Amendment 1 - Metallic cables and other passive components test methods - Part 4-15: Electromagnetic compatibility (EMC) related test method for measuring transfer impedance and screening attenuation or coupling attenuation with triaxial cell

Amendement 1 - Méthodes d'essai des câbles métalliques et autres composants passifs - Partie 4-15 : Compatibilité électromagnétique (CEM) - Méthode d'essai pour le mesurage de l'impédance de transfert et de l'affaiblissement d'écran ou de l'affaiblissement de couplage avec cellule triaxiale

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Published
Publication Date
30-Apr-2024
Current Stage
PPUB - Publication issued
Start Date
24-May-2024
Completion Date
01-May-2024
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IEC 62153-4-15:2021/AMD1:2024 - Amendment 1 - Metallic cables and other passive components test methods - Part 4-15: Electromagnetic compatibility (EMC) related test method for measuring transfer impedance and screening attenuation or coupling attenuation with triaxial cell Released:5/1/2024 Isbn:9782832288313
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IEC 62153-4-15 ®
Edition 2.0 2024-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
AMENDMENT 1
AMENDEMENT 1
Metallic cables and other passive components test methods –
Part 4-15: Electromagnetic compatibility (EMC) related test method for
measuring transfer impedance and screening attenuation or coupling
attenuation with triaxial cell

Méthodes d'essai des câbles métalliques et autres composants passifs –
Partie 4-15: Compatibilité électromagnétique (CEM) – Méthode d'essai pour le
mesurage de l'impédance de transfert et de l'affaiblissement d'écran ou de
l'affaiblissement de couplage avec cellule triaxiale
IEC 62153-4-15:2021-08/AMD1:2024-05(en-fr)

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IEC 62153-4-15 ®
Edition 2.0 2024-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
AMENDMENT 1
AMENDEMENT 1
Metallic cables and other passive components test methods –

Part 4-15: Electromagnetic compatibility (EMC) related test method for

measuring transfer impedance and screening attenuation or coupling

attenuation with triaxial cell

Méthodes d'essai des câbles métalliques et autres composants passifs –

Partie 4-15: Compatibilité électromagnétique (CEM) – Méthode d'essai pour le

mesurage de l'impédance de transfert et de l'affaiblissement d'écran ou de

l'affaiblissement de couplage avec cellule triaxiale

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.10, 33.120.10 ISBN 978-2-8322-8831-3

– 2 – IEC 62153-4-15:2021/AMD1:2024
© IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
METALLIC CABLES AND OTHER PASSIVE COMPONENTS
TEST METHODS –
Part 4-15: Electromagnetic compatibility (EMC) related test method for
measuring transfer impedance and screening attenuation or coupling
attenuation with triaxial cell

AMENDMENT 1
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC Publication(s)"). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
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6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
may be required to implement this document. However, implementers are cautioned that this may not represent
the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
shall not be held responsible for identifying any or all such patent rights.
Amendment 1 to IEC 62153-4-15:2021 has been prepared by IEC Technical Committee 46:
Cables, wires, waveguides, RF connectors, RF and microwave passive components and
accessories.
© IEC 2024
The text of this Amendment is based on the following documents:
Draft Report on voting
46/992/FDIS 46/1004/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Amendment is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications/.
A list of all parts in the IEC 62153 series, published under the general title Metallic
communication cable test methods, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

___________
10.3 Expression of results
Add, at the end of the subclause, the following new sentence:
The coupling attenuation shall be described by an envelope line as described in Annex H,
Clause H.3. In case the measurement is made with mixed mode scattering parameters, the
coupling attenuation shall be obtained as described in Annex H, Clause H.2.

– 4 – IEC 62153-4-15:2021/AMD1:2024
© IEC 2024
Add, after Annex G, the following new Annex H:
Annex H
(normative)
Coupling attenuation expressed by mixed mode
scattering parameter and an envelope line
H.1 General
Coupling attenuation is often measured with a multiport network analyser with mixed mode
scattering parameters. In this case, the formulae for the conversion from voltage ratio to the
coupling attenuation shall be rearranged.
An envelope curve shall be drawn for the coupling attenuation. This simplifies the comparison
of test results.
H.2 Coupling attenuation expressed by mixed mode scattering parameter
Formula (19) is rearranged and expressed by a mixed mode scattering parameter:
ZZ22Z
diff s s
aS=−+20log 10log +10log =−+20log S 10log
(H.1)
c 10 sd21 10 10 10 sd21 10
ZZ Z
0 diff 0
where
a is the coupling attenuation;
c
S is the forward transmission scattering parameter; DUT exited in differential mode;
sd21
received power in single ended mode;
Z is the differential mode impedance;
diff
Z is the normalised value of the characteristic impedance of the environment of the
s
cable; Z = 150 Ω;
s
Z is the system impedance; Z = 50 Ω.
0 0
H.3 Envelope line of coupling attenuation
The coupling attenuation is expressed by a value A of an envelope line. The value A shall be
deduced by drawing a curve derived from the following Formula (H.2):
Af if 30 MHz ≤ < 100 MHz


E =
f (H.2)
 
c
A− 20log
10

 
where
f is the frequency in MHz;
E is the envelop line of coupling attenuation in dB;
c
A is the starting value of the envelope in dB.

© IEC 2024
This curve shall be raised until the first peak of the measurement trace is intersected. The value
A (in dB) is read where the curve intersects the Y axis, see Figure H.1.

Figure H.1 – Example of coupling attenuation with envelope line

___________
– 6 – IEC 62153-4-15:2021/AMD1:2024
© IEC 2024
...

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