IEC 61671-6:2016

IEC 61671-6 ®
Edition 1.0 2016-04
™
IEEE Std 1671.6
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test station description
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IEC 61671-6 ®
Edition 1.0 2016-04
IEEE Std 1671.6™
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test station description

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040; 35.060 ISBN 978-2-8322-3268-2

IEEE Std 1671.6-2015 - i -
Contents
1. Overview . 1
1.1 General . 1
1.2 Application of this document’s annexes . 2
1.3 Scope . 2
1.4 Application . 2
1.5 Conventions used within this document . 2
2. Normative references . 3
3. Definitions, acronyms, and abbreviations . 4
3.1 Definitions . 4
3.2 Acronyms and abbreviations . 5
4. Schema—TestStationDescription.xsd . 6
4.1 General . 6
4.2 Elements . 6
4.3 Child elements . 8
4.4 Complex types . 9
5. Schema—TestStationInstance.xsd .10
5.1 General .10
5.2 Elements .10
5.3 Child elements .12
5.4 Complex types .12
6. ATML TestStationDescription XML schema names and locations .14
7. ATML XML schema extensibility .15
8. Conformance .16
8.1 Conformance of a TestStationDescription instance document .16
8.2 Conformance of a TestStationInstance instance document .16
Annex A (informative) IEEE download website material associated with this document .17
Annex B (informative) User’s information and examples .18
B.1 Partial automatic test station .18
Annex C (informative) Glossary .21
Annex D (informative) Bibliography .22

Annex E (informative) IEEE List of Participants.23

- ii -
IEEE Std 1671.6-2015
Standard for Automatic Test
Markup Language (ATML) Test Station
Description
FOREWORD
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- iii -
IEEE Std 1671.6-2015
International Standard IEC 61671-6/IEEE Std 1671.6-2015 has been processed through IEC
technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo
Agreement.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1671.6-2015 91/1316/FDIS 91/1340/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The IEC Technical Committee and IEEE Technical Committee have decided that the contents
of this publication will remain unchanged until the stability date indicated on the IEC web site
under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the
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