EN 62129-2:2011

SLOVENSKI STANDARD
01-september-2011
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Calibration of wavelength/optical frequency measurement insturments - Part 2:
Michelson interferometer single wavelength meters (IEC 62129-2:2011)
Kalibrierung von Messgeräten für die Wellenlänge/optische Frequenz - Teil 2: Michelson-
Interferometer-Einzelwellenlängen-Messgerät (IEC 62129-2:2011)
Etalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la
fréquence optique - Partie 2: Appareils de mesure de longueur d'onde unique à
interféromètre de Michelson (CEI 62129-2:2011)
Ta slovenski standard je istoveten z: EN 62129-2:2011
ICS:
33.180.01 6LVWHPL]RSWLþQLPLYODNQLQD Fibre optic systems in
VSORãQR general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 62129-2
NORME EUROPÉENNE
July 2011
EUROPÄISCHE NORM
ICS 33.180.30
English version
Calibration of wavelength/optical frequency measurement instruments -
Part 2: Michelson interferometer single wavelength meters
(IEC 62129-2:2011)
Etalonnage des appareils de mesure de Kalibrierung von Messgeräten für die
longueur d'onde/appareil de mesure de la Wellenlänge/optische Frequenz -
fréquence optique - Teil 2: Michelson-Interferometer-
Partie 2: Appareils de mesure de longueur Einzelwellenlängen-Messgeräte
d'onde unique à interféromètre de (IEC 62129-2:2011)
Michelson
(CEI 62129-2:2011)
This European Standard was approved by CENELEC on 2011-06-30. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels

© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62129-2:2011 E
Foreword
The text of document 86/395/FDIS, future edition 1 of IEC 62129-2, prepared by IEC TC 86, Fibre optics,
was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62129-2 on
2011-06-30.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2012-03-30
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2014-06-30
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62129-2:2011 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60793-1-1 NOTE  Harmonized as EN 60793-1-1.
IEC 60825-1 NOTE  Harmonized as EN 60825-1.
IEC 60825-2 NOTE  Harmonized as EN 60825-2.
__________
- 3 - EN 62129-2:2011
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60050-300 2001 International Electrotechnical Vocabulary - - -
Electrical and electronic measurements and
measuring instruments -
Part 311: General terms relating to
measurements -
Part 312: General terms relating to electrical
measurements -
Part 313: Types of electrical measuring
instruments -
Part 314: Specific terms according to the type
of instrument
IEC 61315 2005 Calibration of fibre-optic power meters EN 61315 2006

IEC/TR 61931 1998 Fibre optic - Terminology - -

ISO/IEC 17025 2005 General requirements for the competence of EN ISO/IEC 17025 2005
testing and calibration laboratories

ISO/IEC Guide 99 2007 International vocabulary of metrology - Basic - -
and general concepts and associated terms
(VIM)
ISO/IEC Guide 98-3 2008 Uncertainty of measurement - - -
Part 3: Guide to the expression of uncertainty
in measurement (GUM:1995)
IEC 62129-2 ®
Edition 1.0 2011-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Calibration of wavelength/optical frequency measurement instruments –
Part 2: Michelson interferometer single wavelength meters

Étalonnage des appareils de mesure de longueur d’onde/appareil de mesure
de la fréquence optique –
Partie 2: Appareils de mesure de longueur d'onde unique à interféromètre de
Michelson
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX X
ICS 33.180.30 ISBN 978-2-88912-523-4

– 2 – 62129-2  IEC:2011
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references. 7
3 Terms and definitions . 7
4 Preparation for calibration . 11
4.1 Organization . 11
4.2 Traceability . 11
4.3 Advice for measurements and calibrations . 11
4.4 Recommendations to customers . 12
5 Single wavelength calibration . 12
5.1 General . 12
5.2 Establishing calibration conditions. 12
5.3 Calibration procedure . 13
5.3.1 General . 13
5.3.2 Measurement configuration . 13
5.3.3 Detailed procedure. 15
5.3.4 Stability test (if necessary) . 15
5.3.5 "On/Off repeatability" measurement (optional if a specification is
available) . 16
5.3.6 Wavelength dependence measurement (optional) . 18
5.3.7 Connector repeatability measurement (optional) . 19
5.4 Calibration uncertainty . 20
5.5 Reporting the results . 21
6 Absolute power calibration . 21
Annex A (normative) Mathematical basis . 22
Annex B (informative) Rejection of outliers . 25
Annex C (informative) Example of a single wavelength calibration . 27
Annex D (informative) ITU wavelength bands . 30
Annex E (informative) Atomic and molecular reference transitions . 31
Annex F (informative) Reference locked laser example . 42
Annex G (informative) Balance between accuracy and calibration time. 44
Bibliography . 46

Figure 1 – Example of a traceability chain. 10
Figure 2 – Wavelength meter measurement using a lock quality monitor signal . 14
Figure 3 – Wavelength meter measurement using a reference wavelength meter . 14
Figure F.1 – Typical measurement arrangement to lock laser to gas absorption line . 43

Table 1 – Typical parameters to calculate the "On/Off repeatability" measurement
duration . 17
Table B.1 – Critical values Z as a function of sample size N . 26
c
Table C.1 – Type A uncertainty contributions for a stability measurement . 27
Table C.2 – Uncertainty contributions for a "On/Off repeatability" measurement . 28

62129-2  IEC:2011 – 3 –
Table C.3 – Uncertainty budget for wavelength dependence . 28
Table C.4 – Uncertainty budget for the wavelength meter calibration . 29
Table D.1 – The ITU-T bands in different units . 30
Table E.1 – Helium-neon laser lines . 32
Table E.2 – Centre vacuum wavelengths for Acetylene C H . 33
2 2
Table E.3 – Frequency and vacuum wavelength values for the v + v and v + v + v +
1 3 1 2 4
v bands of C H . 35
5 2 2
Table E.4 – List of H CN transitions . 38
12 16
Table E.5 – List of C O transitions. 40
Table E.6 – Excited state optogalvanic transitions . 41
Table G.1 – Summary of choices . 45

– 4 – 62129-2  IEC:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CALIBRATION OF WAVELENGTH/OPTICAL FREQUENCY
MEASUREMENT INSTRUMENTS –
Part 2: Michelson interferometer single wavelength meters

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly a
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