EN IEC 62435-7:2021

SLOVENSKI STANDARD
01-marec-2021
Elektronske komponente - Dolgoročno skladiščenje elektronskih polprevodniških
elementov - 7. del: Mikroelektromehanski elementi (IEC 62435-7:2020)
Electronic components - Long-term storage of electronic semiconductor devices - Part 7:
Microelectromechanical devices (IEC 62435-7:2020)
Elektronische Bauteile - Langzeitlagerung elektronischer Halbleiterbauelemente - Teil 7:
Bauelemente der Mikrosystemtechnik (IEC 62435-7:2020)
Composants électroniques - Stockage de longue durée des dispositifs électroniques à
semiconducteurs - Partie 7: Dispositifs microélectromécaniques (IEC 62435-7:2020)
Ta slovenski standard je istoveten z: EN IEC 62435-7:2021
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 62435-7

NORME EUROPÉENNE
EUROPÄISCHE NORM
January 2021
ICS 31.020
English Version
Electronic components - Long-term storage of electronic
semiconductor devices - Part 7: Micro-electromechanical
devices
(IEC 62435-7:2020)
Composants électroniques - Stockage de longue durée des Elektronische Bauteile - Langzeitlagerung elektronischer
dispositifs électroniques à semiconducteurs - Partie 7: Halbleiterbauelemente - Teil 7: Bauelemente der
Dispositifs microélectromécaniques Mikrosystemtechnik
(IEC 62435-7:2020) (IEC 62435-7:2020)
This European Standard was approved by CENELEC on 2021-01-08. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2021 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62435-7:2021 E

European foreword
The text of document 47/2664/FDIS, future edition 1 of IEC 62435-7, prepared by IEC/TC 47
"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 62435-7:2021.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2021-10-08
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2024-01-08
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 62435-7:2020 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC/TR 62258-3 NOTE Harmonized as CLC/TR 62258-3
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60721-3-1 - EN IEC 60721-3-1 -
Classification of environmental conditions
- Part 3-1: Classification of groups of
environmental parameters and their
severities - Storage
IEC 60749-20 - Semiconductor devices - Mechanical and EN IEC 60749-20 -
climatic test methods - Part 20:
Resistance of plastic encapsulated
SMDs to the combined effect of moisture
and soldering heat
IEC 60749-20-1 - Semiconductor devices - Mechanical and - -
climatic test methods - Part 20-1:
Handling, packing, labelling and shipping
of surface-mount devices sensitive to the
combined effect of moisture and
soldering heat
IEC 62435-2 - Electronic components - Long-term EN 62435-2 -
storage of electronic semiconductor
devices - Part 2: Deterioration
mechanisms
IEC 62435-3 - Electronic components - Long-term EN IEC 62435-3 -
storage of electronic semiconductor
devices - Part 3: Data
IEC 62435-4 - Electronic components - Long-term EN IEC 62435-4 -
storage of electronic semiconductor
devices - Part 4: Storage
IEC 62435-5 - Electronic components - Long-term EN 62435-5 -
storage of electronic semiconductor
devices - Part 5: Die and wafer devices

IEC 62435-7 ®
Edition 1.0 2020-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electronic components – Long-term storage of electronic semiconductor

devices –
Part 7: Micro-electromechanical devices

Composants électroniques – Stockage de longue durée des dispositifs

électroniques à semiconducteurs –

Partie 7: Dispositifs microélectromécaniques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.020 ISBN 978-2-8322-9147-4

– 2 – IEC 62435-7:2020 © IEC 2020
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Storage considerations . 9
4.1 Overview of MEMS applications . 9
4.2 Failure mechanisms . 9
4.2.1 Occurrence of failure and driving force . 9
4.2.2 Storage environment and mitigation for stimuli to prevent failure . 12
4.3 Materials management . 13
4.4 Storage media . 13
4.5 Documentation/paper lot identifiers . 14
4.6 Inventory check. 14
4.7 Inventory dry packing refreshing . 14
4.8 Inventory re-assessment . 14
5 Baseline long-term storage requirements . 14
5.1 General . 14
5.2 Moisture sensitivity designation . 15
5.3 Dry packing for storage . 15
5.4 Non-moisture sensitive device storage . 15
5.4.1 General . 15
5.4.2 Storage media . 15
5.4.3 Lot data and labelling . 15
5.5 Storage of MEMS devices before assembly – Wafer level and die level
storage . 15
5.6 Storage of moisture sensitive finished devices . 15
5.6.1 Moisture barrier bag . 15
5.6.2 Dunnage . 16
5.6.3 Humidity indicator card . 16
5.6.4 Desiccant . 16
5.6.5 Labelling . 16
5.6.6 Lot data and labelling . 16
5.6.7 Storage environment . 17
5.6.8 Process (temperature) sensitivity designation . 17
Annex A (informative) Packaged or finished device storage environment
considerations . 18
Bibliography . 19

Table 1 – Failure mechanisms in storage and stimuli to mitigate during storage . 10
Table 2 – Long-term environment – sustained condition requirements . 13
Table 3 – Considerations for management, control and documentation during storage . 13
Table A.1 – Long-term storage environment – sustained condition considerations . 18

IEC 62435-7:2020 © IEC 2020 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTRONIC COMPONENTS – LONG-TERM STORAGE
OF ELECTRONIC SEMICONDUCTOR DEVICES –

Part 7: Micro-electromechanical devices

FOREWORD
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