IEC TS 62876-4-1:2025

IEC TS 62876-4-1 ®
Edition 1.0 2025-02
TECHNICAL
SPECIFICATION
Nanomanufacturing – Reliability assessment –
Part 4-1: Nanophotonic products – Optical stability test of quantum dot enabled
light conversion films: Temperature, humidity and light exposure

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IEC TS 62876-4-1 ®
Edition 1.0 2025-02
TECHNICAL
SPECIFICATION
Nanomanufacturing – Reliability assessment –

Part 4-1: Nanophotonic products – Optical stability test of quantum dot enabled

light conversion films: Temperature, humidity and light exposure

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120  ISBN 978-2-8327-0165-2

– 2 – IEC TS 62876-4-1:2025 © IEC 2025
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and abbreviated terms . 8
3.1 Terms and definitions . 8
3.2 Abbreviated terms . 8
4 General requirements . 8
4.1 Q-LCF . 8
4.2 Tests . 9
4.2.1 General . 9
4.2.2 Quantity of specimens . 10
4.2.3 Equipment specifications . 10
4.2.4 Test methods . 10
4.2.5 Caution . 11
4.3 Measurements . 11
4.3.1 General . 11
4.3.2 General testing conditions . 12
4.3.3 Measurement instrument specifications . 12
4.3.4 Conditioning . 12
4.3.5 Data collection . 12
4.3.6 Measurement methods of Q-LCFs in simulated direct-lit BLU . 13
4.3.7 Measurement methods of width of invalid edge . 13
4.3.8 Pass or fail criteria . 14
5 Test methods . 14
5.1 T1 – High temperature and blue light exposure . 14
5.1.1 Purpose . 14
5.1.2 Temperature and light . 14
5.1.3 Data logging . 14
5.1.4 Output . 15
5.1.5 Required equipment . 15
5.2 T2 – Damp heat and blue light exposure . 15
5.2.1 Purpose . 15
5.2.2 Temperature, humidity and light . 15
5.2.3 Data logging . 15
5.2.4 Output . 16
5.2.5 Required equipment . 16
5.3 T3 – Damp heat . 16
5.3.1 Purpose . 16
5.3.2 Procedure . 16
5.3.3 Temperature and humidity . 16
5.3.4 Data logging . 16
5.3.5 Output . 16
5.3.6 Required equipment . 16
5.4 T4 – Low temperature . 16
5.4.1 Purpose . 16

5.4.2 Temperature . 16
5.4.3 Data logging . 16
5.4.4 Output . 17
5.4.5 Required equipment . 17
5.5 T5 – Thermal cycling . 17
5.5.1 Purpose . 17
5.5.2 Temperature . 17
5.5.3 Data logging . 17
5.5.4 Output . 17
5.5.5 Required equipment . 17
6 Report . 18
Annex A (informative) Case study of Q-LCF reliability assessment . 19
A.1 Test sample . 19
A.2 Test method . 19
A.3 Test results . 19
Bibliography . 24

Figure 1 – Overview of stresses that Q-LCF are exposed to in service environments . 9
Figure 2 – General reliability test procedure . 9
Figure 3 – Example of measurement setup for invalid edge . 13
Figure 4 – Lighting assembly . 15
Figure A.1 – Trend plots of Q-LCFs during accelerated aging tests . 23

Table 1 – Summary of stresses utilized in this document . 10
Table 2 – Summary overview of relevant test methods and main control parameters . 11
Table 3 – Pass or fail criteria . 14
Table A.1 – Test results of Q-LCF accelerated aging tests . 19

– 4 – IEC TS 62876-4-1:2025 © IEC 2025
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
NANOMANUFACTURING –
RELIABILITY ASSESSMENT –
Part 4-1: Nanophotonic products – Optical stability test of quantum dot
enabled light conversion films: Temperature, humidity and light exposure

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC Publication(s)"). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
may be required to implement this document. However, implementers are cautioned that this may not represent
the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
shall not be held responsible for identifying any or all such patent rights.
IEC TS 62876-4-1 has been prepared by IEC technical committee 113: Nanotechnology for
electrotechnical products and systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
113/866/DTS 113/886/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.

This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 62876 series, published under the general title Nanomanufacturing –
Reliability assessment, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
– 6 – IEC TS 62876-4-1:2025 © IEC 2025
INTRODUCTION
Quantum dots (QDs), as luminescent nanomaterials, exhibit broad absorption spectra and
narrow emission spectra. Using the same excitation source to excite QDs of different particle
size, it is possible to emit spectra with different peak wavelengths. Based on the above
characteristics, QDs are used in display products, which can greatly improve the display colour
gamut.
Nowadays, as a typical product of quantum dot technology application, quantum dot enabled
light conversion film (Q-LCF) is widely used in the display field. Under normal working
conditions, Q-LCF in a backlight module will be continuously irradiated by high-energy
excitation light (such as blue light) to emit converted light. Under the combined action of water
vapour and oxygen from the environment, the optical properties of the QDs in Q-LCF will slowly
deteriorate. In order to ensure the quality and stability of Q-LCF products, it is essential to
scientifically design a reliability test standard to evaluate product quality. Reliability assessment
can be used, for example, to authorize advancement to the next step in product development,
or to authorize progress payments, or to proceed with delivery and acceptance of products.
This document provides reliability test and evaluation criteria for Q-LCF. In this document,
Q-LCFs are used as the test objects. Accelerated aging tests containing stress factors of
temperature, humidity, light are imposed on the test objects to obtain performance shift data
and change trend.
NANOMANUFACTURING –
RELIABILITY ASSESSMENT –
Part 4-1: Nanophotonic products – Optical stability test of quantum dot
enabled light conversion films: Temperature, humidity and light exposure

1 Scope
This part of IEC 62876, which is a Technical Specification, establishes a general reliability
testing programme to verify the reliability of the performance of quantum dots nanomaterials,
and quantum dot enabled light conversion films (Q-LCFs).
The Q-LCF is used as subassemblies for the fabrication of nano-enabled photoelectrical display
devices, mainly liquid crystal display (LCD) currently, with other components.
This testing programme defines standardized aging conditions, methodologies and data
assessment for Q-LCF product.
The results of these tests define a stability under standardized aging conditions for quantitative
evaluation of the reliability of the Q-LCF.
The procedures specified in this document were designed for Q-LCF but can be extended to
serve as a guideline for other kinds of light conversion films or related subassemblies as well.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60068-2-1:2007, Environmental testing – Part 2-1: Tests – Test A: Cold
IEC 60068-2-27:2008, Environmental testing – Part 2-27: Tests – Test Ea and guidance: Shock
IEC 60068-2-78:2012, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat, steady
state
IEC TS 62565-4-4:2025, Nanomanufacturing – Product specifications – Part 4-4: Nanophotonic
products – Blank detail specifications: Quantum dot enabled light conversion films
IEC 62595-2-1:2016, Display lighting unit – Part 2-1: Electro-optical measuring methods of LED
backlight unit
ISO/IEC 17025, General requirements for the competence of testing and calibration
laboratories
– 8 – IEC TS 62876-4-1:2025 © IEC 2025
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1.1
quantum dot
QD
crystalline nanoparticle that exhibits size-dependent properties due to quantum confinement
effects on the electronic states
[SOURCE: ISO/TS 27687:2008, 4.7]
3.1.2
quantum dot enabled light conversion film
Q-LCF
optical film based on quantum dots that converts high energy light at a particular wavelength
into low energy light at another wavelength
3.1.3
invalid edge
edge of Q-LCF with a significant decline in optical performance, failing to function
3.2 Abbreviated terms
BLU backlight unit
FWHM full width at half maxima
LCE light conversion efficiency
QD quantum dot
Q-LCF quantum dot enabled light conversion film
λ peak wavelength
p
L luminance
v
4 General requirements
4.1 Q-LCF
The Q-LCF is typically an individual subassembly which will be used by an assembler to
fabricate display panel product to be sold to the end user. The purpose of this document is to
assess the reliability of the Q-LCF. The test samples shall be selected randomly from a group
of films cut from a big Q-LCF in a clean environment such that test samples are representative
for the ensemble film. The physical size of the samples shall be no less than 18 cm × 18 cm.
The samples shall not show visible curling, cracking, damage, wrinkles, and no scratches or
dirt on the surface.
4.2 Tests
4.2.1 General
All the tests in this document fall into the class of accelerated aging tests. These tests are
designed to expose the test samples of Q-LCFs to specific well-defined and reproducible stress
factors that accelerate critical failure mechanisms. Being able to quantify the response of the
Q-LCFs under different stages of product development and application, such as for the early
development stage, allows for efficient development cycles to improve the stability of the
Q-LCFs. For the industrial application, the effective service life of electronic devices shall be
no less than 30 000 h. This is too long and time consuming to carry out the text practically, so
it is essential to develop accelerated aging tests to evaluate the stability of a novel technology
or product, which is essential and helpful for its industrial acceptance.
The photoelectrical devices fabricated with Q-LCF will face different stresses from the
environment during their service period. To evaluate the reliability, a suitable selection of
relevant stress factors is important in order to reflect realistic conditions. An overview of typical
stress factors that Q-LCFs are exposed to is shown in Figure 1.

Figure 1 – Overview of stresses that Q-LCF are exposed to in service environments
General reliability testing is performed by repeated measurements of the performance of test
samples before and after exposure to a stress or a combination of stresses for a period of time.
A typical procedure is shown in Figure 2. After initial characterization, the sample is submitted
to the stress environment for a regular time interval. After the exposure interval the sample is
conditioned for measurement, characterized and then re-exposed. This document provides
certain combinations of suggested stresses so that appropriate stress conditions can be
selected. In addition, it defines the procedures and equipment that are required in order to
perform reliable and reproducible reliability measurements.

Figure 2 – General reliability test pr
...