IEC 61671-6:2016

IEC 61671-6 ®
Edition 1.0 2016-04
™
IEEE Std 1671.6
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test station description
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IEC 61671-6 ®
Edition 1.0 2016-04
IEEE Std 1671.6™
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test station description

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040; 35.060 ISBN 978-2-8322-3268-2

IEEE Std 1671.6-2015 - i -
Contents
1. Overview . 1
1.1 General . 1
1.2 Application of this document’s annexes . 2
1.3 Scope . 2
1.4 Application . 2
1.5 Conventions used within this document . 2
2. Normative references . 3
3. Definitions, acronyms, and abbreviations . 4
3.1 Definitions . 4
3.2 Acronyms and abbreviations . 5
4. Schema—TestStationDescription.xsd . 6
4.1 General . 6
4.2 Elements . 6
4.3 Child elements . 8
4.4 Complex types . 9
5. Schema—TestStationInstance.xsd .10
5.1 General .10
5.2 Elements .10
5.3 Child elements .12
5.4 Complex types .12
6. ATML TestStationDescription XML schema names and locations .14
7. ATML XML schema extensibility .15
8. Conformance .16
8.1 Conformance of a TestStationDescription instance document .16
8.2 Conformance of a TestStationInstance instance document .16
Annex A (informative) IEEE download website material associated with this document .17
Annex B (informative) User’s information and examples .18
B.1 Partial automatic test station .18
Annex C (informative) Glossary .21
Annex D (informative) Bibliography .22

Annex E (informative) IEEE List of Participants.23

- ii -
IEEE Std 1671.6-2015
Standard for Automatic Test
Markup Language (ATML) Test Station
Description
FOREWORD
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Published by IEC under license from IEEE. © 2015 IEEE. All rights reserved.

- iii -
IEEE Std 1671.6-2015
International Standard IEC 61671-6/IEEE Std 1671.6-2015 has been processed through IEC
technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo
Agreement.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1671.6-2015 91/1316/FDIS 91/1340/RVD
Full information on the voting for the approval of this standard can be found in the report on
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The IEC Technical Committee and IEEE Technical Committee have decided that the contents
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publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
Published by IEC under license from IEEE. © 2015 IEEE. All rights reserved.

- iv - IEEE Std 1671.6-2015
IEEE Standard for Automatic Test
Markup Language (ATML) Test Station
Description
Sponsor
IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems

Approved 26 March 2015
IEEE-SA Standards Board
IEEE Std 1671.6-2015 - v -
Abstract: An exchange format, using extensible markup language (XML), for identifying all of the
hardware, software, and documentation associated with a test station is specified in this
document. This test station may be used with a test program set to test and diagnose a unit under
test.
Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup
Language (ATML), automatic test system (ATS), IEEE 1671.6™, test station, XML schema

•
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registered and held by its host institutions: Massachusetts Institute of Technology (MIT), European Research Consortium for Information
and Mathematics (ERCIM), and Keio University, Japan.

- vi - IEEE Std 1671.6-2015
IEEE Introduction
This introduction is not part of IEEE Std 1671.6™-2015, IEEE Standard for Automatic Test Markup Language
(ATML) Test Station Description.
This child, or dot, standard, also known as an ATML component standard, provides for the definition of the
Test Station XML schemas, and contains references to examples; both of which accompany this standard.
These XML schemas provide for the identification and definition of a test station.
ATML’s XML schemas define the basic information required within any test application and provide a
vehicle for formally defining the test environment by defining a class hierarchy corresponding to these
basic information entities and provide several methods within each to enable basic operations to be
performed on these entities. ATML component standards within the ATML framework define the
particular requirements within the test environment.

IEEE Std 1671.6-2015 - vii -
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- viii - IEEE Std 1671.6-2015
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IEEE Std 1671.6-2015 - ix -
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- 1 - IEEE Std 1671.6-2015
Standard for Automatic Test
Markup Language (ATML) Test Station
Description
IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health,
or environmental protection, or ensure against interference with or from other devices or networks.
Implementers of IEEE Standards documents are responsible for determining and complying with all
appropriate safety, security, environmental, health, and interference protection practices and all
applicable laws and regulations.
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be found under the heading “Important Notice” or “Important Notices and Disclaimers
Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at
http://standards.ieee.org/IPR/disclaimers.html.
1. Overview
1.1 General
Automatic test markup language (ATML) is a collection of IEEE standards and associated extensible
markup language (XML) schemas that allows automatic test system (ATS) and test information to be
exchanged in a common format adhering to the XML standard.
The ATML framework and the ATML family of standards have been developed and are maintained under
the guidance of the Test Information Integration (TII) Subcommittee of IEEE Standards Coordinating
Committee 20 (SCC20) to serve as a comprehensive environment for integrating design data, test
strategies, test requirements, test procedures, test results management, and test system implementations,
while allowing test program (TP), test asset interoperability, and unit under test (UUT) data to be
interchanged between heterogeneous systems.
This standard (as well as the XML schemas and XML instance document examples that accompany this
standard) is intended to be used in identifying and documenting a test station which may be utilized during
the testing of unit under tests (UUTs). This information includes the mechanical, electrical and software
interfaces of the test station.
This information is given for the convenience of users of this standard and does not constitute an endorsement by the IEEE of this
consortium standard. Equivalent standards or products may be used if they can be shown to lead to the same results.
The XML schemas and examples that accompany this standard are available at the locations defined in Clause 6.

IEEE Std 1671.6-2015 - 2 -
This standard makes use of XML schemas and XML terminology. For readers new to XML, the XML
Schema Tutorial [B1] provides a general introduction.
1.2 Application of this document’s annexes
This document includes four annexes.
Annex A through Annex D are informative, and thus are provided strictly as information, for both users,
implementers, and maintainers of this document.
1.3 Scope
This standard defines an exchange format, utilizing eXtensible Markup Language (XML), for both the
static description of a test station, and the specific description of test station instance information.
1.4 Application
This standard provides a clear definition of test station information that may be exchanged between
conformant cooperating software components and applications. This standard provides a definition that
accomplishes the following objectives:
a) Provide a means of describing the aspects of a complete automatic test equipment (ATE) or a
partial system thereof. (e.g., automatic test information)
b) Provide a means to represent the current information represented within the specification for a test
station.
The information contained in XML documents conforming to this standard will be useful to:
a) TPS developers.
b) Test program set (TPS) developers
c) TPS maintainers
d) Automatic test equipment (ATE) system developers
e) ATE system maintainers
f) Developers of ATML-based tools and systems
g) UUT developers and maintainers
1.5 Conventions used within this document
1.5.1 General
In accordance with the IEEE Standards Style Manual [B3] , any schema examples will be shown in
Courier font. In cases where instance document examples are necessary to depict the use of a schema type
The numbers in brackets correspond to those of the bibliography in Annex D.

- 3 - IEEE Std 1671.6-2015
or element, such examples will also be shown in Courier font. When the characters “.” appear in an
example, it indicates that the example component is incomplete.
All simple types, complex types, attribute groups, and elements will be listed; explanatory information will
be provided, along with examples, if additional clarification is needed. The explanatory information will
include information on the intended use of the elements and/or attributes where the name of the entity does
not clearly indicate its intended use. For elements derived from another source type (e.g., an abstract type),
only attributes that extend the source type will be listed; details regarding the base type will be listed along
with the base type.
When referring to an attribute of an XML element, the convention of [element]@[attribute] will be used. In
cases where an attribute name is referred to with no associated element, the attribute name will be enclosed
in single quotes. Element and type names will always be set in italics when appearing in text.
This standard uses the vocabulary and definitions of relevant IEEE standards. In case of conflict of
definitions, except for those portions quoted from standards, the following precedence shall be observed: 1)
Clause 3, and 2) The IEEE Standards Dictionary Online [B2].
1.5.2 Precedence
The TestStationDescription schema (TestStationDescription.xsd) element, child element, and annotation
information shall take precedence over the descriptive information contained in Clause 4.
The TestStationDescription schema and the material contained in Clause 4 shall take precedence over the
example information represented in Annex B.
The TestStationInstance schema (TestStationInstance.xsd) element, child element, and annotation
information shall take precedence over the descriptive information contained in Clause 5.
The TestStationInstance schema and the material contained in Clause 5 shall take precedence over the
example information represented in Annex B.
1.5.3 Word usage
In accordance with the IEEE Standards Style Manual [B3], the word shall is used to indicate mandatory
requirements strictly to be followed in order to conform to the standard and from which no deviation is
permitted (shall equals is required to). The use of the word must is used only to describe unavoidable
situations. The use of the word will is only used in statements of fact.
The word should is used to indicate that among several possibilities one is recommended as particularly
suitable, without mentioning or excluding others (should equals is recommended that).
The word may is used to indicate a course of action permissible within the limits of the standard (may
equals is permitted to).
The word can is used for statements of possibility and capability (can equals is able to)
2. Normative references
The following referenced documents are indispensable for the application of this document (i.e., they must
be understood and used, so each referenced document is cited in text and its relationship to this document is

IEEE Std 1671.6-2015 - 4 -
explained). For dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments or corrigenda) applies.
IEEE Std 1671™, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging
4,5
Automatic Test Equipment and Test Information via XML.
3. Definitions, acronyms, and abbreviations
3.1 Definitions
For the purposes of this document, the following terms and definitions apply. The IEEE Standards
In the event a term is explicitly
Dictionary Online should be consulted for terms not defined in this clause.
redefined, or further defined in an ATML component standard, the component standards definition shall
take precedence for that ATML component standard.
abstract type: A declared type that can be used to define other types through derivation. Only non-abstract
types derived from the declared type can be used in instance documents. When such a type is used, it shall
be identified by the xsi:type attribute.
automatic test information: The complete set of information needed to describe a partial automatic test
system (e.g., only rack 1 of the complete ATE).
Automatic Test Markup Language (ATML) instance document: See: instance document.
element: A bounded component of the logical structure of an eXtensible Markup Language (XML)
document that has a type and that may have XML attributes and content {adapted from eXtensible Markup
Language (XML) 1.0 (Fifth Edition)}
entity: Something that has a distinct separate existence.
eXtensible Markup Language (XML) attribute: Name-value pair associated with an XML element.
eXtensible Markup Language (XML) document: A data object that conforms to the XML requirements
for being well formed. In addition, the data object is valid if it additionally conforms to semantic rules of
the XML schema.
eXtensible Markup Language (XML) schema: The definition of a class of XML document, typically
expressed in terms of constraints on the structure and the content of documents of that class, above and
beyond the basic syntax constraints imposed by XML itself.
instance document: An XML document that conforms to a particular XML schema.
object: An object consists of state and behavior. An object stores its states in fields (variables in some
programming languages) and exposes its behavior through methods (functions in some programming
languages).
well-formed: Conforming to all of XML’s syntax rules.
IEEE publications are available from The Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08855,
USA (http://standards.ieee.org/).
The standards or products referred to in this clause are trademarks of The Institute of Electrical and Electronics Engineers, Inc.
IEEE Standards Dictionary Online subscription is available at:
http://www.ieee.org/portal/innovate/products/standard/standards_dictionary.html.

- 5 - IEEE Std 1671.6-2015
3.2 Acronyms and abbreviations
ATE automatic test equipment
ATML Automatic Test Markup Language
ATS automatic test system
CHA channel A
COM common relay contact
DC direct current
DCLVA dc power supply low voltage type A
DMM digital multimeter
DMMHI digital multimeter high connection
DMMLO digital multimeter low connection
FREQ frequency
NC normally closed relay contact
NO normally open relay contact
OUT output
PS power supply
RF radio frequency
TII test information integration
TP test program
TPS test program set
UTF-8 8-bit Unicode transformation format
UUT unit under test ®
W3C World Wide Web consortium
XML eXtensible Markup Language

IEEE Std 1671.6-2015 - 6 -
4. Schema—TestStationDescription.xsd
4.1 General
In addition to the conventions specified in 1.5.1, the prefix“c:” indicates that the element is defined by/is
inherited from the IEEE Std 1671-2010 associated Common.xsd XML schema. The prefix “hc:” indicates
that the element is defined by/is inherited from the IEEE Std 1671-2010 associated HardwareCommon.xsd
XML schema. The prefix “te:” indicates that the element is defined by/is inherited from the
IEEE Std 1671-2010 associated TestEquipment.xsd XML schema.
4.2 Elements
4.2.1 TestStationDescription root (or document)
Exactly one element exists, called the root, or document element, of which no part appears in the content of
any other element. This root element serves as the parent for all other elements of the
TestStationDescription schema.
The TestStationDescription schemas root element is defined as follows:
Name Set to
Attribute form default Unqualified (see NOTE)
Element form default Qualified (see NOTE)
Encoding UTF-8
Included schema None
Imported schema urn:IEEE-1671:2010:Common
urn:IEEE-1671:2010:HardwareCommon
urn:IEEE-1671:2010:TestEquipment
Target namespace urn:IEEE-1671.6:2015:TestStationDescription
Version 2.3
a
XML schema namespace reference
NOTE—Qualified and unqualified are described in A.3.7 of IEEE Std 1671.
a
The namespace reference URL is: http://www.w3.org/2001/XMLSchema.
4.2.2 TestStationDescription
Base type: ts:TestStationDescription
Properties: content complex
The TestStationDescription element shall be used to document the aspects of a family of test stations.
4.2.2.1 Attributes
TestStationDescription element inherits the attributes from TestSationDesciption complex type (see 4.2.3).
Notes in text, tables and figures are given for information only, and do not contain requirements needed to implement the standard.

- 7 - IEEE Std 1671.6-2015
4.2.2.2 Child elements
TestStationDescription element inherits the child elements from TestStationDescription complex type (see
4.2.3).
4.2.3 TestStationDescription complex type
Base type: Extension of te:TestEquipment
Properties: content complex
The test station description type will encompass all information necessary to identify all of the hardware,
software, and documentation in a test station.
Figure 1 illustrates the XML types inherited and the XML types (both simple and complex) that comprise
the TestStationDescription.
The subclauses referenced in Figure 1 identify where the definition of the element is located within this
standard.
TestStationDescription
te:TestEquipment
(Annex B of IEEE Std 1671)
Core
(subclause 4.3.3)
Instruments
(subclause 4.3.1)
Figure 1 —Test station description complex type content
4.2.3.1 Attributes
TestStationDescription contains the securityClassification, classified, name, version and uuid attributes
inherited from the te:TestEquipment complex type and the DocumentRootAttributes attribute group defined
in Annex B of IEEE Std 1671.
4.2.3.2 Child elements
TestStationDescription contains the following child element in addition to those inherited from the
te:TestEquipment complex type contained in Annex B of IEEE Std 1671.

IEEE Std 1671.6-2015 - 8 -
Name Type Description Use
Core c:ItemDescriptionReference See 4.3.3 Optional
Instruments See 4.3.1 Optional
4.3 Child elements
4.3.1 TestStationDescription/Instruments
Properties: isRef 0, content complex
The TestStationDescription/Instruments child element shall identify each instrument within the test station.
4.3.1.1 Attributes
TestStationDescription/Instruments contains no attributes.
4.3.1.2 Child elements
TestStationDescription/Instruments contains the following child element:
Name Type Description Use
Instrument InstrumentDescriptionReference A description of an instrument in a test station. Optional
4.3.2 TestStationDescription/Instruments/Instrument
Base type: InstrumentDescriptionReference
Properties: isRef 0, content complex
The TestStationDescription/Instruments/Instrument child element shall identify a specific instrument. The
presence of an instrument in a test station shall only be referenced in this section of a
TestDescriptionDocument. There is no need for instruments to also be referenced in the Components
section.
4.3.2.1 Attributes
TestStationDescription/Instruments/Instrument inherits the attributes from InstrumentDescriptionReference
(see 4.4.1).
4.3.2.2 Child elements
TestStationDescription/Instruments/Instrument inherits the child elements of
InstrumentDescriptionReference (see 4.4.1).
4.3.3 TestStationDescription/Core
Base type: c:ItemDescriptionReference
Properties: isRef 0, content complex

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The TestStationDescription/Core child element shall reference the Test Stations base description where the
test station is derived from core test station as part of a family of testers. Note specific items in the
TestStationDescription override equivalent descriptions defined in the Core reference.
4.3.3.1 Attributes
TestStationDescription/Core contains no attributes.
4.3.3.2 Child elements
TestStationDescription/Core inherits the child elements o
...