IEC 62526:2007

IEC 62526
Edition 1.0 2007-11
™
IEEE 1450.1
INTERNATIONAL
STANDARD
Standard for Extensions to Standard Test Interface Language (STIL) for
Semiconductor Design Environments

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IEC 62526
Edition 1.0 2007-11
™
IEEE 1450.1
INTERNATIONAL
STANDARD
Standard for Extensions to Standard Test Interface Language (STIL) for
Semiconductor Design Environments

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XF
ICS 25.040 ISBN 2-8318-9348-8
– 2 – IEC 62526:2007(E)
IEEE 1450.1-2005(E)
CONTENTS
FOREWORD.5
IEEE Introduction .8
1. Overview.9
1.1 Scope.10
1.2 Purpose.11
2. Definitions, acronyms, and abbreviations.11
2.1 Definitions .11
2.2 Acronyms and abbreviations .12
3. Structure of this standard . 12
4. STIL syntax description.13
4.1 Reserved words.13
4.2 Reserved characters .14
4.3 Reserved UserFunctions .15
4.4 Signal and group name characteristics.15
4.5 STIL name spaces and name resolution .16
5. Expressions .17
5.1 Constant and variable expressions.17
5.2 Expression delimiters—single quotes and parentheses .17
5.3 Arithmetic expressions—integer, real, time, boolean. 19
5.4 Pattern data expressions. 20
5.5 Expression processing. 21
5.6 Boolean—boolean_expr . 26
5.7 Integers—integer_expr . 26
5.8 Logic expressions—logic_expr .27
5.9 Real expressions—real_expr . 28
5.10 Addition to timing expressions—time_expr. 29
5.11 SignalVariables—sigvar_expr . 30
5.12 Formal parameters in procedures and macros . 32
5.13 Integer lists—integer_list. 32
6. Statement structure and organization of STIL information . 33
7. STIL statement. 33
7.1 STIL syntax. 34
7.2 STIL example . 34
8. UserKeywords statement . 34
8.1 UserKeywords syntax . 34
8.2 UserKeywords example. 34
Published by IEC under licence from IEEE. © 2005 IEEE. All rights reserved.

IEEE 1450.1-2005(E)
9. Variables block . 35
9.1 Variables block syntax. 35
9.2 Variables example. 37
9.3 Variables scoping. 37
9.4 Variables synchronizing . 39
10. Signals block. 40
10.1 Signals block syntax . 40
10.2 Signals example . 40
10.3 Bracketed signal notation enhancement . 40
11. SignalGroups block. 43
11.1 SignalGroups syntax . 43
11.2 SignalGroups, WFCMap, and Variables example. 43
11.3 Default WFCMap attribute value . 44
11.4 Defining indexed signal groups .44
12. PatternBurst block. 45
12.1 PatternBurst syntax . 45
12.2 PatternBurst example. 47
12.3 Tiling and synchronization of patterns . 48
12.4 If and While statements . 50
13. Timing block and WaveformTable block . 51
13.1 Additional domain specification. 51
13.2 CompareSubstitute operation—s, S. 51
14. ScanStructures block. 52
14.1 ScanStructures syntax . 52
14.2 Scan cell naming—cell_ref, chain_ref, cell_group, chain_group . 55
14.3 Scoping rules for ScanStructure blocks . 56
14.4 Example indexed list of scan cells. 57
14.5 Example of ScanChainGroups and ActiveScanChain . 57
14.6 Scan chain segments and cell groups. 59
15. Pattern data . 60
15.1 Data content read back—\C, \D, \E, \S, \U, \W . 61
15.2 Vector data mapping and joining—\m, \j . 63
15.3 Specifying event data in a pattern—\e. 65
15.4 Using expressions within pattern data . 66
16. Pattern statements . 67
16.1 Additional Pattern syntax. 68
16.2 Vector data constraints—F, E. 69
16.3 Shift and LoopData statements .70
16.4 Loop statement using an integer expression . 72
16.5 MergedScan function. 73
Published by IEC under licence from IEEE. © 2005 IEEE. All rights reserved.

– 4 – IEC 62526:2007(E)
IEEE 1450.1-2005(E)
17. Procedure and macro data substitution . 73
17.1 Nested procedure and macro cells . 73
17.2 Passing parameters to variables . 74
17.3 Default value of formal parameters . 75
17.4 Data substitution using WFCConstant and SignalVariable. 75
18. Environment block. 77
18.1 Environment syntax .
...