IEC 62149-2:2009

IEC 62149-2
®
Edition 1.0 2009-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Fibre optic active components and devices – Performance standards –
Part 2: 850 nm discrete vertical cavity surface emitting laser devices

Composants et dispositifs actifs à fibres optiques – Normes de performance –
Partie 2: Dispositifs discrets à laser 850 nm émettant en surface

IEC 62149-2:2009

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IEC 62149-2
®
Edition 1.0 2009-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Fibre optic active components and devices – Performance standards –
Part 2: 850 nm discrete vertical cavity surface emitting laser devices

Composants et dispositifs actifs à fibres optiques – Normes de performance –
Partie 2: Dispositifs discrets à laser 850 nm émettant en surface

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
R
CODE PRIX
ICS 33.180.20 ISBN 978-2-88912-271-4
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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– 2 – 62149-2 Ó IEC:2009
CONTENTS
FOREW ORD . 3
INTRODUCTION . 5
1 Sc o pe . 6
2 Normative references . 6
3 Terms, definitions, symbols and abbreviated terms . 7
3.1 Terms and definitions . 7
3.2 Symbols and abbreviated terms . 7
4 Product parameters . 8
4.1 Absolute limiting ratings . 8
4.2 Operating environment . 8
4.3 Functional specification . 8
4.4 Diagrams . 8
5 Testing . 8
5.1 Ge n eral . 8
5.2 Characterization testing . 9
5.3 Performance testing . 9
6 Environmental specifications. 9
6.1 General safety . 9
6.2 Laser safety . 9
6.3 Electromagnetic compatibility (EMC) requirements . 9
Annex A (normative) Specifications for multimode 850-nm VCSEL device without a
monitor photodiode (Case a). 10
Annex B (normative) Specifications for multimode 850 nm VCSEL device with a
monitor photodiode (Case b). 14
Bibliography . 19

Figure A.1 – 850 nm VCSEL TO CAN a) and pigtailed b) devices without a monitor
photodiode. 11
Figure B.1 – 850 nm VCSEL TO CAN a), pigtailed b) and TOSA c) devices with a
monitor photodiode . 16

Table 1 – Operating environment . 8
Table A.1 – Absolute limiting ratings . 10
Table A.2 – Operating conditions for functional specification . 10
Table A.3 – Functional specification . 11
Table A.4 – Performance test plan . 12
Table A.5 – Recommended performance test failure criteria . 13
Table B.1 – Absolute limiting ratings . 14
Table B.2 – Operating conditions for functional specification . 14
Table B.3 – Functional specification . 15
Table B.4 – Performance test plan . 17
Table B.5 – Recommended performance test failure criteria . 18

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62149-2 Ó IEC:2009 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES –
PERFORMANCE STANDARDS –

Part 2: 850 nm discrete vertical cavity surface emitting laser devices


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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agreement between the two organizations.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62149-2 has been prepared by subcommittee 86C: Fibre optic
systems and active devices, of IEC technical committee 86: Fibre optics.
This bilingual version (2010-11) replaces the English version.
The text of this standard is based on the following documents:
FDIS Report on voting
86C/886/FDIS 86C/914/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The French version of this standard has not been voted upon.

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– 4 – 62149-2 Ó IEC:2009
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 62149 series, published under the general title Fibre optic active
components and devices – Performance standards, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
 reconfirmed,
 withdrawn,
 replaced by a revised edition, or
 amended.

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62149-2 Ó IEC:2009 – 5 –
INTRODUCTION
Fibre optic laser devices are used to convert electrical signals into optical signals. This part of
IEC 62149 covers the performance specification for 850-nm discrete vertical cavity surface
emitting laser devices in fibre optic telecommunication and optical data transmission
applications.

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– 6 – 62149-2 Ó IEC:2009
FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES –
PERFORMANCE STANDARDS –

Part 2: 850 nm discrete vertical cavity surface emitting laser devices



1 Scope
This part of IEC 62149 covers the performance specification for 850-nm discrete vertical
cavity surface emitting laser (VCSEL) devices of transverse multimode types used for the
fibre optic telecommunication and optical data transmission application. The performance
standard contains a definition of the product performance requirements together with a series
of sets of tests and measurements with clearly defined conditions, severities, and pass/fail
criteria. The tests are intended to be run on a “once-off” basis to prove any product’s ability to
satisfy the performance standard’s requirements.
A product that has been shown to meet all the requirements of a performance standard can
be declared as complying with the performance standard, but should then be controlled by a
quality assurance/quality conformance program.
Depending on the modulation speeds, subcategorized specifications are defined. Types A1,
A2 and A3 correspond to 1,25 Gbit/s, 2,5 Gbit/s and 4,25 Gbit/s VCSELs, respectively.
Each subcategorized specification is also defined by separate details depending on the
device types, such as specifications for a VCSEL device without a monitor photodiode (Case
a) and for a VCSEL device with a monitor photodiode (Case b).
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60749 (all parts), Semiconductor devices – Mechanical and climatic test methods
IEC 60825 (all parts), Safety of laser products
IEC 60950-1, Information technology equipment – Safety – Part 1: General requirements
IEC 61300-2-4, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 2-4: Tests – Fibre/cable retention
IEC 61300-2-19, Fibre optic interconnecting devices and passive components – Basic test
and measurement procedures – Part 2-19: Tests – Damp heat (steady state)
IEC 61300-2-48, Fibre optic interconnecting devices and passive components – Basic test
and measurement procedures – Part 2-48: Tests – Temperature-humidity cycling
IEC Guide 107: 2009, Electromagnetic compatibility – Guide to the drafting of electromagnetic
compatibility publications

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62149-2 Ó IEC:2009 – 7 –
3 Terms, definitions, symbols and abbreviated terms
For the purposes of this document, the following terms, definitions, symbols and abbreviated
terms apply.
NOTE The terminology concerning the physical concepts, the types of devices, the general terms, and those
related to ratings and characteristics of semiconductor devices can be found in IEC 60747-5-1. In addition, the
definition for the essential ratings and characteristics of the semiconductor optoelectronic devices for fibre optic
system applications can be found in IEC 62007-1.
3.1 Terms and definitions
The following terms are defined for the specific characteristics of vertical cavity surface
emitting laser devices.
3.1.1
operating wavelength
peak centre laser wavelength of the vertical cavity surface emitting laser device when it is
operated at the normal operating conditions specified in the sectional specification of the
VCSEL
3.1.2
transverse mode
cross-sectional profile of the optical beam intensity at the laser output of the VCSEL.
Depending on the mode status between multi-mode and single-mode, the package type of the
VCSEL devices is also defined
3.1.3
multi-mode
cross-section transverse mode of the laser beam profile with mode number greater than one,
which means that the intensity profile has more than one spot, compared to the single-mode
which corresponds to the cross-section transverse mode of the laser beam profile with mode
number of one having the intensity profile of one circular spot
3.1.4
modulation speed
digital modulation speed with an optimum modulation amplitude between the operating current
and threshold current level
3.1.5
submount
substrate upon which a laser is mounted for assembly into the further packaging
3.1.6
VCSEL device without a monitor photodiode
VCSEL packaged device without a monitor photodiode
3.1.7
VCSEL device with a monitor photodiode
VCSEL packaged device with a monitor photodiode
3.2 Symbols and abbreviated terms
l
peak laser wavelength
p
I threshold current
th
V threshold voltage
th
I operating current

op
V forward voltage at operating current
f

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– 8 – 62149-2 Ó IEC:2009
R series resistance
s
h slope efficiency
P continuous laser output power (at connector output or pigtailed fibre output for
o
packaged types)
Dl /DT wavelength change over temperature
T
2
q beam divergence at 1/e intensity
t /t rise and fall time from 20 % to 80 % of the peak intensity
r f
Dl spectral width, RMS (at static condition)
RIN relative intensity noise
DR /DT series resistance temperature coefficient
S
4 Product parameters
4.1 Absolute limiting ratings
Absolute limiting (maximum and/or minimum) ratings imply that no catastrophic damage will
occur if the product is subject to these ratings for short periods, provided each limiting
parameter is in isolation and all other parameters have values within the normal performance
parameters. It should not be assumed that limiting value of more than one parameter can be
applied at any one time. The absolute maximum ratings of the subcategorized types A1, A2,
and A3 for modulation speeds are listed in Annex A and Annex B, depending on the device
types.
4.2 Operating environment
The operating environment of all the subcategorized types, A1, A2 and A3, is specified in
Table 1.
Table 1 – Operating environment
Value
Parameter Symbol Unit
Minimum Maximum
O
Operating temperature T 0 70 C
op

4.3 Functional specification
Functional specifications of all the subcategorized types, A1, A2 and A3, for modulation
speeds are listed in Annex A and Annex B, depending on the device types.
4.4 Diagrams
Diagrams of all the VCSEL device types are included in Annex A and Annex B.
5 Testing
5.1 General
Initial characterisation and qualification shall be undertaken when a build standard has been
completed and frozen. Qualification maintenance is carried using periodic testing programs.
Test conditions for all tests unless otherwise stated are 25 °C ± 2 °C.

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62149-2 Ó IEC:2009 – 9 –
5.2 Characterization testing
Characterisation shall be carried out on at least 20 products taken from at least three different
manufacturing lots. The characteristics and conditions of laser diode are tested at the
operating temperature and the operating current to satisfy the functional specifications
defined in 4.3.
5.3 Performance testing
Performance testing is undertaken when characterization testing is complete. The
performance test plan and recommended performance test failure criteria are specified in
Annex A and Annex B, depending on the device types.
6 Environmental specifications
6.1 General safety
All products meeting this standard shall conform to IEC 60950-1.
6.2 Laser safety
Fibre optic transmitter and transceiver using the laser diode specified in this document shall
be class 3R laser certified under any condition of operation. This includes single fault
conditions whether coupled into a fibre or out of an open bore. Fibre optic transmitter and
transceiver using the laser diode specified in this document shall be certified to be in
conformance with IEC 60825-1: Safety of laser products – Part 1: Equipment classification
and requirements.
Laser safety standards and regulations require that the manufacturer of a laser product
provide information about the product’s laser, safety features, labelling, use, maintenance and
service. This documentation shall explicitly define requirements and usage restrictions on the
host system necessary to meet these safety certifications.
6.3 Electromagnetic compatibility (EMC) requirements
Products defined in this specification shall comply with suitable requirements for
electromagnetic compatibility (in terms of both emission and immunity), depending on
particular usage/environment in which they are intended to be installed or integrated.
Guidance to the drafting of such EMC requirements is provided in IEC Guide 107. Guidance
for electrostatic discharge (ESD) is still under study.

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– 10 – 62149-2 Ó IEC:2009
Annex A
(normative)

Specifications for multimode 850-nm VCSEL device
without a monitor photodiode (Case a)

A.1 Absolute limiting ratings
Absolute limiting (maximum and/or minimum) ratings (Table A.1) imply that no catastrophic
damage will occur if the product is subject to these ratings for short periods, provided each
limiting parameter is in isolation and all other parameters have values within the normal
performance parameters. It should not be assumed that a limiting value of more than one
parameter can be applied at any one time.
Table A.1 – Absolute limiting ratings
Value
Parameter Symbol Unit
Minimum Maximum
O
Storage temperature T –40 100 C

stg
O
260 C,
T
Soldering condition
sol
10 s
Laser diode
Reverse bias voltage V 5 V

RB
Continuous forward current I 12 mA

FLD

A.2 Operating environment
The requirements of 4.2 shall be met.
A.3 Functional specification
Tables A.2 and A.3 contain the operating conditions for functional specifications and the
functional specifications of 1,25/ 2,5/ 4,25 Gbit/s 850 nm VCSEL devices without a monitor
photodiode at the operating conditions.
Table A.2 – Operating conditions for functional specification
Value
Parameter Symbol Unit Note
Minimum Maximum
Operating forward current I 7 mA

op
Operating forward bias voltage V 1,6 2,2 V

f

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62149-2 Ó IEC:2009 – 11 –
Table A.3 – Functional specification
Value
Parameter Symbol Unit Note
Minimum Maximum
Laser diode
Laser wavelength l 840 860 nm CW
p
Spectral bandwidth, RMS Dl 0,85 nm CW

Threshold current I 3,0 mA

th
Threshold voltage V 2,0 V

th
R I
Series resistance 20 65 Ω
s op
0,2 0,7 mW/mA I , TO
op
I , TOSA &
Slope efficiency
h
op
0,03 0,2 mW/mA
Pigtail
5,0 mW I , TO
op
I , TOSA &
Continuous laser output power P
O
op
3.0 mW
Pigtail
O
Wavelength change over temperature Dl/DT 0,07 nm/ C
1,25 Gbit/s,
300/300 ps
Type A1a
2,5 Gbit/s,
Rise and fall time t /t 150/150 Ps
r f
Type A2a
4,25 Gbit/s,
110/110 ps
Type A3a
a
Relative intensity noise RIN -120 dB/Hz
o b
Series resistance temperature coefficient DR /DT -4 000 ppm/ C
S
a
 For 1 GHz bandwidth and optical power specified (typically a negative value).
b
 Series resistance of laser diodes decreases as temperature increases and thus its thermal dependent
parameter is typically a negative value.

A.4 Diagrams

1
4 2
3
Bottom view
Function
Pin mumber
1 VCSEL anode
2 VCSEL cathode
a) b)
3 Not used
4 Not used
IEC  1262/09

Figure A.1 – 850 nm VCSEL TO CAN a) and pigtailed b) devices
without a monitor photodiode

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– 12 – 62149-2 Ó IEC:2009
A.5 Testing
A.5.1 Characterization testing
The requirements of 5.1 shall be met.
A.5.2 Performance testing
Performance testing is undertaken when characterization testing is complete.
Table A.4 – Performance test plan
c
No. Test Reference Conditions n
1 Endurance test of:

1.1 Package

1.1.1 High temperature IEC 60749-6 Temperature: T =Tstg max 11
storage Duration: 1 000 h

1.1.2 Low temperature Temperature: T =Tstg min 11
storage
Duration: > 2 000 h


1.1.3 Temperature 11
Temperature: T =Tstg min
IEC 60749-25
A
cycling

T =Tstg max
B

Number of cycles = 100


 11
T= +40 °C ± 2 °C
IEC 61300-2-19
1.1.4 Damp heat
RH: 93 % ± 2 %


96 h duration




1.1.5 Temperature- IEC 61300-2-48, method A –40 °C ± 2 °C to +85 °C ± 2 °C 11
humidity cycling
85 ± 5 % RH at the maximum

 temperature


1 h minimum duration at

extremes

³1 °C/min rate of change

42 cycles



a
IEC 61300-2-4
1.1.6 Fibre pull 11
5 N ± 0,5 N at 0,5 N/s

60 s duration for buffered fibres


b
1.2 Laser diode
Temperature: at least two test

(submount)
temperatures:
b


φ specified, constant power
e


1.2.1
Ts1=Ts max


1.2.2

Ts2=< (Ts1–20 °C)

Duration: >5 000 h

2 Mechanical shock 11
IEC 60749-10 1 500 G, 0,5 ms
5 times/axis
3 Vibration 11
IEC 60749-12 20G, 20 Hz – 2 000 Hz,
4 min./cycle, 4cycle/axis
ΔT=100 °C, Temperature change
4 Rapid change of 11
IEC 60749-11
temperature time < 10 s, dwell time> 2 min.
temperature reach time < 5min.
15 cycles
5 ESD Human body model, positive and 3
IEC 60749-26
negative voltage pulses with a
pulse interval of 300 ms
−6
6 Internal moisture 11
£ 5 000 ´ 10 water vapor
IEC 60749-7
a
Applied to fibre pigtailed packages.
b
 These parameters can be determined from negotiation between manufacturer and user.
c
 Number of samples.

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62149-2 Ó IEC:2009 – 13 –
Table A.5 – Recommended performance test failure criteria
Devices Parameter Failure criterion Measurement condition
a o
Laser diode Operating current 50 % increase 25 C or life test temperature

a o
Slope efficiency 10 % change 25 C or life test temperature

a o
Forward voltage 10 % change 25 C or life test temperature

o
T min, 25 C, T max
Kinks in L/I curve Kink-free within 1,2 ´ P op op
nom
a

(linearity change £10%)


a o
Laser package Operating current 50 % increase 25 C or life test temperature

Fibre or connector 10 % change Life test temperature
output power  I set to initial value
mon



o
Kinks in L/I curve Kink-free within 1,2 ´ P T min, 25 C, T max
nom op op
a

(linearity change £10 %)




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