IEC 61988-5:2009

IEC 61988-5 ®
Edition 1.0 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Plasma display panels –
Part 5: Generic specification
Panneaux d’affichage à plasma –
Partie 5: Spécification générique

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IEC 61988-5 ®
Edition 1.0 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Plasma display panels –
Part 5: Generic specification
Panneaux d’affichage à plasma –
Partie 5: Spécification générique

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
T
CODE PRIX
ICS 31.260 ISBN 978-2-88910-600-4
– 2 – 61988-5 © IEC:2009
CONTENTS
FOREWORD.4
1 Scope.6
2 Normative references .6
3 Order of precedence.7
4 Terminology, units, symbols and abbreviations.7
5 Standard environmental conditions.8
6 Marking .8
6.1 Device identification code.8
6.2 Device traceability code .8
6.3 Packing .8
7 Quality assessment procedures.8
7.1 General .8
7.2 Eligibility for qualification and/or capability approval.8
7.3 Primary stage of manufacture.8
7.4 Commercially confidential information .9
7.5 Formation of inspection lots.9
7.6 Structurally similar devices.9
7.7 Subcontracting .9
7.8 Incorporated components .9
7.9 Validity of release.9
8 Qualification approval procedure .9
8.1 Qualification approval testing .9
8.2 Granting of qualification approval .9
8.3 Quality conformance inspection requirements.9
8.3.1 General .9
8.3.2 Division into groups and subgroups .10
8.3.3 Inspection requirements .12
8.3.4 Supplementary procedure for reduced inspection .12
8.3.5 Sampling requirements for small lots .13
8.3.6 Certified records of released lots (CRRL) .13
8.3.7 Delivery of device subjected to destructive or non-destructive tests.13
8.3.8 Delayed deliveries .13
8.3.9 Supplementary procedure for deliveries.13
8.4 Statistical sampling procedures .13
8.4.1 AQL sampling plans.14
8.4.2 LTPD sampling plans.14
8.5 Endurance tests .14
8.6 Endurance tests where the failure rate is specified.14
8.6.1 General .14
8.6.2 Selection of samples .14
8.6.3 Failure.14
8.6.4 Endurance test time and sample size .14
8.6.5 Procedure to be used when the number of observed failures exceeds
the acceptance number .14
8.7 Accelerated test procedures .15
9 Capability approval procedures .15

61988-5 © IEC:2009 – 3 –
10 Test and measurement procedures.15
10.1 Standard conditions and general precautions .15
10.1.1 Standard conditions.15
10.1.2 General precautions .15
10.1.3 Precision of measurements .16
10.2 Physical examination.16
10.2.1 Visual examination .16
10.2.2 Dimensions .16
10.3 Electrical and optical measurements .16
10.4 Climatic and mechanical tests .16
10.5 Alternative test methods .16
10.6 Endurance.16
Annex A (normative) Lot tolerance percentage defective (LTPD) sampling plans .17
Annex B (informative) General description of specifications .22

Table A.1 – LTPD sampling plans .19
Table A.2 – Hypergeometric sampling plans for small lot size of 200 or less .20
Table A.3 – AQL and LTPD sampling plans.21

– 4 – 61988-5 © IEC:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
PLASMA DISPLAY PANELS –
Part 5: Generic specification
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61988-5 has been prepared by IEC technical committee 110: Flat
panel display devices.
The text of this standard is based on the following documents:
FDIS Report on voting
110/182/FDIS 110/191/RVD
Full information on the voting for the approval on this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all the parts in the IEC 61988 series, under the general title Plasma display panels,
can be found on the IEC website.

61988-5 © IEC:2009 – 5 –
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
– 6 – 61988-5 © IEC:2009
PLASMA DISPLAY PANELS –
Part 5: Generic specification
1 Scope
This generic specification for plasma display panels specifies general procedures for quality
assessment to be used in the IECQ-CECC system and establishes general principles for
describing and testing of electrical, optical, mechanical and environmental characteristics.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050 (all parts), International electrotechnical vocabulary
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
IEC 60617, Graphical symbols for diagrams
IEC 60747-1, Semiconductor devices – Part 1: General
IEC 61988-1, Plasma display panels – Part 1: Terminology and letter symbols
IEC 61988-2-1, Plasma display panels – Part 2-1: Measuring methods – Optical
IEC 61988-2-2, Plasma display panels – Part 2-2: Measuring methods – Optoelectrical
IEC 61988-3-1, Plasma display panels – Part 3-1: Mechanical interface
IEC 61988-4, Plasma display panels – Part 4: Climatic and mechanical testing methods
IECQ 01, IEC Quality Assessment System for Electronic components (IECQ) – Basic Rules
QC 001002 (all parts), IEC Quality Assessment System for Electronic components (IECQ) –
Rules of Procedure
ISO 1000:1992, SI units and recommendations for the use of their multiples and of certain
other units
ISO 2859-1, Sampling procedures for inspection by attributes – Part 1: Sampling schemes
indexed by acceptance quality limit (AQL) for lot-by-lot inspection
ISO 2859-10, Sampling procedures for inspection by attributes – Part 10: Introduction to the
ISO 2859 series of standards for sampling for inspection by attributes
ISO 3534-2, Statistics – Vocabulary and symbols – Part 2: Applied statistics

61988-5 © IEC:2009 – 7 –
3 Terms, definitions, units, symbols and abbreviations
3.1 Terms and definitions
For the purpose of this document, the following terms and definitions given in IEC 61988-1,
IEC 60050 series, IECQ 01, and ISO 3534-2 apply.
NOTE Special terms for statistical quality control are given in IECQ 01 and ISO 3534-2.
3.2 Units, symbols and abbreviations
Units, graphical and letter symbols shall, wherever possible, be taken from IEC 60027,
IEC 60617 and ISO 1000:1992.
Any other units, symbols or terminology peculiar to one of the devices covered by this generic
specification shall be taken from the relevant IEC or ISO standards (see Clause 2) or derived
in accordance with the principles of the standards listed above.
In this document following abbreviations are used:
AQL: Acceptance quality level (see 8.4.1)
LTPD: Lot tolerance percentage defectives (see 8.4.2)
SI: Supervising Inspectorate
DMR: Designated Management Representative
4 Order of precedence
The documents are ranked in the following order of authority:
a) Detail specifications
b) Blank detail specifications
c) Sectional specifications
d) Generic specifications
e) Basic specifications
f) IECQ rules of procedure
g) Any other international (e.g. IEC) documents to which reference is made
h) National documents.
The same order of precedence shall apply to equivalent national documents.
Detail specifications are prepared by the National Standards Organization (NSO), an
approved manufacturer, industrial task groups or users as described in IEC QC 001002-
2:1998, 1.4.
Blank detail specifications, sectional specifications and generic specification (this standard)
are to be prepared by technical committee of IEC.
Basic specifications are IEC or ISO documents related to all electrical components.
IECQ rules of procedure are specified in IEC QC 001002.
In Annex B, the general description of specifications is shown extracted from IEC Guide 102,
2.3.
– 8 – 61988-5 © IEC:2009
5 Standard environmental conditions
Standard environmental conditions for the measurement of characteristics, for tests and
operating conditions are at temperature of 25 °C ± 3 °C, a relative humidity of 25 % to 85 %,
and pressure of 86 kPa to 106 kPa.
6 Marking
6.1 Device identification code
Each device shall have a marking that will enable clear identification of the device type, for
example the model number.
6.2 Device traceability code
The device shall be provided with a traceability code which enables back-tracing of the device
to a certain production or inspection lot, for example the serial number.
6.3 Packing
Marking on the packing shall state
a) the device identification code(s) of the enclosed device(s);
b) the device traceability code(s);
c) the number of enclosed devices;
d) the required precautions, if any.
This marking shall be in accordance with import/export customs regulations. Additional
requirements can be specified in the relevant detail specification.
7 Quality assessment procedures
7.1 General
Quality assessment is carried out in the following order:
a) approval of the manufacturer;
b) qualification approval;
c) quality conformance inspection;
d) certification of conformity.
The quality conformance inspection are subdivided into group A, B and C tests; these are
performed lot by lot or periodically, as defined in 8.3.2. In some cases, group D tests may
also be specified, for example, for qualification approval.
7.2 Eligibility for qualification and/or capability approval
A type of device becomes eligible for qualification and/or capability approval when the rules of
the following procedures are satisfied: IEC QC 001002-3:2005, Clause 3, Qualification
Approval of electronic components, describing the procedure for qualification approval (QA),
the release for delivery and validity of release.
7.3 Primary stage of manufacture
The primary stage of manufacture is defined in the sectional specification.

61988-5 © IEC:2009 – 9 –
7.4 Commercially confidential information
If any part of the manufacturing process is commercially confidential, this shall be suitably
identified, and DMR shall demonstrate to the SI that the requirements of the rules of
procedure given in IEC QC 001002-3:2005, 2.3.3.1, have been complied with.
7.5 Formation of inspection lots
See the rules of procedure given in IEC QC 001002-3:2005, 3.3.1.
7.6 Structurally similar devices
See the rules of procedure given in IEC QC 001002-3:2005, 3.3.2.
7.7 Subcontracting
The use of subcontracting is permitted, unreservedly.
See the rules of procedure given in IEC QC001002-3:2005, from 3.1.2.3 to 3.1.2.7.
7.8 Incorporated components
See the rules of procedure given in IEC QC 001002-3:2005, 5.2.3.
7.9 Validity of release
See the rules of procedure given in IEC QC 001002-3:2005, 3.2.2.
8 Qualification approval procedure
8.1 Qualification approval testing
Method a), b) or c) of IEC QC001002-3:2005, 3.1.4 of the rules of procedure may be used at
the manufacturer's discretion in accordance with the inspection requirements given in the
sectional or blank detail specifications.
Samples may be composed of appropriate structurally similar devices.
All measurements called for in the detail specification shall be recorded.
The qualification report shall include a summary of all the test results for each group and
subgroup, including number of devices tested and number of devices failed. This summary
shall be derived from the recorded data. The manufacturer shall retain all data for submission
to the SI on demand.
8.2 Granting of qualification approval
See the rules of procedure given in IEC QC 001002-3:2005, 3.1.5.
8.3 Quality conformance inspection requirements
8.3.1 General
Quality conformance inspection shall consist of the examinations and tests of groups A, B, C
and D, as specified. For group B and C inspection, samples may be composed of structurally
similar devices. Sample for periodic test shall be drawn from one or more lots which have
passed groups A and B inspection. Individual devices shall have passed the group A
measurements called for in the detail specification.

– 10 – 61988-5 © IEC:2009
8.3.2 Division into groups and subgroups
The following groups and subgroups shall be used in the preparation of detail specifications.
8.3.2.1 Group A inspection (lot-by-lot)
This group prescribes the visual inspection, the electrical and the optical measurements to be
made on a lot-by-lot basis to assess the principal characteristics of a device. Unless
otherwise specified, samples shall not be composed of structurally similar devices. Group A
inspection is divided into appropriate subgroups as follows:
a) Subgroup A1
This subgroup comprises a visual examination as specified in 10.2.1.
b) Subgroup A2
This subgroup comprises measurements of primary electrical characteristics of the device.
c) Subgroup A3
This subgroup comprises measurements of primary optical characteristics of the device.
d) Subgroup A4 and A5
These subgroups may not be required. They comprise measurements of secondary
characteristics of the device. The choice between subgroups A4 or A5 for given
measurements is essentially governed by the desirability of performing them at a given quality
level.
8.3.2.2 Group B inspection (lot-by-lot)
This group prescribes the procedures to be used to assess additional properties of the device,
and includes electrical and optical measurements, mechanical, climatic and endurance tests
that can normally be performed in one week or as specified in the relevant sectional or blank
detail specification.
8.3.2.3 Group C inspection (periodic)
This group prescribes the procedures to be used on a periodic basis to assess additional
properties of the devices, and includes electrical and optical measurements, mechanical,
climatic and endurance tests appropriate for checking at intervals of either three months or
twelve months, or as specified in the relevant sectional or blank detail specification.
8.3.2.4 Division of group B and group C into subgroups
To enable comparison and to facilitate change from group B to group C and vice versa when
necessary (see 8.3.4), tests in these groups are divided among subgroups bearing the same
number for corresponding tests.
a) Subgroup B1/C1
Comprise measurements that control dimensional interchange-ability of the devices.
b) Subgroup B2/C2
Comprise measurements that assess the electrical properties of the device design.

61988-5 © IEC:2009 – 11 –
c) Subgroup B3/C3
Comprise measurements that assess the optical properties of the device design.
d) Subgroup B4/C4
Comprise measurements that further assess some of the electrical and optical characteristics
of the device already measured in group A by measurement under different voltage, current,
temperature or optical conditions.
e) Subgroup B5/C5
Comprise verification of ratings of the device, where appropriate.
f) Subgroup B6/C6
Comprise tests intended to assess mechanical robustness of the device.
g) Subgroup B7/C7
Comprise tests intended to assess interconnection ability of the device.
h) Subgroup B8/C8
Comprise tests intended to assess the ability of the device to withstand climatic stress, for
example change of temperature.
i) Subgroup B9/C9
Comprise tests intended to assess the ability of the device to withstand mechanical stresses,
for example vibration, shock.
j) Subgroup B10/C10
Comprise tests intended to assess the ability of the device to withstand long-term humidity.
k) Subgroup B11/C11
Comprise tests intended to assess electrical and optical properties of the device under
storage conditions at extremes of temperature.
l) Subgroup B12/C12
Comprise tests intended to assess performance of the device under different conditions of air
pressure.
m) Subgroup B13/C13
Comprise tests intended to assess failure characteristics of the device under endurance
testing.
n) Subgroup B14/C14
Comprise tests on the permanence of marking.

– 12 – 61988-5 © IEC:2009
These subgroups may not all be required. The required subgroups are specified in the
relevant sectional or blank detail specification.
8.3.2.5 Group D inspection
This group prescribes the procedures to be carried out at intervals of twelve months or for
qualification approval only.
8.3.3 Inspection requirements
The statistical sampling procedures described in 8.4 shall be used.
8.3.3.1 Criteria for lot rejection
Lots failing to meet the quality conformance inspection of either group A or group B inspection
shall not be accepted. If, during quality conformance inspection, devices fail a test in a
subgroup which would result in the lot being rejected, the quality conformance inspection can
be terminated, and the lot shall be considered a rejected lot in group A and B. If a lot is
withdrawn in a state of failing to meet quality conformance requirements and is not re-
submitted, it shall be considered a rejected lot.
8.3.3.2 Re-submitted lots
Failing lots, that have been reworked when technically possible and are resubmitted for
quality conformance inspection, shall contain only devices that were included in the original
lot and shall be re-submitted only once for each inspection group (group A and B). Re-
submitted lots shall be kept separate from new lots and shall be clearly identified as re-
submitted lots. Re-submitted lots shall be randomly re-sampled and inspected for all the
inspection criteria of group A.
8.3.3.3 Procedure in case of test equipment failure or operator error
If any devices are believed to have failed as a result of test equipment failure or operator
error, the failures shall be entered in the test record (but may be excluded from the certified
records of released lots by agreement with the SI) and shall be submitted along with a
complete explanation of why the failures are believed to be invalid to the SI.
The chief inspector shall decide whether replacement devices from the same inspection lot
may be added to the sample. Replacement devices shall be subjected to the same tests to
which the discarded devices were subjected prior to failure and to any remaining specified
tests to which the discarded devices were not subjected prior to failure.
8.3.3.4 Procedure in case of failure in periodic tests
When a group B failure occurs, the corresponding group C tests (see 8.3.2.4) are invalid. In
the event of failing periodic inspection tests for causes other than test equipment failure or
operator error, see the rules of procedure given in IEC QC001002-3:2005, 3.1.8.
8.3.4 Supplementary procedure for reduced inspection
8.3.4.1 Group B
A special reduced inspection procedure may be used which allows the manufacturer to carry
out the appropriate group B tests at normal inspection on every fourth lot with a maximum
interval of three months instead of on a lot-by-lot basis for the tests in all subgroups of group
B. This special procedure applies to each subgroup which has fulfilled the required conditions.
The condition for this change shall be that 10 successive lots have passed group B inspection.
Reversion to normal inspection in group B shall be made when a sample has failed to meet a
subgroup inspection under the reduced inspection procedure.

61988-5 © IEC:2009 – 13 –
8.3.4.2 Group C
When a three-month interval is specified for periodic tests, the test period may be extended to
six month provided that three successive periodic tests have been passed at three-month
intervals. Reversion to the normal three-month interval shall be made when a sample has
failed to meet a subgroup inspection under the extended interval procedure (see also 8.3.3.4).
8.3.5 Sampling requirements for small lots
Where a lot size is 200 or less, the following procedures, complying with the appropriate
requirements of Annex A, shall be used.
Where the AQL system is specified, the equivalent LTPD shall first be selected from Table A.3
of Annex A.
a) Non-destructive testing
1) 100 % of the devices shall be inspected for any test indicated as non-destructive.
Or:
2) Any appropriate LTPD single sampling plan selected from Table A.2 of Annex A.
Or:
3) Any appropriate LTPD double sampling plan.
b) Destructive testing
1) Any appropriate LTPD single sampling plan selected from Table A.2 of Annex A.
Or:
2) Any appropriate LTPD double sampling plan.
8.3.6 Certified records of released lots (CRRL)
Certified records of released lots (CRRL) may be prepared by agreement between the
manufacturer and customer. Informative guide is provided in Annex B of IECQ QC001002-
2:1998.
8.3.7 Delivery of device subjected to destructive or non-destructive tests
Tests considered as destructive are marked (D) in the sectional or blank detail specifications.
Devices subjected to destructive tests shall not be included in the lot for delivery. Devices
subjected to non-destructive environmental tests may be delivered provided they are re-tested
according to group A requirements and satisfy them.
8.3.8 Delayed deliveries
Before delivery of lots in store for a period and in conditions specified in the relevant sectional
or blank detail specification, the lots or the quantities to be delivered shall undergo the
specified group A inspection and the group B interconnection ability tests.
8.3.9 Supplementary procedure for deliveries
The manufacturer may, at his discretion, supply devices that have met a more severe
assessment level than that required.
8.4 Statistical sampling procedures
For group A, B and C inspections, either the AQL sampling procedure or the LTPD sampling
procedure shall be used. The detail specification shall specify which of the procedures is to
be used.
– 14 – 61988-5 © IEC:2009
8.4.1 AQL sampling plans
See IEC 60410, ISO 2859-1, and ISO 2859-10. There are three types of sampling plans:
single, double and multiple. When several types of plans are available for a given AQL and
code letter, any one may be used.
8.4.2 LTPD sampling plans
See Annex A.
NOTE IEC 61193-2: Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of
electronic components and packages is published as an alternative for LTPD sampling plan.
8.5 Endurance tests
Endurance tests shall be specified in the detail specification.
8.6 Endurance tests where the failure rate is specified
Failure rate used in this standard is defined as a percentage per 1 000 h, expressed in LTPD
plan.
8.6.1 General
Endurance tests with the specified failure rate shall be specified in detail specification.
Endurance tests performed on devices at, or within, their maximum ratings shall be
considered non-destructive.
8.6.2 Selection of samples
Samples for endurance tests shall be selected at random from the inspection lot (see Annex
A). The sample size for a 1 000 h test shall be chosen by the manufacturer from the column
under the specified failure rate (see Table A.1) or the actual lot size (see Table A.2).
The acceptance number shall be the one associated with the particular sample size chosen.
8.6.3 Failure
A device which fails at one or more of the end-point limits specified for endurance tests shall
be considered a failure. If the sample fails, the test may be terminated at the discretion of the
manufacturer.
8.6.4 Endurance test time and sample size
When the failure rate is specified, the endurance test time shall be 1 000 h initially. Once a lot
has passed the 1 000 h test, endurance tests can be reduced to a certain period, as specified
in the detail specification.
8.6.5 Procedure to be used when the number of observed failures exceeds the
acceptance number
In the event that the number of failures observed on endurance tests exceeds the acceptance
number, the manufacturer shall choose one of the following options:
a) withdraw the entire lot;
b) add additional samples in accordance with 8.6.5.1;
c) extend the test time to 1 000 h in accordance with 8.6.5.2, if a time less than 1 000 h
was chosen;
d) screen the lot and re-submit in accordance with 8.3.3.2.

61988-5 © IEC:2009 – 15 –
8.6.5.1 Additional samples
This option shall be used only once for each submission. When this option is chosen, a new
total sample size (initial plus added) shall be chosen by the manufacturer from Tables A.1 or
A.2 from the column specifying the failure rate (Table A.1) or the actual lot size (Table A.2). A
quantity of additional devices sufficient to increase the sample to the newly chosen total
sample size shall be selected from the lot. The new acceptance number shall be the one
associated with new total sample size chosen. The added sample shall be subjected to the
same endurance test conditions and time period as the initial sample. If the total observed
number of defectives (initial plus added) does not exceed the acceptance number for the total
sample, the lot shall be accepted; if the observed number of defectives exceeds the new
acceptance number, the lot shall be rejected.
8.6.5.2 Extension of endurance test period
If an endurance test time periods less than 1 000 h is used and the number of failures
observed in the initial sample exceeds the acceptance number, the manufacturer may, instead
of adding additional samples, choose to extend the test time of the entire initial sample to
1 000 h and determine a new acceptance number from Tables A.1 or A.2. The new
acceptance number shall be one associated with the largest sampling size in the specified
column which is less than, or equal to, the sample size being tested. A device which is a
failure at the initial reading interval shall be considered as such at the 1 000 h reading interval.
If the observed number of defectives exceeds this acceptance number, the lot shall not be
accepted.
8.7 Accelerated test procedures
Accelerated test may be applied when the acceleration factor is defined in advance according
to the proper theoretical analysis or experimental data.
9 Capability approval procedures
Under consideration
10 Test and measurement procedures
10.1 Standard conditions and general precautions
10.1.1 Standard conditions
Unless otherwise specified, all measurements are carried out under the atmospheric
conditions given in IEC 61988-2 series.
– Ambient temperature: 25 °C ± 3 °C
– Relative humidity between 25 % and 85 %
– Atmospheric pressure between 86 kPa and 106 kPa
Measurements may be carried out at other temperatures provided the National Supervising
Inspectorate is satisfied that the device will conform to the detail specification when tested at
an ambient temperature of 25 °C ± 1 °C and relative humidity between 48 % and 52 % when
this is important.
10.1.2 General precautions
The usual precautions for mechanical and electrostatic damage should be taken to reduce
measurement errors to a minimum and to avoid damage to the device. General precautions
for electrostatic-sensitive devices are given in IEC 60747-1.

– 16 – 61988-5 © IEC:2009
10.1.3 Precision of measurements
The limits quoted in detail specifications are absolute. Measurement inaccuracies shall be
taken into account when determining the actual measurement limits.
10.2 Physical examination
10.2.1 Visual examination
Unless otherwise specified, visual examination shall be performed under normal lighting
conditions. Examination shall be made for correctness of the following elements:
a) marking and its legibility;
b) appearance of the device.
10.2.2 Dimensions
Dimensions shall be checked in accordance with the specified drawing. Examples of typical
drawings for plasma display modules are shown in IEC 61988-3-1.
10.3 Electrical and optical measurements
Standard conditions for electrical and optical measurements are described in 6.1.1 and
IEC 61988-2 series.
The methods for electrical and optical measurements shall be in accordance with IEC 61988-2
series. They shall be used when required and as prescribed by the detail specification.
Additional methods for electrical and optical measurements that are not included in
IEC 61988-2 series shall be described in the relevant sectional or detail specification.
10.4 Climatic and mechanical tests
Methods for climatic and mechanical tests shall be in accordance with IEC 61988-4. They
shall be used when required and as prescribed by the detail specification. They are indicated
as "destructive" or "non-destructive" according to 8.3.7.
When a mandatory sequence of testing is required, it shall be specified in the sectional
specification or in the blank detail specification. Additional methods for climatic or mechanical
tests that are not included in IEC 61988-4 shall be described in the relevant sectional or detail
specification.
For those test methods that involve the observation or the application of external forces which
are related to the orientation of the device, such orientations and the direction of the force
applied shall be in accordance with IEC 61988-4, Figure 2.
10.5 Alternative test methods
All specified measurements should be performed by using the specified methods in
accordance with IEC 61988-2 series, IEC 61988-4, or the detail specification. In case
alternative methods giving equivalent results have been used, it shall be clearly noted on the
reports that it has not been measured according to IEC specified methods.
10.6 Endurance
Under consideration.
61988-5 © IEC:2009 – 17 –
Annex A
(normative)
Lot tolerance percentage defective (LTPD) sampling plans

A.1 General
The following specified procedures are suitable for all quality conformance requirements.
A.1.1 Selection of samples
Sample shall be randomly selected from the inspection lot. For continuous production, the
manufacturer, at his option, may select samples in a regular periodic manner during
manufacture, provided that the lot meets the requirements for the formation of lots.
A.1.2 Failures
Failure of a device for one or more tests of a subgroup shall be charged as a single failure.
A.2 Single-lot sampling method
Quality conformance inspection information (sample sizes and number of observed
defectives) shall be accumulated from a single inspection lot to demonstrate conformance to
the individual subgroup criteria.
A.2.1 Sample size
The sample size for each subgroup shall be determined from Tables A.1 or A.2 and shall meet
the specified LTPD. The manufacturer may, at his option, select a sample size greater than
that required; however, the number of failures permitted shall not exceed the acceptance
number associated with the chosen sample size in Tables A.1 or A.2.
In Table A.2, the LTPD column to be used for sample size determination shall be that given in
the lot size column which is nearest in value to the actual size of the submitted lot except that,
if the actual lot size is halfway between two of the lot sizes given in the table, either of the lot
s
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