EN 61000-4-20:2003

SLOVENSKI SIST EN 61000-4-20:2005

STANDARD
julij 2005
Elektromagnetna združljivost (EMC) – 4-20. del: Preskusne in merilne tehnike –
Preskušanje oddajanja in odpornosti pri prečnih elektromagnetnih (TEM)
valovih (IEC 61000-4-20:2003)
Electromagnetic compatibility (EMC) – Part 4-20: Testing and measurement
techniques – Emission and immunity testing in transverse electromagnetic (TEM)
waveguides (IEC 61000-4-20:2003)
ICS 33.100.10; 33.100.20 Referenčna številka
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

EUROPEAN STANDARD EN 61000-4-20
NORME EUROPÉENNE
EUROPÄISCHE NORM April 2003
ICS 33.100.10; 33.100.20
English version
Electromagnetic compatibility (EMC)
Part 4-20: Testing and measurement techniques –
Emission and immunity testing
in transverse electromagnetic (TEM) waveguides
(IEC 61000-4-20:2003)
Compatibilité électromagnétique (CEM) Elektromagnetische Verträglichkeit (EMV)
Partie 4-20: Techniques d'essai Teil 4-20: Prüf- und Messverfahren -
et de mesure – Messung der Störaussendung
Essais d'émission et d'immunité und Störfestigkeit in transversal-
dans les guides d'onde TEM elektromagnetischen (TEM-) Wellenleitern
(CEI 61000-4-20:2003) (IEC 61000-4-20:2003)

This European Standard was approved by CENELEC on 2003-04-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 61000-4-20:2003 E
Foreword
The text of document CIS/A/419/FDIS, future edition 1 of IEC 61000-4-20, prepared by CISPR SC A,
Radio-interference measurements and statistical methods, in cooperation with SC 77B, High
frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 61000-4-20 on 2003-04-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2004-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2006-04-01

Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annexes A, B, C and ZA are normative and annexes D and E are informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61000-4-20:2003 was approved by CENELEC as a
European Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
CISPR 14 NOTE Harmonized in EN 55014 series (not modified).
CISPR 20 NOTE Harmonized as EN 55020:2002 (not modified).
IEC 61000-2-9 NOTE Harmonized as EN 61000-2-9:1996 (not modified).
__________
- 3 - EN 61000-4-20:2003
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1)
-
IEC 60050-161 International Electrotechnical - -
Vocabulary (IEV)
Chapter 161: Electromagnetic
compatibility
2)
- 1)
IEC 60068-1 Environmental testing EN 60068-1 1994
Part 1: General and guidance
- 1)
IEC 61000-2-11 Electromagnetic compatibility (EMC) - -
Part 2-11: Environment - Classification
of HEMP environments
- 1) 2)
IEC 61000-4-3 Part 4-3: Testing and measurement EN 61000-4-3 2002
techniques - Radiated, radio-
frequency, electromagnetic field
immunity test
- 1) 2)
IEC 61000-4-23 Part 4-23: Testing and measurement EN 61000-4-23 2000
techniques - Test methods for
protective devices for HEMP and other
radiated disturbances
- 1)
IEC/TR 61000-4-32 Electromagnetic compatibility (EMC) - - -
Part 4-32: Testing and measurement
techniques - HEMP simulator
compendium
- 1)
IEC/TR 61000-5-3 Part 5: Installation and mitigation - -
guidelines -- Section 3: HEMP
protection concepts
1)
Undated reference.
2)
Valid edition at date of issue.

Publication Year Title EN/HD Year
- 1)
CISPR 16-1 Specification for radio disturbance and - -
immunity measuring apparatus and
methods
Part 1: Radio disturbance and
immunity measuring apparatus
- 1)
CISPR 16-2 Part 2: Methods of measurement of - -
disturbances and immunity
- 1) 2)
CISPR 22 (mod) Information technology equipment - EN 55022 1998
Radio disturbance characteristics -
Limits and methods of measurement

INTERNATIONAL IEC
STANDARD
61000-4-20
First edition
2003-01
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-20:
Testing and measurement techniques –
Emission and immunity testing in transverse
electromagnetic (TEM) waveguides
 IEC 2003 Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical,
including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch  Web: www.iec.ch
PRICE CODE
XB
Commission Electrotechnique Internationale
International Electrotechnical Commission
Международная Электротехническая Комиссия
For price, see current catalogue

61000-4-20  IEC:2003 – 3 –
CONTENTS
FOREWORD . 7
INTRODUCTION .11
1 Scope and object .13
2 Normative references.13
3 Definitions and abbreviations.15
3.1 Definitions .15
3.2 Abbreviations.21
4 General .21
5 TEM waveguide requirements.23
5.1 General requirements for the use of TEM waveguides .23
5.2 Special requirements for certain types of TEM waveguides.27
5.3 Measurement uncertainty considerations .29
6 Overview of EUT Types .29
6.1 Small EUT .29
6.2 Large EUT .29
Annex A (normative) Emission testing in TEM waveguides .31
Annex B (normative) Immunity testing in TEM waveguides .75
Annex C (normative) HEMP transient testing in TEM waveguides.91
Annex D (informative) TEM waveguide characterization .107
Annex E (informative) Standards including TEM waveguides.121
Bibliography.125
Figure A.1 – Routing the exit cable to the corner at the ortho-angle and the lower edge
of the test volume.55
Figure A.2 – Basic ortho-axis positioner or manipulator.57
Figure A.3 – Three orthogonal axis-rotation positions for emission measurements .59
Figure A.4 – Canonical 12-face/axis orientations for a typical EUT.61
Figure A.5 – Open-area test site geometry .63
Figure A.6 – Two-port TEM cell (symmetric septum) .65
Figure A.7 – One-port TEM cell (asymmetric septum).67
Figure A.8 – Stripline (two plates) .71
Figure A.9 – Stripline (four plates, balanced feeding) .73
Figure B.1 – Example of test set-up for single-polarization TEM waveguides.87
Figure B.2 – Uniform area calibration points in TEM waveguide .89
Figure C.1 – Frequency domain spectral magnitude between 100 kHz and 300 MHz.105

61000-4-20  IEC:2003 – 5 –
Figure D.1 – Simplest waveguide (no TEM wave!).119
Figure D.2 – Waveguides for TEM propagation .119
Figure D.3 – Polarization vector .119
Figure D.4 – Transmission line model for TEM propagation.119
Figure D.5 – One- and two-port TEM waveguides.119
Table B.1 – Uniform area calibration points.79
Table B.2 – Test levels.81
Table C.1 – Radiated immunity test levels defined in the present standard.105

61000-4-20  IEC:2003 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-20: Testing and measurement techniques –
Emission and immunity testing in
transverse electromagnetic (TEM) waveguides
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one o
...