Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells

IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.

General Information

Status
Published
Publication Date
15-Dec-2021
Drafting Committee
Current Stage
PPUB - Publication issued
Start Date
17-Jan-2022
Completion Date
16-Dec-2021
Ref Project

Buy Standard

Technical specification
IEC TS 63202-2:2021 - Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells
English language
19 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (Sample)


IEC TS 63202-2 ®
Edition 1.0 2021-12
TECHNICAL
SPECIFICATION
colour
inside
Photovoltaic cells –
Part 2: Electroluminescence imaging of crystalline silicon solar cells
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform IEC online collection - oc.iec.ch
The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the
variety of criteria (reference number, text, technical publications previews. With a subscription you will always
committee, …). It also gives information on projects, replaced have access to up to date content tailored to your needs.
and withdrawn publications.
Electropedia - www.electropedia.org
IEC Just Published - webstore.iec.ch/justpublished
The world's leading online dictionary on electrotechnology,
Stay up to date on all new IEC publications. Just Published
containing more than 22 000 terminological entries in English
details all new publications released. Available online and
and French, with equivalent terms in 18 additional languages.
once a month by email.
Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Customer Service Centre - webstore.iec.ch/csc

If you wish to give us your feedback on this publication or
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
IEC TS 63202-2 ®
Edition 1.0 2021-12
TECHNICAL
SPECIFICATION
colour
inside
Photovoltaic cells –
Part 2: Electroluminescence imaging of crystalline silicon solar cells

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 27.160 ISBN 978-2-8322-1061-1

– 2 – IEC TS 63202-2:2021 © IEC 2021
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Imaging . 7
4.1 Apparatus . 7
4.1.1 General . 7
4.1.2 Electroluminescence imaging camera . 7
4.1.3 Dark room imaging studio or environment . 8
4.1.4 Power supply . 9
4.1.5 Image processing and displaying software . 9
4.2 Procedure . 10
4.2.1 Camera settings and positioning . 10
4.2.2 Camera setting . 10
4.2.3 Imaging . 11
4.2.4 Image correction . 12
5 Evaluation of EL images . 12
5.1 Principles of electroluminescence . 12
5.2 Image interpretation . 12
5.2.1 Series resistance . 12
5.2.2 Minority carrier lifetime and diffusion length . 13
5.2.3 Shunt resistance . 13
5.2.4 Assignment of root cause . 13
5.2.5 Qualitative image interpretation . 13
6 Reporting. 18
Bibliography . 19

Figure 1 – Typical setup of an electroluminescence imaging system . 7
Figure 2 – Image of multi-crystalline silicon solar cell with SNR value of 45 . 8
Figure 3 – EL images of PV solar cell with broken fingers . 14
Figure 4 – EL images of PV cell with different grades of concentric circles in mono-
crystalline silicon . 15
Figure 5 – EL images of PV cell with local shunting . 16
Figure 6 – EL images of PV mono-crystalline silicon solar cells . 16
Figure 7 – EL images of PV multi-crystalline silicon solar cells. 17
Figure 8 – EL images of PV cell . 17

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PHOTOVOLTAIC CELLS –
Part 2: Electroluminescence imaging
of crystalline silicon solar cells

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC TS 63202-2 has been prepared by IEC technical committee 82: Solar photovoltaic energy
systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
82/1912/DTS 82/1951/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.

– 4 – IEC TS 63202-2:2021 © IEC 2021
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.
A list of all parts in the IEC 63202 series, published under the general title Photovoltaic cells,
can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.

PHOTOVOLTAIC CELLS –
Part 2: Electroluminescence imaging
of crystalline silicon solar cells

1 Scope
This part of IEC 63202 specifies methods to detect and examine defects on bare crystalline
silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being
placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence
images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can
be detected by EL imaging and provides information on the different possible methods to detect
and differentiate such defects. When EL imaging alone cannot provide conclusive information
for the presence of a type of defect, suggestions are also made to utilize a combination of other
methods.
Finally, this document provides some information on potential effects when using cells with
specific EL features in module assembly. Although this document mainly addresses bare c-Si
solar cells, it is generally applicable to all wafer solar cell technologies.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC TS 60904-13:2018, Photovoltaic devices – Part 13: Electroluminescence of photovoltaic
modules
IEC TS 61836:2016, Solar photovoltaic energy systems – Terms, definitions and symbols
IEC TS 62446-3, Photovoltaic (PV) systems – Requirements for testing, documentation and
maintenance – Part 3: Photovoltaic modules and plants – Outdoor infrared thermography
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC TS 61836, together
with the following, apply.
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
electroluminescence
EL
light emission by radiative recombination of excited charge carriers in a semiconductor device
resulting from electrical voltage applied to the semiconductor in forward
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.