FprEN IEC 62522:2024

SLOVENSKI STANDARD
oSIST prEN IEC 62522:2023
01-april-2023
Umerjanje nastavljivih laserskih virov
Calibration of tuneable laser sources
Kalibrierung von abstimmbaren Laserquellen
Étalonnage des sources laser accordables
Ta slovenski standard je istoveten z: prEN IEC 62522:2023
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
33.180.01 Sistemi z optičnimi vlakni na Fibre optic systems in
splošno general
oSIST prEN IEC 62522:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

oSIST prEN IEC 62522:2023
oSIST prEN IEC 62522:2023
86/610/CDV
COMMITTEE DRAFT FOR VOTE (CDV)

PROJECT NUMBER:
IEC 62522 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2023-02-03 2023-04-28
SUPERSEDES DOCUMENTS:
86/600/CD, 86/604A/CC
IEC TC 86 : FIBRE OPTICS
SECRETARIAT: SECRETARY:
United States of America Mr Peter Pondillo
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
SC 86C
Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of
• any relevant patent rights of which they are aware and to provide supporting documentation,
• any relevant “in some countries” clauses to be included should this proposal proceed. Recipients are
reminded that the enquiry stage is the final stage for submitting "in some countries" clauses. See
AC/22/2007.
TITLE:
Calibration of tuneable laser sources

PROPOSED STABILITY DATE: 2029
NOTE FROM TC/SC OFFICERS:
this electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee
positions. You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other
purpose without permission in writing from IEC.

oSIST prEN IEC 62522:2023
IEC CDV 62522/Ed2 © IEC 2023 – 2 – 86/610/CDV
1 CONTENTS
3 FOREWORD . 4
4 INTRODUCTION . 6
5 1 Scope . 7
6 2 Normative references . 7
7 3 Terms, definitions and abbreviations . 7
8 3.1 Terms and definitions . 7
9 3.2 Abbreviations . 9
10 4 Preparation for calibration . 9
11 4.1 Organization . 9
12 4.2 Traceability . 10
13 4.3 Preparation . 10
14 4.4 Reference calibration conditions . 10
15 5 Wavelength calibration . 10
16 5.1 Overview. 10
17 5.2 Wavelength calibration at reference conditions . 11
18 5.2.1 Set-up . 11
19 5.2.2 Calibration equipment . 11
20 5.2.3 Procedure for wavelength calibration . 11
21 5.2.4 Dependence on conditions . 12
22 5.2.5 Uncertainty at reference conditions . 14
23 5.3 Wavelength calibration at operating conditions . 15
24 5.3.1 General . 15
25 5.3.2 Optical power dependence . 15
26 5.3.3 Uncertainty at operating conditions . 16
27 6 Optical power calibration . 16
28 6.1 Overview. 16
29 6.2 Optical power calibration at reference conditions . 17
30 6.2.1 Set-up . 17
31 6.2.2 Calibration equipment . 17
32 6.2.3 Procedure for power calibration at reference conditions . 17
33 6.2.4 Dependence on conditions . 18
34 6.2.5 Uncertainty at reference conditions . 21
35 6.3 Optical power calibration at operating conditions . 21
36 6.3.1 General . 21
37 6.3.2 Wavelength dependence . 22
38 6.3.3 Uncertainty at operating conditions . 22
39 7 Documentation . 23
40 7.1 Calibration data and uncertainty . 23
41 7.2 Calibration conditions . 23
42 Annex A (normative) Mathematical basis for measurement uncertainty calculations . 24
43 A.1 General . 24
44 A.2 Type A evaluation of uncertainty . 24
45 A.3 Type B evaluation of uncertainty . 25
46 A.4 Determining the combined standard uncertainty . 25

oSIST prEN IEC 62522:2023
IEC CDV 62522/Ed2 © IEC 2023 – 3 – 86/610/CDV
47 A.5 Reporting . 26
48 Annex B (informative) Other testing . 27
49 B.1 General . 27
50 B.2 Wavelength resolution . 27
51 B.2.1 Set-up . 27
52 B.2.2 Testing equipment . 27
53 B.2.3 Testing procedure for determining wavelength resolution . 27
54 B.3 Optical power resolution . 28
55 B.3.1 Set-up . 28
56 B.3.2 Testing equipment . 28
57 B.3.3 Testing procedure for optical power resolution . 28
58 B.4 Signal to source spontaneous emission ratio. 29
59 B.4.1 General . 29
60 B.4.2 Set-up . 29
61 B.4.3 Testing equipment . 29
62 B.4.4 Testing procedure for determining signal to source spontaneous
63 emission ratio . 29
64 B.5 Side mode suppression ratio . 30
65 B.5.1 General . 30
66 B.5.2 Set-up . 30
67 B.5.3 Testing equipment . 31
68 B.5.4 Testing procedure . 31
69 Annex C (informative) Linear to dB scale conversion of uncertainties . 34
70 C.1 Definition of decibel . 34
71 C.2 Conversion of relative uncertainties . 34
72 Bibliography . 35
74 Figure 1 – Measurement set-up for wavelength calibration . 11
75 Figure 2 – Measurement set-up for temperature dependence . 12
76 Figure 3 – Measurement set-up for wavelength stability . 13
77 Figure 4 – Measurement set-up for optical power dependence . 15
78 Figure 5 – Measurement set-up for intrinsic optical power calibration . 17
79 Figure 6 – Measurement set-up for temperature dependence . 18
80 Figure 7 – Measurement set-up for optical power stability . 19
81 Figure 8 – Measurement set-up for connection repeatability/reproducibility . 20
82 Figure 9 – Measurement set-up for wavelength dependence . 22
83 Figure B.1 – Measurement set-up for wavelength resolution . 27
84 Figure B.2 – Measurement set-up for optical power resolution setting test . 28
85 Figure B.3 – Measurement set-up for signal to total source spontaneous emission ratio . 29
86 Figure B.4 – Measurement of the signal to spontaneous emission ratio. 30
87 Figure B.5 – Measurement set-up for the side mode suppression ratio test . 30
88 Figure B.6 – Optical spectrum of tuneable laser source . 32
89 Figure B.7 – Measurement set-up for SMSR . 32
91 Table 1 – Source of uncertainty for wavelength calibration . 11
92 Table 2 – Source of uncertainty for optical power calibration . 16

oSIST prEN IEC 62522:2023
IEC CDV 62522/Ed2 © IEC 2023 – 4 – 86/610/CDV
94 INTERNATIONAL ELECTROTECHNICAL COMMISSION
95 ____________
97 CALIBRATION OF TUNEABLE LASER SOURCES
99 FOREWORD
100 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
101 all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
102 co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
103 in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
104 Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
105 preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
106 may participate in this preparatory work. International, governmental and non-governmental organizations liaising
107 with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
108 Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
109 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an internati
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