EN 61747-5:1998

SLOVENSKI STANDARD
01-september-2002
Liquid crystal and solid-state display devices - Part 5: Environmental, endurance
and mechanical test methods (IEC 61747-5:1998)
Liquid crystal and solid-state display devices -- Part 5: Environmental, endurance and
mechanical test methods
Flüssigkristall- und Halbleiter-Anzeige-Bauelemente -- Teil 5: Umwelt-, Lebensdauer-
und mechanische Prüfverfahren
Dispositifs d'affichage à cristaux liquides et à semiconducteurs -- Partie 5: Méthodes
d'essais d'environnement, d'endurance et mécaniques
Ta slovenski standard je istoveten z: EN 61747-5:1998
ICS:
31.120 Elektronske prikazovalne Electronic display devices
naprave
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

NORME
CEI
INTERNATIONALE
IEC
61747-5
INTERNATIONAL
Première édition
STANDARD
First edition
1998-06
Dispositifs d’affichage à cristaux liquides
et à semiconducteurs –
Partie 5:
Méthodes d’essais d’environnement,
d’endurance et mécaniques
Liquid crystal and solid-state display devices –
Part 5:
Environmental, endurance and mechanical
test methods
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61747-5 © IEC:1998 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 General. 7
1.1 Scope and object. 7
1.2 Normative references. 7
1.3 Terms, definitions and letter symbols . 9
1.4 Standard atmospheric conditions . 9
1.5 Visual examination and verification of dimensions . 13
1.6 Electrical and optical measurements. 13
1.7 Electrical operating conditions. 15
2 Mechanical test methods . 15
2.1 Robustness of terminations. 15
2.2 Soldering. 17
2.3 Vibration (sinusoidal). 17
2.4 Shock. 21
2.5 Acceleration, steady state . 23
2.6 Bond strength test . 23
3 Environmental and endurance test methods. 27
3.1 Change of temperature . 27
3.2 Storage (at high temperature) . 33
3.3 Storage (at low temperature). 35
3.4 Low air pressure. 35
3.5 Damp heat, steady state. 35
3.6 Damp heat, cyclic (12+12-hour cycle) . 37
3.7 Composite temperature/humidity cyclic test . 37
3.8 Light exposure. 47
3.9 ESD Test. 47
4 Miscellaneous test methods . 47
4.1 Permanence of marking . 47
4.2 Scratch test (of face plate) . 49
4.3 Life test. 49
5 Visual inspection of monochrome matrix liquid crystal display modules
(Excluding all active matrix liquid crystal display modules) . 49
5.1 General. 49
5.2 Visual inspection of displays. 49
6 Visual inspection of monochrome liquid crystal display cells
(Excluding all active matrix liquid crystal display modules) . 59
6.1 General. 59
6.2 Visual inspection of displays. 59
6.3 Seal inspections (see figure 13) . 65
6.4 Visual inspection of contact pad area (see figure 14) . 67
6.5 Visual inspection for chipped material at the borders and edges of the support
plates of cells . 71
Annex A – Cross references index . 73

61747-5 © IEC:1998 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
_________
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES –
Part 5: Environmental, endurance and mechanical test methods
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61747-5 has been prepared by subcommittee 47C: Optoelectronic,
display and imaging devices, of IEC technical committee 47: Semiconductor devices.
The text of this standard is based on a part of amendments 1 and 2 to IEC 60747-5 and the
following documents:
FDIS Report on voting
47C/203/FDIS 47C/211/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
Annex A is for information only.

61747-5 © IEC:1998 – 7 –
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES –
Part 5: Environmental, endurance and mechanical test methods
1 General
1.1 Scope and object
This part of IEC 61747 lists test methods applicable to liquid crystal display devices. It takes
into account, wherever possible, the environmental test methods outlined in IEC 60068.
It also includes visual inspection for both liquid crystal display cells and modules.
NOTE 1 – This standard is established separately from IEC 60749, because the technology of liquid crystal display
devices is completely different from that of semiconductor devices in such matters as
– shape and size;
– used materials and structure;
– function;
– measuring methods;
– operation principles.
NOTE 2 – Devices include cells and modules.
The object of this standard is to establish uniform preferred test methods with preferred values
for stress levels for judging the environmental properties of liquid crystal display devices.
In case of contradiction between this standard and a relevant specification, the latter shall
govern.
1.2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 61747. At the time of publication, the editions indicated
were valid. All normative documents are subject to revision, and parties to agreements based
on this part of IEC 61747 are encouraged to investigate the possibility of applying the most
recent editions of the normative documents indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
IEC 60068, Environmental testing
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-1:1990, Environmental testing – Part 2: Tests – Test A: Cold
IEC 60068-2-2:1974, Environmental testing – Part 2: Tests – Test B: Dry heat
IEC 60068-2-3:1969, Environmental testing – Part 2: Tests – Test Ca: Damp heat, steady state
IEC 60068-2-5:1975, Environmental testing – Part 2: Tests – Test Sa: Simulated solar radiation
at ground level
61747-5 © IEC:1998 – 9 –
IEC 60068-2-6:1995, Environmental testing – Part 2: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-7:1983, Environmental testing – Part 2: Tests – Test Ga: Acceleration, steady state
IEC 60068-2-13:1983, Environmental testing – Part 2: Tests – Test M: Low air pressure
IEC 60068-2-14:1984, Environmental testing – Part 2: Tests – Test N: Change of temperature
IEC 60068-2-20:1979, Environmental testing – Part 2: Tests – Test T: Soldering
IEC 60068-2-21:1983, Environmental testing – Part 2: Tests – Test U: Robustness of
terminations and integral mounting devices
IEC 60068-2-27:1987, Environmental testing – Part 2: Tests – Test Ea and guidance: Shock
IEC 60068-2-30:1980, Environmental testing – Part 2: Tests – Test Db and guidance: Damp
heat, cyclic (12 + 12-hour cycle)
IEC 60068-2-38:1974, Environmental testing – Part 2: Tests – Test Z/AD: Composite
temperature/humidity cyclic test
IEC 60068-2-45:1980, Environmental testing – Part 2: Tests – Test XA and guidance:
Immersion in cleaning solvents
IEC 60747, Semiconductor devices
IEC 60747-1:1983, Semiconductor devices – Discrete devices – Part 1 – General
Amendment 1 (1991)
Amendment 2 (1993)
Amendment 3 (1996)
IEC 60747-5:1984, Semiconductor devices – Part 5: Optoelctronic devices
Amendment 1 (1994)
Amendment 2 (1995)
IEC 60748-1:1984, Semiconductor devices – Integrated circuits – Part 1: General
IEC 60749:1996, Semiconductor devices – Mechanical and climatic test methods
IEC 61747:1998, Liquid crystal and solid-state display devices
1.3 Terms, definitions and letter symbols
For the purpose of this standard, the definitions and letter symbols of IEC 60068, IEC 60747,
IEC 60748 and IEC 61747-1 apply.
1.4 Standard atmospheric conditions
The atmospheric conditions specified in IEC 60068-1 apply.
1.4.1 Standard reference atmosphere
Temperature: 25 °C
Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar)

61747-5 © IEC:1998 – 11 –
1.4.2 Standard atmosphere for referee measurements and tests
If the
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