Mandatory parameter . 24
5.6.2 Customisation parameters . 24
5.7 Coordinate table CCC – Input coupling conditions . 27
5.7.1 Mandatory parameters . 27
5.7.2 Customisation parameters . 27
5.8 Coordinate table DDD – Output coupling conditions . 29
5.8.1 Mandatory parameters . 29
5.8.2 Customisation parameters . 29
5.9 Coordinate table EEE – Capturing conditions . 31
5.9.1 Mandatory parameters . 31
5.9.2 Customisation parameters . 31
5.10 Examples of deployment . 34
5.10.1 General . 34
5.10.2 MIC-042-113(400)-001-001-112 (integrating sphere device details
including supplier and model number) . 34
5.10.3 MIC-072-123(205)-053(1.56, X,X)-001-042 (integrating sphere device
details including supplier and model number) . 34
5.10.4 Fast polarisation axis: MIC-091-072(150)-042(1.53, 25, -30)-051-004;
slow polarisation axis: MIC-091-072(75)-042(1.53, 25, -120)-051-004 . 35
Annex A (informative) State of the art in optical interconnect technologies . 36
A.1 Diversity of optical interconnect technologies . 36
A.2 Fibre-optic circuit laminates . 36
A.3 Polymer waveguides . 36
A.4 Planar glass waveguides . 36
A.5 Free space optics . 3
...
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