IEC 61000-4-16:1998

IEC 61000-4-16 ®
Edition 1.2 2011-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-16: Testing and measurement techniques – Test for immunity to
conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz

Compatibilité électromagnétique (CEM) –
Partie 4-16: Techniques d’essai et de mesure – Essai d’immunité aux
perturbations conduites en mode commun dans la gamme de fréquences de
0 Hz à 150 kHz
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IEC 61000-4-16 ®
Edition 1.2 2011-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-16: Testing and measurement techniques – Test for immunity to
conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz

Compatibilité électromagnétique (CEM) –
Partie 4-16: Techniques d’essai et de mesure – Essai d’immunité aux
perturbations conduites en mode commun dans la gamme de fréquences de
0 Hz à 150 kHz
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX CK
ICS 33.100.20 ISBN 978-2-88912-418-3

– 2 – 61000-4-16 © IEC:1998+A1:2001
+A2:2009
CONTENTS
FOREWORD . 3
INTRODUCTION . 5

1 Scope . 6
2 Normative references. 7
3 General . 7
4 Definitions . 8
5 Test levels . 8
5.1 Test levels at mains frequency . 9
5.2 Test levels in the frequency range 15 Hz-150 kHz . 9
6 Test equipment . 10
6.1 Test generators . 10
6.2 Verification of the characteristics of the test generators . 11
6.3 Coupling/decoupling networks . 12
7 Test set-up . 13
7.1 Earthing connections . 13
7.2 Equipment under test . 13
7.3 Test generators . 14
7.4 Decoupling/isolation devices . 14
8 Test procedure . 14
8.1 Laboratory reference conditions . 14
8.2 Execution of the test . 14
9 Evaluation of test results . 16
10 Test report . 16

Annex A (informative)  Sources of disturbances and coupling mechanisms . 21
Annex B (informative)  Selection of test levels . 23
Annex C (informative)  Bibliography . 25

Figure 1 – Example of equipment ports and configuration . 17
Figure 2 – Profile of the test voltage . 18
Figure 3 – Schematic in principle of the generator for d.c. voltage tests . 18
Figure 4 – Schematic in principle of the generator for tests at mains frequency . 18
Figure 5 – Schematic circuit of the coupling T network for communication ports
and other ports intended for connection to highly balanced pairs . 19
Figure 6 – Schematic circuit for type tests . 20

61000-4-16 © IEC:1998+A1:2001 – 3 –
+A2:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-16: Testing and measurement techniques –
Test for immunity to conducted, common mode disturbances
in the frequency range 0 Hz to 150 kHz

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
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transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
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expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-16 has been prepared by subcommittee 77A: Low-
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms part 4-16 of IEC 61000. It has the status of a basic EMC publication in accordance with
IEC Guide 107.
This consolidated version of IEC 61000-4-16 consists of the first edition (1998) [documents
77A/201/FDIS and 77A/221/RVD], its amendment 1 (2001) [documents 77B/291+293/FDIS and
77B/298+300/RVD] and its amendment 2 (2009) [documents 77A/691/FDIS and 77A/698/RVD].
The technical content is therefore identical to the base edition and its amendments and has
been prepared for user convenience.
It bears the edition number 1.2.

– 4 – 61000-4-16 © IEC:1998+A1:2001
+A2:2009
A vertical line in the margin shows where the base publication has been modified by
amendments 1 and 2.
Annexes A, B and C are for information only.
The committee has decided that the contents of the base publication and its amendments will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
61000-4-16 © IEC:1998+A1:2001 – 5 –
+A2:2009
INTRODUCTION
This standard is part of the IEC 61000 series, according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards or
as technical specifications or technical reports, some of which have already been published as
sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an international standard which gives immunity requirements and test procedures
related to conducted, common mode disturbances in the range d.c. to 150 kHz.

– 6 – 61000-4-16 © IEC:1998+A1:2001
+A2:2009
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-16: Testing and measurement techniques –
Test for immunity to conducted, common mode disturbances
in the frequency range 0 Hz to 150 kHz

1 Scope
This part of IEC 61000 relates to the immunity requirements and test methods for electrical and
electronic equipment to conducted, common mode disturbances in the range d.c. to 150 kHz.
The object of this standard is to establish a common and reproducible basis for testing
electrical and electronic equipment with the application of common mode disturbances to
power supply, control, signal and communication ports.
This standard defines
– test voltage and current waveform;
– range of test levels;
– test equipment;
– test set-up;
– test procedures.
For some types of ports, for example ports intended to be used with highly balanced lines,
additional test provisions may be established by product committee specifications.
The test is intended to demonstrate the immunity of electrical and electronic equipment when
subjected to conducted, common mode disturbances such as those originating from power line
currents and return leakage currents in the earthing/grounding system.
The disturbances produced by 400 Hz mains systems are not included in the scope of this
standard.
Actual interference due to these disturbance phenomena is relatively rare, except in industrial
plants. Product Committees should therefore consider whether there is a justification for
applying this standard in their Product/Product Family standards (see also clause 3).
This test is not relevant for equipment ports intended to be connected to short cables, having a
length less than 20 m or less.
The immunity to harmonics and interharmonics, including mains signalling, on a.c. power ports (in
differential mode) is not included in the scope of this standard and is covered by IEC 61000-4-13.
The immunity to conducted disturbances generated by intentional radio-frequency transmitters
is not included in the scope of this standard and is covered by IEC 61000-4-6.

61000-4-16 © IEC:1998+A1:2001 – 7 –
+A2:2009
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60050(161), International Electrotechnical Vocabulary – Chapter 161: Electromagnetic
compatibility
IEC 60068-1, Environmental testing – Part 1: General and guidance
3 General
The conducted, common mode disturbances in the frequency range d.c. to 150 kHz may
influence the reliable operation of equipment and systems installed in residential areas,
industrial areas and electrical plants.
Only those ports of an EUT which are likely to be subjected to the disturbances dealt with by
this standard shall be considered for the application of its requirements.
The disturbances are typically generated by
– the power distribution system, with its fundamental frequency, significant harmonics and
interharmonics;
– power electronic equipment (e.g. power convertors), which may inject disturbances into the
ground conductors and earthing system (through stray capacitance or filters), or generate
disturbances in signal and control lines by induction.
At the mains frequency, and harmonics of the mains frequency, the disturbances are usually
generated by the power distribution system (fault and leakage currents in the ground and
earthing systems).
At frequencies above the range of harmonics of the mains frequency (up to 150 kHz) the
disturbances are usually generated by power electronic equipment, which is often found in
industrial and electrical plants.
The coupling of the source of disturbances with the power supply, signal, control and
communication cables, transfer these disturbances to the ports of the equipment under test.
Because the coupling mechanisms defined above cannot be completely eliminated, it is
necessary for equipment to have adequate immunity to the disturbances.
Depending on the type of installation, the disturbances may be classified as follows:
2/3
a) voltage/current at power frequency: d.c., 16 Hz, 50 Hz and 60 Hz;
b) voltage/current in the frequency range 15 Hz-150 kHz (including the harmonics of the mains
frequency).
This standard defines the test procedures for both the categories of disturbance defined above.
The applicability of the tests should be defined in the product standard.
Annex A contains more information on the phenomena.

– 8 – 61000-4-16 © IEC:1998+A1:2001
+A2:2009
4 Definitions
For the purpose of this part of IEC 61000, the following definitions are used and apply to the
restricted field of conducted, common mode disturbances in the range d.c. to 150 kHz (not all
of these definitions are included in IEC 60050-161).
4.1
EUT
equipment under test
4.2
auxiliary equipment (AE)
equipment that is necessary for setting up all functions and assessing the correct performance
(operation) of the EUT during the test
4.3
port
particular interface of the specified equipment with the external electromagnetic environment
(see figure 1)
4.4
coupling
interaction between circuits, transferring energy from one circuit to another
4.5
coupling network
electrical circuit for the purpose of transferring energy from one circuit to another
4.6
decoupling network
electrical circuit for the purpose of preventing test voltage applied to the equipment under test
from affecting other devices, equipment or systems which are not under test
4.7
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance [IEV 161-01-20]
5 Test levels
The preferred range of test levels, applicable to equipment ports as a function of the different
types and sources of disturbances, is given in 5.1 and 5.2.
2/3
The levels are given for the tests at the mains frequency (d.c., 16 Hz, 50 Hz and 60 Hz) and
in the frequency range 15 Hz-150 kHz.
The applicability of each test shall be defined in the product standard.
The test voltage shall be applied in common mode to power supply, control, signal and
communication ports (the differential mode voltage is dependent on the circuit unbalance).
A guide for the selection of the test levels is given in annex B.

61000-4-16 © IEC:1998+A1:2001 – 9 –
+A2:2009
5.1 Test levels at mains frequency
Tables 1 and 2 define the preferred test levels.
2/3
The levels apply to test voltage at d.c. and at the mains frequencies of 16 Hz, 50 Hz and 60 Hz.
Table 1 – Levels for continuous Table 2 – Levels for short duration
disturbance disturbance
Level Open circuit test voltage Level Open circuit test voltage

V (r.m.s.) V (r.m.s.)
1 1 1 10
2 3 2 30
3 10 3 100
4 30 4 300
x Special x Special
NOTE x is an open level. This level may be defined in NOTE x is an open level. This level may be defined
the product standard. in the product standard.

For short duration disturbances, the normal duration for each applied disturbance is 1 s;
however, product standards may specify different durations for specific applications.
2/3
The test shall be carried out at one or more of the following frequencies: d.c., 16 Hz, 50 Hz or
60 Hz, according to the relevant mains frequency in the equipment location (see annex A); the
2/3
test at 16 Hz is therefore only applicable where the equipment is intended to be used in the
proximity of railway systems at this frequency.
The test level shall not exceed the test voltage defined in the product standard.
Information on the proposed test levels is given in annex B.
5.2 Test levels in the frequency range 15 Hz-150 kHz
Table 3 defines the preferred test levels.
Table 3 – Test levels in the frequency range 15 Hz-150 kHz
Level Profile of the test voltage (open circuit)
V (r.m.s.)
15 Hz-150 Hz 150 Hz-1,5 kHz 1,5 kHz-15 kHz 15 kHz-150 kHz
1 1 – 0,1 0,1 0,1 – 1 1
2 3 – 0,3 0,3 0,3 – 3 3
3 10 – 1 1 1 – 10 10
4 30 – 3 3 3 – 30 30
x x x x x
NOTE x is an open level. This level can be given in the product specification.

The profile of the test voltage in relation to frequency (see annex B for information) is as
follows:
– starting from the frequency 15 Hz, the level decreases up to 150 Hz at 20 dB/decade;
– the level is constant from 150 Hz to 1,5 kHz;
– the level increases from 1,5 kHz to 15 kHz at 20 dB/decade;
– the level is constant from 15 kHz to 150 kHz.
The profile of the test voltage is represented in figure 2.

– 10 – 61000-4-16 © IEC:1998+A1:2001
+A2:2009
No test level is defined below 15 Hz, excluding d.c., as tests in this frequency range are not
considered to be relevant.
6 Test equipment
6.1 Test generators
The features of the test generators for each specific test are given in 6.1.1, 6.1.2 and 6.1.3.
The generators shall have provisions to prevent the emission of disturbances which, if injected
in the power supply network, may influence the test results.
Information on the impedance of the test generators is given in annex A.
6.1.1 Characteristics and performance of the generator for d.c. tests
The test generator typically consists of a d.c. power supply unit with variable output voltage and
a time controlled switch for the short duration test.
Generator for continuous disturbance
– waveform: direct current, ripple less than 5 %;
– open circuit output voltage range (r.m.s.): 1 V, with a relative tolerance of − 10 % to
30 V, with a relative tolerance of + 10 %;
– impedance: 50 Ω, with a relative tolerance of ± 10 %.
Generator for short duration disturbance
– waveform: direct current, ripple less than 5 %;
– open circuit output voltage range: 10 V, with a relative tolerance of − 10 % to
300 V, with a relative tolerance of + 10 %;
– impedance: 50 Ω, with a relative tolerance of ± 10 %.
– rise and fall time of the output voltage at
on/off switching: between 1 to 5 µs.
The schematic in principle of the test generator is given in figure 3.
6.1.2 Characteristics and performance of the generator for tests at mains frequency:
2/3
16 Hz, 50 Hz and 60 Hz
The test generator typically consists of a variable transformer (connected to the mains
distribution network), an isolation transformer and a time controlled switch for the short
duration test; the switch shall be synchronized at 0° of the mains voltage waveform.
Generator for continuous disturbance
– waveform: sinusoidal, total harmonic distortion
less than 10 %;
– open circuit output voltage range (r.m.s.): 1 V, with a relative tolerance of − 10 % to
30 V, with a relative tolerance of + 10 %;
– impedance: 50 Ω, with a relative tolerance of ± 10 %.
– frequency: selected mains frequency.

61000-4-16 © IEC:1998+A1:2001 – 11 –
+A2:2009
Generator for short duration disturbance
– waveform: sinusoidal, total harmonic distortion less
than 10 %;
– open circuit output voltage range: 10 V, with a relative tolerance of − 10 % to
300 V, with a relative tolerance of + 10 %;
– impedance: 50 Ω, with a relative tolerance of ± 10 %.
– frequency: selected mains frequency;
– on/off switching of the output voltage: synchronized at zero crossing (0° ± 5 %).
The schematic in principle of the test generator is given in figure 4.
6.1.3 Characteristics and performance of the generator for tests in the frequency
range 15 Hz-150 kHz
The test generator typically consists of a waveform generator capable of covering the
–2
frequency band of interest. It shall have an automated sweep capability of 1 × 10 decade/s or
slower or, in the case of a synthesizer, be capable of being programmed with frequency-
dependent step-sizes of 10 % of the preceding frequency value. It shall also be capable of
being set manually.
Specifications
– waveform: sinusoidal, total harmonic distortion less
than 1 %;
– open circuit output voltage range (r.m.s.): 0,1 V, with a relative tolerance of − 10 % to
30 V, with a relative tolerance of + 10 %;
– impedance: 50 Ω, with a relative tolerance of ± 10 %;
– frequency range: 15 Hz, with a relative tolerance of − 10 %
to 150 kHz, with a relative tolerance of
+ 10 %.
6.2 Verification of the characteristics of the test generators
In order to make it possible to compare the results dealing with different test generators, they
must be calibrated or verified for the most essential characteristics.
The following generator characteristics must be verified:
– output voltage waveform;
– generator impedance;
– frequency accuracy;
– open circuit output voltage accuracy;
– rise and fall time of the output voltage at on/off switching (where applicable).
The verifications shall be carried out with voltage probe and oscilloscope or other equivalent
measurement instrumentation with 1 MHz minimum bandwidth.
The accuracy of the measuring equipment shall be better than ±5 %.

– 12 – 61000-4-16 © IEC:1998+A1:2001
+A2:2009
6.3 Coupling/decoupling networks
The coupling networks enable the test voltage to be applied, in common mode, to the power
supply, input/output (signal and control) and communication ports of the EUT. The decoupling
networks prevent the application of the test voltage to the auxiliary equipment needed to
perform the test.
6.3.1 Coupling networks
6.3.1.1 Coupling network for power supply and input/output ports
For power supply and input/output ports, the coupling network for each conductor is composed
of a resistor and a capacitor in series. The coupling networks of each conductor are connected
in parallel to form the coupling network of the port.
Figure 6 shows a schematic circuit for a coupling network, the value of the capacitor is C = 1,0 µF
and the resistor is R = 100 × n Ω where n is the number of the conductors (n is greater than or
equal to 2).
The capacitors and the resistors for each of the conductors in the coupling network for a port
shall be matched with a tolerance of 1 %.
For the d.c. voltage test the 1,0 µF capacitors shall be short-circuited.
NOTE When performing the d.c. voltage test on a signal port, the impedance of the coupling network may cause
the operating signal to be degraded.
For screened cables, the test signal is injected directly onto the cable shield, so no coupling
network is required (see figure 6).
6.3.1.2 Coupling networks for communication port
For communication ports and other ports intended for connection to balanced pairs (single or
multiple pairs), the coupling network is a T network.
Figure 5 shows a schematic circuit for a T network. The value of the capacitor is C = 4,7 µF,
the resistor is R = 200 Ω and the inductor is L = 2 × 38 mH (bifilar winding).
The components of the T network shall be matched with a tolerance such that the T network
does not significantly degrade the common mode rejection ratio of the EUT.
NOTE It may be possible to produce T networks suitable for use with common mode rejection ratios greater
than 80 dB, in which case the product standard should define an alternative coupling method.
6.3.2 Decoupling devices
6.3.2.1 General characteristics
The function of the decoupling device is to isolate the AE and/or simulator from the EUT port
under test and thereby prevent the application of the test voltage to the AE and/or simulator.
The most important characteristic of a decoupling device is its common mode attenuation over
the frequency range 0 Hz to 150 kHz.
Both active and passive isolation devices are available; examples of active devices include
amplifiers and opto-isolators, whilst examples of passive devices include isolation
transformers.
61000-4-16 © IEC:1998+A1:2001 – 13 –
+A2:2009
6.3.2.2 Specifications
The isolation and decoupling specifications, applicable to all the devices for all the types of
operating signals, are:
– input to output and input/output to ground
insulation withstand capability: 1 kV, 50/60 Hz, 1 min;
– common mode decoupling (attenuation)
in the range 15 Hz-150 kHz: 60 dB.
Decoupling devices with reduced insulation withstand capability may be used when testing at
levels below level 4.
The common mode rejection of the decoupling device shall be as high as possible in order to
minimize the degradation of the common mode rejection ratio of the EUT port.
The requirements of this subclause also apply to complex devices, such as a power supply unit
composed by an isolation transformer and an a.c. to d.c. converter.
For balanced lines the T network specified in 6.3.1.2 provides effective decoupling into the frequency
range 10 kHz to 150 kHz. A decoupling device is still required for frequencies below 10 kHz.
7 Test set-up
The test set-up specifications are given for
– earthing connections;
– equipment under test;
– test generator;
– coupling and decoupling network (decoupling/isolation devices).
7.1 Earthing connections
The safety earthing requirements of the EUT, of the auxiliary equipment (AE) and of the test
equipment shall be complied with at all times.
The EUT shall be connected to the earthing system in accordance with the manufacturer's
specifications. The test generator, the coupling networks and the decoupling devices shall be
connected to a Ground Reference Plane (GRP) or to a common earth terminal. The earth
connection to the GRP or to the common earth terminal shall be less than 1 m in length.
7.2 Equipment under test
The equipment under test shall be arranged and connected according to the equipment
installation specifications.
The power supply, input/output and communication ports shall be connected to the sources of
power supply, control and signals via the decoupling/isolation devices (see 6.3.2).
The operating signals for exercising the EUT may be provided by the auxiliary equipment or
simulator.
The cables specified by the equipment manufacturer shall be used; in the absence of
specifications, unshielded cables shall be adopted, of the type suitable for the signals involved.
The cable length is not relevant for the test, unless in the case of shielded cables (see 8.2).
For shielded cables, where the manufacturer specifies a maximum cable length, this length
shall be used; in all other cases, the cable length shall be 20 m.

– 14 – 61000-4-16 © IEC:1998+A1:2001
+A2:2009
7.3 Test generators
The test generator shall be connected to the coupling network or coupling resistor, as specified
in clause 8.
7.4 Decoupling/isolation devices
The decoupling/isolation devices shall be connected between all the EUT's ports to be tested
and the corresponding signal or power source.
Dedicated decoupling/isolation devices are not required if the AE or the power sources are
isolated.
NOTE The decoupling/isolation devices should be located on the side of the cables near to the auxiliary
equipment port, in order to use the normal terminations provided with the cables without the need to cut them.
In the case of shielded lines (e.g. coaxial cables), the generator shall be directly connected to
the shields (no additional series resistor and capacitor are required).
8 Test procedure
The test procedure includes
– preliminary verification of the correct operation of the equipment;
– execution of the test.
8.1 Laboratory reference conditions
In order to minimize the impact of environmental parameters on test results, the tests shall be
carried out in climatic and electromagnetic reference conditions as specified in 8.1.1 and 8.1.2.
8.1.1 Climatic conditions
Unless otherwise specified by the committee responsible for the generic or product standard,
the climatic conditions in the laboratory shall be within any limits specified for the operation of
the EUT and the test equipment by their respective manufacturers.
Tests shall not be performed if the relative humidity is so high as to cause condensation on the
EUT or the test equipment.
NOTE Where it is considered that there is sufficient evidence to demonstrate that the effects of the phenomenon
covered by this standard are influenced by climatic conditions, this should be brought to the attention of the
committee responsible for this standard.

8.1.2 Electromagnetic conditions
The electromagnetic conditions of the laboratory shall not influence the test results.
8.2 Execution of the test
The EUT shall be configured for its normal operating conditions.
The tests shall be performed according to a test plan that shall specify
– type of test;
– test level;
– test duration;
– EUT's ports to be tested;
61000-4-16 © IEC:1998+A1:2001 – 15 –
+A2:2009
– representative operating conditions of the EUT;
– auxiliary equipment.
The power supply, signal and other functional electrical quantities shall be applied within their
rated range. If the actual operating signal sources are not available, they may be simulated.
The main steps of the test procedure are as follows:
– preliminary verification of equipment performances;
– connection of the coupling networks and decoupling devices to the EUT's ports to be
tested;
– verification of the operating performances of input signals, if necessary;
– application of the test voltage.
The test configuration can affect the operating conditions of the I/O ports of the EUT. These
new conditions shall be considered as references in the evaluation of the test voltage
influence.
The test voltage shall be applied for a period of time sufficient to allow a complete verification
of the EUT's operating performance. For short duration tests (of typically 1 s duration), the test
voltage shall be applied repeatedly until this criterion has been met.
The test in the frequency range 15 Hz-150 kHz starts from 15 Hz; the rate of sweep shall not
–2
exceed 1 × 10 decade/s. Where the frequency is swept incrementally, the step size shall not
exceed 10 % of the start and thereafter 10 % of the preceding frequency value.
The performance of the EUT shall be continuously monitored, and any degradation shall be
recorded in the test report.
The test generator shall be connected to each port in turn. Ports not under test shall have the
input terminals of their respective coupling network connected to ground (see figure 6).
If the apparatus has a large number of similar ports, then a sufficient number shall be selected
so that all different types of termination are covered.

The ports provided by unshielded cables shall be tested by applying the test voltage directly to
the port's terminals.
In the case of shielded lines (e.g. coaxial cables), the generator output shall be directly
connected to the screen (no additional series resistor and capacitor are required).
To test ports with more than two terminals (e.g. grouping), the test voltage shall be applied
simultaneously between all the terminals of the port and ground (common mode).
For ports intended to be connected to balanced lines, the test voltage shall be applied using
the T network specified in 6.3.1.2.
During the test with application of d.c. voltage, the polarity of the test voltage shall be reversed.
A general schematic for the application of the test voltage is given in figure 6.

– 16 – 61000-4-16 © IEC:1998+A1:2001
+A2:2009
The test voltage shall be applied in common mode to the following ports:
– power supply;
– input and output;
– communication.
No specific test is required for the earth port.
The performances of the EUT shall be verified against the requirements of the plan.
The test can produce unsafe situations due to the test voltage involved or the leakage current
to earth: adequate safety precautions are essential to avoid risks to operators.
9 Evaluation of test results
The test results shall be classified in terms of the loss of function or degradation of
performance of the equipment under test, relative to a performance level defined by its manu-
facturer or the requestor of the test, or agreed between the manufacturer and the purchaser of
the product. The recommended classification is as follows:
a) normal performance within limits specified by the manufacturer, requestor or purchaser;
b) temporary loss of function or degradation of performance which ceases after the
disturbance ceases, and from which the equipment under test recovers its normal
performance, without operator intervention;
c) temporary loss of function or degradation of performance, the correction of which requires
operator intervention;
d) loss of function or degradation of performance which is not recoverable, owing to damage
to hardware or software, or loss of data.
The manufacturer’s specification may define effects on the EUT which may be considered
insignificant, and therefore acceptable.
This classification may be used as a guide in formulating performance criteria, by committees
responsible for generic, product and product-family standards, or as a framework for the
agreement on performance criteria between the manufacturer and the purchaser, for example
where no suitable generic, product or product-family standard exists.
10 Test report
The test report shall contain all the information necessary to reproduce the test. In particular,
the following shall be recorded:
– the items specified in the test plan required by clause 8 of this standard;
– identification of the EUT and any associated equipment, for example, brand name, product
type, serial number;
– identification of the test equipment, for example, brand name, product type, serial number;
– any special environmental conditions in which the test was performed, for example,
shielded enclosure;
– any specific conditions necessary to enable the test to be performed;
– performance level defined by the manufacturer, requestor or purchaser;
– performance criterion specified in the generic, product or product-family standard;
– any effects on the EUT observed during or after the application of the test disturbance, and
the duration for which these effects persist;

61000-4-16 © IEC:1998+A1:2001 – 17 –
+A2:2009
– the rationale for the pass/fail decision (based on the performance criterion specified in the
generic, product or product-family standard, or agreed between the manufacturer and the
purchaser);
– any specific conditions of use, for example cable length and type, shielding or grounding, or
EUT operating conditions, which are required to achieve compliance.

Input ports Enclosure port
Output ports
Analog
Digital
high level
Digital
EUT
Data
communication
Communication
and highly balanced
d.c.
Power supply
a.c.
Earth port
(dedicated earth connection)
NOTE The switch position is related to the possible configuration of the ports: single-ended, isolated, etc.
Figure 1 – Example of equipment ports and configuration

– 18 – 61000-4-16 © IEC:1998+A1:2001
+A2:2009
Figure 2 – Profile of the test voltage

Vr: voltage regulation
It: isolation transformer
R/F: rectification/filtering
C: control circuit
Figure 3 – Schematic in principle of the generator for d.c. voltage tests

Vr: voltage regulation
C: control circuit
It: isolation transformer
Figure 4 – Schematic in principle of the generator for tests at mains frequency
2/3
Hz, 50 Hz and 60 Hz)
(16
61000-4-16 © IEC:1998+A1:2001 – 19 –
+A2:2009
R: 200 Ω
C: 4,7 µF, to be short-circuited for d.c. voltage test (SW)
L: 2 × 38 mH (bifilar winding)
Figure 5 – Schematic circuit of the coupling T network for communication ports
and other ports intended for connection to highly balanced pairs

– 20 – 61000-4-16 © I
...

NORME CEI
INTERNATIONALE IEC
61000-4-16
INTERNATIONAL
Edition 1.1
STANDARD
2002-07
Edition 1:1998 consolidée par l'amendement 1:2001
Edition 1:1998 consolidated with amendment 1:2001
PUBLICATION FONDAMENTALE EN CEM
BASIC EMC PUBLICATION
Compatibilité électromagnétique (CEM) –
Partie 4-16:
Techniques d’essai et de mesure –
Essai d’immunité aux perturbations conduites
en mode commun dans la gamme
de fréquences de 0 Hz à 150 kHz
Electromagnetic compatibility (EMC) –
Part 4-16:
Testing and measurement techniques –
Test for immunity to conducted,
common mode disturbances in
the frequency range 0 Hz to 150 kHz
Numéro de référence
Reference number
CEI/IEC 61000-4-16:1998+A1:2001

Numérotation des publications Publication numbering
Depuis le 1er janvier 1997, les publications de la CEI As from 1 January 1997 all IEC publications are
sont numérotées à partir de 60000. Ainsi, la CEI 34-1 issued with a designation in the 60000 series. For
devient la CEI 60034-1. example, IEC 34-1 is now referred to as IEC 60034-1.
Editions consolidées Consolidated editions
Les versions consolidées de certaines publications de la The IEC is now publishing consolidated versions of its
CEI incorporant les amendements sont disponibles. Par publications. For example, edition numbers 1.0, 1.1
exemple, les numéros d’édition 1.0, 1.1 et 1.2 indiquent and 1.2 refer, respectively, to the base publication,
respectivement la publication de base, la publication de the base publication incorporating amendment 1 and
base incorporant l’amendement 1, et la publication de the base publication incorporating amendments 1
base incorporant les amendements 1 et 2. and 2.
Informations supplémentaires Further information on IEC publications
sur les publications de la CEI
Le contenu technique des publications de la CEI est The technical content of IEC publications is kept
constamment revu par la CEI afin qu'il reflète l'état under constant review by the IEC, thus ensuring that
actuel de la technique. Des renseignements relatifs à the content reflects current technology. Information
cette publication, y compris sa validité, sont dispo- relating to this publication, including its validity, is
nibles dans le Catalogue des publications de la CEI available in the IEC Catalogue of publications
(voir ci-dessous) en plus des nouvelles éditions, (see below) in addition to new editions, amendments
amendements et corrigenda. Des informations sur les and corrigenda. Information on the subjects under
sujets à l’étude et l’avancement des travaux entrepris consideration and work in progress undertaken by the
par le comité d’études qui a élaboré cette publication, technical committee which has prepared this
ainsi que la liste des publications parues, sont publication, as well as the list of publications issued,
également disponibles par l’intermédiaire de: is also available from the following:
• Site web de la CEI (www.iec.ch) • IEC Web Site (www.iec.ch)
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Le catalogue en ligne sur le site web de la CEI The on-line catalogue on the IEC web site
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cées ou retirées, ainsi que sur les corrigenda.
• IEC Just Published
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NORME CEI
INTERNATIONALE IEC
61000-4-16
INTERNATIONAL
Edition 1.1
STANDARD
2002-07
Edition 1:1998 consolidée par l'amendement 1:2001
Edition 1:1998 consolidated with amendment 1:2001
PUBLICATION FONDAMENTALE EN CEM
BASIC EMC PUBLICATION
Compatibilité électromagnétique (CEM) –
Partie 4-16:
Techniques d’essai et de mesure –
Essai d’immunité aux perturbations conduites
en mode commun dans la gamme
de fréquences de 0 Hz à 150 kHz
Electromagnetic compatibility (EMC) –
Part 4-16:
Testing and measurement techniques –
Test for immunity to conducted,
common mode disturbances in
the frequency range 0 Hz to 150 kHz
 IEC 2002 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch  Web: www.iec.ch
CODE PRIX
CJ
Commission Electrotechnique Internationale
PRICE CODE
International Electrotechnical Commission
Международная Электротехническая Комиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue

– 2 – 61000-4-16 © CEI:1998+A1:2001
SOMMAIRE
AVANT-PROPOS . 4
INTRODUCTION .6
1 Domaine d’application . 8
2 Références normatives .10
3 Généralités .10
4 Définitions.12
5 Niveaux d’essai.14
5.1 Niveaux d’essai à la fréquence du secteur.14
5.2 Niveaux d’essai dans la gamme de fréquences 15 Hz-150 kHz.16
6 Matériels d’essai .16
6.1 Générateurs d’essai.16
6.2 Vérification des caractéristiques des générateurs d’essai .20
6.3 Réseaux de couplage/découplage .20
7 Installation d’essai .22
7.1 Connexions de mise à la terre.24
7.2 Matériels en cours d’essai.24
7.3 Générateurs d’essai.24
7.4 Dispositifs de découplage/isolement.24
8 Procédure d’essai .24
8.1 Conditions de référence en laboratoire .26
8.2 Exécution de l’essai .26
9 Evaluation des résultats d’essai .30
10 Rapport d’essai.30
Annexe A (informative) Sources de perturbations et mécanismes de couplage.40
Annexe B (informative) Choix des niveaux d’essai .44
Annexe C (informative) Bibliographie.48
Figure 1 – Exemple d’accès de matériels et configuration .32
Figure 2 – Profil de la tension d’essai .34
Figure 3 – Schéma de principe du générateur pour les essais en courant continu.34
Figure 4 – Schéma de principe du générateur pour essais à la fréquence du réseau .34
Figure 5 – Schéma du réseau de couplage en T pour les accès de communication
et pour les autres accès prévus pour être connectés à des paires fortement symétriques.36
Figure 6 – Circuit schématique pour essais de type.38

61000-4-16 © IEC:1998+A1:2001 – 3 –
CONTENTS
FOREWORD . 5
INTRODUCTION .7
1 Scope . 9
2 Normative references.11
3 General.11
4 Definitions.13
5 Test levels .15
5.1 Test levels at mains frequency .15
5.2 Test levels in the frequency range 15 Hz-150 kHz .17
6 Test equipment .17
6.1 Test generators .17
6.2 Verification of the characteristics of the test generators.21
6.3 Coupling/decoupling networks .21
7 Test set-up .23
7.1 Earthing connections.25
7.2 Equipment under test .25
7.3 Test generators .25
7.4 Decoupling/isolation devices .25
8 Test procedure.25
8.1 Laboratory reference conditions .27
8.2 Execution of the test .27
9 Evaluation of test results .31
10 Test report .31
Annex A (informative) Sources of disturbances and coupling mechanisms .41
Annex B (informative) Selection of test levels .45
Annex C (informative) Bibliography.49
Figure 1 – Example of equipment ports and configuration .33
Figure 2 – Profile of the test voltage .35
Figure 3 – Schematic in principle of the generator for d.c. voltage tests.35
Figure 4 – Schematic in principle of the generator for tests at mains frequency .35
Figure 5 – Schematic circuit of the coupling T network for communication ports
and other ports intended for connection to highly balanced pairs .37
Figure 6 – Schematic circuit for type tests.39

– 4 – 61000-4-16 © CEI:1998+A1:2001
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
COMPATIBILITÉ ÉLECTROMAGNÉTIQUE (CEM) –

Partie 4-16: Techniques d’essai et de mesure – Essai d’immunité
aux perturbations conduites en mode commun dans
la gamme de fréquences de 0 Hz à 150 kHz

AVANT-PROPOS
1) La CEI (Commission Electrotechnique Internationale) est une organisation mondiale de normalisation composée
de l'ensemble des comités électrotechniques nationaux (Comités nationaux de la CEI). La CEI a pour objet de
favoriser la coopération internationale pour toutes les questions de normalisation dans les domaines de
l'électricité et de l'électronique. A cet effet, la CEI, entre autres activités, publie des Normes internationales.
Leur élaboration est confiée à des comités d'études, aux travaux desquels tout Comité national intéressé par le
sujet traité peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en
liaison avec la CEI, participent également aux travaux. La CEI collabore étroitement avec l'Organisation
Internationale de Normalisation (ISO), selon des conditions fixées par accord entre les deux organisations.
2) Les décisions ou accords officiels de la CEI concernant les questions techniques représentent, dans la mesure
du possible, un accord international sur les sujets étudiés, étant donné que les Comités nationaux intéressés
sont représentés dans chaque comité d’études.
3) Les documents produits se présentent sous la forme de recommandations internationales. Ils sont publiés
comme normes, spécifications techniques, rapports techniques ou guides et agréés comme tels par les Comités
nationaux.
4) Dans le but d'encourager l'unification internationale, les Comités nationaux de la CEI s'engagent à appliquer de
façon transparente, dans toute la mesure possible, les Normes internationales de la CEI dans leurs normes
nationales et régionales. Toute divergence entre la norme de la CEI et la norme nationale ou régionale
correspondante doit être indiquée en termes clairs dans cette dernière.
5) La CEI n’a fixé aucune procédure concernant le marquage comme indication d’approbation et sa responsabilité
n’est pas engagée quand un matériel est déclaré conforme à l’une de ses normes.
6) L’attention est attirée sur le fait que certains des éléments de la présente Norme internationale peuvent faire
l’objet de droits de propriété intellectuelle ou de droits analogues. La CEI ne saurait être tenue pour
responsable de ne pas avoir identifié de tels droits de propriété et de ne pas avoir signalé leur existence.
La Norme internationale CEI 61000-4-16 a été établie par le sous-comité 77A: Phénomènes
basse fréquence, du comité d’études 77 de la CEI: Compatibilité électromagnétique.
Elle constitue la partie 4-16 de la CEI 61000. Elle a le statut de publication fondamentale en
CEM conformément au Guide 107 de la CEI.
La présente version consolidée de la CEI 61000-4-16 comprend la première édition (1998)
[documents 77A/201/FDIS et 77A/221/RVD] et son amendement 1 (2001) [documents
77B/291+293/FDIS et 77B/298+300/RVD].
Le contenu technique de cette version consolidée est donc identique à celui de l'édition de
base et à son amendement; cette version a été préparée par commodité pour l'utilisateur.
Elle porte le numéro d'édition 1.1.
Une ligne verticale dans la marge indique où la publication de base a été modifiée par
l'amendement 1.
Les annexes A, B et C sont données uniquement à titre d’information.
Le comité a décidé que le contenu de la publication de base et de son amendement 1 ne sera
pas modifié avant 2006. A cette date, la publication sera
• reconduite;
• supprimée;
• remplacée par une édition révisée, ou
• amendée.
61000-4-16 © IEC:1998+A1:2001 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-16: Testing and measurement techniques –
Test for immunity to conducted, common mode disturbances
in the frequency range 0 Hz to 150 kHz

FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-16 has been prepared by subcommittee 77A: Low-
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms part 4-16 of IEC 61000. It has the status of a basic EMC publication in accordance with
IEC Guide 107.
This consolidated version of IEC 61000-4-16 consists of the first edition (1998) [documents
77A/201/FDIS and 77A/221/RVD] and its amendment 1 (2001) [documents 77B/291+293/FDIS
and 77B/298+300/RVD].
The technical content is therefore identical to the base edition and its amendment and has
been prepared for user convenience.
It bears the edition number 1.1.
A vertical line in the margin shows where the base publication has been modified by
amendment 1.
Annexes A, B and C are for information only.
The committee has decided that the contents of the base publication and its amendment 1 will
remain unchanged until 2006. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
– 6 – 61000-4-16 © CEI:1998+A1:2001
INTRODUCTION
La présente norme fait partie de la série CEI 61000, structurée comme suit:
Partie 1: Généralités
Considérations générales (introduction, principes fondamentaux)
Définitions, terminologie
Partie 2: Environnement
Description de l’environnement
Classification de l’environnement
Niveaux de compatibilité
Partie 3: Limites
Limites d’émission
Limites d’immunité (dans la mesure où elles ne relèvent pas des comités de produits)
Partie 4: Techniques d’essai et de mesure
Techniques de mesure
Techniques d’essai
Partie 5: Principes d’installation et d’atténuation
Principes d’installation
Méthodes et dispositifs d’atténuation
Partie 6: Normes génériques
Partie 9: Divers
Certaines parties sont à leur tour subdivisées en sections qui doivent être publiées soit sous
forme de normes internationales soit sous forme de rapports techniques.
La présente partie constitue une norme internationale indiquant les exigences en matière
d’immunité et les procédures d’essai relatives aux perturbations de conduction en mode
commun, dans la gamme du courant continu à 150 kHz.

61000-4-16 © IEC:1998+A1:2001 – 7 –
INTRODUCTION
This standard is part of the IEC 61000 series, according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Some parts are further subdivided into sections which are to be published either as
international standards or as technical reports.
This part is an international standard which gives immunity requirements and test procedures
related to conducted, common mode disturbances in the range d.c. to 150 kHz.

– 8 – 61000-4-16 © CEI:1998+A1:2001
COMPATIBILITÉ ÉLECTROMAGNÉTIQUE (CEM) –
Partie 4-16: Techniques d’essai et de mesure – Essai d’immunité
aux perturbations conduites en mode commun dans
la gamme de fréquences de 0 Hz à 150 kHz
1 Domaine d’application
La présente section de la CEI 61000 traite des exigences en matière d’immunité et des
méthodes d’essai relatives aux matériels électriques et électroniques soumis à des
perturbations par conduction en mode commun dans la gamme du courant continu à 150 kHz.
L’objet de la présente norme est d’établir une base commune et reproductible destinée à
essayer les performances des matériels électriques et électroniques lorsque ceux-ci sont
soumis à des perturbations par conduction en mode commun, appliquées aux accès
d’alimentation, de commande, de signal et de communication.
La présente norme définit
– la tension d’essai et la forme du courant;
– les plages de niveaux d’essai;
– le matériel d’essai;
– le circuit d’essai;
– les procédures d’essais.
Pour certains types d’accès, concernant par exemple des accès prévus pour être utilisés avec
des lignes fortement symétriques, des clauses d’essais complémentaires peuvent être définies
dans les spécifications des comités de produit.
L’essai vise à démontrer l’immunité des matériels électriques et électroniques soumis à des
perturbations de conduction en mode commun telles que celles provenant des courants de
lignes d’alimentation et des retours de courants de fuite dans les dispositifs de mise à la
terre/à la masse.
Les perturbations dues au réseau 400 Hz ne font pas partie du domaine d’application de la
présente norme.
De réelles interférences dues à ces phénomènes de perturbations sont relativement rares,
excepté dans les installations industrielles. Il est recommandé que les comités de produit
étudient si l’application de la présente norme à leurs normes produit/famille de produit est
justifiée (voir aussi l’article 3).
Cet essai n’est pas approprié pour les accès de matériels devant être raccordés à des câbles
courts (20 m ou moins).
L’immunité aux harmoniques et interharmoniques, y compris les courants porteurs de ligne, sur
les accès d’alimentation en courant alternatif (en mode différentiel) ne fait pas partie du
domaine d’application de la présente norme, mais est traitée par la CEI 61000-4-13.
L’immunité aux perturbations de conduction provenant d’émetteurs radioélectriques
intentionnels ne fait pas partie du domaine d’application de la présente norme, mais est traitée
par la CEI 61000-4-6.
61000-4-16 © IEC:1998+A1:2001 – 9 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-16: Testing and measurement techniques –
Test for immunity to conducted, common mode disturbances
in the frequency range 0 Hz to 150 kHz
1 Scope
This part of IEC 61000 relates to the immunity requirements and test methods for electrical and
electronic equipment to conducted, common mode disturbances in the range d.c. to 150 kHz.
The object of this standard is to establish a common and reproducible basis for testing
electrical and electronic equipment with the application of common mode disturbances to
power supply, control, signal and communication ports.
This standard defines
– test voltage and current waveform;
– range of test levels;
– test equipment;
– test set-up;
– test procedures.
For some types of ports, for example ports intended to be used with highly balanced lines,
additional test provisions may be established by product committee specifications.
The test is intended to demonstrate the immunity of electrical and electronic equipment when
subjected to conducted, common mode disturbances such as those originating from power line
currents and return leakage currents in the earthing/grounding system.
The disturbances produced by 400 Hz mains systems are not included in the scope of this
standard.
Actual interference due to these disturbance phenomena is relatively rare, except in industrial
plants. Product Committees should therefore consider whether there is a justification for
applying this standard in their Product/Product Family standards (see also clause 3).
This test is not relevant for equipment ports intended to be connected to short cables, having a
length less than 20 m or less.
The immunity to harmonics and interharmonics, including mains signalling, on a.c. power
ports (in differential mode) is not included in the scope of this standard and is covered by
IEC 61000-4-13.
The immunity to conducted disturbances generated by intentional radio-frequency transmitters
is not included in the scope of this standard and is covered by IEC 61000-4-6.

– 10 – 61000-4-16 © CEI:1998+A1:2001
Certaines recommandations de l’UIT-T telles que la K17, K20 et K21 définissent des méthodes
similaires pour tester la résistance des matériels. Cependant, elles ne concernent que les
accès de télécommunication et traitent de l’induction de puissance à la fréquence du secteur
en courant alternatif ou des chemins de fer électrifiés.
Il est suggéré aux comités de produit de prendre en compte, autant que possible, les
recommandations ci-dessus lors de la définition de leurs normes produit.
2 Références normatives
Les documents de référence suivants sont indispensables pour l'application du présent
document. Pour les références datées, seule l'édition citée s'applique. Pour les références non
datées, la dernière édition du document de référence s'applique (y compris les éventuels
amendements).
CEI 60050(161):1990, Vocabulaire Electrotechnique International (VEI) – Chapitre 161:
Compatibilité électromagnétique
CEI 60068-1:1988, Essais d’environnement – Partie 1: Généralités et guide
3 Généralités
Les perturbations par conduction en mode commun dans la gamme de fréquence du courant
continu à 150 kHz peuvent avoir une influence sur la fiabilité de fonctionnement des matériels
et systèmes installés dans les zones résidentielles ou industrielles et dans les unités de
production électriques.
Seuls les accès d’un EST susceptibles d’être soumis à des perturbations traitées dans la
présente norme doivent être pris en compte pour l’application de ses exigences.
Les perturbations sont typiquement générées par
– le réseau de distribution d’énergie, avec sa fréquence fondamentale, ses harmoniques et
interharmoniques significatifs;
– les matériels électroniques de puissance (tels que les convertisseurs de puissance), qui
peuvent injecter des perturbations dans les conducteurs de masse et les réseaux de mise à
la terre (via la capacité parasite et les filtres), ou bien provoquer une perturbation par
induction dans les lignes de commande et de signal.
Les perturbations à la fréquence du secteur et les harmoniques sont principalement générées
par le réseau de distribution d’énergie (courants de défaut et de fuite dans les systèmes de
mise à la terre/à la masse).
Les perturbations à une fréquence supérieure à la gamme des harmoniques (jusqu’à 150 kHz)
sont principalement générées par des matériels électroniques de puissance, que l’on trouve
souvent dans les unités de production industrielles et électriques.
Le couplage entre la source des perturbations et les câbles d’alimentation, de signal, de
commande, et de communication transfert ces perturbations vers les accès du matériel en
cours d’essai.
Etant donné que les couplages ci-dessus ne peuvent pas être complètement évités, une
certaine immunité adéquate des matériels et systèmes est nécessaire contre de telles
perturbations.
61000-4-16 © IEC:1998+A1:2001 – 11 –
Some ITU-T Recommendations, e.g. K17, K20 and K21, establish similar methods for testing
the resistibility of equipment; however, they are dedicated to telecommunication ports and deal
with power induction at frequency of the a.c. mains or electric railways.
Product Committees are advised to consider the Recommendations above, as far as
applicable, in preparing their product standards.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60050(161):1990, International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
3 General
The conducted, common mode disturbances in the frequency range d.c. to 150 kHz may
influence the reliable operation of equipment and systems installed in residential areas,
industrial areas and electrical plants.
Only those ports of an EUT which are likely to be subjected to the disturbances dealt with by
this standard shall be considered for the application of its requirements.
The disturbances are typically generated by
– the power distribution system, with its fundamental frequency, significant harmonics and
interharmonics;
– power electronic equipment (e.g. power convertors), which may inject disturbances into the
ground conductors and earthing system (through stray capacitance or filters), or generate
disturbances in signal and control lines by induction.
At the mains frequency, and harmonics of the mains frequency, the disturbances are usually
generated by the power distribution system (fault and leakage currents in the ground and
earthing systems).
At frequencies above the range of harmonics of the mains frequency (up to 150 kHz) the
disturbances are usually generated by power electronic equipment, which is often found in
industrial and electrical plants.
The coupling of the source of disturbances with the power supply, signal, control and
communication cables, transfer these disturbances to the ports of the equipment under test.
Because the coupling mechanisms defined above cannot be completely eliminated, it is
necessary for equipment to have adequate immunity to the disturbances.

– 12 – 61000-4-16 © CEI:1998+A1:2001
Suivant le type d’installation, les perturbations peuvent être classées comme suit:
2/3
a) tension/courant à fréquence d’alimentation: courant continu, 16 Hz, 50 Hz et 60 Hz;
b) tension/courant dans la gamme de fréquences allant de 15 Hz à 150 kHz (y compris les
harmoniques de la fréquence secteur).
La présente norme fournit les procédures d’essai pour les deux catégories de perturbations. Il
est recommandé de définir l’applicabilité des essais dans la norme produit.
Pour plus d’information concernant ces phénomènes, voir l’annexe A.
4 Définitions
Pour les besoins de la présente partie de la CEI 61000, les définitions suivantes sont utilisées
et s’appliquent au domaine restreint des perturbations par conduction en mode commun, dans
la gamme du courant continu à 150 kHz (ces définitions ne figurent pas toutes dans la
CEI 60050-161).
4.1
EST
matériel soumis à l’essai
4.2
matériel auxiliaire (EA)
matériel nécessaire pour installer toutes les fonctions et évaluer les performances correctes
(fonctionnement) de l’EST au cours de l’essai
4.3
accès
interface particulière entre les matériels spécifiés et l’environnement électromagnétique
extérieur (voir figure 1)
4.4
couplage
interaction entre les circuits, assurant le transfert de l’énergie d’un circuit à l’autre
4.5
réseau de couplage
circuit électrique destiné au transfert de l’énergie d’un circuit à l’autre
4.6
réseau de découplage
circuit électrique destiné à éviter que la tension d’essai appliquée au matériel en cours d’essai
n’affecte d’autres dispositifs, matériels ou systèmes ne se trouvant pas en cours d’essai
4.7
immunité (à une perturbation)
aptitude d’un dispositif, d’un équipement ou d’un système à fonctionner sans dégradation en
présence d’une perturbation électromagnétique [VEI 161-01-20]

61000-4-16 © IEC:1998+A1:2001 – 13 –
Depending on the type of installation, the disturbances may be classified as follows:
2/3
a) voltage/current at power frequency: d.c., 16 Hz, 50 Hz and 60 Hz;
b) voltage/current in the frequency range 15 Hz-150 kHz (including the harmonics of the mains
frequency).
This standard defines the test procedures for both the categories of disturbance defined above.
The applicability of the tests should be defined in the product standard.
Annex A contains more information on the phenomena.
4 Definitions
For the purpose of this part of IEC 61000, the following definitions are used and apply to the
restricted field of conducted, common mode disturbances in the range d.c. to 150 kHz (not all
of these definitions are included in IEC 60050-161).
4.1
EUT
equipment under test
4.2
auxiliary equipment (AE)
equipment that is necessary for setting up all functions and assessing the correct performance
(operation) of the EUT during the test
4.3
port
particular interface of the specified equipment with the external electromagnetic environment
(see figure 1)
4.4
coupling
interaction between circuits, transferring energy from one circuit to another
4.5
coupling network
electrical circuit for the purpose of transferring energy from one circuit to another
4.6
decoupling network
electrical circuit for the purpose of preventing test voltage applied to the equipment under test
from affecting other devices, equipment or systems which are not under test
4.7
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance [IEV 161-01-20]

– 14 – 61000-4-16 © CEI:1998+A1:2001
5 Niveaux d’essai
La gamme préférentielle des niveaux d’essai, applicable aux accès des matériels en fonction
des différents types et sources de perturbations, est indiquée dans les paragraphes 5.1 et 5.2.
2/3
Les niveaux sont donnés pour les essais à la fréquence du secteur (courant continu, 16 Hz,
50 Hz et 60 Hz) et dans la gamme de fréquences 15 Hz-150 kHz en profil continu.
L’applicabilité de chaque essai doit être établie dans la norme produit.
La tension d’essai doit être appliquée en mode commun aux accès d’alimentation, de
commande, de signal et de communication (la tension en mode différentiel dépend du
déséquilibre du circuit).
On trouvera en annexe B un guide de sélection des niveaux d’essai.
5.1 Niveaux d’essai à la fréquence du secteur
Les tableaux 1 et 2 définissent les niveaux d’essais préférentiels.
Les niveaux s’appliquent à la tension d’essai en courant continu et aux fréquences du secteur
2/3
telles que 16 Hz, 50 Hz et 60 Hz.
Tableau 1 – Niveaux pour perturbations Tableau 2 – Niveaux pour perturbation de
continues courte durée
Niveau Tension d’essai en circuit ouvert Niveau Tension d’essai en circuit ouvert
V (eff) V (eff)
1 1 1 10
2 3 2 30
3 10 3 100
4 30 4 300
x Spécial x Spécial
NOTE x est un niveau ouvert. Ce niveau peut être NOTE x est un niveau ouvert. Ce niveau peut être
donné dans la norme produit. donné dans la norme produit.
Pour des perturbations de courte durée, la durée normale pour chaque perturbation appliquée
est de 1 s; cependant, les normes de produit peuvent spécifier des durées différentes pour des
applications spécifiques.
2/3
L’essai doit être effectué à l’une ou plusieurs des fréquences suivantes: courant continu, 16 Hz,
50 Hz ou 60 Hz, selon la fréquence secteur applicable à l’emplacement du matériel (voir
2/3
annexe A); l’essai à 16 Hz n’est applicable que si le matériel concerné est destiné à être
utilisé près de réseaux de voies ferrées opérant à cette fréquence.
Le niveau d’essai ne doit jamais dépasser la tension d’essai indiquée dans la norme produit.
Pour toute information concernant les niveaux d’essai proposés, voir l’annexe B.

61000-4-16 © IEC:1998+A1:2001 – 15 –
5 Test levels
The preferred range of test levels, applicable to equipment ports as a function of the different
types and sources of disturbances, is given in 5.1 and 5.2.
2/3
The levels are given for the tests at the mains frequency (d.c., 16 Hz, 50 Hz and 60 Hz) and
in the frequency range 15 Hz-150 kHz.
The applicability of each test shall be defined in the product standard.
The test voltage shall be applied in common mode to power supply, control, signal and
communication ports (the differential mode voltage is dependent on the circuit unbalance).
A guide for the selection of the test levels is given in annex B.
5.1 Test levels at mains frequency
Tables 1 and 2 define the preferred test levels.
2/3
The levels apply to test voltage at d.c. and at the mains frequencies of 16 Hz, 50 Hz and 60 Hz.
Table 1 – Levels for continuous Table 2 – Levels for short duration
disturbance disturbance
Level Open circuit test voltage Level Open circuit test voltage
V (r.m.s.) V (r.m.s.)
1 1 1 10
2 3 2 30
3 10 3 100
4 30 4 300
x Special x Special
NOTE x is an open level. This level may be defined in NOTE x is an open level. This level may be defined
the product standard. in the product standard.
For short duration disturbances, the normal duration for each applied disturbance is 1 s;
however, product standards may specify different durations for specific applications.
2/3
The test shall be carried out at one or more of the following frequencies: d.c., 16 Hz, 50 Hz or
60 Hz, according to the relevant mains frequency in the equipment location (see annex A); the
2/3
test at 16 Hz is therefore only applicable where the equipment is intended to be used in the
proximity of railway systems at this frequency.
The test level shall not exceed the test voltage defined in the product standard.
Information on the proposed test levels is given in annex B.

– 16 – 61000-4-16 © CEI:1998+A1:2001
5.2 Niveaux d’essai dans la gamme de fréquences 15 Hz-150 kHz
Les niveaux d’essai préférentiels sont indiqués dans le tableau 3.
Tableau 3 – Niveaux d’essai dans la gamme de fréquences 15 Hz-150 kHz
Niveau Profil de la tension d’essai (en circuit ouvert)
V (eff)
15 Hz-150 Hz 150 Hz-1,5 kHz 1,5 kHz-15 kHz 15 kHz-150 kHz
1 1 – 0,1 0,1 0,1 – 1 1
2 3 – 0,3 0,3 0,3 – 3 3
3 10 – 1 1 1 – 10 10
4 30 – 3 3 3 – 30 30
x x x x x
NOTE x est un niveau ouvert. Ce niveau peut être donné dans la spécification du produit.
Le profil de la tension d’essai par rapport à la fréquence (voir l’annexe B pour information) est
le suivant:
– à partir de la fréquence 15 Hz, le niveau diminue jusqu’à 150 Hz à raison de 20 dB/décade;
– le niveau est constant entre 150 Hz et 1,5 kHz;
– le niveau augmente entre 1,5 kHz et 15 kHz à raison de 20 dB/décade;
– le niveau est constant entre 15 kHz et 150 kHz.
Le profil de la tension d’essai est représenté à la figure 2.
Aucun niveau d’essai n’est défini en-dessous de 15 Hz, à l’exclusion du courant continu, car un
essai dans cette gamme de fréquence n’est pas considéré comme utile.
6 Matériels d’essai
6.1 Générateurs d’essai
Les caractéristiques des générateurs d’essai pour chacun des essais sont données aux
paragraphes 6.1.1, 6.1.2 et 6.1.3.
Les générateurs doivent être en mesure d’éviter l’émission de perturbations qui pourraient
avoir une influence sur le résultat des essais si elles étaient injectées dans le réseau
d’alimentation.
Pour toute information sur l’impédance des générateurs d’essai, voir l’annexe A.
6.1.1 Caractéristiques et performances du générateur pour essais en courant continu
Ce générateur d’essai se compose généralement d’un bloc d’alimentation en courant continu à
tension de sortie variable et d’un interrupteur temporisé pour les essais de courte durée.
Générateur pour perturbations continues
– forme d’onde: courant continu, ondulation inférieure à 5 %;
– gamme de tension de sortie en circuit ouvert: 1 V (–10 %) à 30 V (+10 %);
– impédance: 50 Ω (±10 %).
61000-4-16 © IEC:1998+A1:2001 – 17 –
5.2 Test levels in the frequency range 15 Hz-150 kHz
Table 3 defines the preferred test levels.
Table 3 – Test levels in the frequency range 15 Hz-150 kHz
Level Profile of the test voltage (open circuit)
V (r.m.s.)
15 Hz-150 Hz 150 Hz-1,5 kHz 1,5 kHz-15 kHz 15 kHz-150 kHz
1 1 – 0,1 0,1 0,1 – 1 1
2 3 – 0,3 0,3 0,3 – 3 3
3 10 – 1 1 1 – 10 10
4 30 – 3 3 3 – 30 30
x x x x x
NOTE x is an open level. This level can be given in the product specification.
The profile of the test voltage in relation to frequency (see annex B for information) is as
follows:
– starting from the frequency 15 Hz, the level decreases up to 150 Hz at 20 dB/decade;
– the level is constant from 150 Hz to 1,5 kHz;
– the level increases from 1,5 kHz to 15 kHz at 20 dB/decade;
– the level is constant from 15 kHz to 150 kHz.
The profile of the test voltage is represented in figure 2.
No test level is defined below 15 Hz, excluding d.c., as tests in this frequency range are not
considered to be
...