IEC 62788-7-3:2022/AMD1:2024

IEC 62788-7-3 ®
Edition 1.0 2024-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Measurement procedures for materials used in photovoltaic modules –
Part 7-3: Accelerated stress tests – Methods of abrasion of PV module external
Surfaces
Procédures de mesure des matériaux utilisés dans les modules
photovoltaïques –
Partie 7-3: Essais sous contraintes accélérés – Méthodes d’abrasion des
surfaces externes des modules photovoltaïques
IEC 62788-7-3:2022-02/AMD1:2024-07(en-fr)

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IEC 62788-7-3 ®
Edition 1.0 2024-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Measurement procedures for materials used in photovoltaic modules –
Part 7-3: Accelerated stress tests – Methods of abrasion of PV module external
Surfaces
Procédures de mesure des matériaux utilisés dans les modules
photovoltaïques –
Partie 7-3: Essais sous contraintes accélérés – Méthodes d’abrasion des
surfaces externes des modules photovoltaïques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 27.160 ISBN 978-2-8322-9435-2
– 2 – IEC 62788-7-3:2022/AMD1:2024
© IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT PROCEDURES FOR MATERIALS
USED IN PHOTOVOLTAIC MODULES –

Part 7-3: Accelerated stress tests –
Methods of abrasion of PV module external surfaces

AMENDMENT 1
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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shall not be held responsible for identifying any or all such patent rights.
Amendment 1 to IEC 62788-7-3:2022 has been prepared by IEC technical committee 82: Solar
photovoltaic energy systems.
The text of this Amendment is based on the following documents:
Draft Report on voting
82/2259/FDIS 82/2277/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
© IEC 2024
The language used for the development of this Amendment is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications/.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
_____________
CONTENTS
Add title of new Figure 1 and renumber Figure 1 to Figure 2.
4.2.2 Brush
Replace the existing text of subclause 4.2.2 by the following:
The brush block shall be (38 ± 1) mm × (89 ± 1) mm in area and (13 ± 1) mm in thickness.
The brush bristles shall consist of polyamide 612, poly(hexamethylene dodecanediamide) with
a 50:50 molar ratio of monomer types, (0,23 ± 0,03) mm in diameter that extend (38 ± 2) mm
from the brush block. Brushes with bristles shorter than 35 mm in length shall be replaced. The
bristle profile shall be round, with no taper or other change in geometry along their length. The
lateral repeat space of 6,4 mm shall be used for the bristle tuft rows across the width of the
brush and 12,7 mm shall be used for the bristle tuft columns along the length of the brush. For
the staggered bristles, an offset space of 3,2 mm between adjacent rows and lateral offset
space of 6,4 mm between adjacent bristle columns. The bristle tufts shall be staggered in a
5-4-5-4-. pattern along the brush, with total of 59 tufts. The bristle count shall be (158 ± 6)
−1
. See Figure 1.
tips⋅tuft
– 4 – IEC 62788-7-3:2022/AMD1:2024
© IEC 2024
Dimensions in millimetres
Figure 1 – Schematics showing the arrangement of bristle tufts on the linear brush
4.3.3 Reference material
Replace the existing text of subclause 4.3.3 by the following:
A reference material, which may be used to compare universally relative to the apparatus
manufact
...