IEC 61169-1-6:2022

IEC 61169-1-6 ®
Edition 1.0 2022-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Radio-frequency connectors –
Part 1-6: Electrical test methods – RF power

Connecteurs pour fréquences radioélectriques –
Partie 1-6: Méthodes d’essai électrique – Puissance RF

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IEC 61169-1-6 ®
Edition 1.0 2022-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Radio-frequency connectors –
Part 1-6: Electrical test methods – RF power

Connecteurs pour fréquences radioélectriques –

Partie 1-6: Méthodes d’essai électrique – Puissance RF

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.120.30 ISBN 978-2-8322-1079-4

– 2 – IEC 61169-1-6:2022 © IEC 2022
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Preparation of test sample (TS) . 6
4.1 Cabled RF connector . 6
4.2 Microstrip connector . 6
4.3 Adapter . 7
5 Test conditions . 7
6 Test principle . 7
7 Test equipment . 8
8 Test procedure . 9
8.1 Average power / Continuous wave power rating . 9
8.1.1 Average power rating test . 9
8.1.2 Conversion of average power rating at other frequencies . 9
8.1.3 Conversion of average power rating at different environment
temperatures . 10
8.1.4 Average power rating estimation . 10
8.2 Power handling . 10
8.2.1 Average power / Continuous wave power . 10
8.2.2 Peak power handling . 11
9 Information to be given in the relevant specification . 11
10 Test report . 12
Annex A (informative) Endurance temperatures for typical dielectric materials . 13
Annex B (informative) Average power rating estimation . 14
B.1 Estimation of average power rating at different ambient temperatures . 14

Figure 1 – Illustration of peak power . 6
Figure 2 – Test principle . 8
Figure B.1 – Average RF power rating for one SMA connector at different ambient
temperatures . 14

Table A.1 – Endurance temperatures for typical dielectric materials . 13

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
RADIO-FREQUENCY CONNECTORS –
Part 1-6: Electrical test methods – RF power

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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indispensable for the correct application of this publication.
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rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 61169-1-6 has been prepared by subcommittee 46F: RF and microwave passive
components, of IEC technical committee 46: Cables, wires, waveguides, RF connectors, RF
and microwave passive components and accessories. It is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
46F/598/FDIS 46F/612/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

– 4 – IEC 61169-1-6:2022 © IEC 2022
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.
A list of all parts in the IEC 61169 series, published under the general title Radio-frequency
connectors, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.

RADIO-FREQUENCY CONNECTORS –
Part 1-6: Electrical test methods – RF power

1 Scope
This part of IEC 61169 provides test methods for RF power rating and power handling of RF
connectors at specified frequency, temperature and altitude.
This document is applicable to cabled RF connectors, microstrip RF connectors and RF
connector adapters. It is also suitable to test RF channels in multi-channel RF connectors and
hybrid connectors.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 61169-1, Radio frequency connectors – Part 1: Generic specification – General
requirements and measuring methods
IEC 61169-1-4, Radio frequency connectors – Part – 1-4: Electrical test methods – Voltage
standing wave ratio, return loss and reflection coefficient
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 61169-1 and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
power rating
input power at which neither peak working voltage nor maximum dielectric temperature for an
RF connector is exceeded, if it is terminated
Note 1 to entry: See Annex A for typical dielectric materials for RF connectors and their maximum withstanding
temperatures.
3.2
average power
power that is averaged over the defined frequency range and periods at the specified
temperature and altitude and that can be handled by RF connectors

– 6 – IEC 61169-1-6:2022 © IEC 2022
3.3
peak power
maximum power P that the RF connectors shall withstand for a pulse duration τ over a period
max
Τ with a duty cycle R at the specified temperature and altitude, where the relationship between
duty cycle, pulse duration, and period is expressed by formula (1)
Note 1 to entry: See Figure 1.

Figure 1 – Illustration of peak power
τ
R ×100（）% (1)
T
where
R is the duty factor, in %;
τ is the pulse duration, in s;
T is the period of pulse, in s.
3.4
continuous wave power
power transmitted in almost a straight line whose duty factor R = 1 in Formula (1)
3.5
power handling
ability of the RF connectors to handle the power specified in the relevant specification at the
stated temperature, altitude and frequency
4 Preparation of test sample (TS)
4.1 Cabled RF connector
The cabled RF connector shall be made into a double-ended cable assembly as a test sample
(TS) using a length of pre-selected RF cable with a power capacity greater than the connector.
4.2 Microstrip connector
The microstrip connector shall be provided with an appropriate test fixture at the microstrip end
as specified in the relevant specification, and the microstrip connector with test fixture as a
whole should be treated as a test sample (TS).
=
4.3 Adapter
The adapter shall be tested directly or indirectly by being mated to additional adapters at the
ends that are suitable for the test setup interfaces and sufficient to meet the power capability
requirements of the test. An adapter is just a test sample (TS). When the adapter is needed,
the power capacity of the adapter should be greater than that of the sample.
When needed, it is recommended to drill a small hole in the test sample (TS) on the inner
conductor to place a thermodetector (such as a fiber optic temperature sensor) to measure the
temperature of the inner conductor.
5 Test conditions
The stability of test conditions includes temperature stability and altitude stability.
a) Temperature stability:
When the change of temperature of the test sample is not more than ± 2 °C in 5 min, the
temperature shall be considered stabilized.
When the chamber is used for testing and the change of temperature of the chamber and the
test sample have been not more than ± 2 °C in 5 min, the temperature shall be considered
stabilized.
b) Altitude stability:
When requirements are specified for pressure in the relevant specifications, the altitude of the
low-pressure test chamber that is stable within the range of ± 5 % of the specified value in
10 min is considered a stable altitude.
6 Test principle
A combination of power source, directional coupler, fixed attenuator (when required) and power
meter is used for the test, as shown in Figure 2. When the incident power P passes through
i
the coupler, the coupling power P is produced at its coupling port, and then is attenuated to
f
the range of the power meter by a fixed attenuator (when necessary), so as to obtain the
indication value of power P .
Since the coupling factor C (calculated from Formula (2)) of coupler and attenuation value D
(calculated from Formula (3)) of the fixed attenuator are invariable, the actual incident power of
the sample can be obtained from Formula (4).
P
i
C=10lg
(2)
P
f
P
f
D=10lg
(3)
P
g
P= P++DC
(4)
– 8 – IEC 61169-1-6:2022 © IEC 2022
where
C is the coupling factor of the coupler, in dB;
D is the attenuation of the fixed attenuator, in dB;
P is the incident power of the test system, in dB;
i
P is the power value of the coupling end of the coupler, in dB;
f
P is the power value attenuated by the fixed attenuator, in dB;
g
P is the measured power value, in dB;
P is the indicated value by power meter, in dB.

Figure 2 – Test principle
7 Test equipment
Test equipment is as follows:
a) Power source, directional coupler, fixed attenuator, power meter, high-power load (or
absorber), etc. The rated power of selected couplers, fixed attenuators, high-power loads
and other devices shall be more than 2 to 2,5 times the maximum power measured, to
prevent the devices from burning out due to overheating in case of nonsteady power.
b) The thermodetector shall be able to measure inner and outer conductor temperatures, and
have sufficient sensitivity with an accuracy of ±1 °C.
c) Temperature - altitude test chamber (if applicable) shall meet the test requirements stated
in the relevant specifications.
d) For the power rating test, the voltage standing wave ratio (VSWR) of the load should be less
than 1,05; for power handling tests, unless otherwise specified, VSWR of the load shall not
be less than 1,75.
e) A test room to prevent air circulation, e.g. of fans of the climatic cabinet. If necessary, the
test room should fit the climatic cabinet and be large enough so that the test items can be
20 cm (8 in) away from the walls of the test room.

8 Test procedure
8.1 Average power / Continuous wave power rating
8.1.1 Average power rating test
The test procedure is as follows:
a) The insertion loss and VSWR of the sample shall be measured in accordance with
IEC 61169-1-2 and IEC 61169-1-4 respectively. The measured values shall be as specified
in the relevant specification.
b) Connect the test sample (TS) to the power test system as shown in Figure 2, and use the
thermodetector to monitor the inner conductor temperature t , and the outer conductor
i
temperature t as well as the test environment temperature t , respectively. Record the
o e
temperature values t , t and t individually, at the time when the temperature is stabilized.
i o e
c) Set test parameters: test frequency and average power / continuous wave power (a lower
estimated value), and start the test.
d) Continue the test for a sufficient time to stabilize the temperature at this frequency and
power, and then record the temperature values t and to at this time
i
e) At this frequency, slowly increase the power until the temperature t of the inner conductor
i
reaches the maximum temperature that the sample can withstand and is stabilized at this
level. The power at this point is power rating at this frequency. Record the power P, the
inner conductor temperature t and the outer conductor temperature t at this time.
i o
f) After the test, take out the sample, and when the inner conductor temperature t and outer
i
conductor temperature t are restored to room temperature or standard test atmosphere,
o
the VSWR of the sample shall be measured in accordance with IEC 61169-1-4, and shall
comply with the relevant specification.
g) When environmental temperature and altitude are required, the sample shall be placed in
the temperature-altitude test chamber and tested in accordance with steps from b) to f). The
temperature and altitude of the test chamber shall be monitored during the test.
8.1.2 Conversion of average power rating at other frequencies
In the operating frequency range of an RF connector, when the average power rating at a certain
frequency is known, the average power rating at the other frequency can be converted from
that known average power rating using the insertion loss values at that frequency and at any
other frequency through Formulae (5) and (6).
αα
ff12
−−
(5)
10 10
PP×（1−10 ） ×（1−10 ）
if 12if
When α ≤ 1and α ≤ 1, Formula (5) can be simplified as Formula (6) as follows:
f1 f2
P×=α P×α
(6)
if 11f if 2 f 2
where
α is the attenuation of RF connector at frequency f , in dB;
f1 1
α is the attenuation of RF connector at frequency f , in dB;
f2 2
P is the average power rating at frequency f , in W;
if1 1
=
– 10 – IEC 61169-1-6:2022 © IEC 2022
P is the average power rating at frequency f , in W.
if2 2
8.1.3 Conversion of average power rating at different environment temperatures
Average power ratings at different environment temperatures from 15 °C to 40 °C can be
converted to the average power ratings at 40 °C. When a test at 40 °C standard ambient
temperature is required in the relevant specification, the following approximate Formula (7) can
be used to convert the average power rating at a certain environment temperature to the
average power rating at 40 °C:
1,14
 
tT−
PP= (7)
1 
t−T
 11
where
T is the ambient temperature from 15 °C to 40 °C during the test, in °C;
T is the standard ambient temperature (40 °C), in °C;
t is the measured inner conductor temperature, from (t − 15) to t, in °C;
t is the maximum inner conductor temperature (as specified in the relevant specification);
P is the input power measured under conditions t and T , in W;
1 1 1
P is the power rating (at limit temperature), in W.
The conditions for Formula (7) are as follows:
a) Test environment temperature T ranges from 15 °C to 40 °C;
b) For the test, the temperature of the inner conductor shall not be less than 15 °C below the
maximum allowable temperature between (t − 15) and t.
8.1.4 Average power rating estimation
When it is not possible to test the average power rating directly, the average power rating can
be estimated using the method shown in Annex B.
8.2 Power handling
8.2.1 Average power / Continuous wave power
The test procedure is as follows:
a) The insertion loss and VSWR of the sample shall be measured in accordance with
IEC 61169-1-2 and IEC 61169-1-4 respectively. The measured values shall be as specified
in the relevant specification.
b) Connect the test sample (TS) to the power test system as shown in Figure 2, and use the
thermodetector to monitor the temperature of the test sample.
c) The test sample (TS) shall be placed in the temperature and/or altitude test chamber for
testing when the temperature and/or altitude are specified in the relevant specification.
Temperature and/or air pressure in the temperature and/or altitude test chamber shall
conform to the relevant specification and shall be monitored throughout the test.
d) Set test parameters: test frequency and average power / continuous wave power.
e) Keep the test at that frequency and power for the period specified in the relevant
specification. The temperature of the sample should be recorded when required in the
relevant specification.
f) When the frequency specified in the relevant specification is a frequency region, the
maximum limit power shall be applied at the maximum frequency point for 60 min after the
temperature is stabilized. When the above test conditions are not available, the test should
be carried out at high frequency, middle frequency and low frequency points, respectively.
Unless otherwise specified in the relevant specification, the high-frequency points selected
in the test shall be within 10 % of the upper limit frequency of the sample, and the test
duration shall not be less than 60 min; The middle-frequency point should be the
approximate intermediate frequency in the frequency range, and the test duration should
not be less than 20 min; the low-frequency point should be within 0,10 GHz at the lower end
of the frequency range, and the test duration should not be less than 20 min.
g) The sample shall be restored and stabilized at room temperature before power is applied at
each frequency point.
h) During the test, there should be no breakdown or burning on the sample, and temperature
rise of the sample and the test chamber (when specified) shall comply with the relevant
specifications. After the test, the sample should be taken out and restored to a stable state.
The insertion loss and VSWR of the sample shall be measured in accordance with
IEC 61169-1-2 and IEC 61169-1-4 respectively. The measured values shall be as specified
in the relevant specification.
8.2.2 Peak power handling
The test procedure is as follows:
a) The insertion loss and VSWR of the sample shall be measured in accordance with
IEC 61169-1-2 and IEC 61169-1-4 respectively. The measured values shall be as specified
in the relevant specification.
b) Connect the test sample (TS) to the power test system as shown in Figure 2.
c) The test sample (TS) shall be placed in the temperature and/or altitude test chamber for
testing when the temperature and/or altitude are specified in the relevant specification.
Temperature and/or air pressure in the temperature and/or altitude test chamber shall
conform to the relevant specification and shall be monitored throughout the test.
d) Set test frequency (if stated), peak power, pulse duration, duty factor or period, and carry
out the test in accordance with the relevant specification. Unless otherwise specified, the
duration shall not be less than 60 min. When specified in the relevant specification, the
temperature of the sample should be monitored during the test.
e) During the test, there should be no breakdown or burning on the sample, and temperature
rise of the sample (when specified) should comply with the relevant specifications.
f) After the test, the sample should be taken out and restored to a stable state. The insertion
loss and VSWR of the sample shall be measured in accordance with IEC 61169-1-2 and
IEC 61169-1-4 respectively. The measured values shall be as specified in the relevant
specification.
9 Information to be given in the relevant specification
The following information shall be given in the relevant specification:
a) test method;
b) test conditions;
c) test frequency and power;
d) duty factor, pulse width or cycle (as needed);
e) test duration;
f) any variation from the test method.

– 12 – IEC 61169-1-6:2022 © IEC 2022
10 Test report
Test report should include information the following information:
a) test method;
b) test conditions;
c) test frequency and power;
d) duty factor, pulse duration or cycle (as needed);
e) inner and outer conductor temperatures;
f) test duration;
g) test equipment;
h) test sample number;
i) test results;
j) operator’s name and test date.

Annex A
(informative)
Endurance temperatures for typical dielectric materials
The maximum allowable temperature of the inner conductor depends on the endurance
temperature of the dielectric material, construction, design and manufacture of the connector.
Endurance temperatures for typical dielectric materials for RF connectors are shown in
Table A.1.
Table A.1 – Endurance temperatures for typical dielectric materials
Dielectric material Recommended endurance temperature
°C
Polytetrafluoroethylene (PTFE) +200
Polyether Ether Ketone (PEEK) +250
Polyimide (PI) +280
Poly(amide-imide) (PAI) +260
Polyether imide (PEI) +200
polypropylene (PP) +270
Low density Polyethylene (LD-PE) +85

– 14 – IEC 61169-1-6:2022 © IEC 2022
Annex B
(informative)
Average power rating estimation
B.1 Estimation of average power rating at different ambient temperatures
When the RF power source at a given frequency is insufficient to meet the RF power test
requirements, the average RF power rating can be estimated using the following procedures:
a) Put the test sample in the test temperature chamber and connect it to the power test system
as shown in Figure 2.
b) Set the temperature of the test chamber to T till it is stabilized.
c) The RF power test is carried out according to 8.1.1 until the inner conductor tempera
...