prEN IEC 61340-4-7:2022

SLOVENSKI STANDARD
01-junij-2022
Elektrostatika - 4-7. del: Standardne preskusne metode za posebno uporabo -
Ionizacija
Electrostatics - Part 4-7: Standard test methods for specific applications - Ionization
Elektrostatik - Teil 4-7: Standard-Prüfverfahren für spezielle Anwendungen – Ionisation
Electrostatique - Partie 4-7: Méthodes d'essai normalisées pour des applications
spécifiques - Ionisation
Ta slovenski standard je istoveten z: prEN IEC 61340-4-7:2022
ICS:
17.220.99 Drugi standardi v zvezi z Other standards related to
elektriko in magnetizmom electricity and magnetism
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

101/650/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61340-4-7 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2022-04-08 2022-07-01
SUPERSEDES DOCUMENTS:
101/629/CD, 101/635A/CC
IEC TC 101 : ELECTROSTATICS
SECRETARIAT: SECRETARY:
Germany Mr Hartmut Berndt
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:

Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY

SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they
are aware and to provide supporting documentation.

TITLE:
Electrostatics - Part 4-7: Standard test methods for specific applications - Ionization

PROPOSED STABILITY DATE: 2027
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.

IEC 61340-4-7/Ed3/CDV  IEC (E) – 2 – 101/650/CDV
1 CONTENTS
2 FOREWORD . 4
3 INTRODUCTION . 6
4 1 Scope . 7
5 2 Normative references . 7
6 3 Terms and definitions . 7
7 4 Test fixture and instrumentation . 9
8 5 Specific requirements for equipment categories . 11
9 5.1 Specific requirements for all ionization equipment . 11
10 5.2 Room ionization . 12
11 5.3 Laminar flow hood ionization . 14
12 5.4 Work surface ionization . 16
13 5.5 Compressed gas ionizers – Guns and nozzles . 19
14 Annex A (informative) Theoretical background and additional information on the
15 standard test method for the performance of ionizers . 21
16 A.1 Introductory remarks . 21
17 A.2 Air ions . 21
18 A.3 Mobility and ion current . 21
19 A.4 Neutralization current . 21
20 A.5 Neutralization rate . 22
21 A.6 Ion depletion and field suppression . 22
22 A.7 Charged plate monitor and charge neutralization . 22
23 A.8 Relationship between charged plate monitor decay time and actual object . 23
24 A.9 Offset voltage . 23
25 A.10 Preparation of test area . 23
26 A.11 Ion transport in airflow . 24
27 A.12 Obstruction of airflow around the charged plate monitor . 24
28 A.13 Effect of “air blanket” . 24
29 A.14 Sources of measurement error . 25
30 A.14.1 Typical decay time variability . 25
31 A.14.2 Plate isolation . 25
32 A.14.3 Charging voltage . 25
33 A.14.4 Materials near the plate . 25
34 A.14.5 Other field-producing devices in test area . 25
35 A.14.6 Effect of offset voltage on decay time . 25
36 A.15 Importance of ionization equipment maintenance . 26
37 Annex B (normative) Method of measuring the capacitance of an isolated conductive
38 plate . 27
39 B.1 Method . 27
40 B.2 Equipment . 27
41 B.3 Procedure . 27
42 B.4 Example. 28
43 B.5 Sources of error . 28
44 B.5.1 Measuring equipment . 28
45 B.5.2 Poor plate isolation . 29
46 B.5.3 Objects in the environment . 29
47 B.5.4 Stray capacitance . 29

IEC 61340-4-7/Ed3/CDV  IEC (E) – 3 – 101/650/CDV
48 Annex C (informative) Safety considerations . 30
49 C.1 General . 30
50 C.2 Electrical . 30
51 C.3 Ozone . 30
52 C.4 Radioactive . 30
53 C.5 X-ray . 30
54 C.6 Installation . 30
55 Bibliography . 30
57 Figure 1 – Charged plate monitor components for non-contacting plate measurement . 10
58 Figure 2 – Charged plate monitor components for contacting plate measurement . 10
59 Figure 3 – Conductive plate detail for the non-contacting CPM . 11
60 Figure 4 – Conductive plate detail for the voltage follower CPM . 11
61 Figure 5 – Test locations for room ionization – AC grids and DC bar systems . 13
62 Figure 6 – Test locations for room ionization – Single polarity emitter systems . 13
63 Figure 7 – Test locations for room ionization – Dual DC line systems . 14
64 Figure 8 – Test locations for room ionization – Pulsed DC emitter systems . 14
65 Figure 9 – Test locations for vertical laminar flow hood – Top view . 15
66 Figure 10 – Test locations for vertical laminar flow hood – Side view . 15
67 Figure 11 – Test locations for horizontal laminar flow hood – Top view . 16
68 Figure 12 – Test locations for horizontal laminar flow hood – Side view . 16
69 Figure 13 – Test locations for benchtop ionizer – Top view . 17
70 Figure 14 – Test locations for benchtop ionizer – Side view . 18
71 Figure 15 – Test locations for overhead ionizer – Top view . 18
72 Figure 16 – Test locations for overhead ionizer – Side view . 19
73 Figure 17 – Test locations for compressed gas ionizer (gun or nozzle) – Side view . 20
75 Table 1 – Test set-ups and test locations/points (TP) . 12
76 Table B.1 – Example measurement data . 28
IEC 61340-4-7/Ed3/CDV  IEC (E) – 4 – 101/650/CDV
79 INTERNATIONAL ELECTROTECHNICAL COMMISSION
80 ____________
82 ELECTROSTATICS –
84 Part 4-7: Standard test methods for specific applications –
85 Ionization
88 FOREWORD
89 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
90 all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
91 co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
92 in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
93 Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
94 preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
95 may participate in this preparatory work. International, governmental and non-governmental organizations liaising
96 with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
97 Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
98 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
99 consensus of opinion on the relevant subjects since each technical committee has representation from all
100 interested IEC National Committees.
101 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
102 Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
103 Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
104 misinterpretation by any end user.
105 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
106 transparently to the maximum extent possible in their national and regional publications. Any divergence between
107 any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
108 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
109 assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
110 services carried out by independent certification bodies.
111 6) All users should ensure that they have the latest edition of this publication.
112 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
113 members of its technical committees and IEC National Committees for any personal injury, property damage or
114 other damage of any nature whatsoever, whether direct or indirect, or f
...