prEN IEC 62496-2-6:2026

SLOVENSKI STANDARD
01-februar-2026
Plošče z optičnimi vezji - 2-6. del: Osnovni preskusni in merilni postopki - Analiza
vzorca bližnjega polja mnogorodovnih optičnih valovodov s pravokotnim jedrom
(jedri) z uporabo metodologije obkroženega toka
Optical circuit boards - Part 2-6: Basic test and measurement procedures - Near field
pattern analysis of multimode optical waveguides with rectangular core(s) using
encircled flux methodology
Cartes à circuits optiques - Partie 2-6: Procédures fondamentales d’essais et de
mesures - Analyse de diagrammes de rayonnement en champ proche de guides d’ondes
optiques multimodales à cœurs rectangulaires en utilisant la méthodologie du flux inscrit
Ta slovenski standard je istoveten z: prEN IEC 62496-2-6:2026
ICS:
31.180 Tiskana vezja (TIV) in tiskane Printed circuits and boards
plošče
33.180.01 Sistemi z optičnimi vlakni na Fibre optic systems in
splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

86/669/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62496-2-6 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2026-01-02 2026-03-27
SUPERSEDES DOCUMENTS:
86/659/CD, 86/668/CC
IEC TC 86 : FIBRE OPTICS
SECRETARIAT: SECRETARY:
United States of America Mr Peter Pondillo
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):
SC 86A,SC 86B,SC 86C
ASPECTS CONCERNED:
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
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submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
Optical circuit boards – Part 2-6: Basic test and measurement procedures – Near field pattern
analysis of multimode optical waveguides with rectangular core(s) using encircled flux
methodology
PROPOSED STABILITY DATE: 2029
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
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IEC CDV 62496-2-6 © IEC 2026
1 CONTENTS
2 FOREWORD . 3
3 INTRODUCTION . 5
4 1 Scope . 6
5 2 Normative references . 6
6 3 Terms and definitions . 6
7 4 Abbreviated terms . 7
8 5 Device under test . 7
9 6 Apparatus . 8
10 6.1 Overview. 8
11 6.2 Light source . 8
12 6.3 Micro positioner . 8
13 6.4 NFP optical system . 8
14 6.5 Imaging device . 9
15 6.6 Analyser module . 9
16 7 Safety . 9
17 8 Measurement procedure . 9
18 8.1 Removal of dark current of the imaging device . 9
19 8.2 Near field image acquisition for rectangular waveguide . 9
20 8.2.1 Waveguide end-face alignment . 9
21 8.2.2 NFP image acquisition . 10
22 8.3 Determination of the centre, core region, and ROI . 10
23 8.3.1 Centre determination . 10
24 8.3.2 Core region radius determination . 10
25 8.3.3 ROI (region of interest) centre determination . 10
26 8.3.4 Background noise measurement region determination . 10
27 8.4 Removal of background noise . 10
28 8.5 Computation for analysing NFP (power distribution ratio using EF scale) . 11
29 9 Results . 11
30 9.1 Information available with each measurement . 11
31 9.2 Information available upon request . 12
32 10 Details to be specified . 12
33 Annex A (informative) EF analysis examples of various optical waveguides . 13
34 A.1 General . 13
35 A.2 Sample . 13
36 A.3 Measurement result . 13
37 Annex B (informative) ROI centre determination process . 15
38 B.1 General . 15
39 B.2 NFP outline determination . 15
40 B.3 Geometrical centroid . 15
41 Annex C (informative) Background of the analysis of rectangular mode fields . 16
42 Bibliography . 18
44 Figure 2 – NFP optical system schematic view . 11
45 Figure 3 – Example of the acquired near field image . 12
IEC CDV 62496-2-6 © IEC 2026
46 Figure 4 – Transformation of x-y to polar coordinates on the image sensor plane . 13
47 Figure A.1 – Examples of EF chart . 16
48 Figure C.1 – Conventional circuit board design . 18
49 Figure C.2 – On-board optics design . 18
51 Table A.1 – Measured samples . 15
IEC CDV 62496-2-6 © IEC 2026
56 INTERNATIONAL ELECTROTECHNICAL COMMISSION
57 ____________
59 OPTICAL CIRCUIT BOARDS –
61 Part 2-6: Basic test and measurement procedures – Near field pattern
62 analysis of multimode optical waveguides with rectangular core(s) using
63 encircled flux methodology
65 FOREWORD
66 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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94 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
95 indispensable for the correct application of this publication.
96 9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
97 patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
98 respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
99 may be required to implement this document. However, implementers are cautioned that this may not represent
100 the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
101 shall not be held responsible for identifying any or all such patent rights.
102 IEC 62496-2-6 has been prepared by IEC technical committee 86: FIBRE OPTICS. It is an
103 International Standard.
104 The text of this International Standard is based on the following documents:
Draft Report on voting
86/XX/FDIS 86/XX/RVD
106 Full information on the voting for its approval can be found in the report on voting indicated in
107 the above table.
108 The language used for the development of this International Standard is English.
IEC CDV 62496-2-6 © IEC 2026
109 This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
110 accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
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113 The committee has decided that the contents of this document will remain unchanged until the
114 stability date indicated on the IEC website under webstore.iec.ch in the data related to the
115 specific document. At this date, the document will be
116 • reconfirmed,
117 • withdrawn, or
118 • revised.
IEC CDV 62496-2-6 © IEC 2026
121 INTRODUCTION
122 Bandwidth densities in modern data communication systems are driven by interconnect speeds
123 and scalable input/output (I/O) and will continue to increase over the coming years, thereby
124 severely impacting cost and performance in future data communication systems, bringing
125 increased demands in terms of signal integrity and power consumption.
126 The projected increase in capacity, processing power and bandwidth density in future
127 information communication systems will need to be addressed by the migration of embedded
128 optical interconnects into system enclosures. In particular, this would necessitate the
129 deployment of optical circuit board technologies on some or all key system cards, such as the
130 backplane, motherboard, and peripheral circuit boards.
131 Recently, high bandwidth in-vehicle network systems to support advanced driving assistance
132 and autonomous driving systems are in strong demand in the automotive market, where active
133 human safety and reduction of carbon consumption are the urgent subjects.
134 Considering the electromagnetic environment in automotive, the condition is worst in both
135 conventional internal combustion engine vehicles and modern electrical vehicles; the in-vehicle
136 network is always subjected to the high electromagnetic noise environment.
137 A fibre optic network system is thought of as one of the best solutions for electromagnetic noise,
138 and the specifications of high bandwidth (multi Gbps) optical Ethernet are nearly complet e in
139 the IEEE 802.3 working group.
140 This document specifies the method to measure and analyse the rectangular mode field (near
141 field) based on EF methodology.
IEC CDV 62496-2-6 © IEC 2026
143 OPTICAL CIRCUIT BOARDS –
145 Part 2-6: Basic test and measurement procedures – Near field pattern
146 analysis of multimode optical waveguides with rectangular core(s) using
147 encircled flux methodology
148 1 Scope
149 This document defines the procedure of NFP (near field pattern) analysis of a multimode optical
150 wave
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