IEC 60384-13:2011

IEC 60384-13 ®
Edition 4.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 13: Sectional specification – Fixed polypropylene film dielectric metal foil
d.c. capacitors
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 13: Spécification intermédiaire – Condensateurs fixes pour courant
continu à diélectrique en film de polypropylène à armatures en feuilles
métalliques
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IEC 60384-13 ®
Edition 4.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 13: Sectional specification – Fixed polypropylene film dielectric metal foil
d.c. capacitors
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 13: Spécification intermédiaire – Condensateurs fixes pour courant
continu à diélectrique en film de polypropylène à armatures en feuilles
métalliques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX U
ICS 31.060.30 ISBN 978-2-88912-814-3

– 2 – 60384-13 © IEC:2011
CONTENTS
FOREWORD . 4
1 General . 6
1.1 Scope . 6
1.2 Object . 6
1.3 Normative references . 6
1.4 Information to be given in a detail specification . 7
1.5 Terms and definitions . 8
1.6 Marking . 8
2 Preferred ratings and characteristics . 9
2.1 Preferred characteristics . 9
2.2 Preferred values of ratings . 9
3 Quality assessment procedures . 10
3.1 Primary stage of manufacture . 10
3.2 Structurally similar components . 11
3.3 Certified records of released lots . 11
3.4 Qualification approval . 11
3.5 Quality conformance inspection . 17
4 Test and measurement procedures . 19
4.1 Visual examination and check of dimensions . 19
4.2 Electrical tests . 19
4.3 Robustness of terminations . 22
4.4 Resistance to soldering heat . 22
4.5 Solderability . 22
4.6 Rapid change of temperature . 23
4.7 Vibration. 23
4.8 Bump . 23
4.9 Shock . 24
4.10 Climatic sequence . 24
4.11 Damp heat, steady state . 25
4.12 Endurance . 26
4.13 Component solvent resistance . 26
4.14 Solvent resistance of marking . 26

Table 1 – Preferred tolerances . 9
Table 2 – Preferred values and combinations . 10
Table 3 – Sampling plan together with numbers of permissible non-conformance for
qualification approval test . 12
Table 4 – Test schedule for qualification approval. 13
Table 5 – Lot-by-lot inspection . 18
Table 6 – Periodic inspection . 18
Table 7 – Test points and voltages . 19
Table 8 – Insulation resistance requirements . 21
Table 9 – Correction factors . 21

60384-13 © IEC:2011 – 3 –
Table 10 – Preferred severities . 24
Table 11 – Test conditions . 26

– 4 – 60384-13 © IEC:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION
_____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 13: Sectional specification –
Fixed polypropylene film dielectric metal foil d.c. capacitors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-13 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This fourth edition cancels and replaces the third edition published in 2006 and contains the
following significant technical changes with respect to the previous edition.
– Table 3, Sampling plan together with numbers of permissible non-conformance for
qualification approval test, has been adjusted.
– Table 5, Lot-by-lot inspection, has been changed, highlighting assessment level EZ only.
– Table 6, Periodic inspection, has been changed, highlighting assessment level EZ only.

60384-13 © IEC:2011 – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
40/2130/FDIS 40/2143/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC directives, Part 2.
A list of all the parts of the IEC 60384 series, under the general title Fixed capacitors for use
in electronic equipment, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 6 – 60384-13 © IEC:2011
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 13: Sectional specification –
Fixed polypropylene film dielectric metal foil d.c. capacitors

1 General
1.1 Scope
This part of IEC 60384 applies to fixed direct current capacitors, using as dielectric a
polypropylene film with electrodes of thin metal foils. The capacitors covered by this standard
are intended for use in electronic equipment.
Capacitors for electromagnetic interference suppression are not included, but are covered by
IEC 60384-14.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1, the appropriate quality assessment procedures, tests and measuring
methods, and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification are of at least equal or higher performance level, because lower performance
levels are not permitted.
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60063:1963, Preferred number series for resistors and capacitors
Amendment 1 (1967)
Amendment 2 (1977)
IEC 60068-1, Environmental testing – Part 1:General and guidance
IEC 60384-1:2008, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 60384-13-1, Fixed capacitors for use in electronic equipment – Part 13-1: Blank detail
specification – Fixed polypropylene film dielectric metal foil d.c. capacitors – Assessment
level E and EZ
IEC 60384-14, Fixed capacitors for use in electronic equipment – Part 14: Sectional
specification: Fixed capacitors for electromagnetic interference suppression and connection to
the supply mains
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
IEC 61193-2, Quality assessment systems – Part 2: Selection and use of sampling plans for
inspection of electronic components and packages
ISO 3, Preferred numbers – Series of preferred numbers

60384-13 © IEC:2011 – 7 –
1.4 Information to be given in a detail specification
Detail specifications shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional
or blank detail specification. When more severe requirements are included, they shall be
listed in 1.9 of the detail specification and indicated in the test schedules, for example by an
asterisk.
NOTE The information given in 1.4.1 may, for convenience, be presented in tabular form.
The following information shall be given in each detail specification and the values quoted
shall preferably be selected from those given in the appropriate clause of this sectional
specification.
1.4.1 Outline drawing and dimensions
These shall be an illustration of the capacitor as an aid to easy recognition and for
comparison of the capacitor with others. Dimensions and their associated tolerances, which
affect interchangeability and mounting, shall be given in the detail specification. All
dimensions shall preferably be stated in millimetres.
Normally, the numerical values shall be given for the length, the width and height of the body
and the wire spacing, or for cylindrical types, the body diameter, and the length and diameter
of the terminations. When necessary, for example, when a number of items (capacitance
values/voltage ranges) are covered by a detail specification, the dimensions and their
associated tolerances shall be placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitor. When the capacitor is not
designed for use on printed boards, this shall be clearly stated in the detail specification.
1.4.2 Mounting
The detail specification shall specify the method of mounting to be applied for normal use and
for the application of the vibration and the bump or shock tests. The capacitors shall be
mounted by their normal means. The design of the capacitor may be such that special
mounting fixtures are required in its use. In this case, the detail specification shall describe
the mounting fixtures and they shall be used in the application of the vibration and bump or
shock tests.
1.4.3 Rating and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this
specification, together with the following.
1.4.3.1 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.3.2 Soldering
The detail specification shall prescribe the test methods, severities and requirements
applicable for the solderability and the resistance to solder heat test.
1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
package. Deviations from 1.6 of this sectional specification shall be specifically stated.

– 8 – 60384-13 © IEC:2011
1.5 Terms and definitions
For the purpose of this document, the terms and definitions given in IEC 60384-1 and the
following apply.
1.5.1
stability class
tolerance on the temperature coefficient together with the permissible change of capacitance
after defined tests
NOTE 1 The stability class is stated in the detail specification.
NOTE 2 Table 2 shows the preferred stability classes.
1.5.2
rated voltage
U
R
maximum d.c. voltage which may be applied continuously to a capacitor at the rated
temperature
NOTE The sum of the d.c. voltage and the peak a.c. voltage applied to the capacitor should not exceed the rated
voltage. The value of the peak a.c. voltage should not exceed the following percentages of the rated voltage at the
frequencies stated and should be not greater than 280 V:
50 Hz: 20 %
100 Hz: 15 %
1 000 Hz: 3 %
10 000 Hz: 1 %
unless otherwise specified in the detail specification.
1.6 Marking
See IEC 60384-1, 2.4 with the following details.
1.6.1 General
The information given in the marking is normally selected from the following list; the relative
importance of each item is indicated by its position in the list.
– nominal capacitance;
– rated voltage (d.c. voltage may be indicated by the symbol      or     );
– tolerance on nominal capacitance;
– year and month (or week) of manufacture;
– manufacturer’s name or trade mark;
– temperature coefficient and stability class;
– climatic category;
– manufacturer’s type designation;
– reference to the detail specification;
1.6.2 Marking of capacitors
The capacitor shall be clearly marked with a), b) and c) of 1.6.1 and with as many as possible
of the remaining items as is considered necessary. Any duplication of information in the
marking on the capacitor should be avoided.

60384-13 © IEC:2011 – 9 –
1.6.3 Marking of packaging
The package containing the capacitor(s) shall be clearly marked with all the information listed
in 1.6.1.
1.6.4 Additional marking
Any additional marking shall be so applied that no confusion can arise.
2 Preferred ratings and characteristics
2.1 Preferred characteristics
The values given in detail specifications shall preferably be selected from the following.
2.1.1 Preferred climatic categories
The capacitors covered by this specification are classified into climatic categories according
to the general rules given in IEC 60068-1.
The lower and upper category temperatures and the duration of the damp heat, steady-state
test shall be chosen from the following:
• Lower category temperature: –55 °C, –40 °C, –25 °C and –10 °C
• Upper category temperature: +85 °C , +100 °C and +105 °C
• Duration of the damp heat, steady-state test: 10, 21 and 56 days
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
2.1.2 Assisted drying
Assisted drying is conditionally for a period between 1 h and 6 h at a temperatures (55 ± 2) °C
and a relative humidity not exceeding 20 %.
2.2 Preferred values of ratings
2.2.1 Nominal capacitance (C )
N
Preferred values of nominal capacitance are to be taken from the E 6, E 12, E 24, E 48 and
E 96 series of IEC 60063.
2.2.2 Tolerance on nominal capacitance
The preferred tolerances on nominal capacitance are given in Table 1.
Table 1 – Preferred tolerances
Preferred series Preferred tolerance Tolerance code
E 6 M
±20 %
E 12 K
±10 %
E 24 J
±5 %
E 48 G
±2 %
E 96 F
±1 %
– 10 – 60384-13 © IEC:2011
In all cases, the minimum tolerance is ±1 pF. Additional values of capacitance outside the
E 96 range and additional tolerances may be specified.
2.2.3 Rated voltage (U )
R
The preferred values of rated voltages are: 40 V – 63 V – 100 V – 160 V – 250 V and their
decimal multiples. These values conform to the basic series of preferred values R 5 given in
ISO 3.
2.2.4 Stability classes in relation to temperature coefficients and change of
capacitance
Preferred values of temperature coefficients (α) with associated tolerances and preferred
values of permissible change of capacitance and also preferred combinations of these values
defined as stability classes are given in Table 2.
The table is not valid for capacitance values smaller than 50 pF.
Table 2 – Preferred values and combinations
a
Stability Temperature coefficient α and Permissible change of capacitance
class tolerance in parts per million per
Upper category temperature
degree Kelvin
−6
10 /K
85 °C 100 °C 105 °C
－80 －100 －125 －160 －250
±40 ±50 ±60 ±80 ±120 ±(0,5 ％+0,5 pF) ±(1 ％+0,5 pF) ±(1 ％+0,5 pF)
±100 ±125 ±160 ±250 ±(1 ％+1 pF) ±(2 ％+1 pF) ±(2 ％+1 pF)
±160 ±250 ±(2 ％+2 pF) ±(5 ％+2 pF) ±(5 ％+2 pF)
a
Permissible change of capacitance after each of the following tests:
– resistance to soldering heat;
– rapid change of temperature;
– vibrations;
– bump or shock;
– damp heat, cyclic;
– damp heat, steady state;
– endurance.
2.2.5 Category voltage (U )
C
At 85 °C the category voltage is equal to the rated voltage (U ). For upper category
R
temperature of 100 °C, the category voltage is equal to 0,7 U .
R
2.2.6 Rated temperature
The standard value of rated temperature is 85 °C.
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the winding of the capacitor element or the equivalent
operation.
60384-13 © IEC:2011 – 11 –
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, though they may be of different case sizes and values.
3.3 Certified records of released lots
The information required in Clause Q.9 of Annex Q of IEC 60384-1 shall be made available
when prescribed in the detail specification and when requested by a purchaser. After the
endurance test, the parameters for which information on variables is required are the
capacitance change, tan δ and insulation resistance.
3.4 Qualification approval
The procedure for qualification approval testing is given in Clause Q.5 of IEC 60384-1.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in Clause Q.5 of IEC 60384-1. The procedure using a fixed sample size
schedule is given in 3.4.1 and 3.4.2 below.
3.4.1 Qualification approval on the basis of the fixed sample size procedures
The fixed sample size procedure is described in item b) of Q.5.3 of IEC 60384-1. The sample
shall be representative of the range of capacitors for which approval is sought. This may or
may not be the complete range covered by the detail specification.
The samples shall consist of specimens having the lowest and highest voltages, and, for
these voltages, the lowest and highest capacitances. When there are more than four rated
voltages, an intermediate voltage shall also be tested. Thus, for the approval of a range,
testing is required of either four or six values (capacitance/voltage combinations). When the
range consists of less than four values, the number of specimens to be tested shall be that
required for four values.
Spare specimens are permitted two or three per value which may be used as replacements for
specimens which are non-conforming because of incidents not attributable to the
manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so, the
numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the
number specimens required for Group 0 shall be increased by a same number as that
required for the additional group.
Table 1 gives the number of samples to be tested in each group or subgroup together with the
permissible number of non-conforming items for qualification approval tests.
3.4.2 Tests
The complete series of tests specified in Table 3 and Table 4 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other
groups.
Specimens found non-conforming during the tests of Group 0 shall not be used for the other
groups.
– 12 – 60384-13 © IEC:2011
“One non-conforming” is counted when a capacitor has not satisfied the whole or a part of the
tests of a group.
The approval is granted when the number of non-conforming does not exceed the specified
number of permissible non-conforming for each group or subgroup and the total number of
permissible non-conforming.
NOTE Tables 3 and 4 together form the fixed sample size test schedule, for which Table 3 includes the details for
the sampling and permissible non-conforming for the different tests or groups of tests, whereas Table 4 together
with the detail of test contained in Clause 4 gives a complete summary of test conditions and performance
requirements and indicates where, for example for the test method or conditions of test, a choice should be made
in the detail specification.
The conditions of the test and performance requirements for the fixed sample size test
schedule shall be identical to those prescribed in the detail specification for quality
conformance inspection.
Table 3 – Sampling plan together with numbers of permissible non-conformance
for qualification approval test
Number of
Subclause of permissible
Group Number of
Test this non-
number specimens (n)
publication conformance (c)
b
0 Visual examination 4.1
Dimensions 4.1
Capacitance 4.2.2
Tangent of loss angle 4.2.3 120 0
Voltage proof 4.2.1
Insulation resistance 4.2.4
Spare specimen 12 0
1A Robustness of terminations 4.3
Resistance to soldering heat 4.4 12 0
Component solvent resistance 4.13
1B Solderabiliry 4.5
Solvent resistance of the marking 4.14
Rapid change of temperature 4.6 24 0
Vibration 4.7
a
Bump or shock 4.8 or 4.9
1 Climatic sequence 4.10 36 0
2 Damp heat, steady state 4.11 24 0
3 Endurance 4.12 36 0
4 Characteristics depending on temperature 4.2.5 24 0
a
Inductance 4.2.6
a
Outer foil termination 4.2.7
a
As required in the detail specification.
b
Not more than one non-conformity is permitted from any one value.

60384-13 © IEC:2011 – 13 –
Table 4 – Test schedule for qualification approval
Number of
specimens (n)
D and number
Subclause number or of Performance
Conditions of test
a
and test ND permissible requirements
b
non-
conformances
(c)
Group 0 ND See Table 3
4.1 Visual examination  As in 4.1
Legible marking and as
specified in the detail
specification
4.1 Dimensions (detail)  See detail specification
4.2.1 Voltage proof  No break down or
flashover
4.2.2 Capacitance Frequency 1 kHz Within specified tolerance
4.2.3 Tangent of loss See detail specification for the As in 4.2.3.2
angle (tan δ) method
4.2.4 Insulation See detail specification for the As in 4.2.4.2
resistance method
Group 1A D See Table 3
4.3.1 Initial Capacitance
measurements Tangent of loss angle:
4.3 Robustness of Visual examination No visible damage
terminations
4.4 Resistance to No pre-drying See detail specification
soldering heat See detail specification for the
method (1A or 1B)
Recovery: 1 h to 2 h
4.14 Component Solvent:…
solvent resistance Solvent temperature:…
(if applicable) Method 2
Recovery time:…
4.4.2 Final Visual examination No visible damage
measurements Legible marking
Capacitance
∆C/C: Within limit for
relevant stability class at
upper category
temperature as specified
in 2.2.4 and compared to
values measured in 4.3.1
Tangent of loss angle As in 4.2.3.2

– 14 – 60384-13 © IEC:2011
Table 4 (continued)
Number of
specimens (n)
D and number
Subclause number or of Performance
Conditions of test
a
and test ND permissible requirements
b
non-
conformances
(c)
Group 1B D See Table 3
4.1 Solderability Without ageing Good tinning as evidenced
See detail specification for the by free flowing of the
method solder with wetting of the
terminations or solder
shall flow within…s, as
applicable
4.14 Solvent resistance Solvent: Legible marking
of the marking Solvent temperature:
(if applicable) Method 1
Rubbing material: cotton wool
Recovery time: …
4.6.1 Initial Capacitance
measurement Tangent of loss angle
4.6 Rapid change of T = Lower category temperature
A
temperature T = Upper category temperature
B
Five cycles
Duration t = …
Visual examination No visible damage
4.7 Vibration For mounting method, see detail
specification
Frequency range: from … Hz to
…Hz
Amplitude: 0,75 mm or
acceleration 100 m/s : …
(whichever is the less severe)
Total duration: 6 h
4.7.2 Final inspection Visual examination No visible damage
Capacitance ∆C/C: Within limit for
relevant stability class at
upper category
temperature as specified
in 2.2.4 and compared to
values measured in 4.3.1
Tangent of loss angle As per 4.2.3.2
4.8 Bump (or shock, For mounting method see detail
see 4.9) specification
Number of bumps: …
Acceleration: … m/s
Duration of pulse: … ms
4.9 Shock (or bump, For mounting method see detail
see 4.8) specification
Number of bumps: …
Acceleration: … m/s
Duration of pulse: … ms
60384-13 © IEC:2011 – 15 –
Table 4 (continued)
Number of
specimens (n)
D and number
Subclause number or of Performance
Conditions of test
a
and test ND permissible requirements
b
non-
conformances
(c)
4.8.3 or 4.9.3 D Visual examination See Table 3 No visible damage
Final
Capacitance ∆C/C: Within limit for
measurements
relevant stability class at
upper category
temperature as specified
in 2.2.4 and compared to
values measured in 4.3.1
Tangent of loss angle As per 4.2.3.2
Group 1 D See Table 3
4.10 Climatic sequence
4.10.2 Dry heat Temperature: Upper category
temperature
Duration: 16 h
4.10.3 Damp heat,
cyclic, Test Db,
first cycle
4.10.4 Cold Temperature: lower category
temperature
Duration: 2 h
4.10.5 Low air pressure Air pressure: 8 kPa
(if required by
Duration: 1 h
the detail
specification)
4.10.5.2 Final Visual examination No permanent breakdown
measurement flashover or harmful
Recovery: 1 h to 2 h
deformation of the case
4.10.6 Damp heat,
cyclic, Test Db,
remaining
cycles
4.10.6.2 Final Visual examination No visible damage
measurement
Capacitance ∆C/C: Within limit for
relevant stability class at
85 ℃ as specified in 2.2.4
and compared to values
measured in 4.4.2, 4.8.5 or
4.9.5 as applicable
Tangent of loss angle
tan δ ≤ 1,4 times values
measured in 4.3.1 or 4.6.1,
as applicable.
Insulation resistance
≥50 % of values of 4.2.4.2.
– 16 – 60384-13 © IEC:2011
Table 4 (continued)
Number of
specimens (n)
D and number
Subclause number or of Performance
Conditions of test
a
and test ND permissible requirements
b
non-
conformances
(c)
Group 2 D See Table 3
4.11 Damp heat,
steady state
4.11.1 Initial Capacitance
measurements
Tangent of loss angle at 1 kHz
Recovery: 1 h to 2 h
4.11.3 Final Visual examination No visible damage
measurement Legible marking
Capacitance
∆C/C: Within limit for
relevant stability class at
85 ℃ as specified in 2.2.4
and compared to values
measured in 4.11.1
Tangent of loss angle tan δ ≤ 1,4 times values
measured in 4.11.1
Insulation resistance
≥50 % of values of 4.2.4.2
Group 3 D See Table 3
4.12 Endurance Duration: .h
4.12.1 Initial Capacitance
measurements Tangent of loss angle:
4.12.3 Final Visual examination No visible damage
measurement Legible marking
Capacitance ∆C/C: Within limit for
relevant stability class at
85 ℃ as specified in 2.2.4
and compared to values
measured in 4.12.1
Tangent of loss angle
tan δ as in 4.2.3.2 or ≤1,4
times values measured in
4.12.1, whichever is
greater.
Insulation resistance
≥50 % of values of 4.2.4.2
60384-13 © IEC:2011 – 17 –
Table 4 (continued)
Number of
specimens (n)
D and number
Subclause number or of Performance
Conditions of test
a
and test ND permissible requirements
b
non-
conformances
(c)
Group 4 D See Table 1
4.2.5 Characteristics Capacitance As in 4.2.5
depending on
temperature
(if applicable)
4.2.6 Inductance
(if required)
4.2.7 Outer foil
termination
(if required)
a
Subclause numbers of test and performance requirements refer to Clause 4 – Test and measurement
procedures.
b
In this table: D = destructive, ND = non-destructive.

3.5 Quality conformance inspection
3.5.1 Formation of inspection lots
a) Groups A and B inspection
These tests shall be carried out on a lot-by-lot basis.
A manufacturer may aggregate the current production into inspection lots subject to the
following safeguards.
1) The inspection lot shall consist of structurally similar capacitors (see 3.2).
2a) The sample tested shall be representative of the values and dimensions contained in
the inspection lot:
– in relation to their number;
– with a minimum of five of any one value.
2b) If there are less than five of any one value in the sample, the basis for the drawing of
samples shall be agreed between the manufacturer and National Supervising
Inspectorate .
b) Group C inspection
These tests shall be carried out on a periodic basis.
Samples shall be representative of the current production of the specified periods and
shall be divided into high, medium and low voltage ratings. In order to cover the range of
approvals in any period, one case size shall be tested from each voltage group. In
subsequent periods other case sizes and/or voltage ratings in production shall be tested
with the aim of covering the whole range.
3.5.2 Test schedule
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given
in the blank detail specification.
___________
The term Certification Body (CB) replaces the term National Supervising Inspectorate (NSI), see IECQ 01.

– 18 – 60384-13 © IEC:2011
3.5.3 Delayed delivery
When, according to the procedures in Clause Q.10 of IEC 60384-1, re-inspection has to be
made, solderability and capacitance shall be checked as specified in Groups A and B
inspection.
3.5.4 Assessment levels
The assessment level(s) given in the blank detail specification shall preferably be selected
from the following Tables 5 and 6.
Table 5 – Lot-by-lot inspection
EZ
b
Inspection subgroup
IL n c
a
A0 100 %
b
A1
S-3 0
b
A2
S-3 0
b
B1
S-3 0
IL = inspection level;
AQL = acceptance quality limit;
n = sample size;
c = permissible number of non-conforming items.
a
This inspection shall be performed after removal of non-conforming items by 100 % testing during the
manufacturing process. Whether the lot was accepted or not, all of the samples for sampling inspection
shall be inspected in order to monitor the outgoing quality level by non-conforming items per million (×10 ).
The sampling level shall be established by the manufacturer, preferably according to IEC 61193-2, Annex A.
In case one or more non-conforming items occur in a sample, this lot shall be rejected but all non-
conforming items shall be counted for the calculation of quality level values.
If applicable, the outgoing quality level by non-conforming items per million (×10 ) values shall be
calculated by accumulating inspection data according to the method given in IEC 61193-2, 6.2.
b
Number to be tested: Sample size as directly allotted to the code letter for IL in IEC 60410,Table IIA, or it
shall be determined according to IEC 61193-2, 4.3.2.
c
The content of the inspection subgroups is described in Clause 2 of the relevant blank detail specification.

Table 6 – Periodic inspection
EZ
b
Inspection subgroup
p n c
C1A 6 5 0
C1B 6 5 0
C1 6 10 0
C2 6 10 0
C3 6 0
C4 6 10 0
p = periodicity in months;
n = sample size;
c = permissible number of non-conforming items.
a
The content of the inspection subgroups is described in Clause 2 of the relevant blank detail specification.

60384-13 © IEC:2011 – 19 –
4 Test and measurement procedures
4.1 Visual examination and check of dimensions
See IEC 60384-1, 4.4.
4.2 Electrical tests
4.2.1 Voltage proof
See IEC 60384-1, 4.6, with the following details.
4.2.1.1 Test circuit
The product of R and the nominal capacitance (C ) of capacitor C under test shall be
1 N x
smaller than or equal to 1 s and greater than 0,01 s.
includes the internal resistance of the power supply.
R
R shall limit the discharge current to a value equal to, or less than, 1 A.
4.2.1.2 Test points and voltages
The voltages as given in Table 7 shall be applied between the measuring points of Table 3 of
IEC 60384-1, for a period of 1 min for qualification approval testing and for a period of 1 s for
the lot-by-lot quality conformance testing.
Table 7 – Test points and voltages
Test point Test voltage
1 a)
2×U
R
1 b) and 1 c) 2×U with a minimum of 400 V
R
4.2.2 Capacitance
See IEC 60384-1, 4.7, with the following details.
4.2.2.1 Measuring conditions
The capacitance shall be measured at, or corrected to, a frequency of 1 000 Hz. The
capacitance shall be for
a) nominal capacitance C ≤ 1 000 pF:
N
– For measuring purposes:  1 MHz ± 20 % or 100 kHz ± 20 %.
– For referee purposes:    1 MHz ± 20 %.
b) nominal capacitance C > 1 000 pF:
N
– For measuring purposes:  1 kHz ± 20 % or 10 kHz ± 20 %.
– For referee purposes:     1 kHz ± 20 %.
The peak value of applied voltage shall not exceed 3 % of the rated voltage or 5 V, whichever
is smaller.
4.2.2.2 Requirements
The capacitance shall be within the specified tolerance.

– 20 – 60384-13 © IEC:2011
For capacitors with a value of less than 10 pF or of more than 1 µF, the method of
measurement and the limits shall be given in the detail specification.
4.2.3 Tangent of loss angle (tan δ)
See IEC 60384-1, 4.8, with the following details:
4.2.3.1 Measuring conditions
Tangent of loss angle shall be measured and the values recorded (for ref
...