EN 62670-3:2017

SLOVENSKI STANDARD
01-julij-2017
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Photovoltaic concentrators (CPV) - Performance testing - Part 3: Performance
measurements and power rating
Ta slovenski standard je istoveten z: EN 62670-3:2017
ICS:
27.160 6RQþQDHQHUJLMD Solar energy engineering
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 62670-3
NORME EUROPÉENNE
EUROPÄISCHE NORM
May 2017
ICS 27.160
English Version
Photovoltaic concentrators (CPV) - Performance testing - Part 3:
Performance measurements and power rating
(IEC 62670-3:2017)
Concentrateurs photovoltaïques (CPV) - Essai de Konzentrator-Photovoltaik (CPV) - Leistungsmessung - Teil
performances - Partie 3: Mesurages de performances et 3: Leistungsmessungen und Leistungsbemessung
rapport de puissance (IEC 62670-3:2017)
(IEC 62670-3:2017)
This European Standard was approved by CENELEC on 2017-03-14. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62670-3:2017 E
European foreword
The text of document 82/1204/FDIS, future edition 1 of IEC 62670-3, prepared by IEC/TC 82 “Solar
photovoltaic energy systems" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 62670-3:2017.
The following dates are fixed:
(dop) 2017-12-14
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2020-03-14
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62670-3:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standards indicated:
IEC 60904-5 NOTE Harmonized as EN 60904-5.

Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60891 -  Photovoltaic devices - Procedures for EN 60891 -
temperature and irradiance corrections to
measured I-V characteristics
IEC 60904-2 -  Photovoltaic devices - Part 2: EN 60904-2 -
Requirements for photovoltaic reference
devices
IEC 60904-3 -  Photovoltaic devices - Part 3: EN 60904-3 -
Measurement principles for terrestrial
photovoltaic (PV) solar devices with
reference spectral irradiance data
IEC 60904-4 2009 Photovoltaic devices - Part 4: Reference EN 60904-4 2009
solar devices - Procedures for establishing
calibration traceability
IEC 60904-10 -  Photovoltaic devices - Part 10: Methods of EN 60904-10 -
linearity measurement
IEC 62670-1 -  Photovoltaic concentrators (CPV) - EN 62670-1 -
Performance testing - Part 1: Standard
conditions
IEC 62817 2014 Solar trackers for photovoltaic systems - EN 62817 2015
Design qualification
ISO 2859-1 -  Sampling procedures for inspection by - -
attributes - Part 1: Sampling schemes
indexed by acceptance quality limit (AQL)
for lot-by-lot inspection
ISO 9060 1990 Solar energy; specification and - -
classification of instruments for measuring
hemispherical solar and direct solar
radiation
ISO/IEC 17025 -  General requirements for the competence EN ISO/IEC 17025 -
of testing and calibration laboratories

IEC 62670-3 ®
Edition 1.0 2017-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Photovoltaic concentrators (CPV) – Performance testing –

Part 3: Performance measurements and power rating

Concentrateurs photovoltaïques (CPV) – Essai de performances –

Partie 3: Mesurages de performances et rapport de puissance

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 27.160 ISBN 978-2-8322-3859-2

– 2 – IEC 62670-3:2017 © IEC 2017
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Concepts . 7
4 Sampling . 11
5 DUT marking and information . 11
5.1 Indelible marking . 11
5.2 Preliminary information indicated by manufacturer . 11
6 Testing . 11
7 Report . 12
8 Standard apparatus requirements . 13
8.1 Irradiance measurement equipment . 13
8.1.1 Normal incidence pyrheliometer (NIP) . 13
8.1.2 Global normal irradiance pyranometer . 13
8.1.3 Spectral measurement device . 13
8.1.4 Component reference cells . 14
8.1.5 Indoor reference irradiance sensor . 14
8.1.6 Auxiliary irradiance sensor . 15
8.2 Solar simulator . 15
8.2.1 General requirements . 15
8.2.2 Continuous light simulator . 15
8.2.3 Single-flash pulse simulator . 16
8.2.4 Multi-flash pulse simulator . 16
8.3 Solar tracker or DUT mounting system . 16
8.3.1 General . 16
8.3.2 Pointing error sensor . 16
8.4 Temperature measurement and control . 16
8.4.1 DUT temperature sensor . 16
8.4.2 Ambient temperature sensor . 16
8.4.3 Lens or optics temperature sensor . 16
8.4.4 Temperature control system . 17
8.5 Current-voltage measurement . 17
8.6 Anemometer . 17
8.7 Electrical load . 17
9 Test procedures . 18
9.1 Measurement of DUT temperature coefficients . 18
9.1.1 Purpose . 18
9.1.2 Apparatus . 18
9.1.3 Data collection procedure and data requirements . 18
9.1.4 Temperature coefficient determination . 21
9.2 DUT reference V at (900 W/m and 25 °C cell temperature) . 22
oc
9.2.1 General . 22
9.2.2 Reference V dark I-V procedure . 22
oc
9.2.3 Reference V using a solar simulator . 23
oc
9.3 Calculating the average DUT cell temperature . 23
9.3.1 Purpose . 23

IEC 62670-3:2017 © IEC 2017 – 3 –
9.3.2 Procedure . 24
9.4 Reference irradiance sensor calibration and reference I determination . 24
sc
9.4.1 Purpose . 24
9.4.2 Data requirements . 24
9.4.3 Determination of the calibrated and reference I , (I and I ) . 24
sc sc, cal scr
9.4.4 Calibration requirement . 26
9.5 Indoor I-V measurements of a CPV DUT . 26
9.5.1 Purpose . 26
9.5.2 General measurement requirements . 26
9.5.3 DUT indoor alignment procedure . 28
9.5.4 Procedure for single-flash pulsed solar simulators . 28
9.5.5 Procedure for multi-flash pulsed solar simulators . 28
9.6 Outdoor I-V measurements of a CPV DUT . 28
9.6.1 Purpose . 28
9.6.2 Apparatus . 28
9.6.3 Procedure . 29
9.6.4 Report . 29
9.7 CSOC and CSTC power ratings . 30
9.7.1 Data filtering requirements for CSOC or CSTC translation . 30
9.7.2 CSOC power determination . 31
9.7.3 CSTC power determination . 31
9.8 DUT alignment procedure and measurement of misalignment sensitivity . 32
9.8.1 Purpose . 32
9.8.2 Apparatus . 32
9.8.3 Recommendations for initial DUT mounting . 33
9.8.4 General requirements . 33
9.8.5 Individual off-axis sweeps and final DUT alignment . 33
9.8.6 Alternate ellipse plot procedure for reporting misalignment sensitivity . 34
9.8.7 Reporting . 34
9.9 Mounting and aligning the pointing error sensor and other alignment
sensitive equipment . 35
9.9.1 Purpose . 35
9.9.2 Procedure . 35
9.10 Outdoor lens temperature performance test . 35
9.10.1 General guidance . 35
9.10.2 Procedure . 36
9.10.3 Reporting . 37
9.11 Indoor lens temperature performance test . 38
9.11.1 General guidance . 38
9.11.2 Procedure . 38
9.11.3 Reporting . 39
Bibliography . 40

Figure 1 – Collimating tube geometry . 9
Figure 2 – Solar tracker pointing error . 10
Figure 3 – Example of acceptance angle data for a CPV DUT . 10
Figure 4 – Flow chart of performance testing for the DUT . 12
Figure 5 – V data after an uncover event . 20
oc
– 4 – IEC 62670-3:2017 © IEC 2017
Figure 6 – Figure 5 repeated after removing one data point . 21
Figure 7 – The derivative of dark I-V data plotted to determine R . 23
s
Figure 8 – Iterative approach to determine I and V . 26
sc oc
Figure 9 – Raw data for extracting the impact of lens temperature . 37
Figure 10 – Filtered data for extracting impact of lens temperature . 37

Table 1 – SMR requirements for indoor measurements . 27

IEC 62670-3:2017 © IEC 2017 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PHOTOVOLTAIC CONCENTRATORS (CPV) –
PERFORMANCE TESTING –
Part 3: Performance measurements and power rating

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62670-3 has been prepared by IEC technical committee 82: Solar
photovoltaic energy systems.
The text of this standard is based on the following documents:
FDIS Report on voting
82/1204/FDIS 82/1233/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 62670 series, published under the general title Photovoltaic
concentrators (CPV) – Performance testing, can be found on the IEC website.

– 6 – IEC 62670-3:2017 © IEC 2017
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
IEC 62670-3:2017 © IEC 2017 – 7 –
PHOTOVOLTAIC CONCENTRATORS (CPV) –
PERFORMANCE TESTING –
Part 3: Performance measurements and power rating

1 Scope
This part of IEC 62670 defines measurement procedures and instrumentation for determining
concentrator photovoltaic performance at concentrator standard operating conditions (CSOC)
and concentrator standard test conditions (CSTC), defined in IEC 62670-1, including power
ratings.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60891, Photovoltaic devices – Procedures for temperature and irradiance corrections to
measured I-V characteristics
IEC 60904-2, Photovoltaic devices – Part 2: Requirements for photovoltaic reference devices
IEC 60904-3, Photovoltaic devices – Part 3: Measurement principles for terrestrial
photovoltaic (PV) solar devices with reference spectral irradiance data
IEC 60904-4:2009, Photovoltaic devices – Part 4: Reference solar devices – Procedures for
establishing calibration traceability
IEC 60904-10, Photovoltaic devices – Part 10 Methods of linearity measurement
IEC 62670-1, Photovoltaic concentrators (CPV) – Performance testing – Part 1: Standard
conditions
IEC 62817:2014, Photovoltaic systems – Design qualification of solar trackers
ISO/IEC 17025, General requirements for the competence of testing and calibration
laboratories
ISO 2859-1, Sampling procedures for inspection by attributes – Part 1:Sampling schemes
indexed by acceptance quality limit (AQL) for lot-by-lot inspection
ISO 9060:1990, Solar energy – Specification and classification of instruments for measuring
hemispherical solar and direct solar radiation
3 Concepts
The following concepts are used through this document.

– 8 – IEC 62670-3:2017 © IEC 2017
a) CSOC – concentrator standard operating conditions per IEC 62670-1 (direct normal
irradiance (DNI) 900 W/m , 20 °C ambient temperature, 2 m/s wind speed, AM1.5D
spectrum per IEC 60904-3).
b) CSTC – concentrator standard test conditions per IEC 62670-1 (DNI 1 000 W/m , 25 °C
cell temperature, AM1.5D spectrum per IEC 60904-3).
I I
i j
c) SMR – spectral matching ratio, where I and I are the short-circuit
SMR(i, j)=
i j
I I
i,ref j,ref
current or short-circuit current densities under prevailing spectral conditions per the i and j
distinct subcells in the multi-junction solar cell. I and I are the associated short-
i,ref j,ref
circuit currents/current densities under the AM 1.5 direct spectrum as defined by
IEC 60904-3. The subcell is assigned a number in the ordering of their band gap energy
(Eg) starting with 1 for the highest Eg and up to n for the lowest Eg. In this manner a multi-
junction solar cell with n distinct sub cells has (n²–n)/2 unique SMR values. For example,
for n = 3 (three-junction device) there is SMR(1,2), SMR(1,3) and SMR(2,3). For a lattice
matched triple junction cell: GaInP is junction 1, GaInAs is junction 2, and Ge is junction 3.
SMR as applied to outdoor I-V curves does NOT imply that the outputs from subcells will
match the DUT but to a more generic set of subcells used by the test laboratory to
characterize deviations in the prevailing outdoor spectrum from the reference AM1.5D
spectrum. A specific DUT match is not required as precipitable water vapor, aerosols, and
airmass are the dominant variables which drive changes in the outdoor spectrum. It has
been shown that filtering based on measurements in three sub-bands of the spectrum is
sufficient to minimize CPV DUT performance variation. Component reference cells (8.1.4)
can be used to determine SMR values or the SMR can be calculated under the prevailing
spectrum. In this case I , I and I are generally defined as the direct normal spectral
1 2 3
irradiance in sub-bands from 370 nm to 650 nm, 650 nm to 870 nm and 870 nm to
1 650 nm respectively. This is equivalent to assuming a set of component reference cells
which have external quantum efficiencies (EQE) of 100 % in the defined bands.
SMR as applied to indoor I-V curves DOES refer to outputs from the subcells that match
the DUT. The indoor measurements specifically refer to matching subcells as the spectrum
under simulated sunlight is known to deviate from the characteristic shape of the outdoor
spectrum. Therefore three sub-bands are not always sufficient to minimize variation in
CPV DUT performance. SMR can be determined from device specific component
reference cells or can be calculated from the measured spectrum and the spectral
responses of device specific component reference cells.
d) Separate SMR crossing – event in outdoor data measurements where the given SMR
value is within the defined boundaries around unity and the event is separated by at least
an hour from other events where the SMR value is within the defined boundaries around
unity.
e) MPP – global maximum power point of an I-V curve.
f) V – the voltage at MPP.
mp
g) I – the current at MPP.
mp
h) DNI– direct normal irradiance.
i) GNI– global normal irradiance.
j) η – efficiency of the DUT at MPP for an individual I-V curve.
k) DUT – device under test.
l) Aperture – aperture area of the DUT, measured from inside edge to inside edge of the
DUT frame. If no clear transition from lens to frame is present an opaque tape can be
used to mask off the edge of lens area and define the edge of the aperture area. This shall
be completed prior to the collection of I-V curves. If this method is not applicable to the
DUT, alternate methods can be considered. The test report shall document the procedure
used for determining aperture area.
m) Opening half-angle – half-angle of a device with a collimating tube defined as the
arctan(R/L) per Figure 1.
n) Field of view or opening full-angle– two times the opening half angle.

IEC 62670-3:2017 © IEC 2017 – 9 –
o) Slope angle – angle of a device with a collimating tube defined as the arctan[(R–r)/L] per
Figure 1.
p) Limit angle – angle of a device with a collimating tube defined as the arctan[(R+r)/L] per
Figure 1.
q) Primary and secondary axis pointing error – measured angle between the pointing vector
of the tracker and the pointing vector of the sun (see Figure 2) [adapted from
IEC 62817:2014, 7.2]. Typically the pointing vector of the tracker is defined by the sensor
that is used for measuring pointing error. The sensor has a plane which is responsive to
the direct beam from the sun. Therefore the normal vector to this measurement plane is
representative of the pointing vector of the tracker or the pointing vector of the DUT.
Although pointing error as defined is a single angular deviation, the sensor measures this
error in two separate angles in relation to reference plane
2 2
pointing error= primary axis pointing error + secondary axis pointing error
In this document, primary and secondary axis pointing error are defined by the above
equation. As it is also assumed that the plane of the DUT is aligned with the pointing error
sensor, the primary and secondary axes are also representative for the DUT.
r) Acceptance angle – minimum full angle through which the DUT can be rotated (with
respect to the sun) while continuing to produce 90 % of its DNI normalized maximum
power. Although a two dimensional plot is necessary to fully determine acceptance angle,
herein acceptance angle refers to the minimum full angle as resulting from angular
measurement sweeps limited to the primary and secondary axes of the DUT (see 9.8.5).
For example the DUT described in Figure 3. Figure 3 shows acceptance angle
measurement results of 0,75° for the primary axis and 0,7° for the secondary axis.
Therefore the acceptance angle for this DUT is reported as 0,7°. Caution should be noted
that Figure 3 shows measurement results that are symmetric around the zero point
(normal angle of incidence) but a DUT can have asymmetric results.
s) Half acceptance angle – half acceptance angle is defined as the acceptance angle defined
above divided by two. This definition is introduced as it is more relevant to filtering
restrictions placed on pointing error later in this document. Although asymmetry around
the zero angle of incidence is not consistent with this definition of half angle, the definition
is retained for simplicity.
t) 98 % acceptance angle and 98 % half acceptance angle – the definitions acceptance
angle and half acceptance angle given above apply with the exception that when preceded
by 98 % the terms now refer to full and half angles through which DUT orientation can be
rotated while continuing to produce 98 % of its DNI normalized maximum power (not the
original 90 %). For example the DUT in Figure 3 shows a 98 % acceptance angle of 0,32°
and a 98 % half angle measurement of 0,16°.
Field stop
Detector
surface
Aperture stop
Z
Z
Z
s
X L
IEC
Figure 1 – Collimating tube geometry
r
R
– 10 – IEC 62670-3:2017 © IEC 2017
In Figure 1 the field stop represents the limiting entry point for light into the collimating tube
and has a radius of R. The aperture stop represents further limitation of the light which can
reach the detector and has a radius of r. L is the distance between the front of the field stop
and aperture stop. It is assumed that the distance, X, between the aperture stop and the
detector is small and negligible.
Error
IEC
Figure 2 – Solar tracker pointing error
IEC 62817 defines pointing error of a solar tracker as the measured angle between the
pointing vector of the tracker and the vector of the sun’s rays. As shown here the pointing
vector of the tracker is the vector which is normal to the plane of sensor that measures
pointing error.
Primary axis
Secondary axis
0,32° at 98 %
Poly. (Primary axis)
Poly. (Secondary axis)
0,7° at 90 %
Primary and secondary axis pointing error (°)
IEC
Figure 3 – Example of acceptance angle data for a CPV DUT
In Figure 3 the secondary axis acceptance angle in slightly less than the primary axis
acceptance angle and therefore the secondary axis is used in reporting. The DUT has an
acceptance angle of 0,7°(half acceptance angle of 0,35°) and a 98 % acceptance angle of
0,32° (98 % half acceptance angle of 0,16°).
Normalized power/DNI (%)
IEC 62670-3:2017 © IEC 2017 – 11 –
4 Sampling
For performance qualification testing three specimens shall be selected at random from a
production batch or batches in accordance with the procedure given in ISO 2859-1. For
measurements of prototype devices which are not from production, sampling shall not apply.
This shall be noted in the test report.
When the results will be used for ascribing a name-plate rating, the modules or assemblies,
hereafter referred to as device under test (DUT), shall have been manufactured from specified
materials and components in accordance with the relevant drawings and process sheets and
shall have been subjected to the manufacture’s normal inspection, quality control and
production acceptance procedures. The DUT shall be complete in every detail and shall be
accompanied by the manufacturer’s handling and final assembly instructions regarding the
recommended installation of any diodes, frames, brackets, etc.
5 DUT marking and information
5.1 Indelible marking
Each DUT shall carry the following clear and indelible markings:
• name, monogram or symbol of the manufacturer;
• type or model number;
• serial number;
• polarity of terminals or leads (colour coding is permissible);
• the date and place of manufacture shall be marked on the DUT or be traceable from the
serial number.
5.2 Preliminary information indicated by manufacturer
Indicative values shall be provided by the manufacturer to the test laboratory for the purpose
of measurement setup:
• expected maximum power point (MPP), V , and I at CSOC;
oc sc
• acceptance angle;
• installation instructions.
6 Testing
The DUT shall be subjected to the procedure for irradiance and temperature performance
measurements defined in Clause 9. In carrying out the tests, where applicable the tester shall
observe the manufacturer’s handling, mounting and connection instructions.
Testing of the DUT shall follow the test sequence as defined in Figure 4.

– 12 – IEC 62670-3:2017 © IEC 2017
Align device on tracker
Measure acceptance angle, realign if
necessary
Cover/Uncover collect fast I-V
Collect outdoor I-V data
data (very stable DNI)
Will DUT be used as
Filtered I-V
reference irradiance
Yes
data set achieved, will device be
device?
Calculate temperature coefficients

measured with simulator?
for efficiency (δ), I (α), V (β)
sc oc
Yes
No
No
δ, α, β
Set simulator per hot I ,
Filtered
sc
I-V data measure ~ V reference
oc
α
Filtered
Calculate reference I
sc
β
I-V data
Set simulator per
Measure dark I-V at 25 °C
calibrated reference
Set simulator per DUT
device,
reference Isc;
measure
α
Filtered measure
Calculate reference I , V
sc oc
β reference I , V ,
I-V data sc oc
reference V , ᶯ
oc crsc
ᶯ
crsc
Calculate outdoor cell
δ
Filtered Filtered Calculate outdoor cell
δ, β
temperature, CSOC, CSTC
β I-V data I-V data temperature, CSOC, CSTC

IEC
NOTE The dashed boxes indicate actual measurements while solid boxes indicate calculations or decisions in the
flow chart.
Figure 4 – Flow chart of performance testing for the DUT
7 Report
Following completion of the procedure, a certified report of the performance tests, with
measured power characteristics shall be prepared by the test agency in accordance with the
procedures of ISO IEC 17025. Each certificate or test report shall include at least the
following information.
a) a title;
b) name and address of the test laboratory and location (including latitude, longitude and
altitude if outdoor measurements were included) where the calibration or tests were
carried out;
c) unique identification of the certification or report and of each page;
d) name and address of client, where appropriate;
e) description and identification of the item calibrated or tested;
f) characterization and condition of the calibration or test item;
g) date of receipt of test item, date(s) of calibration, and dates and time of outdoor testing,
where appropriate;
h) identification of calibration or test method used;
i) reference to sampling procedure, where relevant;

IEC 62670-3:2017 © IEC 2017 – 13 –
j) any deviations from, additions to or exclusions from the calibration or test method, and
any other information relevant to a specific calibration or test, such as environmental
conditions;
k) measurements, examinations and derived results, include the following as a minimum: a
histogram of all CSOC data points and the mean CSOC power, the mean power at CSTC
(include a histogram of all translated data points if outdoor data is used to determine
CSTC), DUT temperature coefficients, and the reference V and I used for cell
oc sc
temperature calculations;
l) a statement of the estimated uncertainty of test results;
m) a statement as to whether the measured CSOC powers agree with the manufacturer’s
indicated values within the test laboratory’s measurement uncertainty (if appropriate);
n) a signature and title, or equivalent identification of the person(s) accepting responsibility
for the content of the certificate or report, and the date of issue;
o) where relevant, a statement to the effect that the results relate only to the items calibrated
or tested;
p) a statement that the certificate or report shall not be reproduced except in full, without the
written approval of the laboratory;
q) identification of the tracker used, the tracker pointing error sensor including sensor
calibration data and date, and the documented tracker accuracy characterization per
IEC 62817:2014, Clause 7;
r) identification of the wind sensor used, the location of the wind sensor and the calibration
of the wind sensor;
s) identification of the normal incidence pyrheliometer (NIP) used and the calibration of the
pyrheliometer;
t) identification of the current and voltage sensors used and their calibration;
u) identification of the alignment method used for the DUT;
v) identification of distance between NIP and DUT;
w) identification of the component reference cells or spectroradiometer used and the
calibration;
x) identification of the cleaning dates for the DUT, the NIP, and the component reference
cells if applicable;
y) statement of determination of aperture area.
A copy of this report shall be kept by the manufacturer for reference purposes.
8 Standard apparatus requirements
8.1 Irradiance measurement equipment
8.1.1 Normal incidence pyrheliometer (NIP)
The DNI measurements shall be made using a first class normal incidence pyrheliometer in
accordance with ISO 9060:1990. The reference device shall be linear in measurement as
defined in IEC 60904-10 over the irradiance range of interest.
8.1.2 Global normal irradiance pyranometer
GNI measurements shall be made using a PV reference device packaged and calibrated in
conformance with IEC 60904-2 or a pyranometer.
8.1.3 Spectral measurement device
For outdoor measurements, the spectral measurement device shall be capable of determining
the direct normal spectral irradiance at least in the 3 distinct ranges of wavelengths necessary

– 14 – IEC 62670-3:2017 © IEC 2017
for determining SMR values as defined by item c) of Clause 3. For simulator measurements,
the spectral measurement device shall be capable of determining direct normal spectral
irradiance in the separate ranges of wavelengths which correspond to subcells in the DUT.
The device shall include collimating tubes such that the opening full-angle is 5° and the slope
angle is 1°. The device shall be calibrated as a primary or secondary reference device and
show traceability per 3.3, 3.4 and 3.5 of IEC 60904-4:2009 respectively. Calibration shall be
completed at least once per year. The spectral measurement device could be a
spectroradiometer, component reference cells as defined by 8.1.4, or another suitable
instrument. The uncertainty of the SMR values that are generated shall be documented. For
indoor measurements, the designated test area of the solar simulator’s beam shall include
also the aperture area of this spectral measurement device.
8.1.4 Component reference cells
8.1.4.1 General
Component reference cells are a set of devices that together can serve as the spectral
measurement device for this document. A minimum of 3 separate cells/junctions are required
for outdoor spectral irradiance measurements.
8.1.4.2 Standard component reference cells
Standard component reference cells are a set of component reference cells that are an
acceptable outdoor spectral measurement device regardless of the DUT. The standard set of
component reference cells shall be equivalent to the individual junctions from a latticed
matched triple junction cell with bandgaps of 1,9 eV, 1,4 eV, and 0,7 eV. It is expected that
component cells from a conventional triple junction latticed matched GaInP/GaInAs/Ge cell
will meet these requirements.
NOTE This standard set of component reference cells is not intended to be a specific match to the subcells in the
DUT or to the current generated from each of the DUT subcells. While not specific to the DUT, the standard
component reference cells enable filtering of outdoor data which limit spectral variation and minimize uncertainty in
performance reported at CSOC and CSTC (derived from outdoor I-V data).
8.1.4.3 DUT matched component reference cells
Component reference cells that are specifically matched to the DUT can provide improved
information about the current matching of the subcells in the DUT and are applicable as a
spectral measurement device both indoors and outdoors. With sufficient test data, specifically
matched component reference cells can lead to SMR filtering criteria that reduce uncertainty
of ratings at CSOC and CSTC. The test laboratory is permitted to use DUT matched
component reference cells if the following are true:
a) the component cells mee
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