EN 62435-2:2017

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.SUHYRGQLãNLKComposants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 2 - Mécanismes de détérioration (IEC 62435-2:2017)Electronic components - Long-term storage of electronic semiconductor devices - Part 2 - Deterioration Mechanisms (IEC 62435-2:2017)31.080.01Polprevodniški elementi (naprave) na splošnoSemiconductor devices in generalICS:Ta slovenski standard je istoveten z:EN 62435-2:2017SIST EN 62435-2:2017en01-junij-2017SIST EN 62435-2:2017SLOVENSKI
STANDARD
EUROPEAN STANDARD NORME EUROPÉENNE EUROPÄISCHE NORM
EN 62435-2
April 2017 ICS 31.020
English Version
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017)
Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs -
Partie 2: Mécanismes de détérioration (IEC 62435-2:2017)
Elektronische Bauteile - Langzeitlagerung elektronischer Halbleiterbauelemente - Teil 2: Schädigungsmechanismen (IEC 62435-2:2017) This European Standard was approved by CENELEC on 2017-02-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17,
B-1000 Brussels © 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62435-2:2017 E SIST EN 62435-2:2017

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62435-2:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60068-2-17:1994 NOTE Harmonized as EN 60068-2-17:1994 (not modified). IEC 60068-2-20:2008 NOTE Harmonized as EN 60068-2-20:2008 (not modified). IEC 60721-3-1 NOTE Harmonized as EN 60721-3-1. IEC 60721-3-3 NOTE Harmonized as EN 60721-3-3. IEC 60749-21 NOTE Harmonized as EN 60749-21. IEC 61340-5-1:2007 NOTE Harmonized as EN 61340-5-1:2007 (not modified). IEC/TR 61340-5-2:2007 NOTE Harmonized as CLC/TR 61340-5-2:2008 (not modified). IEC 61760-4 NOTE Harmonized as EN 61760-4. IEC/TR 62258-3 NOTE Harmonized as CLC/TR 62258-3. IEC 62435-1 NOTE Harmonized as EN 62435-1. IEC 62435-4 1) NOTE Harmonized as EN 62435-4 1). IEC 62435-5 NOTE Harmonized as EN 62435-5.
1) At draft stage. SIST EN 62435-2:2017

Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu.
Publication Year Title EN/HD Year IEC 60749-20-1 -
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat EN 60749-20-1 -
IEC 62435-2 Edition 1.0 2017-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Electronic components – Long-term storage of electronic semiconductor devices –
Part 2: Deterioration mechanisms
Composants électroniques – Stockage de longue durée des dispositifs électroniques à semiconducteurs –
Partie 2: Mécanismes de détérioration
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE
ICS 31.020
ISBN 978-2-8322-3836-3
– 2 – IEC 62435-2:2017 © IEC 2017
CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope . 7 2 Normative references . 7 3 Terms, definitions and abbreviated terms . 7 3.1 Terms and definitions . 7 3.2 Abbreviated terms . 8 4 Principles of deterioration . 8 4.1 General . 8 4.2 Solderability and oxidisation of lead finishes . 8 4.3 Popcorning . 8 4.4 Delamination . 8 4.5 Corrosion and tarnishing . 8 4.6 Electrical effects . 9 4.7 High-energy ionizing radiation damage . 9 4.8 Storage temperature risks to semiconductor devices . 9 4.9 Noble metal finishes . 9 4.10 Matte tin and other finishes . 9 4.11 Solder ball and solder bump . 9 4.12 Devices containing programmable memory – flash, programmable logic and other devices containing non-volatile memory cells . 10 5 Technical validation of the components . 10 5.1 Purpose . 10 5.2 Test selection criteria . 10 5.3 Measurements and tests . 11 5.3.1 Assessment of the supplied batch reliability . 11 5.3.2 List of test methods . 11 5.4 Periodic assessment . 12 Annex A (normative)
Failure mechanisms – Encapsulated and non-encapsulated active components . 14 Bibliography . 17
Table 1 – List of tests . 11 Table A.1 – Failure mechanisms: encapsulated and non-encapsulated active components . 14
IEC 62435-2:2017 © IEC 2017 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________
ELECTRONIC COMPONENTS – LONG-TERM STORAGE
OF ELECTRONIC SEMICONDUCTOR DEVICES –
Part 2: Deterioration mechanisms
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62435-2 has been prepared by IEC technical committee 47: Semiconductor devices. The text of this standard is based on the following documents: FDIS Report on voting 47/2327/FDIS 47/2350/RVD
Full information on the voting for the approval of this International Standard can be found in the report on voting indicated in the above table. This document has been drafted in accordance with the ISO/IEC Directives, Part 2. SIST EN 62435-2:2017

– 4 – IEC 62435-2:2017 © IEC 2017
A list of all parts in the IEC 62435 series, published under the general title Electronic components – Long-term storage of electronic semiconductor devices, can be found on the IEC website. The committee has decided that the contents of this document will remain unchanged until the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to the specific document. At this date, the document will be
• reconfirmed, • withdrawn, • replaced by a revised edition, or • amended.
IEC 62435-2:2017 © IEC 2017 – 5 –
INTRODUCTION This document applies to the long-term storage of electronic components. This is a document for long-term storage (LTS) of electronic devices d
...