IEC 60384-19:2006

IEC 60384-19 ®
Edition 2.0 2006-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate
film dielectric surface mount d.c. capacitors

Condensateurs fixes utilisés dans les équipements électroniques –
Partie 19: Spécification intermédiaire: Condensateurs fixes pour montage en
surface pour courant continu à diélectrique en film de polyéthylène téréphtalate
métallisé
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IEC 60384-19 ®
Edition 2.0 2006-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –

Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate

film dielectric surface mount d.c. capacitors

Condensateurs fixes utilisés dans les équipements électroniques –

Partie 19: Spécification intermédiaire: Condensateurs fixes pour montage en

surface pour courant continu à diélectrique en film de polyéthylène téréphtalate

métallisé
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
T
CODE PRIX
ICS 31.060.30 ISBN 978-2-8322-0049-0

– 2 – 60384-19  IEC:2006
CONTENTS
FOREWORD . 3
1 General . 6
1.1 Scope . 6
1.2 Object . 6
1.3 Normative references . 6
1.4 Information to be given in a detail specification . 6
1.5 Terms and definitions . 8
1.6 Marking . 8
2 Preferred ratings and characteristics . 9
2.1 Preferred characteristics . 9
2.2 Preferred values of ratings . 9
3 Quality assessment procedures . 10
3.1 Primary stage of manufacture . 10
3.2 Structurally similar components . 10
3.3 Certified records of released lots . 10
3.4 Qualification approval . 10
3.5 Quality conformance inspection . 17
4 Test and measurement procedures . 18
4.1 Mounting . 18
4.2 Visual examination and check of dimensions . 18
4.3 Electrical tests . 18
4.4 Shear test (formerly adhesion test) . 21
4.5 Substrate bending test (formerly bond strength of the end of plating) . 21
4.6 Resistance to soldering heat . 21
4.7 Solderability . 22
4.8 Rapid change of temperature . 22
4.9 Climatic sequence . 22
4.10 Damp heat, steady state . 23
4.11 Endurance . 23
4.12 Charge and discharge . 24
4.13 Component solvent resistance (if applicable) . 24
4.14 Solvent resistance of the marking (if applicable) . 24

Table 1 – Fixed sample size test plan for qualification approval Assessment level EZ . 12
Table 2 – Test schedule for qualification approval. 13
Table 3 – Lot-by-lot inspection . 17
Table 4 – Periodic inspection . 18
Table 5 – Voltages to be applied . 19
Table 6 – Applicable tan δ values. 20
Table 7 – Insulation resistance requirements . 20
Table 8 – Correction factors . 21
Table 9 – Test conditions . 24

60384-19  IEC:2006 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 19: Sectional specification: Fixed metallized polyethylene-
terephthalate film dielectric surface mount d.c. capacitors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-19 has been prepared by technical committee 40:
Capacitors and resistors for electronic equipment.
This second edition cancels and replaces the first edition published in 1993 and constitutes
minor revisions related to tables, figures and references.
This bilingual version (2012-03) corresponds to the monolingual English version, published in
2006-01.
– 4 – 60384-19  IEC:2006
The text of this standard is based on the following documents:
FDIS Report on voting
40/1622/FDIS 40/1645/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The French version of this standard has not been voted upon.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
IEC 60384 consists of the following parts, under the general title Fixed capacitors for use in
electronic equipment:
Part 1: Generic specification
Part 2: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric
d.c. capacitors
Part 3: Sectional specification: Fixed tantalum surface mount capacitors
Part 4: Sectional specification: Aluminium electrolytic capacitors with solid and non-solid
electrolyte
Part 5: Sectional specification: Fixed mica dielectric d.c. capacitors with a rated voltage
not exceeding 3000 V - Selection of methods of test and general requirements
Part 6: Sectional specification: Fixed metallized polycarbonate film dielectric d.c.
capacitors
Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, Class 1
Part 9: Sectional specification: Fixed capacitors of ceramic dielectric, Class 2
Part 11: Sectional specification: Fixed polyethylene-terephthalate film dielectric metal foil
d.c. capacitors
Part 12: Sectional specification: Fixed polycarbonate film dielectric metal foil d.c.
capacitors
Part 13: Sectional specification: Fixed polypropylene film dielectric metal foil d.c.
capacitors
Part 14: Sectional specification: Fixed capacitors for electromagnetic interference
suppression and connection to the supply mains
Part 15: Sectional specification: Fixed tantalum capacitors with non-solid or solid
electrolyte
Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c.
capacitors
Part 17: Sectional specification: Fixed metallized polypropylene film dielectric a.c. and
pulse capacitors
Part 18: Sectional specification: Fixed aluminium electrolytic surface mount capacitors with
solid and non-solid electrolyte
Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric
surface mount d.c. capacitors
Part 20: Sectional specification: Fixed metallized polyphenylene sulfide film dielectric
surface mount d.c. capacitors
Part 21: Sectional specification: Fixed surface mount multilayer capacitors of ceramic
dielectric, Class 1
Part 22: Sectional specification: Fixed surface mount multilayer capacitors of ceramic
dielectric, Class 2
60384-19  IEC:2006 – 5 –
Part 23: Sectional specification - Fixed surface mount metallized polyethylene naphthalate
film dielectric DC capacitors
Part 24: Sectional specification - Surface mount fixed tantalum electrolytic capacitors with
conductive polymer solid electrolyte
Part 25: Sectional specification - Surface mount fixed aluminium electrolytic capacitors
with conductive polymer solid electrolyte
All sectional specifications mentioned above do have one or more blank detail specifications
being a supplementary document, containing requirements for style, layout and minimum
content of detail specifications.
The QC number that appears on the front cover of this publication is the specification number
in the IECQ Quality Assessment System for Electronic Components.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
———————
To be published.
– 6 – 60384-19  IEC:2006
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 19: Sectional specification – Fixed metallized polyethylene-
terephthalate film dielectric surface mount d.c. capacitors

1 General
1.1 Scope
This part of IEC 60384 is applicable to fixed surface mount capacitors for direct current, with
metallized electrodes and polyethylene-terephthalate dielectric for use in electronic
equipment. These capacitors have metallized connecting pads or soldering strips and are
intended to be mounted direct onto substrates for hybrid circuits or onto printed boards.
These capacitors may have "self-healing properties" depending on conditions of use. They
are primarily intended for applications where the a.c. component is small with respect to the
rated voltage.
Capacitors for electromagnetic interference suppression are not included but are covered by
IEC 60384-14.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1:1999, the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification shall be of equal or higher performance level, because lower performance levels
are not permitted.
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60063:1963, Preferred number series for resistors and capacitors
Amendment 1 (1967)
Amendment 2 (1977)
IEC 60068-1, Environmental testing – Part 1: General and guidance
IEC 60384-1, Fixed capacitors for use in electronic equipment – Part 1: Generic specification
IEC 60410, Sampling plans and procedures for inspection by attributes
ISO 3, Preferred numbers – Series of preferred numbers
1.4 Information to be given in a detail specification
Detail specifications shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional
or blank detail specification. When more severe requirements are included, they shall be

60384-19  IEC:2006 – 7 –
listed in 1.9 of the detail specification and indicated in the test schedules, for example, by an
asterisk.
NOTE The information given in 1.4.1 may, for convenience, be presented in tabular form.
The following information shall be given in each detail specification and the values quoted
shall preferably be selected from those given in the appropriate clause of this sectional
specification.
1.4.1 Outline drawing and dimensions
There shall be an illustration of the capacitor as an aid to easy recognition and for comparison
of the capacitor with others. Dimensions and their associated tolerances, which affect inter-
changeability and mounting, shall be given in the detail specification. All dimensions are
preferably to be stated in millimetres.
Normally, the numerical values shall be given for the length, width and height of the body.
When necessary, for example when a number of items (sizes and capacitance/voltage
ranges) is covered by a detail specification, the dimensions and their associated tolerances
shall be placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitor.
1.4.2 Mounting
The detail specification shall give guidance on methods of mounting for normal use. Mounting
for test and measurement purposes (when required) shall be in accordance with 4.1 of this
sectional specification.
1.4.3 Ratings and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this
specification, together with the following.
1.4.3.1 Rated capacitance range
See 2.2.1.
NOTE When products approved to the detail specification have different ranges, the following statement should
be added: “The range of capacitance values available in each voltage range is given in IEC QC 001005.".
1.4.3.2 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.3.3 Soldering
The detail specification shall prescribe the test methods, severities and requirements
applicable for the solderability and the resistance to soldering heat tests.
1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
package. Deviations from 1.6 of this sectional specification, shall be specifically stated.

– 8 – 60384-19 © IEC:2006
1.5 Terms and definitions
For the purposes of this sectional specification, the terms and definitions given in IEC 60384-1,
as well as the following, apply.
1.5.1
surface mount capacitor
capacitor whose small dimensions and nature or shape of terminations make it suitable for
surface mounting in hybrid circuits and on printed boards
1.5.2
performance grade 1 capacitors (long-life)
capacitors for long-life applications with stringent requirements for the electrical parameters
1.5.3
performance grade 2 capacitors (general-purpose)
capacitors for general applications where the stringent requirements for grade 1 capacitors
are not necessary
1.5.4
rated voltage (U )
R
maximum d.c. voltage which may be applied continuously to a capacitor at the rated
temperature
NOTE The sum of the d.c. voltage and the peak a.c. voltage applied to the capacitor should not exceed the rated
voltage. The value of the peak a.c. voltage should not exceed the following percentages of the rated voltage at the
frequencies stated and should be not greater than 280 V:
50 Hz : 20 %
100 Hz : 15 %
1 000 Hz : 3 %
10 000 Hz : 1 %
unless otherwise specified in the detail specification.
1.6 Marking
See IEC 60384-1, 2.4, with the following details.
1.6.1 The information given in the marking is normally selected from the following list; the
relative importance of each item is indicated by its position in the list:
a) rated capacitance;
b) rated voltage (d.c. voltage may be indicated by the symbol        or );
c) tolerance on rated capacitance;
d) category voltage;
e) year and month (or week) of manufacture;
f) manufacturer's name or trade mark;
g) climatic category;
h) manufacturer's type designation;
i) reference to the detail specification.
1.6.2 Surface mount capacitors are generally not marked on the body. If some marking can
be applied, they shall be clearly marked with as many as possible of the above items as is
considered useful. Any duplication of information in the marking on the capacitor should be
avoided.
60384-19  IEC:2006 – 9 –
1.6.3 Any marking shall be legible and not easily smeared or removed by rubbing with the
finger.
1.6.4 The package containing the capacitor(s) shall be clearly marked with all the
information listed in 1.6.1.
1.6.5 Any additional marking shall be so applied that no confusion can arise.
2 Preferred ratings and characteristics
2.1 Preferred characteristics
The values given in detail specifications shall preferably be selected from the following.
2.1.1 Preferred climatic categories
The surface mount capacitors covered by this specification are classified into climatic
categories according to the general rules given in IEC 60068-1.
The lower and upper category temperature and the duration of the damp-heat steady-state
test shall be chosen from the following.
Lower category temperature: –55 °C, –40 °C and –25 °C.
Upper category temperature: +85 °C, +100 °C and +125 °C.
Duration of the damp-heat steady-state test: 4, 10, 21 and 56 days.
NOTE With continuous operation at 125 °C in excess of the endurance test time, accelerated ageing has to be
considered (see detail specification).
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
2.2 Preferred values of ratings
2.2.1 Rated capacitance (C )
R
The preferred values of rated capacitance are:
1 - 1,5 - 2,2 - 3,3 - 4,7 and 6,8 and their decimal multiples.
These values conform to the E6 series of preferred values given in IEC 60063.
If other values are required they shall preferably be chosen from the E12 series.
2.2.2 Tolerance on rated capacitance
The preferred tolerances on the rated capacitance are ±5 %, ±10 % and ±20 %.
2.2.3 Rated voltage (U )
R
The preferred values of rated voltage are:
25 V - 40 V - 63 V - 100 V - 160 V - 250 V - 400 V - 630 V.
These values conform to the basic series of preferred values R5 given in ISO 3.

– 10 – 60384-19  IEC:2006
2.2.4 Category voltage (U )
C
The category voltage is:
0,8 U for upper category temperature 100 °C and 0,5 U for upper category temperature
R R
125 °C.
2.2.5 Rated temperature
The standard value of rated temperature is 85 °C.
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the winding of the capacitor element or the equivalent
operation.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, though they may be of different case sizes and capacitance and
voltage values.
3.3 Certified records of released lots
The information required in IEC 60384-1, 3.9, shall be made available when prescribed in the
detail specification and when requested by a purchaser. After the endurance test the
parameters for which variables information is required are the capacitance change, tan δ and
the insulation resistance.
3.4 Qualification approval
The procedures for qualification approval testing are given in IEC 60384-1, 3.5.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in 3.5. The procedure using a fixed sample size schedule is given in
3.4.1.
3.4.1 Qualification approval on the basis of the fixed sample size procedure
3.4.1.1 Sampling
The fixed sample size procedure is described in IEC 60384-1, 3.5.3b). The sample shall be
representative of the range of capacitors for which approval is sought. This may or may not be
the complete range covered by the detail specification.
The sample shall consist of specimens having the lowest and highest voltages, and for these
voltages the lowest and highest capacitances. When there are more than four rated voltages,
an intermediate voltage shall also be tested. Thus, for the approval of a range, testing is
required of either four or six values (capacitance/voltage combinations). When the range
consists of less than four values, the number of specimens to be tested shall be that required
for four values.
60384-19  IEC:2006 – 11 –
Spare specimens are permitted as follows:
• two (for six values) or three (for four values) per value which may be used as
replacements for specimens which are non-conforming because of incidents not
attributable to the manufacturer.
• the numbers given in Group 0 assume that all groups are applicable. If this is not so the
numbers may be reduced accordingly.
• when additional groups are introduced into the qualification approval test schedule, the
number of specimens required for Group 0 shall be increased by the same number as that
required for the additional groups.
Table 1 gives the number of samples to be tested in each group or subgroup together with the
permissible number of nonconformances for qualification approval tests.
3.4.1.2 Tests
The complete series of tests specified in Tables 1 and 2 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other
groups.
Specimens found defective during the tests of Group 0 shall not be used for the other groups.
"One nonconforming item" is counted when a capacitor has not satisfied the whole or a part of
the tests of a group.
The approval is granted when the number of nonconforming items does not exceed the
specified number of permissible nonconformances for each group or subgroup and the total
number of permissible nonconformances.
NOTE Tables 1 and 2 together form the fixed sample size test schedule. Table 1 includes the details for the
sampling and permissible nonconformances for the different tests or groups of tests. Table 2, together with the
details of tests contained in Clause 4, gives a complete summary of test conditions and performance requirements
and indicates where, for example for the test method or conditions of test, a choice should be made in the detail
specification.
The conditions of test and performance requirements for the fixed sample size test schedule
shall be identical to those prescribed in the detail specification for quality conformance
inspection.
– 12 – 60384-19  IEC:2006
Table 1 – Fixed sample size test plan for qualification approval
Assessment level EZ
Group Test Subclause of Number of Permissible
No. this specimens number of non-
publication conforming
items
a
n c
0 Visual examination 4.2
Dimensions 4.2
Capacitance 4.3.2 144 0
Tangent of loss angle 4.3.3
Voltage proof 4.3.1
Insulation resistance 4.3.4
Spare specimens 12
1A Resistance to soldering heat 4.6 12 0
b
Component solvent resistance 4.13
1B Solderability 4.7 12 0
b
Solvent resistance of the marking 4.14
2 Substrate bending test (formerly 4.5 12 0
bond strength of the end face
plating)
Mounting 4.1
Visual examination 4.2
c)
Capacitance 4.3.2 108 0
3 Tangent of loss angle 4.3.3
Voltage proof 4.3.1
Insulation resistance  4.3.4
Shear (formerly adhesion) test 4.4
3.1 Rapid change of temperature 4.8 24 0
Climatic sequence 4.9
3.2 Damp heat, steady state 4.10 24 0
3.3 Endurance 4.11 36 0
3.4 Charge and discharge 4.12 24 0
a
Capacitance/voltage combinations, see 3.4.1.
b
If required by the detail specification.
c
Specimens found defective after mounting shall not be taken into account when calculating the
permissible nonconforming items for the following tests. They shall be replaced by spare parts.

60384-19  IEC:2006 – 13 –
Table 2 – Test schedule for qualification approval
a a
Subclause number and D Conditions of test Number of Performance requirements
a
test or specimens (n)
ND and number of
b
permissible
non-
conformances
(c)
Group 0 ND See Table 1
4.2.1 Visual examination   As in 4.2.2
Legible marking and as
specified in the detail
specification
4.2 Dimensions (detail)   See detail specification
4.3.2 Capacitance   Within specified tolerance
4.3.3 Tangent of loss Frequency: 1 kHz  As in 4.3.3.2
angle (tan δ)
4.3.1 Voltage proof See detail specification  No breakdown or flashover.
for the method Self-healing breakdowns
allowed
4.3.4 Insulation resistance See detail specification  As in 4.3.4.3
for the method
Group 1A D See Table 1
4.6 Resistance to
soldering heat
4.6.1 Initial measurements Capacitance
4.6.2 Test conditions See detail specification
for the method
As in 4.6.3
4.6.3 Final measurements Visual examination

Capacitance ∆C/C ≤ 3 % of value
measured in 4.6.1
4.13 Component solvent Solvent : …  See detail specification
resistance
Solvent temperature: …
(if applicable)
Method 2
Recovery time: …
– 14 – 60384-19  IEC:2006
a a
Subclause number and Conditions of test Number of Performance requirements
D
a
test or specimens (n)
ND and number of
b
permissible
non-
conformances
(c)
Group 1B
D See Table 1
4.7 Solderability No ageing
Method 1 or 2 as specified in
the detail specification
4.7.2 Final measurements Visual examination  As in 4.7.2
4.14 Solvent resistance Solvent: .  Legible marking
c
of the marking Solvent temperature: .
(if applicable) Method 1
Rubbing material: cotton wool
Recovery time: .
Group 2 D See Table 1
4.5 Substrate bending Capacitance (with board in
∆C/C ≤ 10%
test bent position)
Visual examination  No visible damage
Group 3 D See Table 1
c
4.1 Mounting Substrate material: …
4.2.1 Visual examination   See detail specification
4.3.2 Capacitance   ∆C/C ≤ 2% of value
measured in Group 0
4.3.3 Tangent of loss Frequency:  As in 4.3.3
1 kHz (for all capacitance
angle (tan δ)
(Reference values for final
values)
measurements in subgroups
10 kHz for capacitors with
3.1, 3.3 and 3.4)
C ≤ 1 µF (in addition, see
R
4.3.3.3)
4.3.4 Insulation   As in 4.3.4.3
resistance
Subgroup 3.1 D See Table 1
4.4 Shear
4.8 Rapid change
of temperature
4.8.1 Initial  Not required, see Group 3
measurements
4.8.2 Test  T = Lower category
A
conditions temperature
T = Upper category
B
temperature
Five cycles
Duration t = 30 min
4.8.3 Intermediate  Visual examination  No visible damage
inspection
4.9 Climatic
sequence
4.9.1 Initial  Not required, see Group 3
measurements
60384-19  IEC:2006 – 15 –
a
a
Subclause number and D Conditions of Number of Performance requirements
a
test or specimens (n)
ND and number of
b
permissible
non-
conformances
(c)
See Table 1
4.9.2 Dry heat Temperature:
upper category temperature
Duration: 16 h
4.9.3 Damp heat, cyclic,
test Db, first
cycle
4.9.4 Cold Temperature: lower category
temperature
Duration: 2 h
4.9.5 Damp heat,  Within 15 min after removal
cyclic, test Db, from test chamber U to be
R
remaining cycles applied for 1 min
4.9.6 Final Visual examination  No visible damage
measurements Legible marking
Capacitance  ∆C/C ≤ 5 % of the value
measured in Group 3
Tangent of loss angle:  Increase of tan δ:
at 10 kHz for CR ≤ 1 µF ≤ 0,005 for Grade 1
≤ 0,008 for Grade 2
at 1 kHz for C > 1 µf  ≤ 0,003 for Grade 1
R
≤ 0,005 for Grade 2 compared
to values measured in
Group 3
Insulation resistance  ≥ 50 % of values in 4.3.4.3
Subgroup 3.2 D See Table 1
4.10 Damp heat,
steady state
4.10.1 Initial  Not required, see Group 3
measurements
4.10.2 Final  Visual examination  No visible damage
measurements
Capacitance  ∆C/C ≤ 5 % of the
value measured in Group 3
Tangent of loss angle at 1 kHz  Increase of tan δ:
≤ 0,005 compared to values
measured in Group 3
Insulation resistance  ≥ 50 % of values in 4.3.4.3
Subgroup 3.3 D See Table 1
4.11 Endurance
Not required, see Group 3
4.11.1 Initial
measurements
4.11.2 Test conditions See 4.11.2, 4.11.3
and 4.11.4
4.11.5 Final  Visual examination  No visible damage
measurements Legible marking
Capacitance  ∆C/C ≤ 5 % for Grade 1
∆C/C ≤ 8 % for Grade 2
compared to measurements in
Group 3
– 16 – 60384-19  IEC:2006
a a
Subclause number and D Conditions of test Number of Performance requirements
a
test or specimens (n)
ND and number of
b
permissible
non-
conformances
(c)
See Table 1
Tangent of loss angle: Increase of tan δ:

at 10 kHz for C ≤ 1 µF ≤ 0,003 for Grade 1
R
≤ 0,005 for Grade 2
at 1 kHz for C > 1 µf ≤ 0,002 for Grade 1
R
≤ 0,003 for Grade 2
compared to values
measured in
Group 3
Insulation resistance ≥ 50 % of values in 4.3.4.3

Subgroup 3.4
D See Table 1
4.12 Charge and
discharge
Not required, see Group 3
4.12.1 Initial
measurement
4.12.2 Test conditions 10 000 cycles
4.12.3 Final Capacitance  ∆C/C ≤ 3 % for Grade 1
measurements ∆C/C ≤ 5 % for Grade 2
compared to value measured
in Group 3
Tangent of loss angle:  Increase of tan δ:
≤ 0,003 for Grade 1
at 10 kHz for C ≤ 1 µF
R
≤ 0,005 for Grade 2
≤ 0,002 for Grade 1
at 1 kHz for CR > 1 µF
≤ 0,003 for Grade 2
compared to values
measured in
Group 3
Insulation resistance  ≥ 50 % of values in 4.3.4.3
a
Subclause numbers of test and performance requirements refer to Clause 4.
b
In this table: D = destructive, ND = non-destructive.
c
This test may be carried out on surface mount capacitors mounted on a substrate.
When different substrate materials are used for the individual subgroups, the detail
specification shall indicate which substrate material is used in each subgroup.

60384-19  IEC:2006 – 17 –
3.5 Quality conformance inspection
3.5.1 Formation of inspection lots
a) Groups A and B inspection
These tests shall be carried out on a lot-by-lot basis.
A manufacturer may aggregate the current production into inspection lots subject to the
following safeguards.
1) The inspection lot shall consist of structurally similar capacitors (see 3.2).
2a) The sample tested shall be representative of the values and dimensions contained in
the inspection lot:
– in relation to their number;
– with a minimum of five of any one value.
2b) If there are less than five of any one value in the sample the basis for the drawing of
samples shall be agreed between the manufacturer and the National Supervising
Inspectorate.
b) Group C inspection
These tests shall be carried out on a periodic basis.
Samples shall be representative of the current production of the specified periods and
shall be divided into high-, medium- and low-voltage ratings. In order to cover the range of
approvals in any period, one case size shall be tested from each voltage group. In
subsequent periods, other case sizes and/or voltage ratings in production shall be tested
with the aim of covering the whole range.
3.5.2 Test schedule
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given
in Clause 2, Table 4 of the blank detail specification, for example, IEC 60384-19-1.
3.5.3 Delayed delivery
When according to the procedures of IEC 60384-1, 3.10 reinspection has to be made,
solderability and capacitance shall be checked as specified in Group A and B inspection.
3.5.4 Assessment levels
The assessment level(s) given in the blank detail specification shall preferably be selected
from Tables 3 and 4.
Table 3 – Lot-by-lot inspection
c c c
Inspection D EZ F G
d
subgroup
IL n c IL n c IL n c IL n c
a
A0  100 %
b)
A1  S-3
b)
A2  S-3
b)
B1 S-3
b)
B2 S-3
See notes in Table 4.
– 18 – 60384-19  IEC:2006
Table 4 – Periodic inspection
c c c
Inspection D EZ F G
d
subgroup
p n c p n c p n c p n c
C1  3 12 0
C2  3 12 0
C3.1 6 27 0
C3.2 6 15 0
C3.3 3 15 0
C3.4 6 9 0
IL = inspection level
n = sample size
c = permissible number of non-conforming items
p = periodicity in months
a
100 % testing shall be followed by re-inspection by sampling in order to monitor outgoing quality level by non-
conforming items per million (ppm). The sampling level shall be established by the manufacturer. For the cal-
culation of ppm values any parametric failure shall be counted as a nonconforming item. In case one or more
nonconforming items occur in a sample, this lot shall be rejected.
b
Number to be tested: sample size as directly allotted to the code letter for IL in Table 2a of IEC 60410.
c
The assessment levels D, F and G are under consideration.
d
The content of the inspection subgroups is described in Clause 2 of the relevant blank detail specification.
4 Test and measurement procedures
This clause supplements the information given in IEC 60384-1, Clause 4.
4.1 Mounting
See IEC 60384-1, 4.33.
4.2 Visual examination and check of dimensions
See IEC 60384-1, 4.4 with the following details.
4.2.1 Visual examination
Visual examination shall be carried out with suitable equipment with approximately 10×
magnification and lighting appropriate to the specimen under test and the quality level
required.
NOTE The operator should have available facilities for incident or transmitted illumination as well as an
appropriate measuring facility.
4.2.2 Requirements
The capacitors shall be examined to verify that the materials, design, construction, physical
dimensions and workmanship are in accordance with the applicable requirements given in the
detail specification.
4.3 Electrical tests
4.3.1 Voltage proof
See IEC 60384-1, 4.6, with the following details.

60384-19  IEC:2006 – 19 –
4.3.1.1 Test circuit
Delete the capacitor C .
The product of R and the rated capacitance C shall be smaller than, or equal to, 1 s and
X
greater than 0,01 s.
R includes the internal resistance of the power supply.
R shall limit the discharge current to a value equal to or less than 1 A.
4.3.1.2 The voltages given in Table 5 shall be applied between the measuring points of
Table 3 in IEC 60384-1 for a period of 1 min for qualification approval testing and for a period
of 1 s for the lot-by-lot quality conformance testing.
Table 5 – Voltages to be
...